Reliable Low-Power High Performance Spintronic Memories

Moores Gesetz folgend, ist es der Chipindustrie in den letzten fünf Jahrzehnten gelungen, ein explosionsartiges Wachstum zu erreichen. Dies hatte ebenso einen exponentiellen Anstieg der Nachfrage von Speicherkomponenten zur Folge, was wiederum zu speicherlastigen Chips in den heutigen Computersystemen führt. Allerdings stellen traditionelle on-Chip Speichertech- nologien wie Static Random Access Memories (SRAMs), Dynamic Random Access Memories (DRAMs) und Flip-Flops eine Herausforderung in Bezug auf Skalierbarkeit, Verlustleistung und Zuverlässigkeit dar. Eben jene Herausforderungen und die überwältigende Nachfrage nach höherer Performanz und Integrationsdichte des on-Chip Speichers motivieren Forscher, nach neuen nichtflüchtigen Speichertechnologien zu suchen. Aufkommende spintronische Spe- ichertechnologien wie Spin Orbit Torque (SOT) und Spin Transfer Torque (STT) erhielten in den letzten Jahren eine hohe Aufmerksamkeit, da sie eine Reihe an Vorteilen bieten. Dazu gehören Nichtflüchtigkeit, Skalierbarkeit, hohe Beständigkeit, CMOS Kompatibilität und Unan- fälligkeit gegenüber Soft-Errors. In der Spintronik repräsentiert der Spin eines Elektrons dessen Information. Das Datum wird durch die Höhe des Widerstandes gespeichert, welche sich durch das Anlegen eines polarisierten Stroms an das Speichermedium verändern lässt. Das Prob- lem der statischen Leistung gehen die Speichergeräte sowohl durch deren verlustleistungsfreie Eigenschaft, als auch durch ihr Standard- Aus/Sofort-Ein Verhalten an. Nichtsdestotrotz sind noch andere Probleme, wie die hohe Zugriffslatenz und die Energieaufnahme zu lösen, bevor sie eine verbreitete Anwendung finden können. Um diesen Problemen gerecht zu werden, sind neue Computerparadigmen, -architekturen und -entwurfsphilosophien notwendig. Die hohe Zugriffslatenz der Spintroniktechnologie ist auf eine vergleichsweise lange Schalt- dauer zurückzuführen, welche die von konventionellem SRAM übersteigt. Des Weiteren ist auf Grund des stochastischen Schaltvorgangs der Speicherzelle und des Einflusses der Prozessvari- ation ein nicht zu vernachlässigender Zeitraum dafür erforderlich. In diesem Zeitraum wird ein konstanter Schreibstrom durch die Bitzelle geleitet, um den Schaltvorgang zu gewährleisten. Dieser Vorgang verursacht eine hohe Energieaufnahme. Für die Leseoperation wird gleicher- maßen ein beachtliches Zeitfenster benötigt, ebenfalls bedingt durch den Einfluss der Prozess- variation. Dem gegenüber stehen diverse Zuverlässigkeitsprobleme. Dazu gehören unter An- derem die Leseintereferenz und andere Degenerationspobleme, wie das des Time Dependent Di- electric Breakdowns (TDDB). Diese Zuverlässigkeitsprobleme sind wiederum auf die benötigten längeren Schaltzeiten zurückzuführen, welche in der Folge auch einen über längere Zeit an- liegenden Lese- bzw. Schreibstrom implizieren. Es ist daher notwendig, sowohl die Energie, als auch die Latenz zur Steigerung der Zuverlässigkeit zu reduzieren, um daraus einen potenziellen Kandidaten für ein on-Chip Speichersystem zu machen. In dieser Dissertation werden wir Entwurfsstrategien vorstellen, welche das Ziel verfolgen, die Herausforderungen des Cache-, Register- und Flip-Flop-Entwurfs anzugehen. Dies erre- ichen wir unter Zuhilfenahme eines Cross-Layer Ansatzes. Für Caches entwickelten wir ver- schiedene Ansätze auf Schaltkreisebene, welche sowohl auf der Speicherarchitekturebene, als auch auf der Systemebene in Bezug auf Energieaufnahme, Performanzsteigerung und Zuver- lässigkeitverbesserung evaluiert werden. Wir entwickeln eine Selbstabschalttechnik, sowohl für die Lese-, als auch die Schreiboperation von Caches. Diese ist in der Lage, den Abschluss der entsprechenden Operation dynamisch zu ermitteln. Nachdem der Abschluss erkannt wurde, wird die Lese- bzw. Schreiboperation sofort gestoppt, um Energie zu sparen. Zusätzlich limitiert die Selbstabschalttechnik die Dauer des Stromflusses durch die Speicherzelle, was wiederum das Auftreten von TDDB und Leseinterferenz bei Schreib- bzw. Leseoperationen re- duziert. Zur Verbesserung der Schreiblatenz heben wir den Schreibstrom an der Bitzelle an, um den magnetischen Schaltprozess zu beschleunigen. Um registerbankspezifische Anforderungen zu berücksichtigen, haben wir zusätzlich eine Multiport-Speicherarchitektur entworfen, welche eine einzigartige Eigenschaft der SOT-Zelle ausnutzt, um simultan Lese- und Schreiboperatio- nen auszuführen. Es ist daher möglich Lese/Schreib- Konfilkte auf Bitzellen-Ebene zu lösen, was sich wiederum in einer sehr viel einfacheren Multiport- Registerbankarchitektur nieder- schlägt. Zusätzlich zu den Speicheransätzen haben wir ebenfalls zwei Flip-Flop-Architekturen vorgestellt. Die erste ist eine nichtflüchtige non-Shadow Flip-Flop-Architektur, welche die Speicherzelle als aktive Komponente nutzt. Dies ermöglicht das sofortige An- und Ausschalten der Versorgungss- pannung und ist daher besonders gut für aggressives Powergating geeignet. Alles in Allem zeigt der vorgestellte Flip-Flop-Entwurf eine ähnliche Timing-Charakteristik wie die konventioneller CMOS Flip-Flops auf. Jedoch erlaubt er zur selben Zeit eine signifikante Reduktion der statis- chen Leistungsaufnahme im Vergleich zu nichtflüchtigen Shadow- Flip-Flops. Die zweite ist eine fehlertolerante Flip-Flop-Architektur, welche sich unanfällig gegenüber diversen Defekten und Fehlern verhält. Die Leistungsfähigkeit aller vorgestellten Techniken wird durch ausführliche Simulationen auf Schaltkreisebene verdeutlicht, welche weiter durch detaillierte Evaluationen auf Systemebene untermauert werden. Im Allgemeinen konnten wir verschiedene Techniken en- twickeln, die erhebliche Verbesserungen in Bezug auf Performanz, Energie und Zuverlässigkeit von spintronischen on-Chip Speichern, wie Caches, Register und Flip-Flops erreichen

