Transition Faults and Transition Path Delay Faults: Test Generation, Path Selection, and Built-In Generation of Functional Broadside Tests

As the clock frequency and complexity of digital integrated circuits increase rapidly, delay testing is indispensable to guarantee the correct timing behavior of the circuits. In this dissertation, we describe methods developed for three aspects of delay testing in scan-based circuits: test generation, path selection and built-in test generation. We first describe a deterministic broadside test generation procedure for a path delay fault model named the transition path delay fault model, which captures both large and small delay defects. Under this fault model, a path delay fault is detected only if all the individual transition faults along the path are detected by the same test. To reduce the complexity of test generation, sub-procedures with low complexity are applied before a complete branch-and-bound procedure. Next, we describe a method based on static timing analysis to select critical paths for test generation. Logic conditions that are necessary for detecting a path delay fault are considered to refine the accuracy of static timing analysis, using input necessary assignments. Input necessary assignments are input values that must be assigned to detect a fault. The method calculates more accurate path delays, selects paths that are critical during test application, and identifies undetectable path delay faults. These two methods are applicable to off-line test generation. For large circuits with high complexity and frequency, built-in test generation is a cost-effective method for delay testing. For a circuit that is embedded in a larger design, we developed a method for built-in generation of functional broadside tests to avoid excessive power dissipation during test application and the overtesting of delay faults, taking the functional constraints on the primary input sequences of the circuit into consideration. Functional broadside tests are scan-based two-pattern tests for delay faults that create functional operation conditions during test application. To avoid the potential fault coverage loss due to the exclusive use of functional broadside tests, we also developed an optional DFT method based on state holding to improve fault coverage. High delay fault coverage can be achieved by the developed method for benchmark circuits using simple hardware

Multi-Cycle at Speed Test

In this research, we focus on the development of an algorithm that is used to generate a minimal number of patterns for path delay test of integrated circuits using the multi-cycle at-speed test. We test the circuits in functional mode, where multiple functional cycles follow after the test pattern scan-in operation. This approach increases the delay correlation between the scan and functional test, due to more functionally realistic power supply noise. We use multiple at-speed cycles to compact K-longest paths per gate tests, which reduces the number of scan patterns. After a path is generated, we try to place each path in the first pattern in the pattern pool. If the path does not fit due to conflicts, we attempt to place it in later functional cycles. This compaction approach retains the greedy nature of the original dynamic compaction algorithm where it will stop if the path fits into a pattern. If the path is not able to compact in any of the functional cycles of patterns in the pool, we generate a new pattern. In this method, each path delay test is compared to at-speed patterns in the pool. The challenge is that the at-speed delay test in a given at-speed cycle must have its necessary value assignments set up in previous (preamble) cycles, and have the captured results propagated to a scan cell in the later (coda) cycles. For instance, if we consider three at-speed (capture) cycles after the scan-in operation, and if we need to place a fault in the first capture cycle, then we must generate it with two propagation cycles. In this case, we consider these propagation cycles as coda cycles, so the algorithm attempts to select the most observable path through them. Likewise, if we are placing the path test in the second capture cycle, then we need one preamble cycle and one coda cycle, and if we are placing the path test in the third capture cycle, we require two preamble cycles with no coda cycles

A software-hardware hybrid steering mechanism for clustered microarchitectures

Clustered microarchitectures provide a promising paradigm to solve or alleviate the problems of increasing microprocessor complexity and wire delays. High- performance out-of-order processors rely on hardware-only steering mechanisms to achieve balanced workload distribution among clusters. However, the additional steering logic results in a significant increase on complexity, which actually decreases the benefits of the clustered design. In this paper, we address this complexity issue and present a novel software-hardware hybrid steering mechanism for out-of-order processors. The proposed software- hardware cooperative scheme makes use of the concept of virtual clusters. Instructions are distributed to virtual clusters at compile time using static properties of the program such as data dependences. Then, at runtime, virtual clusters are mapped into physical clusters by considering workload information. Experiments using SPEC CPU2000 benchmarks show that our hybrid approach can achieve almost the same performance as a state-of-the-art hardware-only steering scheme, while requiring low hardware complexity. In addition, the proposed mechanism outperforms state-of-the-art software-only steering mechanisms by 5% and 10% on average for 2-cluster and 4-cluster machines, respectively.Peer ReviewedPostprint (published version

