STT-RAM을 이용한 에너지 효율적인 캐시 설계 기술

학위논문 (박사)-- 서울대학교 대학원 : 공과대학 전기·컴퓨터공학부, 2019. 2. 최기영.지난 수십 년간 '메모리 벽' 문제를 해결하기 위해 온 칩 캐시의 크기는 꾸준히 증가해왔다. 하지만 지금까지 캐시에 주로 사용되어 온 메모리 기술인 SRAM은 낮은 집적도와 높은 대기 전력 소모로 인해 큰 캐시를 구성하는 데에는 적합하지 않다. 이러한 SRAM의 단점을 보완하기 위해 더 높은 집적도와 낮은 대기 전력을 소모하는 새로운 메모리 기술인 STT-RAM으로 SRAM을 대체하는 것이 제안되었다. 하지만 STT-RAM은 데이터를 쓸 때 많은 에너지와 시간을 소비하기 때문에 단순히 SRAM을 STT-RAM으로 대체하는 것은 오히려 캐시 에너지 소비를 증가시킨다. 이러한 문제를 해결하기 위해 본 논문에서는 STT-RAM을 이용한 에너지 효율적인 캐시 설계 기술들을 제안한다. 첫 번째, 배타적 캐시 계층 구조에서 STT-RAM을 활용하는 방법을 제안하였다. 배타적 캐시 계층 구조는 계층 간에 중복된 데이터가 없기 때문에 포함적 캐시 계층 구조와 비교하여 더 큰 유효 용량을 갖지만, 배타적 캐시 계층 구조에서는 상위 레벨 캐시에서 내보내진 모든 데이터를 하위 레벨 캐시에 써야 하므로 더 많은 양의 데이터를 쓰게 된다. 이러한 배타적 캐시 계층 구조의 특성은 쓰기 특성이 단점인 STT-RAM을 함께 활용하는 것을 어렵게 한다. 이를 해결하기 위해 본 논문에서는 재사용 거리 예측을 기반으로 하는 SRAM/STT-RAM 하이브리드 캐시 구조를 설계하였다. 두 번째, 비휘발성 STT-RAM을 이용해 캐시를 설계할 때 고려해야 할 점들에 대해 분석하였다. STT-RAM의 비효율적인 쓰기 동작을 줄이기 위해 다양한 해결법들이 제안되었다. 그중 한 가지는 STT-RAM 소자가 데이터를 유지하는 시간을 줄여 (휘발성 STT-RAM) 쓰기 특성을 향상하는 방법이다. STT-RAM에 저장된 데이터를 잃는 것은 확률적으로 발생하기 때문에 저장된 데이터를 안정적으로 유지하기 위해서는 오류 정정 부호(ECC)를 이용해 주기적으로 오류를 정정해주어야 한다. 본 논문에서는 STT-RAM 모델을 이용하여 휘발성 STT-RAM 설계 요소들에 대해 분석하였고 실험을 통해 해당 설계 요소들이 캐시 에너지와 성능에 주는 영향을 보여주었다. 마지막으로, 매니코어 시스템에서의 분산 하이브리드 캐시 구조를 설계하였다. 단순히 기존의 하이브리드 캐시와 분산캐시를 결합하면 하이브리드 캐시의 효율성에 큰 영향을 주는 SRAM 활용도가 낮아진다. 따라서 기존의 하이브리드 캐시 구조에서의 에너지 감소를 기대할 수 없다. 본 논문에서는 분산 하이브리드 캐시 구조에서 SRAM 활용도를 높일 수 있는 두 가지 최적화 기술인 뱅크-내부 최적화와 뱅크간 최적화 기술을 제안하였다. 뱅크-내부 최적화는 highly-associative 캐시를 활용하여 뱅크 내부에서 쓰기 동작이 많은 데이터를 분산시키는 것이고 뱅크간 최적화는 서로 다른 캐시 뱅크에 쓰기 동작이 많은 데이터를 고르게 분산시키는 최적화 방법이다.Over the last decade, the capacity of on-chip cache is continuously increased to mitigate the memory wall problem. However, SRAM, which is a dominant memory technology for caches, is not suitable for such a large cache because of its low density and large static power. One way to mitigate these downsides of the SRAM cache is replacing SRAM with a more efficient memory technology. Spin-Transfer Torque RAM (STT-RAM), one of the emerging memory technology, is a promising candidate for the alternative of SRAM. As a substitute of SRAM, STT-RAM can compensate drawbacks of SRAM with its non-volatility and small cell size. However, STT-RAM has poor write characteristics such as high write energy and long write latency and thus simply replacing SRAM to STT-RAM increases cache energy. To overcome those poor write characteristics of STT-RAM, this dissertation explores three different design techniques for energy-efficient cache using STT-RAM. The first part of the dissertation focuses on combining STT-RAM with exclusive cache hierarchy. Exclusive caches are known to provide higher effective cache capacity than inclusive caches by removing duplicated copies of cache blocks across hierarchies. However, in exclusive cache hierarchies, every block evicted from the upper-level cache is written back to the last-level cache regardless of its dirtiness thereby incurring extra write overhead. This makes it challenging to use STT-RAM for exclusive last-level caches due to its high write energy and long write latency. To mitigate this problem, we design an SRAM/STT-RAM hybrid cache architecture based on reuse distance prediction. The second part of the dissertation explores trade-offs in the design of volatile STT-RAM cache. Due to the inefficient write