Sequential Circuit Design for Embedded Cryptographic Applications Resilient to Adversarial Faults

In the relatively young field of fault-tolerant cryptography, the main research effort has focused exclusively on the protection of the data path of cryptographic circuits. To date, however, we have not found any work that aims at protecting the control logic of these circuits against fault attacks, which thus remains the proverbial Achilles’ heel. Motivated by a hypothetical yet realistic fault analysis attack that, in principle, could be mounted against any modular exponentiation engine, even one with appropriate data path protection, we set out to close this remaining gap. In this paper, we present guidelines for the design of multifault-resilient sequential control logic based on standard Error-Detecting Codes (EDCs) with large minimum distance. We introduce a metric that measures the effectiveness of the error detection technique in terms of the effort the attacker has to make in relation to the area overhead spent in implementing the EDC. Our comparison shows that the proposed EDC-based technique provides superior performance when compared against regular N-modular redundancy techniques. Furthermore, our technique scales well and does not affect the critical path delay

Advanced information processing system: The Army fault tolerant architecture conceptual study. Volume 2: Army fault tolerant architecture design and analysis

Described here is the Army Fault Tolerant Architecture (AFTA) hardware architecture and components and the operating system. The architectural and operational theory of the AFTA Fault Tolerant Data Bus is discussed. The test and maintenance strategy developed for use in fielded AFTA installations is presented. An approach to be used in reducing the probability of AFTA failure due to common mode faults is described. Analytical models for AFTA performance, reliability, availability, life cycle cost, weight, power, and volume are developed. An approach is presented for using VHSIC Hardware Description Language (VHDL) to describe and design AFTA's developmental hardware. A plan is described for verifying and validating key AFTA concepts during the Dem/Val phase. Analytical models and partial mission requirements are used to generate AFTA configurations for the TF/TA/NOE and Ground Vehicle missions

Application of advanced on-board processing concepts to future satellite communications systems: Bibliography

Abstracts are presented of a literature survey of reports concerning the application of signal processing concepts. Approximately 300 references are included

An Iterative Heuristic for State Justi�cation in Sequential Automatic Test Pattern Generation

State justifcation is one of the most time-consuming tasks in sequential Automatic Test Pattern Generation (ATPG). For states that are difficult to justify, deterministic algorithms take significant CPU time without much success most of the time. In this work, we adopt a hybrid approach for state justification. A new method based on Genetic Algorithms is proposed, in which we engineer state justifcation sequences vector by vector. The proposed method is compared with previous GA-based approaches. Significant improvements have been obtained for ISCAS benchmark circuits in terms of state coverage and CPU time

An Iterative Heuristic for State Justi�cation in Sequential Automatic Test Pattern Generation

State justifcation is one of the most time-consuming tasks in sequential Automatic Test Pattern Generation (ATPG). For states that are difficult to justify, deterministic algorithms take significant CPU time without much success most of the time. In this work, we adopt a hybrid approach for state justification. A new method based on Genetic Algorithms is proposed, in which we engineer state justifcation sequences vector by vector. The proposed method is compared with previous GA-based approaches. Significant improvements have been obtained for ISCAS benchmark circuits in terms of state coverage and CPU time

Identifying worst case test vectors for FPGA exposed to total ionization dose using design for testability techniques

Electronic devices often operate in harsh environments which contain a variation of radiation sources. Radiation may cause different kinds of damage to proper operation of the devices. Their sources can be found in terrestrial environments, or in extra-terrestrial environments like in space, or in man-made radiation sources like nuclear reactors, biomedical devices and high energy particles physics experiments equipment. Depending on the operation environment of the device, the radiation resultant effect manifests in several forms like total ionizing dose effect (TID), or single event effects (SEEs) such as single event upset (SEU), single event gate rupture (SEGR), and single event latch up (SEL). TID effect causes an increase in the delay and the leakage current of CMOS circuits which may damage the proper operation of the integrated circuit. To ensure proper operation of these devices under radiation, thorough testing must be made especially in critical applications like space and military applications. Although the standard which describes the procedure for testing electronic devices under radiation emphasizes the use of worst case test vectors (WCTVs), they are never used in radiation testing due to the difficulty of generating these vectors for circuits under test. For decades, design for testability (DFT) has been the best choice for test engineers to test digital circuits in industry. It has become a very mature technology that can be relied on. DFT is usually used with automatic test patterns generation (ATPG) software to generate test vectors to test application specific integrated circuits (ASICs), especially with sequential circuits, against faults like stuck at faults and path delay faults. Surprisingly, however, radiation testing has not yet made use of this reliable technology. In this thesis, a novel methodology is proposed to extend the usage of DFT to generate WCTVs for delay failure in Flash based field programmable gate arrays (FPGAs) exposed to total ionizing dose (TID). The methodology is validated using MicroSemi ProASIC3 FPGA and cobalt 60 facility

