Crosstalk Noise Analysis for Nano-Meter VLSI Circuits.

Scaling of device dimensions into the nanometer process technology has led to a considerable reduction in the gate delays. However, interconnect delays have not scaled in proportion to gate delays, and global-interconnect delays account for a major portion of the total circuit delay. Also, due to process-technology scaling, the spacing between adjacent interconnect wires keeps shrinking, which leads to an increase in the amount of coupling capacitance between interconnect wires. Hence, coupling noise has become an important issue which must be modeled while performing timing verification for VLSI chips. As delay noise strongly depends on the skew between aggressor-victim input transitions, it is not possible to a priori identify the victim-input transition that results in the worst-case delay noise. This thesis presents an analytical result that would obviate the need to search for the worst-case victim-input transition and simplify the aggressor-victim alignment problem significantly. We also propose a heuristic approach to compute the worst-case aggressor alignment that maximizes the victim receiver-output arrival time with current-source driver models. We develop algorithms to compute the set of top-k aggressors in the circuit, which could be fixed to reduce the delay noise of the circuit. Process variations cause variability in the aggressor-victim alignment which leads to variability in the delay noise. This variability is modeled by deriving closed-form expressions of the mean, the standard deviation and the correlations of the delay-noise distribution. We also propose an approach to estimate the confidence bounds on the path delay-noise distribution. Finally, we show that the interconnect corners obtained without incorporating the effects of coupling noise could lead to significant errors, and propose an approach to compute the interconnect corners considering the impact of coupling noise.Ph.D.Electrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/64663/1/gravkis_1.pd

IC design for reliability

textAs the feature size of integrated circuits goes down to the nanometer scale, transient and permanent reliability issues are becoming a significant concern for circuit designers. Traditionally, the reliability issues were mostly handled at the device level as a device engineering problem. However, the increasing severity of reliability challenges and higher error rates due to transient upsets favor higher-level design for reliability (DFR). In this work, we develop several methods for DFR at the circuit level. A major source of transient errors is the single event upset (SEU). SEUs are caused by high-energy particles present in the cosmic rays or emitted by radioactive contaminants in the chip packaging materials. When these particles hit a N+/P+ depletion region of an MOS transistor, they may generate a temporary logic fault. Depending on where the MOS transistor is located and what state the circuit is at, an SEU may result in a circuit-level error. We analyze SEUs both in combinational logic and memories (SRAM). For combinational logic circuit, we propose FASER, a Fast Analysis tool of Soft ERror susceptibility for cell-based designs. The efficiency of FASER is achieved through its static and vector-less nature. In order to evaluate the impact of SEU on SRAM, a theory for estimating dynamic noise margins is developed analytically. The results allow predicting the transient error susceptibility of an SRAM cell using a closedform expression. Among the many permanent failure mechanisms that include time-dependent oxide breakdown (TDDB), electro-migration (EM), hot carrier effect (HCE), and negative bias temperature instability (NBTI), NBTI has recently become important. Therefore, the main focus of our work is NBTI. NBTI occurs when the gate of PMOS is negatively biased. The voltage stress across the gate generates interface traps, which degrade the threshold voltage of PMOS. The degraded PMOS may eventually fail to meet timing requirement and cause functional errors. NBTI becomes severe at elevated temperatures. In this dissertation, we propose a NBTI degradation model that takes into account the temperature variation on the chip and gives the accurate estimation of the degraded threshold voltage. In order to account for the degradation of devices, traditional design methods add guard-bands to ensure that the circuit will function properly during its lifetime. However, the worst-case based guard-bands lead to significant penalty in performance. In this dissertation, we propose an effective macromodel-based reliability tracking and management framework, based on a hybrid network of on-chip sensors, consisting of temperature sensors and ring oscillators. The model is concerned specifically with NBTIinduced transistor aging. The key feature of our work, in contrast to the traditional tracking techniques that rely solely on direct measurement of the increase of threshold voltage or circuit delay, is an explicit macromodel which maps operating temperature to circuit degradation (the increase of circuit delay). The macromodel allows for costeffective tracking of reliability using temperature sensors and is also essential for enabling the control loop of the reliability management system. The developed methods improve the over-conservatism of the device-level, worstcase reliability estimation techniques. As the severity of reliability challenges continue to grow with technology scaling, it will become more important for circuit designers/CAD tools to be equipped with the developed methods.Electrical and Computer Engineerin