operation of STT-RAM, various solutions have been proposed to tackle this inefficiency. One of the proposed solutions is redesigning STT-RAM cell for better write characteristics at the cost of shortened retention time (i.e., volatile STT-RAM). Since the retention failure of STT-RAM has a stochastic property, an extra overhead of periodic scrubbing with error correcting code (ECC) is required to tolerate the failure. With an analysis based on analytic STT-RAM model, we have conducted extensive experiments on various volatile STT-RAM cache design parameters including scrubbing period, ECC strength, and target failure rate. The experimental results show the impact of the parameter variations on last-level cache energy and performance and provide a guideline for designing a volatile STT-RAM with ECC and scrubbing. The last part of the dissertation proposes Benzene, an energy-efficient distributed SRAM/STT-RAM hybrid cache architecture for manycore systems running multiple applications. It is based on the observation that a naive application of hybrid cache techniques to distributed caches in a manycore architecture suffers from limited energy reduction due to uneven utilization of scarce SRAM. We propose two-level optimization techniques: intra-bank and inter-bank. Intra-bank optimization leverages highly-associative cache design, achieving more uniform distribution of writes within a bank. Inter-bank optimization evenly balances the amount of write-intensive data across the banks.Abstract i Contents iii List of Figures vii List of Tables xi Chapter 1 Introduction 1 1.1 Exclusive Last-Level Hybrid Cache 2 1.2 Designing Volatile STT-RAM Cache 4 1.3 Distributed Hybrid Cache 5 Chapter 2 Background 9 2.1 STT-RAM 9 2.1.1 Thermal Stability 10 2.1.2 Read and Write Operation of STT-RAM 11 2.1.3 Failures of STT-RAM 11 2.1.4 Volatile STT-RAM 13 2.1.5 Related Work 14 2.2 Exclusive Last-Level Hybrid Cache 18 2.2.1 Cache Hierarchies 18 2.2.2 Related Work 19 2.3 Distributed Hybrid Cache 21 2.3.1 Prediction Hybrid Cache 21 2.3.2 Distributed Cache Partitioning 22 2.3.3 Related Work 23 Chapter 3 Exclusive Last-Level Hybrid Cache 27 3.1 Motivation 27 3.1.1 Exclusive Cache Hierarchy 27 3.1.2 Reuse Distance 29 3.2 Architecture 30 3.2.1 Reuse Distance Predictor 30 3.2.2 Hybrid Cache Architecture 32 3.3 Evaluation 34 3.3.1 Methodology 34 3.3.2 LLC Energy Consumption 35 3.3.3 Main Memory Energy Consumption 38 3.3.4 Performance 39 3.3.5 Area Overhead 39 3.4 Summary 39 Chapter 4 Designing Volatile STT-RAM Cache 41 4.1 Analysis 41 4.1.1 Retention Failure of a Volatile STT-RAM Cell 41 4.1.2 Memory Array Design 43 4.2 Evaluation 45 4.2.1 Methodology 45 4.2.2 Last-Level Cache Energy 46 4.2.3 Performance 51 4.3 Summary 52 Chapter 5 Distributed Hybrid Cache 55 5.1 Motivation 55 5.2 Architecture 58 5.2.1 Intra-Bank Optimization 59 5.2.2 Inter-Bank Optimization 63 5.2.3 Other Optimizations 67 5.3 Evaluation Methodology 69 5.4 Evaluation Results 73 5.4.1 Energy Consumption and Performance 73 5.4.2 Analysis of Intra-bank Optimization 76 5.4.3 Analysis of Inter-bank Optimization 78 5.4.4 Impact of Inter-Bank Optimization on Network Energy 79 5.4.5 Sensitivity Analysis 80 5.4.6 Implementation Overhead 81 5.5 Summary 82 Chapter 6 Conculsion 85 Bibliography 88 초록 101Docto

