Approximate logic circuits: Theory and applications

CMOS technology scaling, the process of shrinking transistor dimensions based on Moore's law, has been the thrust behind increasingly powerful integrated circuits for over half a century. As dimensions are scaled to few tens of nanometers, process and environmental variations can significantly alter transistor characteristics, thus degrading reliability and reducing performance gains in CMOS designs with technology scaling. Although design solutions proposed in recent years to improve reliability of CMOS designs are power-efficient, the performance penalty associated with these solutions further reduces performance gains with technology scaling, and hence these solutions are not well-suited for high-performance designs. This thesis proposes approximate logic circuits as a new logic synthesis paradigm for reliable, high-performance computing systems. Given a specification, an approximate logic circuit is functionally equivalent to the given specification for a "significant" portion of the input space, but has a smaller delay and power as compared to a circuit implementation of the original specification. This contributions of this thesis include (i) a general theory of approximation and efficient algorithms for automated synthesis of approximations for unrestricted random logic circuits, (ii) logic design solutions based on approximate circuits to improve reliability of designs with negligible performance penalty, and (iii) efficient decomposition algorithms based on approxiiii mate circuits to improve performance of designs during logic synthesis. This thesis concludes with other potential applications of approximate circuits and identifies. open problems in logic decomposition and approximate circuit synthesis

Circuits and Systems Advances in Near Threshold Computing

Modern society is witnessing a sea change in ubiquitous computing, in which people have embraced computing systems as an indispensable part of day-to-day existence. Computation, storage, and communication abilities of smartphones, for example, have undergone monumental changes over the past decade. However, global emphasis on creating and sustaining green environments is leading to a rapid and ongoing proliferation of edge computing systems and applications. As a broad spectrum of healthcare, home, and transport applications shift to the edge of the network, near-threshold computing (NTC) is emerging as one of the promising low-power computing platforms. An NTC device sets its supply voltage close to its threshold voltage, dramatically reducing the energy consumption. Despite showing substantial promise in terms of energy efficiency, NTC is yet to see widescale commercial adoption. This is because circuits and systems operating with NTC suffer from several problems, including increased sensitivity to process variation, reliability problems, performance degradation, and security vulnerabilities, to name a few. To realize its potential, we need designs, techniques, and solutions to overcome these challenges associated with NTC circuits and systems. The readers of this book will be able to familiarize themselves with recent advances in electronics systems, focusing on near-threshold computing

Synthesis and Verification of Digital Circuits using Functional Simulation and Boolean Satisfiability.

The semiconductor industry has long relied on the steady trend of transistor scaling, that is, the shrinking of the dimensions of silicon transistor devices, as a way to improve the cost and performance of electronic devices. However, several design challenges have emerged as transistors have become smaller. For instance, wires are not scaling as fast as transistors, and delay associated with wires is becoming more significant. Moreover, in the design flow for integrated circuits, accurate modeling of wire-related delay is available only toward the end of the design process, when the physical placement of logic units is known. Consequently, one can only know whether timing performance objectives are satisfied, i.e., if timing closure is achieved, after several design optimizations. Unless timing closure is achieved, time-consuming design-flow iterations are required. Given the challenges arising from increasingly complex designs, failing to quickly achieve timing closure threatens the ability of designers to produce high-performance chips that can match continually growing consumer demands. In this dissertation, we introduce powerful constraint-guided synthesis optimizations that take into account upcoming timing closure challenges and eliminate expensive design iterations. In particular, we use logic simulation to approximate the behavior of increasingly complex designs leveraging a recently proposed concept, called bit signatures, which allows us to represent a large fraction of a complex circuit's behavior in a compact data structure. By manipulating these signatures, we can efficiently discover a greater set of valid logic transformations than was previously possible and, as a result, enhance timing optimization. Based on the abstractions enabled through signatures, we propose a comprehensive suite of novel techniques: (1) a fast computation of circuit don't-cares that increases restructuring opportunities, (2) a verification methodology to prove the correctness of speculative optimizations that efficiently utilizes the computational power of modern multi-core systems, and (3) a physical synthesis strategy using signatures that re-implements sections of a critical path while minimizing perturbations to the existing placement. Our results indicate that logic simulation is effective in approximating the behavior of complex designs and enables a broader family of optimizations than previous synthesis approaches.Ph.D.Computer Science & EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/61793/1/splaza_1.pd