Maximizing Crosstalk-Induced Slowdown During Path Delay Test

Capacitive crosstalk between adjacent signal wires in integrated circuits may lead to noise or a speedup or slowdown in signal transitions. These in turn may lead to circuit failure or reduced operating speed. This thesis focuses on generating test patterns to induce crosstalk-induced signal delays, in order to determine whether the circuit can still meet its timing specification. A timing-driven test generator is developed to sensitize multiple aligned aggressors coupled to a delay-sensitive victim path to detect the combination of a delay spot defect and crosstalk-induced slowdown. The framework uses parasitic capacitance information, timing windows and crosstalk-induced delay estimates to screen out unaligned or ineffective aggressors coupled to a victim path, speeding up crosstalk pattern generation. In order to induce maximum crosstalk slowdown along a path, aggressors are prioritized based on their potential delay increase and timing alignment. The test generation engine introduces the concept of alignment-driven path sensitization to generate paths from inputs to coupled aggressor nets that meet timing alignment and direction requirements. By using path delay information obtained from circuit preprocessing, preferred paths can be chosen during aggressor path propagation processes. As the test generator sensitizes aggressors in the presence of victim path necessary assignments, the search space is effectively reduced for aggressor path generation. This helps in reducing the test generation time for aligned aggressors. In addition, two new crosstalk-driven dynamic test compaction algorithms are developed to control the increase in test pattern count. The proposed test generation algorithm is applied to ISCAS85 and ISCAS89 benchmark circuits. SPICE simulation results demonstrate the ability of the alignment-driven test generator to increase crosstalk-induced delays along victim paths

System-on-chip Computing and Interconnection Architectures for Telecommunications and Signal Processing

This dissertation proposes novel architectures and design techniques targeting SoC building blocks for telecommunications and signal processing applications. Hardware implementation of Low-Density Parity-Check decoders is approached at both the algorithmic and the architecture level. Low-Density Parity-Check codes are a promising coding scheme for future communication standards due to their outstanding error correction performance. This work proposes a methodology for analyzing effects of finite precision arithmetic on error correction performance and hardware complexity. The methodology is throughout employed for co-designing the decoder. First, a low-complexity check node based on the P-output decoding principle is designed and characterized on a CMOS standard-cells library. Results demonstrate implementation loss below 0.2 dB down to BER of 10^{-8} and a saving in complexity up to 59% with respect to other works in recent literature. High-throughput and low-latency issues are addressed with modified single-phase decoding schedules. A new "memory-aware" schedule is proposed requiring down to 20% of memory with respect to the traditional two-phase flooding decoding. Additionally, throughput is doubled and logic complexity reduced of 12%. These advantages are traded-off with error correction performance, thus making the solution attractive only for long codes, as those adopted in the DVB-S2 standard. The "layered decoding" principle is extended to those codes not specifically conceived for this technique. Proposed architectures exhibit complexity savings in the order of 40% for both area and power consumption figures, while implementation loss is smaller than 0.05 dB. Most modern communication standards employ Orthogonal Frequency Division Multiplexing as part of their physical layer. The core of OFDM is the Fast Fourier Transform and its inverse in charge of symbols (de)modulation. Requirements on throughput and energy efficiency call for FFT hardware implementation, while ubiquity of FFT suggests the design of parametric, re-configurable and re-usable IP hardware macrocells. In this context, this thesis describes an FFT/IFFT core compiler particularly suited for implementation of OFDM communication systems. The tool employs an accuracy-driven configuration engine which automatically profiles the internal arithmetic and generates a core with minimum operands bit-width and thus minimum circuit complexity. The engine performs a closed-loop optimization over three different internal arithmetic models (fixed-point, block floating-point and convergent block floating-point) using the numerical accuracy budget given by the user as a reference point. The flexibility and re-usability of the proposed macrocell are illustrated through several case studies which encompass all current state-of-the-art OFDM communications standards (WLAN, WMAN, xDSL, DVB-T/H, DAB and UWB). Implementations results are presented for two deep sub-micron standard-cells libraries (65 and 90 nm) and commercially available FPGA devices. Compared with other FFT core compilers, the proposed environment produces macrocells with lower circuit complexity and same system level performance (throughput, transform size and numerical accuracy). The final part of this dissertation focuses on the Network-on-Chip design paradigm whose goal is building scalable communication infrastructures connecting hundreds of core. A low-complexity link architecture for mesochronous on-chip communication is discussed. The link enables skew constraint looseness in the clock tree synthesis, frequency speed-up, power consumption reduction and faster back-end turnarounds. The proposed architecture reaches a maximum clock frequency of 1 GHz on 65 nm low-leakage CMOS standard-cells library. In a complex test case with a full-blown NoC infrastructure, the link overhead is only 3% of chip area and 0.5% of leakage power consumption. Finally, a new methodology, named metacoding, is proposed. Metacoding generates correct-by-construction technology independent RTL codebases for NoC building blocks. The RTL coding phase is abstracted and modeled with an Object Oriented framework, integrated within a commercial tool for IP packaging (Synopsys CoreTools suite). Compared with traditional coding styles based on pre-processor directives, metacoding produces 65% smaller codebases and reduces the configurations to verify up to three orders of magnitude