STT-RAM memory hierarchy designs aimed to performance, reliability and energy consumption

Current applications demand larger on-chip memory capacity since off-chip memory accesses be-come a bottleneck. However, if we want to achieve this by scaling down the transistor size of SRAM-based Last-Level Caches (LLCs) it may become prohibitive in terms of cost, area and en-ergy. Therefore, other technologies such as STT-RAM are becoming real alternatives to build the LLC in multicore systems. Although STT-RAM bitcells feature high density and low static power, they suffer from other trade-offs. On the one hand, STT-RAM writes are more expensive than STT-RAM reads and SRAM writes. In order to address this asymmetry, we will propose microarchitectural techniques to minimize the number of write operations on STT-RAM cells. On the other hand, reliability also plays an important role. STT-RAM cells suffer from three types of errors: write, read disturbance, and retention errors. Regarding this, we will suggest tech-niques to manage redundant information allowing error detection and information recovery.Postprint (published version

High-Performance Energy-Efficient and Reliable Design of Spin-Transfer Torque Magnetic Memory

In this dissertation new computing paradigms, architectures and design philosophy are proposed and evaluated for adopting the STT-MRAM technology as highly reliable, energy efficient and fast memory. For this purpose, a novel cross-layer framework from the cell-level all the way up to the system- and application-level has been developed. In these framework, the reliability issues are modeled accurately with appropriate fault models at different abstraction levels in order to analyze the overall failure rates of the entire memory and its Mean Time To Failure (MTTF) along with considering the temperature and process variation effects. Design-time, compile-time and run-time solutions have been provided to address the challenges associated with STT-MRAM. The effectiveness of the proposed solutions is demonstrated in extensive experiments that show significant improvements in comparison to state-of-the-art solutions, i.e. lower-power, higher-performance and more reliable STT-MRAM design

