Practical implementation of a sequential sampling algorithm for EMI near-field scanning

Abstract—In this paper, a practical implementation of a recently proposed automatic and sequential sampling algorithm for the near-field scanning of printed circuit boards and/or integrated circuits is presented. The sampling algorithm minimizes the required number of sampling points by making a balanced trade-off between ‘exploration ’ and ‘exploitation’. Moreover, at every moment analytical models for the complete near-field pattern can be computed by means of Kriging. By comparing successive models, an automatic stopping criterion can be implemented. The performance and effectiveness of the proposed sampling algorithm is tested on a number of simple printed circuit boards and compared with that of the traditionally used uniform sampling

Automated near-field scanning algorithm for the EMC analysis of electronic devices

This paper presents an automated procedure to determine the electric ormagnetic near-field profile of electronic systems and devices in a given plane. It combines sequential sampling to determine the optimal coordinates of near-field scan points at arbitrary coordinates in the scanning plane. The effectiveness of the approach is illustrated by applying it to both a simulated and a measured printed circuit board example

Practical implementation of a sequential sampling algorithm for EMI near-field scanning

Abstract—In this paper, a practical implementation of a recently proposed automatic and sequential sampling algorithm for the near-field scanning of printed circuit boards and/or integrated circuits is presented. The sampling algorithm minimizes the required number of sampling points by making a balanced trade-off between ‘exploration ’ and ‘exploitation’. Moreover, at every moment analytical models for the complete near-field pattern can be computed by means of Kriging. By comparing successive models, an automatic stopping criterion can be implemented. The performance and effectiveness of the proposed sampling algorithm is tested on a number of simple printed circuit boards and compared with that of the traditionally used uniform sampling

Sequential sampling algorithm for simultaneous near-field scanning of amplitude and phase

This paper describes an automated sequential sampling algorithm for EMI near-field scanning of electronic systems which allows to measure both magnitude and phase of the electromagnetic near-fields simultaneously. The main goal of the sequential sampling algorithm is to drastically reduce the total measurement time to obtain a complete model of the electronic system's near-field distribution. Measuring both magnitude and phase is important for predicting the far-field emission from the near-field or for building equivalent radiation models of the device under test. Previous work described such a sequential sampling algorithm for amplitude-only measurements. The extension towards both amplitude and phase poses two challenges. First, the underlying sampling and modelling techniques have to be adapted such that they can handle building up two separate models at the same time using a common set of optimal sampling points and without significant increase of the measurement time. Second, a good choice has to be made with respect to which components will be sampled and modelled. It is shown that the most advantageous choice is to sample and model the real and imaginary components of the near-fields instead of the amplitude and phase directly

Postprocessing of Near-Field Measurement Based on Neural Networks

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