Automatic test pattern generation for asynchronous circuits

The testability of integrated circuits becomes worse with transistor dimensions reaching nanometer scales. Testing, the process of ensuring that circuits are fabricated without defects, becomes inevitably part of the design process; a technique called design for test (DFT). Asynchronous circuits have a number of desirable properties making them suitable for the challenges posed by modern technologies, but are severely limited by the unavailability of EDA tools for DFT and automatic test-pattern generation (ATPG). This thesis is motivated towards developing test generation methodologies for asynchronous circuits. In total four methods were developed which are aimed at two different fault models: stuck-at faults at the basic logic gate level and transistor-level faults. The methods were evaluated using a set of benchmark circuits and compared favorably to previously published work. First, ABALLAST is a partial-scan DFT method adapting the well-known BALLAST technique for asynchronous circuits where balanced structures are used to guide the selection of the state-holding elements that will be scanned. The test inputs are automatically provided by a novel test pattern generator, which uses time frame unrolling to deal with the remaining, non-scanned sequential C-elements. The second method, called AGLOB, uses algorithms from strongly-connected components in graph graph theory as a method for finding the optimal position of breaking the loops in the asynchronous circuit and adding scan registers. The corresponding ATPG method converts cyclic circuits into acyclic for which standard tools can provide test patterns. These patterns are then automatically converted for use in the original cyclic circuits. The third method, ASCP, employs a new cycle enumeration method to find the loops present in a circuit. Enumerated cycles are then processed using an efficient set covering heuristic to select the scan elements for the circuit to be tested.Applying these methods to the benchmark circuits shows an improvement in fault coverage compared to previous work, which, for some circuits, was substantial. As no single method consistently outperforms the others in all benchmarks, they are all valuable as a designer’s suite of tools for testing. Moreover, since they are all scan-based, they are compatible and thus can be simultaneously used in different parts of a larger circuit. In the final method, ATRANTE, the main motivation of developing ATPG is supplemented by transistor level test generation. It is developed for asynchronous circuits designed using a State Transition Graph (STG) as their specification. The transistor-level circuit faults are efficiently mapped onto faults that modify the original STG. For each potential STG fault, the ATPG tool provides a sequence of test vectors that expose the difference in behavior to the output ports. The fault coverage obtained was 52-72 % higher than the coverage obtained using the gate level tests. Overall, four different design for test (DFT) methods for automatic test pattern generation (ATPG) for asynchronous circuits at both gate and transistor level were introduced in this thesis. A circuit extraction method for representing the asynchronous circuits at a higher level of abstraction was also implemented. Developing new methods for the test generation of asynchronous circuits in this thesis facilitates the test generation for asynchronous designs using the CAD tools available for testing the synchronous designs. Lessons learned and the research questions raised due to this work will impact the future work to probe the possibilities of developing robust CAD tools for testing the future asynchronous designs

Integrated circuit outlier identification by multiple parameter correlation

Semiconductor manufacturers must ensure that chips conform to their specifications before they are shipped to customers. This is achieved by testing various parameters of a chip to determine whether it is defective or not. Separating defective chips from fault-free ones is relatively straightforward for functional or other Boolean tests that produce a go/no-go type of result. However, making this distinction is extremely challenging for parametric tests. Owing to continuous distributions of parameters, any pass/fail threshold results in yield loss and/or test escapes. The continuous advances in process technology, increased process variations and inaccurate fault models all make this even worse. The pass/fail thresholds for such tests are usually set using prior experience or by a combination of visual inspection and engineering judgment. Many chips have parameters that exceed certain thresholds but pass Boolean tests. Owing to the imperfect nature of tests, to determine whether these chips (called "outliers") are indeed defective is nontrivial. To avoid wasted investment in packaging or further testing it is important to screen defective chips early in a test flow. Moreover, if seemingly strange behavior of outlier chips can be explained with the help of certain process parameters or by correlating additional test data, such chips can be retained in the test flow before they are proved to be fatally flawed. In this research, we investigate several methods to identify true outliers (defective chips, or chips that lead to functional failure) from apparent outliers (seemingly defective, but fault-free chips). The outlier identification methods in this research primarily rely on wafer-level spatial correlation, but also use additional test parameters. These methods are evaluated and validated using industrial test data. The potential of these methods to reduce burn-in is discussed

