Measuring a time interval in the nanoseconds range has opened the way to 3-D imaging, where additional information as distance of objects light detection and ranging (LiDAR) or lifetime decay fluorescence-lifetime imaging (FLIM) is added to spatial coordinates. One of the key elements of these systems is the time measurement circuit, which encodes a time interval into digital words. Nowadays, most demanding applications, especially in the biological field, require time-conversion circuits with a challenging combination of performance, including sub-ps resolution, ps precision, several ns of measurement range, linearity better than few percent of the bin width (especially when complex lifetime data caused by multiple factors have to be retrieved), and operating rates in the order of tens of Mcps. In this article, we present a time-to-amplitude converter (TAC) implemented in a SiGe 350 nm process featuring a resolution of 782 fs, a minimum timing jitter as low as 1.9 ps-rms, a DNL down to 0.79% LSB-rms, and conversion rate as high as 12.3 Mcps. With an area occupation of 0.2 mm2 [without PADs and digital-to-analog converter (DAC)], a FSR up to 100 ns, and a power dissipation of 70 mW, we developed a circuit suitable to be the core element of a densely integrated, faster and high-performance system