Normally-Off Computing Design Methodology Using Spintronics: From Devices to Architectures

Energy-harvesting-powered computing offers intriguing and vast opportunities to dramatically transform the landscape of Internet of Things (IoT) devices and wireless sensor networks by utilizing ambient sources of light, thermal, kinetic, and electromagnetic energy to achieve battery-free computing. In order to operate within the restricted energy capacity and intermittency profile of battery-free operation, it is proposed to innovate Elastic Intermittent Computation (EIC) as a new duty-cycle-variable computing approach leveraging the non-volatility inherent in post-CMOS switching devices. The foundations of EIC will be advanced from the ground up by extending Spin Hall Effect Magnetic Tunnel Junction (SHE-MTJ) device models to realize SHE-MTJ-based Majority Gate (MG) and Polymorphic Gate (PG) logic approaches and libraries, that leverage intrinsic-non-volatility to realize middleware-coherent, intermittent computation without checkpointing, micro-tasking, or software bloat and energy overheads vital to IoT. Device-level EIC research concentrates on encapsulating SHE-MTJ behavior with a compact model to leverage the non-volatility of the device for intrinsic provision of intermittent computation and lifetime energy reduction. Based on this model, the circuit-level EIC contributions will entail the design, simulation, and analysis of PG-based spintronic logic which is adaptable at the gate-level to support variable duty cycle execution that is robust to brief and extended supply outages or unscheduled dropouts, and development of spin-based research synthesis and optimization routines compatible with existing commercial toolchains. These tools will be employed to design a hybrid post-CMOS processing unit utilizing pipelining and power-gating through state-holding properties within the datapath itself, thus eliminating checkpointing and data transfer operations

