6T CMOS SRAM Stability in Nanoelectronic Era: From Metrics to Built-in Monitoring

The digital technology in the nanoelectronic era is based on intensive data processing and battery-based devices. As a consequence, the need for larger and energy-efficient circuits with large embedded memories is growing rapidly in current system-on-chip (SoC). In this context, where embedded SRAM yield dominate the overall SoC yield, the memory sensitivity to process variation and aging effects has aggressively increased. In addition, long-term aging effects introduce extra variability reducing the failure-free period. Therefore, although stability metrics are used intensively in the circuit design phases, more accurate and non-invasive methodologies must be proposed to observe the stability metric for high reliability systems. This chapter reviews the most extended memory cell stability metrics and evaluates the feasibility of tracking SRAM cell reliability evolution implementing a detailed bit-cell stability characterization measurement. The memory performance degradation observation is focused on estimating the threshold voltage (Vth) drift caused by process variation and reliability mechanisms. A novel SRAM stability degradation measurement architecture is proposed to be included in modern memory designs with minimal hardware intrusion. The new architecture may extend the failure-free period by introducing adaptable circuits depending on the measured memory stability parameter

Containing the Nanometer “Pandora-Box”: Cross-Layer Design Techniques for Variation Aware Low Power Systems

The demand for richer multimedia services, multifunctional portable devices and high data rates can only been visioned due to the improvement in semiconductor technology. Unfortunately, sub-90 nm process nodes uncover the nanometer Pandora-box exposing the barriers of technology scaling—parameter variations, that threaten the correct operation of circuits, and increased energy consumption, that limits the operational lifetime of today’s systems. The contradictory design requirements for low-power and system robustness, is one of the most challenging design problems of today. The design efforts are further complicated due to the heterogeneous types of designs (logic, memory, mixed-signal) that are included in today’s complex systems and are characterized by different design requirements. This paper presents an overview of techniques at various levels of design abstraction that lead to low power and variation aware logic, memory and mixed-signal circuits and can potentially assist in meeting the strict power budgets and yield/quality requirements of future systems

Towards Scalable Network Traffic Measurement With Sketches

Driven by the ever-increasing data volume through the Internet, the per-port speed of network devices reached 400 Gbps, and high-end switches are capable of processing 25.6 Tbps of network traffic. To improve the efficiency and security of the network, network traffic measurement becomes more important than ever. For fast and accurate traffic measurement, managing an accurate working set of active flows (WSAF) at line rates is a key challenge. WSAF is usually located in high-speed but expensive memories, such as TCAM or SRAM, and thus their capacity is quite limited. To scale up the per-flow measurement, we pursue three thrusts. In the first thrust, we propose to use In-DRAM WSAF and put a compact data structure (i.e., sketch) called FlowRegulator before WSAF to compensate for DRAM\u27s slow access time. Per our results, FlowRegulator can substantially reduce massive influxes to WSAF without compromising measurement accuracy. In the second thrust, we integrate our sketch into a network system and propose an SDN-based WLAN monitoring and management framework called RFlow+, which can overcome the limitations of existing traffic measurement solutions (e.g., OpenFlow and sFlow), such as a limited view, incomplete flow statistics, and poor trade-off between measurement accuracy and CPU/network overheads. In the third thrust, we introduce a novel sampling scheme to deal with the poor trade-off that is provided by the standard simple random sampling (SRS). Even though SRS has been widely used in practice because of its simplicity, it provides non-uniform sampling rates for different flows, because it samples packets over an aggregated data flow. Starting with a simple idea that independent per-flow packet sampling provides the most accurate estimation of each flow, we introduce a new concept of per-flow systematic sampling, aiming to provide the same sampling rate across all flows. In addition, we provide a concrete sampling method called SketchFlow, which approximates the idea of the per-flow systematic sampling using a sketch saturation event

Low-Power and Error-Resilient VLSI Circuits and Systems.

