2,215 research outputs found

    On-chip jitter measurement for true random number generators

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    Applications of true random number generators (TRNGs) span from art to numerical computing and system security. In cryptographic applications, TRNGs are used for generating new keys, nonces and masks. For this reason, a TRNG is an essential building block and often a point of failure for embedded security systems. One type of primitives that are widely used as source of randomness are ring oscillators. For a ring-oscillator-based TRNG, the true randomness originates from its timing jitter. Therefore, determining the jitter strength is essential to estimate the quality of a TRNG. In this paper, we propose a method to measure the jitter strength of a ring oscillator implemented on an FPGA. The fast tapped delay chain is utilized to perform the on-chip measurement with a high resolution. The proposed method is implemented on both a Xilinx FPGA and an Intel FPGA. Fast carry logic components on different FPGAs are used to implement the fast delay line. This carry logic component is designed to be fast and has dedicated routing, which enables a precise measurement. The differential structure of the delay chain is used to thwart the influence of undesirable noise from the measurement. The proposed methodology can be applied to other FPGA families and ASIC designs

    Testing of PLL-based True Random Number Generator in Changing Working Conditions

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    Security of cryptographic systems depends significantly on security of secret keys. Unpredictability of the keys is achieved by their generation by True Random Number Generators (TRNGs). In the paper we analyze behavior of the Phase-Locked Loop (PLL) based TRNG in changing working environment. The frequency of signals synthesized by PLL may be naturally influenced by chip temperature. We show what impact the temperature has on the quality of generated random sequence of the PLL-based TRNG. Thank to analysis of internal signals of the generator we are able to prove dependencies between the PLL parameters, statistical parameters of the generated sequence and temperature. Considering the measured results of experiments we form a new requirement in order to improve the robustness of the designed TRNG

    Timing Measurement Platform for Arbitrary Black-Box Circuits Based on Transition Probability

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    A Simple PLL-Based True Random Number Generator for Embedded Digital Systems

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    The paper presents a simple True Random Number Generator (TRNG) which can be embedded in digital Application Specific Integrated Circuits (ASICs) and Field Programmable Logic Devices (FPLDs). As a source of randomness, it uses on-chip noise generated in the internal analog Phase-Locked Loop (PLL) circuitry. In contrast to traditionally used free-running oscillators, it uses a novel method of randomness extraction based on two rationally related synthesized clock signals. The generator has been developed for embedded cryptographic applications, where it significantly increases the system security, but it can be used in a wide range of other applications. The functionality of the proposed solution is demonstrated for the Altera Apex FPLD family, but the same principle can be used for all recent ASICs or FPLDs that include an on-chip reconfigurable analog PLL. The quality of the TRNG output is confirmed by applying special DIEHARD and NIST statistical tests, which pass even for high output bit-rates of several hundreds of Kbits/s

    Ring oscillator clocks and margins

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    How much margin do we have to add to the delay lines of a bundled-data circuit? This paper is an attempt to give a methodical answer to this question, taking into account all sources of variability and the existing EDA machinery for timing analysis and sign-off. The paper is based on the study of the margins of a ring oscillator that substitutes a PLL as clock generator. A timing model is proposed that shows that a 12% margin for delay lines can be sufficient to cover variability in a 65nm technology. In a typical scenario, performance and energy improvements between 15% and 35% can be obtained by using a ring oscillator instead of a PLL. The paper concludes that a synchronous circuit with a ring oscillator clock shows similar benefits in performance and energy as those of bundled-data asynchronous circuits.Peer ReviewedPostprint (author's final draft
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