Data reliability and error correction for NAND Flash Memory System

NAND flash memory has been widely used for data storage due to its high density, high throughput, and low power. However, as the flash memory scales to smaller process technologies and stores more bits per cell, its reliability is decreasing. The error correction coding can be used to significantly improve the data reliability; nevertheless, the advanced ECCs such as low-density parity-check (LDPC) codes generally demand soft decisions while NAND flash memory channel provides hard-decisions only. Extracting the soft information requires the accurate characterization of flash memory channel and the effective design of coding schemes. To this end, we have presented a novel LDPC-TCM coding scheme for the Multilevel Cell (MLC) flash memories. The a posteriori TCM decoding algorithm is used in the scheme to generate soft information, which is fed to the LDPC decoder for further correction of data bits. It has been demonstrated that the proposed scheme can achieve higher error correction performance than the traditional hard-decisions based flash coding algorithms, and is feasible in the design practice. Further with the LDPC-TCM, we believe it is important to characterize the flash memory channel and investigate a method to calculate the soft decision for each bit, with the available channel outputs. We studied the various noises and interferences occurring in the memory channel and mathematically formulated the probability density function of the overall noise distribution. Based on the results we derived the final distribution for the cell threshold voltages, which can be used to instruct the calculation of soft decisions. The discoveries on the theoretical level have been demonstrated to be consistent with the real channel behaviours. The channel characterization and model provided in this dissertation can enable more design of soft-decisions based ECCs for future NAND flash memories. The data pattern processing algorithm deals with the write patterns and targets to lower the proportion of patterns that would introduce data errors. On the other hand, the voltages applied to the memory cells charges the MOSFET capacitances frequently on programming these data patterns, leading to the power problem. The high energy consumption and current spikes also cause reliability issue to the data stored in the flash memory. This dissertation proposes a write pattern formatting algorithm (WPFA) attempting to solve the two problems together. We have designed and implemented the algorithm and evaluated its performance through both the software simulations and hardware synthesis

Improving Reliability and Performance of NAND Flash Based Storage System

High seek and rotation overhead of magnetic hard disk drive (HDD) motivates development of storage devices, which can offer good random performance. As an alternative technology, NAND flash memory demonstrates low power consumption, microsecond-order access latency and good scalability. Thanks to these advantages, NAND flash based solid state disks (SSD) show many promising applications in enterprise servers. With multi-level cell (MLC) technique, the per-bit fabrication cost is reduced and low production cost enables NAND flash memory to extend its application to the consumer electronics. Despite these advantages, limited memory endurance, long data protection latency and write amplification continue to be the major challenges in the designs of NAND flash storage systems. The limited memory endurance and long data protection latency issue derive from memory bit errors. High bit error rate (BER) severely impairs data integrity and reduces memory durance. The limited endurance is a major obstacle to apply NAND flash memory to the application with high reliability requirement. To protect data integrity, hard-decision error correction codes (ECC) such as Bose-Chaudhuri-Hocquenghem (BCH) are employed. However, the hardware cost becomes prohibitively with the increase of BER when the BCH ECC is employed to extend system lifetime. To extend system lifespan without high hardware cost, we has proposed data pattern aware (DPA) error prevention system design. DPA realizes BER reduction by minimizing the occurrence of data patterns vulnerable to high BER with simple linear feedback shift register circuits. Experimental results show that DPA can increase the system lifetime by up to 4× with marginal hardware cost. With the technology node scaling down to 2Xnm, BER increases up to 0.01. Hard-decision ECCs and DPA are no longer applicable to guarantee data integrity due to either prohibitively high hardware cost or high storage overhead. Soft-decision ECC, such as lowdensity parity check (LDPC) code, has been introduced to provide more powerful error correction capability. However, LDPC code demands extra memory sensing operations, directly leading to long read latency. To reduce LDPC code induced read latency without adverse impact on system reliability, we has proposed FlexLevel NAND flash storage system design. The FlexLevel design reduces BER by broadening the noise margin via threshold voltage (Vth) level reduction. Under relatively low BER, no extra sensing level is required and therefore read performance can be improved. To balance Vth level reduction induced capacity loss and the read speedup, the FlexLevel design identifies the data with high LDPC overhead and only performs Vth reduction to these data. Experimental results show that compared with the best existing works, the proposed design achieves up to 11% read speedup with negligible capacity loss. Write amplification is a major cause to performance and endurance degradation of the NAND flash based storage system. In the object-based NAND flash device (ONFD), write amplification partially results from onode partial update and cascading update. Onode partial update only over-writes partial data of a NAND flash page and incurs unnecessary data migration of the un-updated data. Cascading update is update to object metadata in a cascading manner due to object data update or migration. Even through only several bytes in the object metadata are updated, one or more page has to be re-written, significantly degrading write performance. To minimize write operations incurred by onode partial update and cascading update, we has proposed a Data Migration Minimizing (DMM) device design. The DMM device incorporates 1) the multi-level garbage collection technique to minimize the unnecessary data migration of onode partial update and 2) the virtual B+ tree and diff cache to reduce the write operations incurred by cascading update. The experiment results demonstrate that the DMM device can offer up to 20% write reduction compared with the best state-of-art works

異種の不揮発性メモリで構成される半導体ストレージシステムに関する研究

【学位授与の要件】中央大学学位規則第4条第1項【論文審査委員主査】竹内　健　（中央大学理工学部教授）【論文審査委員副査】山村　清隆（中央大学理工学部教授）、築山　修治（中央大学理工学部教授）、首藤　一幸（東京工業大学大学院情報理工学研究科准教授）博士（工学）中央大

Fault-tolerant satellite computing with modern semiconductors

Miniaturized satellites enable a variety space missions which were in the past infeasible, impractical or uneconomical with traditionally-designed heavier spacecraft. Especially CubeSats can be launched and manufactured rapidly at low cost from commercial components, even in academic environments. However, due to their low reliability and brief lifetime, they are usually not considered suitable for life- and safety-critical services, complex multi-phased solar-system-exploration missions, and missions with a longer duration. Commercial electronics are key to satellite miniaturization, but also responsible for their low reliability: Until 2019, there existed no reliable or fault-tolerant computer architectures suitable for very small satellites. To overcome this deficit, a novel on-board-computer architecture is described in this thesis.Robustness is assured without resorting to radiation hardening, but through software measures implemented within a robust-by-design multiprocessor-system-on-chip. This fault-tolerant architecture is component-wise simple and can dynamically adapt to changing performance requirements throughout a mission. It can support graceful aging by exploiting FPGA-reconfiguration and mixed-criticality.  Experimentally, we achieve 1.94W power consumption at 300Mhz with a Xilinx Kintex Ultrascale+ proof-of-concept, which is well within the powerbudget range of current 2U CubeSats. To our knowledge, this is the first COTS-based, reproducible on-board-computer architecture that can offer strong fault coverage even for small CubeSats.European Space AgencyComputer Systems, Imagery and Medi