Efficient low-power operation is critically important for the success of the next-generation signal processing applications. Device and supply voltage have been continuously scaled to meet a more constrained power envelope, but scaling has created resiliency challenges, including increasing timing faults and soft errors. Our research aims at designing low-power and robust circuits and systems for signal processing by drawing circuit, architecture, and algorithm approaches. To gain an insight into the system faults due to supply voltage reduction, we researched the two primary effects that determine the minimum supply voltage (VMIN) in Intel’s tri-gate CMOS technology, namely process variations and gate-dielectric soft breakdown. We determined that voltage scaling increases the timing window that sequential circuits are vulnerable. Thus, we proposed a new hold-time violation metric to define hold-time VMIN, which has been adopted as a new design standard. Device scaling increases soft errors which affect circuit reliability. Through extensive soft error characterization using two 65nm CMOS test chips, we studied the soft error mechanisms and its dependence on supply voltage and clock frequency. This study laid the foundation of the first 65nm DSP chip design for a NASA spaceflight project. To mitigate such random errors, we proposed a new confidence-driven architecture that effectively enhances the error resiliency of deeply scaled CMOS and post-CMOS circuits. Designing low-power resilient systems can effectively leverage application-specific algorithmic approaches. To explore design opportunities in the algorithmic domain, we demonstrate an application-specific detection and decoding processor for multiple-input multiple-output (MIMO) wireless communication. To enhance the receive error rate for a robust wireless communication, we designed a joint detection and decoding technique by enclosing detection and decoding in an iterative loop to enhance both interference cancellation and error reduction. A proof-of-concept chip design was fabricated for the next-generation 4x4 256QAM MIMO systems. Through algorithm-architecture optimizations and low-power circuit techniques, our design achieves significant improvements in throughput, energy efficiency and error rate, paving the way for future developments in this area.PhDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/110323/1/uchchen_1.pd

Energy-Efficient Digital Signal Processing Hardware Design.

As CMOS technology has developed considerably in the last few decades, many SoCs have been implemented across different application areas due to reduced area and power consumption. Digital signal processing (DSP) algorithms are frequently employed in these systems to achieve more accurate operation or faster computation. However, CMOS technology scaling started to slow down recently and relatively large systems consume too much power to rely only on the scaling effect while system power budget such as battery capacity improves slowly. In addition, there exist increasing needs for miniaturized computing systems including sensor nodes that can accomplish similar operations with significantly smaller power budget. Voltage scaling is one of the most promising power saving techniques due to quadratic switching power reduction effect, making it necessary feature for even high-end processors. However, in order to achieve maximum possible energy efficiency, systems should operate in near or sub-threshold regimes where leakage takes significant portion of power. In this dissertation, a few key energy-aware design approaches are described. Considering prominent leakage and larger PVT variability in low operating voltages, multi-level energy saving techniques to be described are applied to key building blocks in DSP applications: architecture study, algorithm-architecture co-optimization, and robust yet low-power memory design. Finally, described approaches are applied to design examples including a visual navigation accelerator, ultra-low power biomedical SoC and face detection/recognition processor, resulting in 2~100 times power savings than state-of-the-art.PhDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/110496/1/djeon_1.pd