Modélisation compacte et conception de circuit à base de jonction tunnel ferroélectrique et de jonction tunnel magnétique exploitant le transfert de spin assisté par effet Hall de spin

Non-volatile memory (NVM) devices have been attracting intensive research interest since they promise to solve the increasing static power issue caused by CMOS technology scaling. This thesis focuses on two fields related to NVM: the one is the ferroelectric tunnel junction (FTJ), which is a recent emerging NVM device. The other is the spin-Hall-assisted spin-transfer torque (STT), which is a recent proposed write approach for the magnetic tunnel junction (MTJ). Our objective is to develop the compact models for these two technologies and to explore their application in the non-volatile circuits through simulation.First, we investigated physical models describing the electrical behaviors of the FTJ such as tunneling resistance, dynamic ferroelectric switching and memristive response. The accuracy of these physical models is validated by a good agreement with experimental results. In order to develop an electrical model available for the circuit simulation, we programmed the aforementioned physical models with Verilog-A language and integrated them together. The developed electrical model can run on Cadence platform (a standard circuit simulation tool) and faithfully reproduce the behaviors of the FTJ.Then, using the developed FTJ model and STMicroelectronics CMOS design kit, we designed and simulated three types of circuits: i) FTJ-based random access memory (FTRAM), ii) two FTJ-based neuromorphic systems, one of which emulates spike-timing dependent plasticity (STDP) learning rule, the other implements supervised learning of logic functions, iii) FTJ-based Boolean logic block, by which NAND and NOR logic are demonstrated. The influences of the FTJ parameters on the performance of these circuits were analyzed based on simulation results.Finally, we focused on the reversal of the perpendicular magnetization driven by spin-Hall-assisted STT in a three-terminal MTJ. In this scheme, two write currents are applied to generate spin-Hall effect (SHE) and STT. Numerical simulation based on Landau-Lifshitz-Gilbert (LLG) equation demonstrates that the incubation delay of the STT can be eliminated by the strong SHE, resulting in ultrafast magnetization switching without the need to strengthen the STT. We applied this novel write approach to the design of the magnetic flip-flop and full-adder. Performance comparison between the spin-Hall-assisted and the conventional STT magnetic circuits were discussed based on simulation results and theoretical models.Les mémoires non-volatiles (MNV) sont l'objet d'un effort de recherche croissant du fait de leur capacité à limiter la consommation statique, qui obère habituellement la réduction des dimensions dans la technologie CMOS. Dans ce contexte, cette thèse aborde plus spécifiquement deux technologies de mémoires non volatiles : d'une part les jonctions tunnel ferroélectriques (JTF), dispositif non volatil émergent, et d'autre part les dispositifs à transfert de spin (TS) assisté par effet Hall de spin (EHS), approche alternative proposée récemment pour écrire les jonctions tunnel magnétiques (JTM). Mon objectif est de développer des modèles compacts pour ces deux technologies et d'explorer, par simulation, leur intégration dans les circuits non-volatiles.J'ai d'abord étudié les modèles physiques qui décrivent les comportements électriques des JTF : la résistance tunnel, la dynamique de la commutation ferroélectrique et leur comportement memristif. La précision de ces modèles physiques est validée par leur bonne adéquation avec les résultats expérimentaux. Afin de proposer un modèle compatible avec les simulateurs électriques standards, nous j'ai développé les modèles physiques mentionnés ci-dessus en langue Verilog-A, puis je les ai intégrés ensemble. Le modèle électrique que j'ai conçu peut être exploité sur la plate-forme Cadence (un outil standard pour la simulation de circuit). Il reproduit fidèlement les comportements de JTF. Ensuite, en utilisant ce modèle de JTF et le design-kit CMOS de STMicroelectronics, j'ai conçu et simulé trois types de circuits: i) une mémoire vive (RAM) basée sur les JTF, ii) deux systèmes neuromorphiques basés sur les JTF, l'un qui émule la règle d'apprentissage de la plasticité synaptique basée sur le décalage temporel des impulsions neuronale (STDP), l'autre mettant en œuvre l'apprentissage supervisé de fonctions logiques, iii) un bloc logique booléen basé sur les JTF, y compris la démonstration des fonctions logiques NAND et NOR. L'influence des paramètres de la JTF sur les performances de ces circuits a été analysée par simulation. Finalement, nous avons modélisé la dynamique de renversement de l'aimantation dans les dispositifs à anisotropie perpendiculaire à transfert de spin assisté par effet Hall de spin dans un JTM à trois terminaux. Dans ce schéma, deux courants d'écriture sont appliqués pour générer l'EHS et le TS. La simulation numérique basée sur l'équation de Landau-Lifshitz-Gilbert (LLG) démontre que le délai d'incubation de TS peut être éliminé par un fort EHS, conduisant à la commutation ultra-rapide de l'aimantation, sans pour autant requérir une augmentation excessive du TS. Nous avons appliqué cette nouvelle méthode d'écriture à la conception d'une bascule magnétique et d'un additionneur 1 bit magnétique. Les performances des circuits magnétiques assistés par l'EHS ont été comparés à ceux écrits par transfert de spin, par simulation et par une analyse fondée sur le modèle théorique

