Improving the Reliability and Modal Stability of High Power 870 nm AlGaAs CSP Laser Diodes for Applications to Free Space Communication Systems

The operating characteristics (power-current, beam divergence, etc.) and reliability assessment of high-power CSP lasers is discussed. The emission wavelength of these lasers was optimized at 860 to 880 nm. The operational characteristics of a new laser, the inverse channel substrate planar (ICSP) laser, grown by metalorganic chemical vapor deposition (MOCVD), is discussed and the reliability assessment of this laser is reported. The highlights of this study include a reduction in the threshold current value for the laser to 15 mA and a degradation rate of less than 2 kW/hr for the lasers operating at 60 mW of peak output power

Design, processing and testing of LSI arrays hybrid microelectronics task

Those factors affecting the cost of electronic subsystems utilizing LSI microcircuits were determined and the most efficient methods for low cost packaging of LSI devices as a function of density and reliability were developed

Impact of parameter variations on circuits and microarchitecture

Parameter variations, which are increasing along with advances in process technologies, affect both timing and power. Variability must be considered at both the circuit and microarchitectural design levels to keep pace with performance scaling and to keep power consumption within reasonable limits. This article presents an overview of the main sources of variability and surveys variation-tolerant circuit and microarchitectural approaches.Peer ReviewedPostprint (published version

Product assurance technology for custom LSI/VLSI electronics

The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification

Small Satellite Industrial Base Study: Foundational Findings

This report documents findings from a Small Satellite (SmallSat) Industrial Base Study conducted by The Aerospace Corporation between November 2018 and September 2019. The primary objectives of this study were a) to gain a better understanding of the SmallSat communitys technical practices, engineering approaches, requirements flow-downs, and common processes and b) identify insights and recommendations for how the government can further capitalize on the strengths and capabilities of SmallSat offerings. In the context of this study, SmallSats are understood to weigh no more than 500 kg, as described in State of the Art Small Spacecraft Technology, NASA/TP-2018- 220027, December 2018. CubeSats were excluded from this study to avoid overlap and duplication of recently completed work or other studies already under way. The team also touched on differences between traditional space-grade and the emerging mid-grade and other non-space, alternate-grade EEEE (electrical, electronic, electromechanical, electro-optical) piece part categories. Finally, the participants sought to understand the potential effects of increased use of alternate-grade parts on the traditional space-grade industrial base. The study team was keenly aware that there are missions for which non-space grade parts currently are infeasible for the foreseeable future. National security, long-duration and high-reliability missions intolerant of risk are a few examples. The team sought to identify benefits of alternative parts and approaches that can be harnessed by the government to achieve greater efficiencies and capabilities without impacting mission success

Linear laser diode arrays for improvement in optical disk recording for space stations

The design and fabrication of individually addressable laser diode arrays for high performance magneto-optic recording systems are presented. Ten diode arrays with 30 mW cW light output, linear light vs. current characteristics and single longitudinal mode spectrum were fabricated using channel substrate planar (CSP) structures. Preliminary results on the inverse CSP structure, whose fabrication is less critically dependent on device parameters than the CSP, are also presented. The impact of systems parameters and requirements, in particular, the effect of feedback on laser design is assessed, and techniques to reduce feedback or minimize its effect on systems performance, including mode-stabilized structures, are evaluated

Scheduling system upgrading & downbinning project at Qimonda Portugal, S.A.

Estágio realizado na Qimonda Portugal, S. A. orientado pelo Eng.º José Adriano MoreiraRelatório de estágio curricular da LGEI 2006/200

Characterising and Testing Deep UV LEDs for Use in Space Applications

Deep ultraviolet (DUV) light sources are used to neutralise isolated test masses in highly sensitive space-based gravitational experiments. An example is the LISA Pathfinder charge management system, which uses low-pressure mercury lamps. A future gravitational-wave observatory such as eLISA will use UV light-emitting diodes (UV LEDs), which offer numerous advantages over traditional discharge lamps. Such devices have limited space heritage but are are now available from a number of commercial suppliers. Here we report on a test campaign that was carried out to quantify the general properties of three types of commercially available UV LEDs and demonstrate their suitability for use in space. Testing included general electrical and UV output measurements, spectral stability, pulsed performance, temperature dependence as well as thermal vacuum, radiation and vibration survivability

A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment

Efficient screening procedures for the control of the defectivity are vital to limit early failures especially in critical automotive applications. Traditional strategies based on burn-in and in-line tests are able to provide the required level of reliability but they are expensive and time consuming. This paper presents a novel built-in reliability testing methodology to screen out gate oxide and crystal related defects in Lateral Diffused MOS transistors. The proposed technique is based on an embedded circuitry that includes control logic, high voltage generation, and leakage current monitoring. The concept, advantages and the circuit for the proposed test procedure are described in very detail and illustrated by circuit simulatio

Converting the Minuteman missile into a small satellite launch system

Due to the Strategic Arms Reduction Talks (START) treaty between the United States and Ex-Soviet Union, 450 Minuteman 2 (MM 2) missiles were recently taken out of service. Minotaur Designs Incorporated (MDI) intends to convert the MM 2 ballistic missile from a nuclear warhead carrier into a small satellite launcher. MDI will perform this conversion by acquiring the Minuteman stages, purchasing currently available control wafers, and designing a new shroud and interfaces for the satellite. MDI is also responsible for properly integrating all systems