238 research outputs found
A FPGA-Based Reconfigurable Software Architecture for Highly Dependable Systems
Nowadays, systems-on-chip are commonly equipped with reconfigurable hardware. The use of hybrid architectures based on a mixture of general purpose processors and reconfigurable components has gained importance across the scientific community allowing a significant improvement of computational performance. Along with the demand for performance, the great sensitivity of reconfigurable hardware devices to physical defects lead to the request of highly dependable and fault tolerant systems. This paper proposes an FPGA-based reconfigurable software architecture able to abstract the underlying hardware platform giving an homogeneous view of it. The abstraction mechanism is used to implement fault tolerance mechanisms with a minimum impact on the system performanc
FPGA ARCHITECTURE AND VERIFICATION OF BUILT IN SELF-TEST (BIST) FOR 32-BIT ADDER/SUBTRACTER USING DE0-NANO FPGA AND ANALOG DISCOVERY 2 HARDWARE
The integrated circuit (IC) is an integral part of everyday modern technology, and its application is very attractive to hardware and software design engineers because of its versatility, integration, power consumption, cost, and board area reduction. IC is available in various types such as Field Programming Gate Array (FPGA), Application Specific Integrated Circuit (ASIC), System on Chip (SoC) architecture, Digital Signal Processing (DSP), microcontrollers (μC), and many more. With technology demand focused on faster, low power consumption, efficient IC application, design engineers are facing tremendous challenges in developing and testing integrated circuits that guaranty functionality, high fault coverage, and reliability as the transistor technology is shrinking to the point where manufacturing defects of ICs are affecting yield which associates with the increased cost of the part. The competitive IC market is pressuring manufactures of ICs to develop and market IC in a relatively quick turnaround which in return requires design and verification engineers to develop an integrated self-test structure that would ensure fault-free and the quality product is delivered on the market. 70-80% of IC design is spent on verification and testing to ensure high quality and reliability for the enduser. To test complex and sophisticated IC designs, the verification engineers must produce laborious and costly test fixtures which affect the cost of the part on the competitive market. To avoid increasing the part cost due to yield and test time to the end-user and to keep up with the competitive market many IC design engineers are deviating from complex external test fixture approach and are focusing on integrating Built-in Self-Test (BIST) or Design for Test
(DFT) techniques onto IC’s which would reduce time to market but still guarantee high coverage for the product. Understanding the BIST, the architecture, as well as the application of IC, must be understood before developing IC. The architecture of FPGA is elaborated in this paper followed by several BIST techniques and applications of those BIST relative to FPGA, SoC, analog to digital (ADC), or digital to analog converters (DAC) that are integrated on IC. Paper is concluded with verification of BIST for the 32-bit adder/subtracter designed in Quartus II software using the Analog Discovery 2 module as stimulus and DE0-NANO FPGA board for verification
DeSyRe: on-Demand System Reliability
The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect and fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints
Design of a Scan Chain for Side Channel Attacks on AES Cryptosystem for Improved Security
Scan chain-based attacks are side-channel attacks focusing on one of the most significant features of hardware test circuitry. A technique called Design for Testability (DfT) involves integrating certain testability components into a hardware design. However, this creates a side channel for cryptanalysis, providing crypto devices vulnerable to scan-based attacks. Advanced Encryption Standard (AES) has been proven as the most powerful and secure symmetric encryption algorithm announced by USA Government and it outperforms all other existing cryptographic algorithms. Furthermore, the on-chip implementation of private key algorithms like AES has faced scan-based side-channel attacks. With the aim of protecting the data for secure communication, a new hybrid pipelined AES algorithm with enhanced security features is implemented. This paper proposes testing an AES core with unpredictable response compaction and bit level-masking throughout the scan chain process. A bit-level scan flipflop focused on masking as a scan protection solution for secure testing. The experimental results show that the best security is provided by the randomized addition of masked scan flipflop through the scan chain and also provides minimal design difficulty and power expansion overhead with some negligible delay measures. Thus, the proposed technique outperforms the state-of-the-art LUT-based S-box and the composite sub-byte transformation model regarding throughput rate 2 times and 15 times respectively. And security measured in the avalanche effect for the sub-pipelined model has been increased up to 95 per cent with reduced computational complexity. Also, the proposed sub-pipelined S-box utilizing a composite field arithmetic scheme achieves 7 per cent area effectiveness and 2.5 times the hardware complexity compared to the LUT-based model