Design and Analysis of the Sphinx-NG CubeSat

This project continues the development of the Attitude Determination and Control (ADC) subsystem for a three-unit CubeSat in a high-altitude, polar, sun-synchronous orbit mission to perform solar and extraterrestrial X-ray spectroscopy. The previously outlined list of sensors and actuators were evaluated and updated. The performance of algorithms used for detumble, initial attitude determination, and attitude maintenance was improved by using MATLAB® and Systems Tool Kit (STK) simulations. Additionally, a low- cost, prototype ADC test bed was constructed which will be used by future teams to test and verify the selected ADC hardware. Finally, a detailed MATLAB® code guide, derivations of ADC algorithms, and recommendations were developed to assist future CubeSat ADC teams

フィールドにおけるテスト印加と低電力論理BISTに関する研究

Advances in semiconductor process technology have resulted in various aging issues in field operation of Very Large Scale Integration (VLSI) circuits. For example, HCI (Hot carrier injection), BTI (Bias Temperature Instability), TDDB (Time Dependent Dielectric Breakdown) are well-known aging phenomena, and they can increase the circuit delay resulting in serious reliability problems. In order to avoid system failures caused by aging, recent design usually sets a certain timing margin in operational frequency of the circuit. However, it is difficult to determine the size of the proper timing margin because of the difficulty of prediction of its aging speed in actual use that is related to operational environment. Pessimistic prediction may result in performance sacrificing although it will improve the reliability of the system. BIST-based field test is a promising way to guarantee the reliability of the circuit through detecting the aging-induced faults during the circuit operation. However, the field test has a limitation on test application time, which makes it difficult to achieve high test quality. Therefore an effective test application method at field is required. In addition to the requirement of short test application time, the BIST-based field test requires performing at-speed testing in order to detect timing-related defects. However, it is well known that power dissipation during testing is much higher than that in normal circuit operation. Because excessive power dissipation causes higher IR-drop and higher temperature, it results in delay increase during testing, and in turn, causing false at-speed testing and yield loss. While many low power test methods have been proposed to tackle the test power issue, inadequate test power reduction and lower fault coverage still remain as important issues. Moreover, low power testing that just focuses on power reduction is insufficient. When the test power is reduced to a very low level, a timing-related defect may be missed by the test, and a defective circuit will appear to be a good part passing the test. Therefore, appropriate test power control is necessary though it was out of considering in the existing methods. In this dissertation, we first proposed a new test application to satisfy the limitation of short test application time for BIST-based field test, and then we proposed a new low power BIST scheme that focuses on controlling the test power to a specified value for improving the field test quality. In chapter 3, a new field test application method named “rotating test” is presented in which a set of generated test patterns to detect aging-induced faults is partitioned into several subsets, and apply each subset in one test session at field. In order to maximize the test quality for rotating test, we proposed test partitioning methods that refer to two items: First one aims at maximizing fault coverage of each subset obtained by partitioning. Second one aims at minimizing the detection time interval of all faults in rotating test to avoid system failures. Experimental results demonstrated the effectiveness of the proposed partitioning methods. In chapter 4, we proposed a new low power BIST scheme which can control the scan-in power, scan-out power and capture power while keeping test coverage at high level. In this scheme, a new circuit called pseudo low-pass filter (PLPF) is developed for scan-in power control, and a multi-cycle capture test technique is employed to reduce the capture power. In order to control scan-out power dissipated by test responses, we proposed a novel method that selects some flip-flops in scan chains at logic design phase, and fills the selected flip-flops with proper values before starting scan-shift operation so as to reduce the switching activity associated with scan-out. The experimental results for ISCAS-89 and ITC-99 benchmark circuits show that significant scan-in power reduction rate (the original rate of 50% is reduced to 7~8%) and capture power reduction rate (the original rate of 20% is reduced to 6~7%) were derived. With the scan-out controlling method, the scan-out power can be reduced from 17.2% to 8.4%, which could not be achieved by the conventional methods. Moreover, in order to control the test power to the specified rate to accommodate the various test power requirements. A scan-shift power controlling scheme was also discussed. It showed the capability of controlling any scan-shift toggle rate between 6.7% and 50%.九州工業大学博士学位論文 学位記番号:情工博甲第289号　学位授与年月日:平成26年3月25日1. INTRODUCTION|2. PRELIMINARY|3. BIST-BASED FIELD ROTATING TEST FOR AGING-INDUCED FAULT DETECTION|4. TEST POWER REDUCTION FOR LOGIC-BIST|5. SUMMARY九州工業大学平成25年