Conception innovante et développement d'outils de conception d'ASIC pour Technologie Hybride CMOS / Magnétique

Depuis plusieurs années de nombreuses technologies non volatiles sont apparues et ont pris place principalement dans le monde de la mémoire, tendant à remplacer tout type de mémoire. Leurs atouts laissent à penser que certaines d'entre elles, et en particulier les technologies MRAM, pourraient améliorer les performances des circuits intégrés en utilisant leurs composants magnétiques, si connus notamment sous le nom de jonctions tunnel magnétiques, dans la logique. Pour évaluer ces éventuels gains, il faut être capable de concevoir de tels circuits. C'est pourquoi nous proposons dans ces travaux d'une part un kit de conception complet pour les flots de conception full custom et numérique, permettant de couvrir l'ensemble des étapes de conception pour chacun d'entre eux. Une partie de ce kit a servi à plusieurs partenaires de projets de recherche ANR, pour concevoir des démonstrateurs. Nous proposons également dans ce kit de conception un latch magnétique non volatil innovant ultra compact, pour lequel deux brevets d'invention ont été déposés, intégré à une flip-flop. Enfin, nous présentons l'intégration de composants magnétiques à deux applications, sécurité et faible consommation, ainsi qu'une étude qui montre que les gains en consommation statique peuvent être considérables.For several years many non-volatile technologies have been appearing and taking place mainly in the memory world, aiming at replacing all kind of memory. Their assets let thinking that some of them, specially the MRAM technologies, could improve the integrated circuit performances, using their so called magnetic components in the logic, in particular the magnetic tunnel junctions. To evaluate the potential benefits, it is necessary to be able to design such a circuit. That is the reason why we are proposing a full design kit for both full custom and digital designs, allowing all the design steps. Part of this kit has been used by partners in research project to design demonstrators. We also propose in this kit an innovative ultra-compact magnetic latch, for which 2 patents have been deposited, integrated in a flip-flop. Finally, we present the integration of magnetic components for two applications, security and low power, as well as a case study which shows that the static consumption reduction can be huge.SAVOIE-SCD - Bib.électronique (730659901) / SudocGRENOBLE1/INP-Bib.électronique (384210012) / SudocGRENOBLE2/3-Bib.électronique (384219901) / SudocSudocFranceF

Straintronics: A Leap towards Ultimate Energy Efficiency of Magnetic Memory and Logic