Application development process for GNAT, a SOC networked system
The market for smart devices was identified years ago, and yet commercial progress into this field has not made significant progress. The reason such devices are so painfully slow to market is that the gap between the technologically possible and the market capitalizable is too vast. In order for inventions to succeed commercially, they must bridge the gap to tomorrow\u27s technology with marketability today. This thesis demonstrates a design methodology that enables such commercial success for one variety of smart device, the Ambient Intelligence Node (AIN). Commercial Off-The Shelf (COTS) design tools allowing a Model-Driven Architecture (MDA) approach are combined via custom middleware to form an end-to-end design flow for rapid prototyping and commercialization. A walkthrough of this design methodology demonstrates its effectiveness in the creation of Global Network Academic Test (GNAT), a sample AIN. It is shown how designers are given the flexibility to incorporate IP Blocks available in the Global Economy to reduce Time-To-Market and cost. Finally, new kinds of products and solutions built on the higher levels of design abstraction permitted by MDA design methods are explored
Programmable logic devices: a test approach for the Input / Output blocks and Pad-to-Pin interconnections
Dynamically reconfigurable systems based on partial and dynamically reconfigurable FPGAs may have their functionality partially modified at run-time without stopping the operation of the whole system. The efficient management of the logic space available is one of the biggest problems faced by these systems. When the sequence of reconfigurations to be performed is not predictable, resource allocation decisions have to be made on-line. A rearrangement may be necessary to get enough contiguous space to implement incoming functions, avoiding the spreading of their components and the resulting degradation of system performance.A new software tool that helps to handle the problems posed by the consecutive reconfiguration of the same logic space is presented in this paper. This tool uses a novel on-line rearrangement procedure to solve fragmentation problems and to rearrange the logic space in a way completely transparent to the applications currently running
Fault and Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices
This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a fault and defect tolerant (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required hardware redundancy is approximately 15 times that of a non-fault tolerant design. While larger than current FT designs, this architecture allows the use of devices much more likely to fail than silicon CMOS. As part of model development, an improved model is derived for NAND Multiplexing. The model is the first accurate model for small and medium amounts of redundancy. Previous models are extended to account for dependence between the inputs and produce more accurate results
Delay Measurements and Self Characterisation on FPGAs
This thesis examines new timing measurement methods for self delay characterisation of Field-Programmable Gate Arrays (FPGAs) components and delay measurement of complex circuits
on FPGAs. Two novel measurement techniques based on analysis of a circuit's output failure
rate and transition probability is proposed for accurate, precise and efficient measurement of
propagation delays. The transition probability based method is especially attractive, since
it requires no modifications in the circuit-under-test and requires little hardware resources,
making it an ideal method for physical delay analysis of FPGA circuits.
The relentless advancements in process technology has led to smaller and denser transistors
in integrated circuits. While FPGA users benefit from this in terms of increased hardware
resources for more complex designs, the actual productivity with FPGA in terms of timing
performance (operating frequency, latency and throughput) has lagged behind the potential
improvements from the improved technology due to delay variability in FPGA components
and the inaccuracy of timing models used in FPGA timing analysis. The ability to measure
delay of any arbitrary circuit on FPGA offers many opportunities for on-chip characterisation
and physical timing analysis, allowing delay variability to be accurately tracked and variation-aware optimisations to be developed, reducing the productivity gap observed in today's FPGA
designs.