An Adaptive ECC Scheme for Runtime Write Failure Suppression of STT-RAM Cache

Spin-transfer torque random access memory (STT-RAM) features many attractive charac- teristics, including near-zero standby power, nanosecond access time, small footprint, etc. These properties make STT-RAM perfectly suitable for the applications that are subject to limited power and area budgets, i.e., on-chip cache. Write reliability is one of the major challenges in design of STT-RAM caches. To ensure design quality, error correction code (ECC) scheme is usually adopted in STT-RAM caches. However, it incurs significant hard- ware overhead. In observance of the dynamic error correcting requirements, in this work, we propose an adaptive ECC scheme to suppress the runtime write failures of STT-RAM cache with minimized hardware cost, in which the cache is partitioned into regions protected by different ECCs. The error rate of a data is speculated on-the-fly and the data is allocated to a partition that provides the needed error correcting capability. Moreover, to accom- modate the time-varying error correcting requirements of runtime data, the thresholds that determine data’s destination cache partition will be adaptively adjusted. Our experimental results show that compared to conventional ECC schemes, our scheme can save up to 80.2% ECC bit overhead with slightly degraded write reliability of the STT-RAM cache. Moreover, the detailed analysis shows that through simultaneous optimization in cache access patterns and reducing STT cell programming workload, our method outperforms conventional ECC design in power and energy consumptions

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems

Circuit and Architecture Co-Design of STT-RAM for High Performance and Low Energy

Spin-Transfer Torque Random Access Memory (STT-RAM) has been proved a promising emerging nonvolatile memory technology suitable for many applications such as cache mem- ory of CPU. Compared with other conventional memory technology, STT-RAM offers many attractive features such as nonvolatility, fast random access speed and extreme low leakage power. However, STT-RAM is still facing many challenges. First of all, programming STT-RAM is a stochastic process due to random thermal fluctuations, so the write errors are hard to avoid. Secondly, the existing STT-RAM cell designs can be used for only single-port accesses, which limits the memory access bandwidth and constraints the system performance. Finally, while other memory technology supports multi-level cell (MLC) design to boost the storage density, adopting MLC to STT-RAM brings many disadvantages such as requirement for large transistor and low access speed. In this work, we proposed solutions on both circuit and architecture level to address these challenges. For the write error issues, we proposed two probabilistic methods, namely write-verify- rewrite with adaptive period (WRAP) and verify-one-while-writing (VOW), for performance improvement and write failure reduction. For dual-port solution, we propose the design methods to support dual-port accesses for STT-RAM. The area increment by introducing an additional port is reduced by leveraging the shared source-line structure. Detailed analysis on the performance/reliability degrada- tion caused by dual-port accesses is performed, and the corresponding design optimization is provided. To unleash the potential of MLC STT-RAM cache, we proposed a new design through a cross-layer co-optimization. The memory cell structure integrated the reversed stacking of magnetic junction tunneling (MTJ) for a more balanced device and design trade-off. In architecture development, we presented an adaptive mode switching mechanism: based on application’s memory access behavior, the MLC STT-RAM cache can dynamically change between low latency SLC mode and high capacity MLC mode. Finally, we present a 4Kb test chip design which can support different types and sizes of MTJs. A configurable sensing solution is used in the test chip so that it can support wide range of MTJ resistance. Such test chip design can help to evaluate various type of MTJs in the future

