A 128K-bit CCD buffer memory system

A prototype system was implemented to demonstrate that CCD's can be applied advantageously to the problem of low power digital storage and particularly to the problem of interfacing widely varying data rates. 8K-bit CCD shift register memories were used to construct a feasibility model 128K-bit buffer memory system. Peak power dissipation during a data transfer is less than 7 W., while idle power is approximately 5.4 W. The system features automatic data input synchronization with the recirculating CCD memory block start address. Descriptions are provided of both the buffer memory system and a custom tester that was used to exercise the memory. The testing procedures and testing results are discussed. Suggestions are provided for further development with regards to the utilization of advanced versions of CCD memory devices to both simplified and expanded memory system applications

G0^0 Electronics and Data Acquisition (Forward-Angle Measurements)

The G$^0$ parity-violation experiment at Jefferson Lab (Newport News, VA) is designed to determine the contribution of strange/anti-strange quark pairs to the intrinsic properties of the proton. In the forward-angle part of the experiment, the asymmetry in the cross section was measured for $\vec{e}p$ elastic scattering by counting the recoil protons corresponding to the two beam-helicity states. Due to the high accuracy required on the asymmetry, the G$^0$ experiment was based on a custom experimental setup with its own associated electronics and data acquisition (DAQ) system. Highly specialized time-encoding electronics provided time-of-flight spectra for each detector for each helicity state. More conventional electronics was used for monitoring (mainly FastBus). The time-encoding electronics and the DAQ system have been designed to handle events at a mean rate of 2 MHz per detector with low deadtime and to minimize helicity-correlated systematic errors. In this paper, we outline the general architecture and the main features of the electronics and the DAQ system dedicated to G$^0$ forward-angle measurements.Comment: 35 pages. 17 figures. This article is to be submitted to NIM section A. It has been written with Latex using \documentclass{elsart}. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment In Press (2007

A comprehensive comparison between design for testability techniques for total dose testing of flash-based FPGAs

Radiation sources exist in different kinds of environments where electronic devices often operate. Correct device operation is usually affected negatively by radiation. The radiation resultant effect manifests in several forms depending on the operating environment of the device like total ionizing dose effect (TID), or single event effects (SEEs) such as single event upset (SEU), single event gate rupture (SEGR), and single event latch up (SEL). CMOS circuits and Floating gate MOS circuits suffer from an increase in the delay and the leakage current due to TID effect. This may damage the proper operation of the integrated circuit. Exhaustive testing is needed for devices operating in harsh conditions like space and military applications to ensure correct operations in the worst circumstances. The use of worst case test vectors (WCTVs) for testing is strongly recommended by MIL-STD-883, method 1019, which is the standard describing the procedure for testing electronic devices under radiation. However, the difficulty of generating these test vectors hinders their use in radiation testing. Testing digital circuits in the industry is usually done nowadays using design for testability (DFT) techniques as they are very mature and can be relied on. DFT techniques include, but not limited to, ad-hoc technique, built-in self test (BIST), muxed D scan, clocked scan and enhanced scan. DFT is usually used with automatic test patterns generation (ATPG) software to generate test vectors to test application specific integrated circuits (ASICs), especially with sequential circuits, against faults like stuck at faults and path delay faults. Despite all these recommendations for DFT, radiation testing has not benefited from this reliable technology yet. Also, with the big variation in the DFT techniques, choosing the right technique is the bottleneck to achieve the best results for TID testing. In this thesis, a comprehensive comparison between different DFT techniques for TID testing of flash-based FPGAs is made to help designers choose the best suitable DFT technique depending on their application. The comparison includes muxed D scan technique, clocked scan technique and enhanced scan technique. The comparison is done using ISCAS-89 benchmarks circuits. Points of comparisons include FPGA resources utilization, difficulty of designs bring-up, added delay by DFT logic and robust testable paths in each technique

Timing speculation and adaptive reliable overclocking techniques for aggressive computer systems