Cost modelling and concurrent engineering for testable design

This thesis was submitted for the degree of Doctor of Philosophy and awarded by Brunel University.As integrated circuits and printed circuit boards increase in complexity, testing becomes a major cost factor of the design and production of the complex devices. Testability has to be considered during the design of complex electronic systems, and automatic test systems have to be used in order to facilitate the test. This fact is now widely accepted in industry. Both design for testability and the usage of automatic test systems aim at reducing the cost of production testing or, sometimes, making it possible at all. Many design for testability methods and test systems are available which can be configured into a production test strategy, in order to achieve high quality of the final product. The designer has to select from the various options for creating a test strategy, by maximising the quality and minimising the total cost for the electronic system. This thesis presents a methodology for test strategy generation which is based on consideration of the economics during the life cycle of the electronic system. This methodology is a concurrent engineering approach which takes into account all effects of a test strategy on the electronic system during its life cycle by evaluating its related cost. This objective methodology is used in an original test strategy planning advisory system, which allows for test strategy planning for VLSI circuits as well as for digital electronic systems. The cost models which are used for evaluating the economics of test strategies are described in detail and the test strategy planning system is presented. A methodology for making decisions which are based on estimated costing data is presented. Results of using the cost models and the test strategy planning system for evaluating the economics of test strategies for selected industrial designs are presented

Design, Analysis and Test of Logic Circuits under Uncertainty.

Integrated circuits are increasingly susceptible to uncertainty caused by soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects become detrimental to circuit reliability. In order to address this, we develop methods for analyzing, designing, and testing circuits subject to probabilistic effects. Our main contributions are: 1) a fast, soft-error rate (SER) analyzer that uses functional-simulation signatures to capture error effects, 2) novel design techniques that improve reliability using little area and performance overhead, 3) a matrix-based reliability-analysis framework that captures many types of probabilistic faults, and 4) test-generation/compaction methods aimed at probabilistic faults in logic circuits. SER analysis must account for the main error-masking mechanisms in ICs: logic, timing, and electrical masking. We relate logic masking to node testability of the circuit and utilize functional-simulation signatures, i.e., partial truth tables, to efficiently compute estability (signal probability and observability). To account for timing masking, we compute error-latching windows (ELWs) from timing analysis information. Electrical masking is incorporated into our estimates through derating factors for gate error probabilities. The SER of a circuit is computed by combining the effects of all three masking mechanisms within our SER analyzer called AnSER. Using AnSER, we develop several low-overhead techniques that increase reliability, including: 1) an SER-aware design method that uses redundancy already present within the circuit, 2) a technique that resynthesizes small logic windows to improve area and reliability, and 3) a post-placement gate-relocation technique that increases timing masking by decreasing ELWs. We develop the probabilistic transfer matrix (PTM) modeling framework to analyze effects beyond soft errors. PTMs are compressed into algebraic decision diagrams (ADDs) to improve computational efficiency. Several ADD algorithms are developed to extract reliability and error susceptibility information from PTMs representing circuits. We propose new algorithms for circuit testing under probabilistic faults, which require a reformulation of existing test techniques. For instance, a test vector may need to be repeated many times to detect a fault. Also, different vectors detect the same fault with different probabilities. We develop test generation methods that account for these differences, and integer linear programming (ILP) formulations to optimize test sets.Ph.D.Computer Science & EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/61584/1/smita_1.pd

Ionic Liquids in Dye Sensitized Solar Cells : Theoretical Assessment of Properties and Applications

Dye-sensitized solar cells have the potential to play a major role in the future of the global energy economy. Unfortunately, they still lack the consistency and durability to be truly competitive from a commercial point of view. The use of ionic liquids may hold a solution to most of the current drawbacks; thus, the implications of their use in dye-sensitized solar cells are approached by means of quantum chemical calculations and computational modeling. The pure bulk phase of three promising cyano-based ionic liquids was investigated by ab initio molecular dynamics studies. Differences in cation-cation structuring was revealed despite the fact that all liquids bear the same cation, which might be correlated to macroscopic properties such as viscosity. The semiconductor-electrolyte interface is of special interest, as many processes occur here in a complete device. Characterization of this system was attempted on different pathways: First, the adsorption behavior was investigated in detail for selected cyano-based ionic liquids in order to understand specific interactions. Second, a polarizable molecular dynamics force field was parametrized to study the extended TiO2-ionic liquid interface, focusing on cooperative and bulk phase effects. Third, a great variety of ionic liquids were classified in their ability to shift the energy levels of the semiconductor TiO2. Furthermore, influences of the ionic liquid electrolyte on the sensitizing dye were studied. Directed coordination plays a role, and a universal redshift of adsorption spectra upon solvation with respect to the gas phase is apparent. Beneficial effects of ionic liquid application can be fine-tuning of semiconductor energy levels or spectroscopic properties of the dye, they can build blocking layers on the surface to prevent unfavored recombination reactions, or can enhance dye regeneration by favorably interacting with the redox mediator. Ultimately, the choice of the ionic liquid decides. Choosing the "right" ionic liquid can certainly have beneficial effects on the dye-sensitized solar cell, whereas choosing the "wrong" ionic liquid will result in inferior properties. By illuminating the fundamental processes involved, the results presented herein shall guide the choice of the ionic liquid electrolyte in future applications