Emerging Run-Time Reconfigurable FPGA and CAD Tools

Field-programmable gate array (FPGA) is a post fabrication reconfigurable device to accelerate domain specific computing systems. It offers offer high operation speed and low power consumption. However, the design flexibility and performance of FPGAs are severely constrained by the costly on-chip memories, e.g. static random access memory (SRAM) and FLASH memory. The objective of my dissertation is to explore the opportunity and enable the use of the emerging resistance random access memory (ReRAM) in FPGA design. The emerging ReRAM technology features high storage density, low access power consumption, and CMOS compatibility, making it a promising candidate for FPGA implementation. In particular, ReRAM has advantages of the fast access and nonvolatility, enabling the on-chip storage and access of configuration data. In this dissertation, I first propose a novel three-dimensional stacking scheme, namely, high-density interleaved memory (HIM). The structure improves the density of ReRAM meanwhile effectively reducing the signal interference induced by sneak paths in crossbar arrays. To further enhance the access speed and design reliability, a fast sensing circuit is also presented which includes a new sense amplifier scheme and reference cell configuration. The proposed ReRAM FPGA leverages a similar architecture as conventional SRAM based FPGAs but utilizes ReRAM technology in all component designs. First, HIM is used to implement look-up table (LUT) and block random access memories (BRAMs) for func- tionality process. Second, a 2R1T, two ReRAM cells and one transistor, nonvolatile switch design is applied to construct connection blocks (CBs) and switch blocks (SBs) for signal transition. Furthermore, unified BRAM (uBRAM) based on the current BRAM architecture iv is introduced, offering both configuration and temporary data storage. The uBRAMs provides extremely high density effectively and enlarges the FPGA capacity, potentially saving multiple contexts of configuration. The fast configuration scheme from uBRAM to logic and routing components also makes fast run-time partial reconfiguration (PR) much easier, improving the flexibility and performance of the entire FPGA system. Finally, modern place and route tools are designed for homogeneous fabric of FPGA. The PR feature, however, requires the support of heterogeneous logic modules in order to differentiate PR modules from static ones and therefore maintain the signal integration. The existing approaches still reply on designers’ manual effort, which significantly prolongs design time and lowers design efficiency. In this dissertation, I integrate PR support into VPR – an academic place and route tool by introducing a B*-tree modular placer (BMP) and PR-aware router. As such, users are able to explore new architectures or map PR applications to a variety of FPGAs. More importantly, this enhanced feature can also support fast design automation, e.g. mapping IP core, loading pre-synthesizing logic modules, etc

Towards Computational Efficiency of Next Generation Multimedia Systems

To address throughput demands of complex applications (like Multimedia), a next-generation system designer needs to co-design and co-optimize the hardware and software layers. Hardware/software knobs must be tuned in synergy to increase the throughput efficiency. This thesis provides such algorithmic and architectural solutions, while considering the new technology challenges (power-cap and memory aging). The goal is to maximize the throughput efficiency, under timing- and hardware-constraints