Computers have changed our lives beyond our own imagination in the past several decades. The continued and progressive advancements in VLSI technology and numerous micro-architectural innovations have played a key role in the design of spectacular low-cost high performance computing systems that have become omnipresent in today\u27s technology driven world. Performance and dependability have become key concerns as these ubiquitous computing machines continue to drive our everyday life. Every application has unique demands, as they run in diverse operating environments. Dependable, aggressive and adaptive systems improve efficiency in terms of speed, reliability and energy consumption. Traditional computing systems run at a fixed clock frequency, which is determined by taking into account the worst-case timing paths, operating conditions, and process variations. Timing speculation based reliable overclocking advocates going beyond worst-case limits to achieve best performance while not avoiding, but detecting and correcting a modest number of timing errors. The success of this design methodology relies on the fact that timing critical paths are rarely exercised in a design, and typical execution happens much faster than the timing requirements dictated by worst-case design methodology. Better-than-worst-case design methodology is advocated by several recent research pursuits, which exploit dependability techniques to enhance computer system performance. In this dissertation, we address different aspects of timing speculation based adaptive reliable overclocking schemes, and evaluate their role in the design of low-cost, high performance, energy efficient and dependable systems. We visualize various control knobs in the design that can be favorably controlled to ensure different design targets. As part of this research, we extend the SPRIT3E, or Superscalar PeRformance Improvement Through Tolerating Timing Errors, framework, and characterize the extent of application dependent performance acceleration achievable in superscalar processors by scrutinizing the various parameters that impact the operation beyond worst-case limits. We study the limitations imposed by short-path constraints on our technique, and present ways to exploit them to maximize performance gains. We analyze the sensitivity of our technique\u27s adaptiveness by exploring the necessary hardware requirements for dynamic overclocking schemes. Experimental analysis based on SPEC2000 benchmarks running on a SimpleScalar Alpha processor simulator, augmented with error rate data obtained from hardware simulations of a superscalar processor, are presented. Even though reliable overclocking guarantees functional correctness, it leads to higher power consumption. As a consequence, reliable overclocking without considering on-chip temperatures will bring down the lifetime reliability of the chip. In this thesis, we analyze how reliable overclocking impacts the on-chip temperature of a microprocessor and evaluate the effects of overheating, due to such reliable dynamic frequency tuning mechanisms, on the lifetime reliability of these systems. We then evaluate the effect of performing thermal throttling, a technique that clamps the on-chip temperature below a predefined value, on system performance and reliability. Our study shows that a reliably overclocked system with dynamic thermal management achieves 25% performance improvement, while lasting for 14 years when being operated within 353K. Over the past five decades, technology scaling, as predicted by Moore\u27s law, has been the bedrock of semiconductor technology evolution. The continued downscaling of CMOS technology to deep sub-micron gate lengths has been the primary reason for its dominance in today\u27s omnipresent silicon microchips. Even as the transition to the next technology node is indispensable, the initial cost and time associated in doing so presents a non-level playing field for the competitors in the semiconductor business. As part of this thesis, we evaluate the capability of speculative reliable overclocking mechanisms to maximize performance at a given technology level. We evaluate its competitiveness when compared to technology scaling, in terms of performance, power consumption, energy and energy delay product. We present a comprehensive comparison for integer and floating point SPEC2000 benchmarks running on a simulated Alpha processor at three different technology nodes in normal and enhanced modes. Our results suggest that adopting reliable overclocking strategies will help skip a technology node altogether, or be competitive in the market, while porting to the next technology node. Reliability has become a serious concern as systems embrace nanometer technologies. In this dissertation, we propose a novel fault tolerant aggressive system that combines soft error protection and timing error tolerance. We replicate both the pipeline registers and the pipeline stage combinational logic. The replicated logic receives its inputs from the primary pipeline registers while writing its output to the replicated pipeline registers. The organization of redundancy in the proposed Conjoined Pipeline system supports overclocking, provides concurrent error detection and recovery capability for soft errors, intermittent faults and timing errors, and flags permanent silicon defects. The fast recovery process requires no checkpointing and takes three cycles. Back annotated post-layout gate-level timing simulations, using 45nm technology, of a conjoined two-stage arithmetic pipeline and a conjoined five-stage DLX pipeline processor, with forwarding logic, show that our approach, even under a severe fault injection campaign, achieves near 100% fault coverage and an average performance improvement of about 20%, when dynamically overclocked

Spacecraft Microminiature PAM Decommutator System

Operation and testing of spacecraft microminiature PAM decommutator syste

The Mid-Infrared Instrument for the James Webb Space Telescope, VIII: The MIRI Focal Plane System

We describe the layout and unique features of the focal plane system for MIRI. We begin with the detector array and its readout integrated circuit (combining the amplifier unit cells and the multiplexer), the electronics, and the steps by which the data collection is controlled and the output signals are digitized and delivered to the JWST spacecraft electronics system. We then discuss the operation of this MIRI data system, including detector readout patterns, operation of subarrays, and data formats. Finally, we summarize the performance of the system, including remaining anomalies that need to be corrected in the data pipeline

Design and Analysis of an Adaptive Asynchronous System Architecture for Energy Efficiency