After decades of exponential growth of the semiconductor industries, predicted by Moore’s Law, the complementary metal-oxide semiconductor (CMOS) circuits are approaching their end of the road, as the feature sizes reach sub-10nm regimes, leaving electrical engineers with a profusion of design challenges in terms of energy limitations and power density. The latter has left the road for alternative technologies wide open to help CMOS overcome the present challenges. Magnetic random access memories (MRAM) are one of the candidates to assist with aforesaid obstacles. Proposed in the early 90’s, MRAM has been under research and development for decades. The expedition for energy efficient MRAM is carried out by the fact that magnetic logic, potentially, has orders of magnitude lower switching energy compared to a charge-based CMOS logic since, in a nanomagnet, magnetic domains would self-align with each other. Regrettably, conventional methods for switching the state of the cell in an MRAM, field induced magnetization switching (FIMS) and spin transfer torque (STT), use electric current (flow of charges) to switch the state of the magnet, nullifying the energy advantage, stated above. In order to maximize the energy efficiency, the amount of charge required to switch the state of the MTJ should be minimized. To this end, straintronics, as an alternative energy efficient method to FIMS and STT to switch the state of a nanomagnet, is proposed recently. The method states that by combining piezoelectricity and inverse magnetostriction, the magnetization state of the device can flip, within few nano-seconds while reducing the switching energy by orders of magnitude compared to STT and FIMS. This research focuses on analysis, design, modeling, and applications of straintronics-based MTJ. The first goal is to perform an in-depth analysis on the static and dynamic behavior of the device. Next, we are aiming to increase the accuracy of the model by including the effect of temperature and thermal noise on the device’s behavior. The goal of performing such analysis is to create a comprehensive model of the device that predicts both static and dynamic responses of the magnetization to applied stress. The model will be used to interface the device with CMOS controllers and switches in large systems. Next, in an attempt to speed up the simulation of such devices in multi-megabyte memory systems, a liberal model has been developed by analytically approximating a solution to the magnetization dynamics, which should be numerically solved otherwise. The liberal model demonstrates more than two orders of magnitude speed improvement compared to the conventional numerical models. Highlighting the applications of the straintronics devices by combining such devices with peripheral CMOS circuitry is another goal of the research. Design of a proof-of-concept 2 kilo-bit nonvolatile straintronics-based memory was introduced in our recent work. To highlight the potential applications of the straintronics device, beyond data storage, the use of the principle in ultra-fast yet low power true random number generation and neuron/synapse design for artificial neural networks have been investigated. Lastly, in an attempt to investigate the practicality of the straintronics principle, the effect of process variations and interface imperfections on the switching behavior of the magnetization is investigated. The results reveal the destructive aftermath of fabrication imperfections on the switching pattern of the device, leaving careful pulse-shaping, alternative topologies, or combination with STT as the last resorts for successful strain-based magnetization switching.PHDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttps://deepblue.lib.umich.edu/bitstream/2027.42/137010/1/barangi_1.pd

STT-MRAM characterization and its test implications

Spin torque transfer (STT)-magnetoresistive random-access memory (MRAM) has come a long way in research to meet the speed and power consumption requirements for future memory applications. The state-of-the-art STT-MRAM bit-cells employ magnetic tunnel junction (MTJ) with perpendicular magnetic anisotropy (PMA). The process repeatabil- ity and yield stability for wafer fabrication are some of the critical issues encountered in STT-MRAM mass production. Some of the yield improvement techniques to combat the e ect of process variations have been previously explored. However, little research has been done on defect oriented testing of STT-MRAM arrays. In this thesis, the author investi- gates the parameter deviation and non-idealities encountered during the development of a novel MTJ stack con guration. The characterization result provides motivation for the development of the design for testability (DFT) scheme that can help test and characterize STT-MRAM bit-cells and the CMOS peripheral circuitry e ciently. The primary factors for wafer yield degradation are the device parameter variation and its non-uniformity across the wafer due to the fabrication process non-idealities. There- fore, e ective in-process testing strategies for exploring and verifying the impact of the parameter variation on the wafer yield will be needed to achieve fabrication process opti- mization. While yield depends on the CMOS process variability, quality of the deposited MTJ lm, and other process non-idealities, test platform can enable parametric optimiza- tion and veri cation using the CMOS-based DFT circuits. In this work, we develop a DFT algorithm and implement a DFT circuit for parametric testing and prequali cation of the critical circuits in the CMOS wafer. The DFT circuit successfully replicates the electrical characteristics of MTJ devices and captures their spatial variation across the wafer with an error of less than 4%. We estimate the yield of the read sensing path by implement- ing the DFT circuit, which can replicate the resistance-area product variation up to 50% from its nominal value. The yield data from the read sensing path at di erent wafer loca- tions are analyzed, and a usable wafer radius has been estimated. Our DFT scheme can provide quantitative feedback based on in-die measurement, enabling fabrication process optimization through iterative estimation and veri cation of the calibrated parameters. Another concern that prevents mass production of STT-MRAM arrays is the defect formation in MTJ devices due to aging. Identifying manufacturing defects in the magnetic tunnel junction (MTJ) device is crucial for the yield and reliability of spin-torque-transfer (STT) magnetic random-access memory (MRAM) arrays. Several of the MTJ defects result in parametric deviations of the device that deteriorate over time. We extend our work on the DFT scheme by monitoring the electrical parameter deviations occurring due to the defect formation over time. A programmable DFT scheme was implemented for a sub-arrayin 65 nm CMOS technology to evaluate the feasibility of the test scheme. The scheme utilizes the read sense path to compare the bit-cell electrical parameters against known DFT cells characteristics. Built-in-self-test (BIST) methodology is utilized to trigger the onset of the fault once the device parameter crosses a threshold value. We demonstrate the operation and evaluate the accuracy of detection with the proposed scheme. The DFT scheme can be exploited for monitoring aging defects, modeling their behavior and optimization of the fabrication process. DFT scheme could potentially nd numerous applications for parametric characteriza- tion and fault monitoring of STT-MRAM bit-cell arrays during mass production. Some of the applications include a) Fabrication process feedback to improve wafer turnaround time, b) STT-MRAM bit-cell health monitoring, c) Decoupled characterization of the CMOS pe- ripheral circuitry such as read-sensing path and sense ampli er characterization within the STT-MRAM array. Additionally, the DFT scheme has potential applications for detec- tion of fault formation that could be utilized for deploying redundancy schemes, providing a graceful degradation in MTJ-based bit-cell array due to aging of the device, and also providing feedback to improve the fabrication process and yield learning