Timing-Error Tolerance Techniques for Low-Power DSP: Filters and Transforms

Low-power Digital Signal Processing (DSP) circuits are critical to commercial System-on-Chip design for battery powered devices. Dynamic Voltage Scaling (DVS) of digital circuits can reclaim worst-case supply voltage margins for delay variation, reducing power consumption. However, removing static margins without compromising robustness is tremendously challenging, especially in an era of escalating reliability concerns due to continued process scaling. The Razor DVS scheme addresses these concerns, by ensuring robustness using explicit timing-error detection and correction circuits. Nonetheless, the design of low-complexity and low-power error correction is often challenging. In this thesis, the Razor framework is applied to fixed-precision DSP filters and transforms. The inherent error tolerance of many DSP algorithms is exploited to achieve very low-overhead error correction. Novel error correction schemes for DSP datapaths are proposed, with very low-overhead circuit realisations. Two new approximate error correction approaches are proposed. The first is based on an adapted sum-of-products form that prevents errors in intermediate results reaching the output, while the second approach forces errors to occur only in less significant bits of each result by shaping the critical path distribution. A third approach is described that achieves exact error correction using time borrowing techniques on critical paths. Unlike previously published approaches, all three proposed are suitable for high clock frequency implementations, as demonstrated with fully placed and routed FIR, FFT and DCT implementations in 90nm and 32nm CMOS. Design issues and theoretical modelling are presented for each approach, along with SPICE simulation results demonstrating power savings of 21 – 29%. Finally, the design of a baseband transmitter in 32nm CMOS for the Spectrally Efficient FDM (SEFDM) system is presented. SEFDM systems offer bandwidth savings compared to Orthogonal FDM (OFDM), at the cost of increased complexity and power consumption, which is quantified with the first VLSI architecture

Special Topics in Information Technology

This open access book presents thirteen outstanding doctoral dissertations in Information Technology from the Department of Electronics, Information and Bioengineering, Politecnico di Milano, Italy. Information Technology has always been highly interdisciplinary, as many aspects have to be considered in IT systems. The doctoral studies program in IT at Politecnico di Milano emphasizes this interdisciplinary nature, which is becoming more and more important in recent technological advances, in collaborative projects, and in the education of young researchers. Accordingly, the focus of advanced research is on pursuing a rigorous approach to specific research topics starting from a broad background in various areas of Information Technology, especially Computer Science and Engineering, Electronics, Systems and Control, and Telecommunications. Each year, more than 50 PhDs graduate from the program. This book gathers the outcomes of the thirteen best theses defended in 2020-21 and selected for the IT PhD Award. Each of the authors provides a chapter summarizing his/her findings, including an introduction, description of methods, main achievements and future work on the topic. Hence, the book provides a cutting-edge overview of the latest research trends in Information Technology at Politecnico di Milano, presented in an easy-to-read format that will also appeal to non-specialists

Design Space Exploration and Resource Management of Multi/Many-Core Systems

The increasing demand of processing a higher number of applications and related data on computing platforms has resulted in reliance on multi-/many-core chips as they facilitate parallel processing. However, there is a desire for these platforms to be energy-efficient and reliable, and they need to perform secure computations for the interest of the whole community. This book provides perspectives on the aforementioned aspects from leading researchers in terms of state-of-the-art contributions and upcoming trends

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems

Special Topics in Information Technology

This open access book presents thirteen outstanding doctoral dissertations in Information Technology from the Department of Electronics, Information and Bioengineering, Politecnico di Milano, Italy. Information Technology has always been highly interdisciplinary, as many aspects have to be considered in IT systems. The doctoral studies program in IT at Politecnico di Milano emphasizes this interdisciplinary nature, which is becoming more and more important in recent technological advances, in collaborative projects, and in the education of young researchers. Accordingly, the focus of advanced research is on pursuing a rigorous approach to specific research topics starting from a broad background in various areas of Information Technology, especially Computer Science and Engineering, Electronics, Systems and Control, and Telecommunications. Each year, more than 50 PhDs graduate from the program. This book gathers the outcomes of the thirteen best theses defended in 2020-21 and selected for the IT PhD Award. Each of the authors provides a chapter summarizing his/her findings, including an introduction, description of methods, main achievements and future work on the topic. Hence, the book provides a cutting-edge overview of the latest research trends in Information Technology at Politecnico di Milano, presented in an easy-to-read format that will also appeal to non-specialists