Power has become a critical design parameter for digital CMOS integrated circuits. With performance still garnering much concern, a central idea has emerged: minimizing power consumption while maintaining performance. The use of dynamic voltage scaling (DVS) with parallelism has shown to be an effective way of saving power while maintaining performance. However, the potency of DVS and parallelism in traditional, clocked synchronous systems is limited because of the strict timing requirements such systems must comply with. Delay-insensitive (DI) asynchronous systems have the potential to benefit more from these techniques due to their flexible timing requirements and high modularity. This dissertation presents the design and analysis of a real-time adaptive DVS architecture for paralleled Multi-Threshold NULL Convention Logic (MTNCL) systems. Results show that energy-efficient systems with low area overhead can be created using this approach

Development of high speed integrated circuit for very high resolution timing measurements

A multi-channel high-precision low-power time-to-digital converter application specific integrated circuit for high energy physics applications has been designed and implemented in a 130 nm CMOS process. To reach a target resolution of 24.4 ps, a novel delay element has been conceived. This nominal resolution has been experimentally verified with a prototype, with a minimum resolution of 19 ps. To further improve the resolution, a new interpolation scheme has been described. The ASIC has been designed to use a reference clock with the LHC bunch crossing frequency of 40MHz and generate all required timing signals internally, to ease to use within the framework of an LHC upgrade. Special care has been taken to minimise the power consumption

RAKSHA:Reliable and Aggressive frameworK for System design using High-integrity Approaches

Advances in the fabrication technology have been a major driving force in the unprecedented increase in computing capabilities over the last several decades. Despite huge reductions in the switching energy of the transistors, two major issues have emerged with decreasing fabrication technology scales. They are: 1) increased impact of process, voltage, and temperature (PVT) variation on transistor performance, and 2) increased susceptibility of transistors to soft errors induced by high energy particles. In presence of PVT variation, as transistor sizes continue to decrease, the design margins used to guarantee correct operation in the presence of worst-case scenarios have been increasing. Systems run at a clock frequency, which is determined by accounting the worst-case timing paths, operating conditions, and process variations. Timing speculation based reliable and aggressive clocking advocates going beyond worst-case limits to achieve best performance while not avoiding, but detecting and correcting a modest number of timing errors. Such design methodology exploits the fact that timing critical paths are rarely exercised in a design, and typical execution happens much faster than the timing requirements dictated by worst-case scenarios. Better-than-worst-case design methodology is advocated by several recent research pursuits, which propose to exploit in-built fault tolerance mechanisms to enhance computer system performance. Recent works have also shown that the performance lose due to over provisioning base on worst-case design margins is upward of 20\% in terms operating frequency and upward of 50\% in terms of power efficiency. The threat of soft error induced system failure in computing systems has become more prominent as we adopt ultra-deep submicron process technologies. With respect to soft error susceptibility, decreasing transistor geometries lower the energy threshold needed by high-energy particles to induce errors. As this trend continues, the need for fault tolerance mechanisms to counteract this effect has moved from a nice to have, to be a requirement in current and future systems. In this dissertation, RAKSHA (meaning to protect and save in Sanskrit), we take a multidimensional look at the challenges of system design built with scaled-technologies using high integrity techniques. In RAKSHA, to mitigate soft errors, we propose lightweight high-integrity mechanisms as basic system building blocks which allow system to offer performance levels comparable to a non-fault tolerant system. In addition, we also propose to effectively exploit and use the availability of fault tolerant mechanisms to allow and tolerate data-dependent failures, thus setting systems to operate at typical case circuit delays and enhance system performance. We also propose the use of novel high-integrity cells for increasing system energy efficiency and also potentially increasing system security by combating power-analysis-based side channel attacks. Such an approach allows balancing of performance, power, and security with no further overhead over the resources needed to incorporate fault tolerance. Using our framework, instead of designing circuits to meet worst-case requirements, circuits can be designed to meet typical-case requirements. In RAKSHA, we propose two efficient soft error mitigation schemes, namely Soft Error Mitigation (SEM) and Soft and Timing Error Mitigation (STEM), using the approach of multiple clocking of data for protecting combinational logic blocks from soft errors. Our first technique, SEM, based on distributed and temporal voting of three registers, unloads the soft error detection overhead from the critical path of the systems. SEM is also capable of ignoring false errors and recovers from soft errors using in-situ fast recovery avoiding recomputation. Our second technique, STEM, while tolerating soft errors, adds timing error detection capability to guarantee reliable execution in aggressively clocked designs that enhance system performance by operating beyond worst-case clock frequency. We also present a specialized low overhead clock phase management scheme that ably supports our proposed techniques. Timing annotated gate level simulations, using 45nm libraries, of a pipelined adder-multiplier and DLX processor show that both our techniques achieve near 100% fault coverage. For DLX processor, even under severe fault injection campaigns, SEM achieves an average performance improvement of 26.58% over a conventional triple modular redundancy voter based soft error mitigation scheme, while STEM outperforms SEM by 27.42%. We refer to systems built with SEM and STEM cells as reliable and aggressive systems. Energy consumption minimization in computing systems has attracted a great deal of attention and has also become critical due to battery life considerations and environmental concerns. To address this problem, many task scheduling algorithms are developed using dynamic voltage and frequency scaling (DVFS). Majority of these algorithms involve two passes: schedule generation and slack reclamation. Using this approach, linear combination of frequencies has been proposed to achieve near optimal energy for systems operating with discrete and traditional voltage frequency pairs. In RAKSHA, we propose a new slack reclamation algorithm, aggressive dynamic and voltage scaling (ADVFS), using reliable and aggressive systems. ADVFS exploits the enhanced voltage frequency spectrum offered by reliable and aggressive designs for improving energy efficiency. Formal proofs are provided to show that optimal energy for reliable and aggressive designs is either achieved by using single frequency or by linear combination of frequencies. ADVFS has been evaluated using random task graphs and our results show 18% reduction in energy when compared with continuous DVFS and over more than 33% when compared with scheme using linear combination of traditional voltage frequency pairs. Recent events have indicated that attackers are banking on side-channel attacks, such as differential power analysis (DPA) and correlation power analysis (CPA), to exploit information leaks from physical devices. Random dynamic voltage frequency scaling (RDVFS) has been proposed to prevent such attacks and has very little area, power, and performance overheads. But due to the one-to-one mapping present between voltage and frequency of DVFS voltage-frequency pairs, RDVFS cannot prevent power attacks. In RAKSHA, we propose a novel countermeasure that uses reliable and aggressive designs to break this one-to-one mapping. Our experiments show that our technique significantly reduces the correlation for the actual key and also reduces the risk of power attacks by increasing the probability for incorrect keys to exhibit maximum correlation. Moreover, our scheme also enables systems to operate beyond the worst-case estimates to offer improved power and performance benefits. For the experiments conducted on AES S-box implemented using 45nm CMOS technology, our approach has increased performance by 22% over the worst-case estimates. Also, it has decreased the correlation for the correct key by an order and has increased the probability by almost 3.5X times for wrong keys when compared with the original key to exhibit maximum correlation. Overall, RAKSHA offers a new way to balance the intricate interplay between various design constraints for the systems designed using small scaled-technologies