Energy and Area Efficient Machine Learning Architectures using Spin-Based Neurons

Recently, spintronic devices with low energy barrier nanomagnets such as spin orbit torque-Magnetic Tunnel Junctions (SOT-MTJs) and embedded magnetoresistive random access memory (MRAM) devices are being leveraged as a natural building block to provide probabilistic sigmoidal activation functions for RBMs. In this dissertation research, we use the Probabilistic Inference Network Simulator (PIN-Sim) to realize a circuit-level implementation of deep belief networks (DBNs) using memristive crossbars as weighted connections and embedded MRAM-based neurons as activation functions. Herein, a probabilistic interpolation recoder (PIR) circuit is developed for DBNs with probabilistic spin logic (p-bit)-based neurons to interpolate the probabilistic output of the neurons in the last hidden layer which are representing different output classes. Moreover, the impact of reducing the Magnetic Tunnel Junction\u27s (MTJ\u27s) energy barrier is assessed and optimized for the resulting stochasticity present in the learning system. In p-bit based DBNs, different defects such as variation of the nanomagnet thickness can undermine functionality by decreasing the fluctuation speed of the p-bit realized using a nanomagnet. A method is developed and refined to control the fluctuation frequency of the output of a p-bit device by employing a feedback mechanism. The feedback can alleviate this process variation sensitivity of p-bit based DBNs. This compact and low complexity method which is presented by introducing the self-compensating circuit can alleviate the influences of process variation in fabrication and practical implementation. Furthermore, this research presents an innovative image recognition technique for MNIST dataset on the basis of p-bit-based DBNs and TSK rule-based fuzzy systems. The proposed DBN-fuzzy system is introduced to benefit from low energy and area consumption of p-bit-based DBNs and high accuracy of TSK rule-based fuzzy systems. This system initially recognizes the top results through the p-bit-based DBN and then, the fuzzy system is employed to attain the top-1 recognition results from the obtained top outputs. Simulation results exhibit that a DBN-Fuzzy neural network not only has lower energy and area consumption than bigger DBN topologies while also achieving higher accuracy

Energy-Efficient In-Memory Architectures Leveraging Intrinsic Behaviors of Embedded MRAM Devices