Runtime Monitoring for Dependable Hardware Design

Mit dem Voranschreiten der Technologieskalierung und der Globalisierung der Produktion von integrierten Schaltkreisen eröffnen sich eine Fülle von Schwachstellen bezüglich der Verlässlichkeit von Computerhardware. Jeder Mikrochip wird aufgrund von Produktionsschwankungen mit einem einzigartigen Charakter geboren, welcher sich durch seine Arbeitsbedingungen, Belastung und Umgebung in individueller Weise entwickelt. Daher sind deterministische Modelle, welche zur Entwurfszeit die Verlässlichkeit prognostizieren, nicht mehr ausreichend um Integrierte Schaltkreise mit Nanometertechnologie sinnvoll abbilden zu können. Der Bedarf einer Laufzeitanalyse des Zustandes steigt und mit ihm die notwendigen Maßnahmen zum Erhalt der Zuverlässigkeit. Transistoren sind anfällig für auslastungsbedingte Alterung, die die Laufzeit der Schaltung erhöht und mit ihr die Möglichkeit einer Fehlberechnung. Hinzu kommen spezielle Abläufe die das schnelle Altern des Chips befördern und somit seine zuverlässige Lebenszeit reduzieren. Zusätzlich können strahlungsbedingte Laufzeitfehler (Soft-Errors) des Chips abnormales Verhalten kritischer Systeme verursachen. Sowohl das Ausbreiten als auch das Maskieren dieser Fehler wiederum sind abhängig von der Arbeitslast des Systems. Fabrizierten Chips können ebenfalls vorsätzlich während der Produktion boshafte Schaltungen, sogenannte Hardwaretrojaner, hinzugefügt werden. Dies kompromittiert die Sicherheit des Chips. Da diese Art der Manipulation vor ihrer Aktivierung kaum zu erfassen ist, ist der Nachweis von Trojanern auf einem Chip direkt nach der Produktion extrem schwierig. Die Komplexität dieser Verlässlichkeitsprobleme machen ein einfaches Modellieren der Zuverlässigkeit und Gegenmaßnahmen ineffizient. Sie entsteht aufgrund verschiedener Quellen, eingeschlossen der Entwicklungsparameter (Technologie, Gerät, Schaltung und Architektur), der Herstellungsparameter, der Laufzeitauslastung und der Arbeitsumgebung. Dies motiviert das Erforschen von maschinellem Lernen und Laufzeitmethoden, welche potentiell mit dieser Komplexität arbeiten können. In dieser Arbeit stellen wir Lösungen vor, die in der Lage sind, eine verlässliche Ausführung von Computerhardware mit unterschiedlichem Laufzeitverhalten und Arbeitsbedingungen zu gewährleisten. Wir entwickelten Techniken des maschinellen Lernens um verschiedene Zuverlässigkeitseffekte zu modellieren, zu überwachen und auszugleichen. Verschiedene Lernmethoden werden genutzt, um günstige Überwachungspunkte zur Kontrolle der Arbeitsbelastung zu finden. Diese werden zusammen mit Zuverlässigkeitsmetriken, aufbauend auf Ausfallsicherheit und generellen Sicherheitsattributen, zum Erstellen von Vorhersagemodellen genutzt. Des Weiteren präsentieren wir eine kosten-optimierte Hardwaremonitorschaltung, welche die Überwachungspunkte zur Laufzeit auswertet. Im Gegensatz zum aktuellen Stand der Technik, welcher mikroarchitektonische Überwachungspunkte ausnutzt, evaluieren wir das Potential von Arbeitsbelastungscharakteristiken auf der Logikebene der zugrundeliegenden Hardware. Wir identifizieren verbesserte Features auf Logikebene um feingranulare Laufzeitüberwachung zu ermöglichen. Diese Logikanalyse wiederum hat verschiedene Stellschrauben um auf höhere Genauigkeit und niedrigeren Overhead zu optimieren. Wir untersuchten die Philosophie, Überwachungspunkte auf Logikebene mit Hilfe von Lernmethoden zu identifizieren und günstigen Monitore zu implementieren um eine adaptive Vorbeugung gegen statisches Altern, dynamisches Altern und strahlungsinduzierte Soft-Errors zu schaffen und zusätzlich die Aktivierung von Hardwaretrojanern zu erkennen. Diesbezüglich haben wir ein Vorhersagemodell entworfen, welches den Arbeitslasteinfluss auf alterungsbedingte Verschlechterungen des Chips mitverfolgt und dazu genutzt werden kann, dynamisch zur Laufzeit vorbeugende Techniken, wie Task-Mitigation, Spannungs- und Frequenzskalierung zu benutzen. Dieses Vorhersagemodell wurde in Software implementiert, welche verschiedene Arbeitslasten aufgrund ihrer Alterungswirkung einordnet. Um die Widerstandsfähigkeit gegenüber beschleunigter Alterung sicherzustellen, stellen wir eine Überwachungshardware vor, welche einen Teil der kritischen Flip-Flops beaufsichtigt, nach beschleunigter Alterung Ausschau hält und davor warnt, wenn ein zeitkritischer Pfad unter starker Alterungsbelastung steht. Wir geben die Implementierung einer Technik zum Reduzieren der durch das Ausführen spezifischer Subroutinen auftretenden Belastung von zeitkritischen Pfaden. Zusätzlich schlagen wir eine Technik zur Abschätzung von online Soft-Error-Schwachstellen von Speicherarrays und Logikkernen vor, welche auf der Überwachung einer kleinen Gruppe Flip-Flops des Entwurfs basiert. Des Weiteren haben wir eine Methode basierend auf Anomalieerkennung entwickelt, um Arbeitslastsignaturen von Hardwaretrojanern während deren Aktivierung zur Laufzeit zu erkennen und somit eine letzte Verteidigungslinie zu bilden. Basierend auf diesen Experimenten demonstriert diese Arbeit das Potential von fortgeschrittener Feature-Extraktion auf Logikebene und lernbasierter Vorhersage basierend auf Laufzeitdaten zur Verbesserung der Zuverlässigkeit von Harwareentwürfen

System software techniques to enhance reliability of modern platforms

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