High-speed Low-voltage CMOS Flash Analog-to-Digital Converter for Wideband Communication System-on-a-Chip

With higher-level integration driven by increasingly complex digital systems and downscaling CMOS processes available, system-on-a-chip (SoC) is an emerging technology of low power, high cost effectiveness and high reliability and is exceedingly attractive for applications in high-speed data conversion wireless and wideband communication systems. This research presents a novel ADC comparator design methodology; the speed and performance of which is not restricted by the supply voltage reduction and device linearity deterioration in scaling-down CMOS processes. By developing a dynamic offset suppression technique and a circuit optimization method, the comparator can achieve a 3 dB frequency of 2 GHz in 130 nanometer (nm) CMOS process. Combining this new comparator design and a proposed pipelined thermometer-Gray- binary encoder designed by the DCVSPG logic, a high-speed, low-voltage clocked-digital- comparator (CDC) pipelined CMOS flash ADC architecture is proposed for wideband communication SoC. This architecture has advantages of small silicon area, low power, and low cost. Three CDC-based pipelined CMOS flash ADCs were implemented in 130 nm CMOS process and their experimental results are reported: 1. 4-b, 2.5-GSPS ADC: SFDR of 21.48-dB, SNDR of 15.99-dB, ENOB of 2.4-b, ERBW of 1-GHz, power of 7.9-mW, and area of 0.022-mm2. 2. 4-b, 4-GSPS ADC: SFDR of 25-dB, SNDR of 18.6-dB, ENOB of 2.8-b, ERBW of 2-GHz, power of 11-mW. 3. 6-b, 4-GSPS ADC: SFDR of 48-dB at a signal frequency of 11.72-MHz, SNDR of 34.43-dB, ENOB of 5.4-b, power of 28-mW. An application of the proposed CDC-based pipelined CMOS flash ADC is 1-GHz bandwidth, 2.5-GSPS digital receiver on a chip. To verify the performance of the receiver, a mixed-signal block-level simulation and verification flow was built in Cadence AMS integrated platform. The verification results of the digital receiver using a 4-b 2.5-GSPS CDC-based pipelined CMOS ADC, a 256-point, 12-point kernel function FFT and a frequency detection logic show that two tone signals up to 1125 MHz can be detected and discriminated. A notable contribution of this research is that the proposed ADC architecture and the comparator design with dynamic offset suppression and optimization are extremely suitable for future VDSM CMOS processes and make all-digital receiver SoC design practical