For decades, innovations to surmount the processor versus memory gap and move beyond conventional von Neumann architectures continue to be sought and explored. Recent machine learning models still expend orders of magnitude more time and energy to access data in memory in addition to merely performing the computation itself. This phenomenon referred to as a memory-wall bottleneck, is addressed herein via a completely fresh perspective on logic and memory technology design. The specific solutions developed in this dissertation focus on utilizing intrinsic switching behaviors of embedded MRAM devices to design cross-layer and energy-efficient Compute-in-Memory (CiM) architectures, accelerate the computationally-intensive operations in various Artificial Neural Networks (ANNs), achieve higher density and reduce the power consumption as crucial requirements in future Internet of Things (IoT) devices. The first cross-layer platform developed herein is an Approximate Generative Adversarial Network (ApGAN) designed to accelerate the Generative Adversarial Networks from both algorithm and hardware implementation perspectives. In addition to binarizing the weights, further reduction in storage and computation resources is achieved by leveraging an in-memory addition scheme. Moreover, a memristor-based CiM accelerator for ApGAN is developed. The second design is a biologically-inspired memory architecture. The Short-Term Memory and Long-Term Memory features in biology are realized in hardware via a beyond-CMOS-based learning approach derived from the repeated input information and retrieval of the encoded data. The third cross-layer architecture is a programmable energy-efficient hardware implementation for Recurrent Neural Network with ultra-low power, area-efficient spin-based activation functions. A novel CiM architecture is proposed to leverage data-level parallelism during the evaluation phase. Specifically, we employ an MRAM-based Adjustable Probabilistic Activation Function (APAF) via a low-power tunable activation mechanism, providing adjustable accuracy levels to mimic ideal sigmoid and tanh thresholding along with a matching algorithm to regulate neuronal properties. Finally, the APAF design is utilized in the Long Short-Term Memory (LSTM) network to evaluate the network performance using binary and non-binary activation functions. The simulation results indicate up to 74.5 x 215; energy-efficiency, 35-fold speedup and ~11x area reduction compared with the similar baseline designs. These can form basis for future post-CMOS based non-Von Neumann architectures suitable for intermittently powered energy harvesting devices capable of pushing intelligence towards the edge of computing network

Heterogeneous Reconfigurable Fabrics for In-circuit Training and Evaluation of Neuromorphic Architectures

A heterogeneous device technology reconfigurable logic fabric is proposed which leverages the cooperating advantages of distinct magnetic random access memory (MRAM)-based look-up tables (LUTs) to realize sequential logic circuits, along with conventional SRAM-based LUTs to realize combinational logic paths. The resulting Hybrid Spin/Charge FPGA (HSC-FPGA) using magnetic tunnel junction (MTJ) devices within this topology demonstrates commensurate reductions in area and power consumption over fabrics having LUTs constructed with either individual technology alone. Herein, a hierarchical top-down design approach is used to develop the HSCFPGA starting from the configurable logic block (CLB) and slice structures down to LUT circuits and the corresponding device fabrication paradigms. This facilitates a novel architectural approach to reduce leakage energy, minimize communication occurrence and energy cost by eliminating unnecessary data transfer, and support auto-tuning for resilience. Furthermore, HSC-FPGA enables new advantages of technology co-design which trades off alternative mappings between emerging devices and transistors at runtime by allowing dynamic remapping to adaptively leverage the intrinsic computing features of each device technology. HSC-FPGA offers a platform for fine-grained Logic-In-Memory architectures and runtime adaptive hardware. An orthogonal dimension of fabric heterogeneity is also non-determinism enabled by either low-voltage CMOS or probabilistic emerging devices. It can be realized using probabilistic devices within a reconfigurable network to blend deterministic and probabilistic computational models. Herein, consider the probabilistic spin logic p-bit device as a fabric element comprising a crossbar-structured weighted array. The Programmability of the resistive network interconnecting p-bit devices can be achieved by modifying the resistive states of the array\u27s weighted connections. Thus, the programmable weighted array forms a CLB-scale macro co-processing element with bitstream programmability. This allows field programmability for a wide range of classification problems and recognition tasks to allow fluid mappings of probabilistic and deterministic computing approaches. In particular, a Deep Belief Network (DBN) is implemented in the field using recurrent layers of co-processing elements to form an n x m1 x m2 x ::: x mi weighted array as a configurable hardware circuit with an n-input layer followed by i ≥ 1 hidden layers. As neuromorphic architectures using post-CMOS devices increase in capability and network size, the utility and benefits of reconfigurable fabrics of neuromorphic modules can be anticipated to continue to accelerate