Reliable Low-Power High Performance Spintronic Memories

Moores Gesetz folgend, ist es der Chipindustrie in den letzten fünf Jahrzehnten gelungen, ein explosionsartiges Wachstum zu erreichen. Dies hatte ebenso einen exponentiellen Anstieg der Nachfrage von Speicherkomponenten zur Folge, was wiederum zu speicherlastigen Chips in den heutigen Computersystemen führt. Allerdings stellen traditionelle on-Chip Speichertech- nologien wie Static Random Access Memories (SRAMs), Dynamic Random Access Memories (DRAMs) und Flip-Flops eine Herausforderung in Bezug auf Skalierbarkeit, Verlustleistung und Zuverlässigkeit dar. Eben jene Herausforderungen und die überwältigende Nachfrage nach höherer Performanz und Integrationsdichte des on-Chip Speichers motivieren Forscher, nach neuen nichtflüchtigen Speichertechnologien zu suchen. Aufkommende spintronische Spe- ichertechnologien wie Spin Orbit Torque (SOT) und Spin Transfer Torque (STT) erhielten in den letzten Jahren eine hohe Aufmerksamkeit, da sie eine Reihe an Vorteilen bieten. Dazu gehören Nichtflüchtigkeit, Skalierbarkeit, hohe Beständigkeit, CMOS Kompatibilität und Unan- fälligkeit gegenüber Soft-Errors. In der Spintronik repräsentiert der Spin eines Elektrons dessen Information. Das Datum wird durch die Höhe des Widerstandes gespeichert, welche sich durch das Anlegen eines polarisierten Stroms an das Speichermedium verändern lässt. Das Prob- lem der statischen Leistung gehen die Speichergeräte sowohl durch deren verlustleistungsfreie Eigenschaft, als auch durch ihr Standard- Aus/Sofort-Ein Verhalten an. Nichtsdestotrotz sind noch andere Probleme, wie die hohe Zugriffslatenz und die Energieaufnahme zu lösen, bevor sie eine verbreitete Anwendung finden können. Um diesen Problemen gerecht zu werden, sind neue Computerparadigmen, -architekturen und -entwurfsphilosophien notwendig. Die hohe Zugriffslatenz der Spintroniktechnologie ist auf eine vergleichsweise lange Schalt- dauer zurückzuführen, welche die von konventionellem SRAM übersteigt. Des Weiteren ist auf Grund des stochastischen Schaltvorgangs der Speicherzelle und des Einflusses der Prozessvari- ation ein nicht zu vernachlässigender Zeitraum dafür erforderlich. In diesem Zeitraum wird ein konstanter Schreibstrom durch die Bitzelle geleitet, um den Schaltvorgang zu gewährleisten. Dieser Vorgang verursacht eine hohe Energieaufnahme. Für die Leseoperation wird gleicher- maßen ein beachtliches Zeitfenster benötigt, ebenfalls bedingt durch den Einfluss der Prozess- variation. Dem gegenüber stehen diverse Zuverlässigkeitsprobleme. Dazu gehören unter An- derem die Leseintereferenz und andere Degenerationspobleme, wie das des Time Dependent Di- electric Breakdowns (TDDB). Diese Zuverlässigkeitsprobleme sind wiederum auf die benötigten längeren Schaltzeiten zurückzuführen, welche in der Folge auch einen über längere Zeit an- liegenden Lese- bzw. Schreibstrom implizieren. Es ist daher notwendig, sowohl die Energie, als auch die Latenz zur Steigerung der Zuverlässigkeit zu reduzieren, um daraus einen potenziellen Kandidaten für ein on-Chip Speichersystem zu machen. In dieser Dissertation werden wir Entwurfsstrategien vorstellen, welche das Ziel verfolgen, die Herausforderungen des Cache-, Register- und Flip-Flop-Entwurfs anzugehen. Dies erre- ichen wir unter Zuhilfenahme eines Cross-Layer Ansatzes. Für Caches entwickelten wir ver- schiedene Ansätze auf Schaltkreisebene, welche sowohl auf der Speicherarchitekturebene, als auch auf der Systemebene in Bezug auf Energieaufnahme, Performanzsteigerung und Zuver- lässigkeitverbesserung evaluiert werden. Wir entwickeln eine Selbstabschalttechnik, sowohl für die Lese-, als auch die Schreiboperation von Caches. Diese ist in der Lage, den Abschluss der entsprechenden Operation dynamisch zu ermitteln. Nachdem der Abschluss erkannt wurde, wird die Lese- bzw. Schreiboperation sofort gestoppt, um Energie zu sparen. Zusätzlich limitiert die Selbstabschalttechnik die Dauer des Stromflusses durch die Speicherzelle, was wiederum das Auftreten von TDDB und Leseinterferenz bei Schreib- bzw. Leseoperationen re- duziert. Zur Verbesserung der Schreiblatenz heben wir den Schreibstrom an der Bitzelle an, um den magnetischen Schaltprozess zu beschleunigen. Um registerbankspezifische Anforderungen zu berücksichtigen, haben wir zusätzlich eine Multiport-Speicherarchitektur entworfen, welche eine einzigartige Eigenschaft der SOT-Zelle ausnutzt, um simultan Lese- und Schreiboperatio- nen auszuführen. Es ist daher möglich Lese/Schreib- Konfilkte auf Bitzellen-Ebene zu lösen, was sich wiederum in einer sehr viel einfacheren Multiport- Registerbankarchitektur nieder- schlägt. Zusätzlich zu den Speicheransätzen haben wir ebenfalls zwei Flip-Flop-Architekturen vorgestellt. Die erste ist eine nichtflüchtige non-Shadow Flip-Flop-Architektur, welche die Speicherzelle als aktive Komponente nutzt. Dies ermöglicht das sofortige An- und Ausschalten der Versorgungss- pannung und ist daher besonders gut für aggressives Powergating geeignet. Alles in Allem zeigt der vorgestellte Flip-Flop-Entwurf eine ähnliche Timing-Charakteristik wie die konventioneller CMOS Flip-Flops auf. Jedoch erlaubt er zur selben Zeit eine signifikante Reduktion der statis- chen Leistungsaufnahme im Vergleich zu nichtflüchtigen Shadow- Flip-Flops. Die zweite ist eine fehlertolerante Flip-Flop-Architektur, welche sich unanfällig gegenüber diversen Defekten und Fehlern verhält. Die Leistungsfähigkeit aller vorgestellten Techniken wird durch ausführliche Simulationen auf Schaltkreisebene verdeutlicht, welche weiter durch detaillierte Evaluationen auf Systemebene untermauert werden. Im Allgemeinen konnten wir verschiedene Techniken en- twickeln, die erhebliche Verbesserungen in Bezug auf Performanz, Energie und Zuverlässigkeit von spintronischen on-Chip Speichern, wie Caches, Register und Flip-Flops erreichen