Steps to an advanced Ada programming environment

Conceptual simplicity, tight coupling of tools, and effective support of host-target software development will characterize advanced Ada programming support environments. Several important principles have been demonstrated in the Arcturus system, including template-assisted Ada editing, command completion using Ada as a command language, and combining the advantages of interpretation and compliation. Other principles, relating to analysis, testing, and debugging of concurrent Ada programs, have appeared in other contexts. This paper discusses several of these topics, considers how they can be integrated, and argues for their inclusion in an environment appropriate for software development in the late 1980's

Efficient Path Delay Test Generation with Boolean Satisfiability

This dissertation focuses on improving the accuracy and efficiency of path delay test generation using a Boolean satisfiability (SAT) solver. As part of this research, one of the most commonly used SAT solvers, MiniSat, was integrated into the path delay test generator CodGen. A mixed structural-functional approach was implemented in CodGen where longest paths were detected using the K Longest Path Per Gate (KLPG) algorithm and path justification and dynamic compaction were handled with the SAT solver. Advanced techniques were implemented in CodGen to further speed up the performance of SAT based path delay test generation using the knowledge of the circuit structure. SAT solvers are inherently circuit structure unaware, and significant speedup can be availed if structure information of the circuit is provided to the SAT solver. The advanced techniques explored include: Dynamic SAT Solving (DSS), Circuit Observability Don’t Care (Cir-ODC), SAT based static learning, dynamic learnt clause management and Approximate Observability Don’t Care (ACODC). Both ISCAS 89 and ITC 99 benchmarks as well as industrial circuits were used to demonstrate that the performance of CodGen was significantly improved with MiniSat and the use of circuit structure

Streaming Graph Challenge: Stochastic Block Partition

An important objective for analyzing real-world graphs is to achieve scalable performance on large, streaming graphs. A challenging and relevant example is the graph partition problem. As a combinatorial problem, graph partition is NP-hard, but existing relaxation methods provide reasonable approximate solutions that can be scaled for large graphs. Competitive benchmarks and challenges have proven to be an effective means to advance state-of-the-art performance and foster community collaboration. This paper describes a graph partition challenge with a baseline partition algorithm of sub-quadratic complexity. The algorithm employs rigorous Bayesian inferential methods based on a statistical model that captures characteristics of the real-world graphs. This strong foundation enables the algorithm to address limitations of well-known graph partition approaches such as modularity maximization. This paper describes various aspects of the challenge including: (1) the data sets and streaming graph generator, (2) the baseline partition algorithm with pseudocode, (3) an argument for the correctness of parallelizing the Bayesian inference, (4) different parallel computation strategies such as node-based parallelism and matrix-based parallelism, (5) evaluation metrics for partition correctness and computational requirements, (6) preliminary timing of a Python-based demonstration code and the open source C++ code, and (7) considerations for partitioning the graph in streaming fashion. Data sets and source code for the algorithm as well as metrics, with detailed documentation are available at GraphChallenge.org.Comment: To be published in 2017 IEEE High Performance Extreme Computing Conference (HPEC

A design representation model for high-level synthesis

Design tools share and exchange various types of information pertaining to the design. The identification of a uniform design representation to capture this information is essential for the development of a successful design environment. We have done an extensive study on the representation needs of existing database tools in the UCI CADLAB; examples of which are graph compilers for high-level hardware specifications, state schedulers, hardware allocators, and microarchitecture optimizers. The result of this study is the development of a design representation model that will serve as a common internal representation (DDM) for all system and behavioral synthesis tools. DDM thus builds the foundation for a CAD Framework in which design tools can communicate via operating on this common representation. The design information is composed of three separate graph models: the conceptual model, the behavioral model and the structural model. The conceptual model (represented by a Design Entity Graph) captures the overall organization of the design information, such as, versions and configurations. The behavioral model (represented by an Augmented Control/Data Flow Graph) describes the design behavior. The structural model (represented by an Annotated Component Graph) captures the hierarchical data path structure and its geometric information. In this paper, we define the last two graph models. They both capture the actual design data of the application domain. Since VHDL has gained increasing popularity as hardware description language for synthesis, we give numerous examples throughout this report that show how the proposed design representation model can be used to represent VHDL specifications

Using formal methods to support testing

Formal methods and testing are two important approaches that assist in the development of high quality software. While traditionally these approaches have been seen as rivals, in recent years a new consensus has developed in which they are seen as complementary. This article reviews the state of the art regarding ways in which the presence of a formal specification can be used to assist testing