The measurement techniques are developed into complete self measurement and characterisation platforms in this thesis, demonstrating their practical uses in actual FPGA hardware for
cross-chip delay characterisation and accurate delay measurement of both complex combinatorial and sequential circuits, further reinforcing their positions in solving the delay variability
problem in FPGAs
Design and Validation of Network-on-Chip Architectures for the Next Generation of Multi-synchronous, Reliable, and Reconfigurable Embedded Systems
NETWORK-ON-CHIP (NoC) design is today at a crossroad. On one hand, the
design principles to efficiently implement interconnection networks in the
resource-constrained on-chip setting have stabilized. On the other hand,
the requirements on embedded system design are far from stabilizing. Embedded
systems are composed by assembling together heterogeneous components featuring
differentiated operating speeds and ad-hoc counter measures must be adopted
to bridge frequency domains. Moreover, an unmistakable trend toward enhanced
reconfigurability is clearly underway due to the increasing complexity of applications.
At the same time, the technology effect is manyfold since it provides unprecedented
levels of system integration but it also brings new severe constraints
to the forefront: power budget restrictions, overheating concerns, circuit delay and
power variability, permanent fault, increased probability of transient faults.
Supporting different degrees of reconfigurability and flexibility in the parallel
hardware platform cannot be however achieved with the incremental evolution of
current design techniques, but requires a disruptive approach and a major increase
in complexity. In addition, new reliability challenges cannot be solved by using
traditional fault tolerance techniques alone but the reliability approach must be
also part of the overall reconfiguration methodology.
In this thesis we take on the challenge of engineering a NoC architectures for
the next generation systems and we provide design methods able to overcome the
conventional way of implementing multi-synchronous, reliable and reconfigurable
NoC. Our analysis is not only limited to research novel approaches to the specific
challenges of the NoC architecture but we also co-design the solutions in a single
integrated framework. Interdependencies between different NoC features are
detected ahead of time and we finally avoid the engineering of highly optimized solutions
to specific problems that however coexist inefficiently together in the final
NoC architecture. To conclude, a silicon implementation by means of a testchip
tape-out and a prototype on a FPGA board validate the feasibility and effectivenes
CROSS-LAYER DESIGN, OPTIMIZATION AND PROTOTYPING OF NoCs FOR THE NEXT GENERATION OF HOMOGENEOUS MANY-CORE SYSTEMS
This thesis provides a whole set of design methods to enable and manage the
runtime heterogeneity of features-rich industry-ready Tile-Based Networkon-
Chips at different abstraction layers (Architecture Design, Network Assembling,
Testing of NoC, Runtime Operation). The key idea is to maintain
the functionalities of the original layers, and to improve the performance
of architectures by allowing, joint optimization and layer coordinations. In
general purpose systems, we address the microarchitectural challenges by codesigning
and co-optimizing feature-rich architectures. In application-specific
NoCs, we emphasize the event notification, so that the platform is continuously
under control. At the network assembly level, this thesis proposes a
Hold Time Robustness technique, to tackle the hold time issue in synchronous
NoCs. At the network architectural level, the choice of a suitable synchronization
paradigm requires a boost of synthesis flow as well as the coexistence
with the DVFS. On one hand this implies the coexistence of mesochronous
synchronizers in the network with dual-clock FIFOs at network boundaries.
On the other hand, dual-clock FIFOs may be placed across inter-switch links
hence removing the need for mesochronous synchronizers. This thesis will
study the implications of the above approaches both on the design flow and
on the performance and power quality metrics of the network. Once the manycore
system is composed together, the issue of testing it arises. This thesis
takes on this challenge and engineers various testing infrastructures. At the
upper abstraction layer, the thesis addresses the issue of managing the fully
operational system and proposes a congestion management technique named
HACS. Moreover, some of the ideas of this thesis will undergo an FPGA
prototyping. Finally, we provide some features for emerging technology by
characterizing the power consumption of Optical NoC Interfaces
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