Error Characterization and Correction Techniques for Reliable STT-RAM Designs

The concerns on the continuous scaling of mainstream memory technologies have motivated tremendous investment to emerging memories. Being a promising candidate, spin-transfer torque random access memory (STT-RAM) offers nanosecond access time comparable to SRAM, high integration density close to DRAM, non-volatility as Flash memory, and good scalability. It is well positioned as the replacement of SRAM and DRAM for on-chip cache and main memory applications. However, reliability issue continues being one of the major challenges in STT-RAM memory designs due to the process variations and unique thermal fluctuations, i.e., the stochastic resistance switching property of magnetic devices. In this dissertation, I decoupled the reliability issues as following three-folds: First, the characterization of STT-RAM operation errors often require expensive Monte-Carlo runs with hybrid magnetic-CMOS simulation steps, making it impracticable for architects and system designs; Second, the state of the art does not have sufficiently understanding on the unique reliability issue of STT-RAM, and conventional error correction codes (ECCs) cannot efficiently handle such errors; Third, while the information density of STT-RAM can be boosted by multi-level cell (MLC) design, the more prominent reliability concerns and the complicated access mechanism greatly limit its applications in memory subsystems. Thus, I present a novel through solution set to both characterize and tackle the above reliability challenges in STT-RAM designs. In the first part of the dissertation, I introduce a new characterization method that can accurately and efficiently capture the multi-variable design metrics of STT-RAM cells; Second, a novel ECC scheme, namely, content-dependent ECC (CD-ECC), is developed to combat the characterized asymmetric errors of STT-RAM at 0->1 and 1->0 bit flipping's; Third, I present a circuit-architecture design, namely state-restricted multi-level cell (SR-MLC) STT-RAM design, which simultaneously achieves high information density, good storage reliability and fast write speed, making MLC STT-RAM accessible for system designers under current technology node. Finally, I conclude that efficient robust (or ECC) designs for STT-RAM require a deep holistic understanding on three different levels-device, circuit and architecture. Innovative ECC schemes and their architectural applications, still deserve serious research and investigation in the near future