619 research outputs found

    A Bang-Bang All-Digital PLL for Frequency Synthesis

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    abstract: Phase locked loops are an integral part of any electronic system that requires a clock signal and find use in a broad range of applications such as clock and data recovery circuits for high speed serial I/O and frequency synthesizers for RF transceivers and ADCs. Traditionally, PLLs have been primarily analog in nature and since the development of the charge pump PLL, they have almost exclusively been analog. Recently, however, much research has been focused on ADPLLs because of their scalability, flexibility and higher noise immunity. This research investigates some of the latest all-digital PLL architectures and discusses the qualities and tradeoffs of each. A highly flexible and scalable all-digital PLL based frequency synthesizer is implemented in 180 nm CMOS process. This implementation makes use of a binary phase detector, also commonly called a bang-bang phase detector, which has potential of use in high-speed, sub-micron processes due to the simplicity of the phase detector which can be implemented with a simple D flip flop. Due to the nonlinearity introduced by the phase detector, there are certain performance limitations. This architecture incorporates a separate frequency control loop which can alleviate some of these limitations, such as lock range and acquisition time.Dissertation/ThesisM.S. Electrical Engineering 201

    Built-in self test of high speed analog-to-digital converters

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    Signals found in nature need to be converted to the digital domain through analog-to-digital converters (ADCs) to be processed by digital means [1]. For applications in communication and measurement [2], [3], high conversion rates are required. With advances of the complementary metal oxide semiconductor (CMOS) technology, the conversion rates of CMOS ADCs are now well beyond the gigasamples per second (GS/s) range, but only moderate resolutions are required [4]. These ADCs need to be tested after fabrication and, if possible, during field operation. The test costs are a very significant fraction of their production cost [5]. This is mainly due to lengthy use of very expensive automated test equipment (ATE) to apply specific test stimuli to the devices under test (DUT) and to collect and analyze their responses.publishe

    A PLL Exploiting Sub-Sampling of the VCO Output to Reduce In-band Phase Noise

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    Abstract— In this paper, we present a 2.2-GHz low jitter PLL based on sub-sampling. It uses a phase-detector/charge-pump (PD/CP) that sub-samples the VCO output with the reference clock. In contrast to what happens in a classical PLL, the PD/CP noise is not multiplied by N2 in this sub-sampling PLL. Moreover, no frequency divider is needed in the locked state and hence divider noise and power can be eliminated. A frequency locked loop guarantees correct frequency locking without degenerating jitter performance. The PLL implemented in a standard 0.18-μm CMOS process consumes 4.2 mA from a 1.8 V supply and occupies an active area of 0.4 × 0.45 mm2. The in-band phase noise at 200 kHz offset is measured to be -126 dBc/Hz and the rms PLL output jitter integrated from 10 kHz to 40 MHz is 0.15 ps

    A 1.9 ps-rms Precision Time-to-Amplitude Converter With 782 fs LSB and 0.79%-rms DNL

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    Measuring a time interval in the nanoseconds range has opened the way to 3-D imaging, where additional information as distance of objects light detection and ranging (LiDAR) or lifetime decay fluorescence-lifetime imaging (FLIM) is added to spatial coordinates. One of the key elements of these systems is the time measurement circuit, which encodes a time interval into digital words. Nowadays, most demanding applications, especially in the biological field, require time-conversion circuits with a challenging combination of performance, including sub-ps resolution, ps precision, several ns of measurement range, linearity better than few percent of the bin width (especially when complex lifetime data caused by multiple factors have to be retrieved), and operating rates in the order of tens of Mcps. In this article, we present a time-to-amplitude converter (TAC) implemented in a SiGe 350 nm process featuring a resolution of 782 fs, a minimum timing jitter as low as 1.9 ps-rms, a DNL down to 0.79% LSB-rms, and conversion rate as high as 12.3 Mcps. With an area occupation of 0.2 mm2 [without PADs and digital-to-analog converter (DAC)], a FSR up to 100 ns, and a power dissipation of 70 mW, we developed a circuit suitable to be the core element of a densely integrated, faster and high-performance system
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