Physical and Electrical Characterization of Aluminum Polymer Capacitors

Conductive polymer aluminum capacitor (PA capacitor) is an evolution of traditional wet electrolyte aluminum capacitors by replacing liquid electrolyte with a solid, highly conductive polymer. On the other hand, the cathode construction in polymer aluminum capacitors with coating of carbon and silver epoxy for terminal connection is more like a combination of the technique that solid tantalum capacitor utilizes. This evolution and combination result in the development of several competing capacitor construction technologies in manufacturing polymer aluminum capacitors. The driving force of this research on characterization of polymer aluminum capacitors is the rapid progress in IC technology. With the microprocessor speeds exceeding a gigahertz and CPU current demands of 80 amps and more, the demand for capacitors with higher peak current and faster repetition rates bring conducting polymer capacitors to the center o( focus. This is because this type of capacitors has been known for its ultra-low ESR and high capacitance. Polymer aluminum capacitors from several manufacturers with various combinations of capacitance, rated voltage, and ESR values were obtained and tested. The construction analysis of the capacitors revealed three different constructions: conventional rolled foil, the multilayer stacking V-shape, and a dual-layer sandwich structure. The capacitor structure and its impact on the electrical characteristics has been revealed and evaluated. A destructive test with massive current over stress to fail the polymer aluminum capacitors reveals that all polymer aluminum capacitors failed in a benign mode without ignition, combustion, or any other catastrophic failures. The extraordinary low ESR (as low as 3 mOMEGA), superior frequency independence reported for polymer aluminum capacitors have been confirmed. For the applications of polymer aluminum capacitors in space programs, a thermal vacuum cycle test was performed. The results, as expected, show no impact on the electrical characteristics of the capacitors. The breakdown voltage of polymer capacitors has been evaluated using a steady step surge test. Initial results show the uniform distribution in the breakdown voltage for polymer aluminum capacitors. Polymer aluminum capacitors with a combination of very high capacitance, extraordinary low ESR, excellent frequency stability, and non-ignite benign failure mode make it a niche fit in space applications for both today and future. Polymer capacitors are apparently also the best substitutes of the currently used MnO2-based tantalum capacitors in the low voltage range. However, some critical aspects are still to be addressed in the next phase of the investigation for PA capacitors. These include the long term reliability test of 125 C dry life and 85 C/85%RH humidity, the failure mechanism and de-rating, the radiation tolerance, and the high temperature performance. All of the above requires the continuous NEPP funding and support

Failure Modes in Capacitors When Tested Under a Time-Varying Stress

Power-on failure has been the prevalent failure mechanism for solid tantalum capacitors in decoupling applications. A surge step stress test (SSST) has been previously applied to identify the critical stress level of a capacitor batch to give some predictability to the power-on failure mechanism [1]. But SSST can also be viewed as an electrically destructive test under a time-varying stress (voltage). It consists of rapidly charging the capacitor with incremental voltage increases, through a low resistance in series, until the capacitor under test is electrically shorted. When the reliability of capacitors is evaluated, a highly accelerated life test (HALT) is usually adopted since it is a time-efficient method of determining the failure mechanism; however, a destructive test under a time-varying stress such as SSST is even more time efficient. It usually takes days or weeks to complete a HALT test, but it only takes minutes for a time-varying stress test to produce failures. The advantage of incorporating a specific time-varying stress profile into a statistical model is significant in providing an alternative life test method for quickly revealing the failure mechanism in capacitors. In this paper, a time-varying stress that mimics a typical SSST has been incorporated into the Weibull model to characterize the failure mechanism in different types of capacitors. The SSST circuit and transient conditions for correctly surge testing capacitors are discussed. Finally, the SSST was applied for testing Ta capacitors, polymer aluminum capacitors (PA capacitors), and multi-layer ceramic (MLC) capacitors with both precious metal electrodes (PME) and base metal electrodes (BME). The test results are found to be directly associated with the dielectric layer breakdown in Ta and PA capacitors and are independent of the capacitor values, the way the capacitors were built, and the capacitors manufacturers. The test results also show that MLC capacitors exhibit surge breakdown voltages much higher than the rated voltage and that the breakdown field is inversely proportional to the dielectric layer thickness. The SSST data can also be used to comparatively evaluate the voltage robustness of capacitors for decoupling applications

THE ELECTRICAL CHARACTERIZATION OF TANTALUM CAPACITORS AS MIS DEVICES

Electrical characteristics of a new class of tantalum capacitor are presented. Specifically, this type of tantalum capacitor is manufactured by KEMET Electronics Corporation and utilizes Poly(3,4-ethylenedioxythiolphene) (PEDOT) as the cathode material. There are two capacitor varieties based on the polymerization method used for the PEDOT. One uses In-Situ polymerization, and the other uses Pre-Polymerization. Existing polymer Ta capacitors use In-Situ polymerization while Pre-Polymerization is a new technique of cathode application. We investigated both types of devices to determine what, if any, performance benefits were gained by using Pre-Poly. In a basic form Ta capacitors consist of a Ta anode, Ta2O5 dielectric, and PEDOT cathode polymerized to be a semiconductor. Based on the simplified representation of the capacitor materials these devices were investigated as MIS structures and C-V, I-t, and I-V measurements were made. C-V measurements were used to observe characteristics of MIS operation in the devices. Measurements were made from room temperature down to 100K in attempts to suppress the leakage current in these devices. I-t and I-V measurements were used to identify dominating leakage current mechanisms. The Poole-Frenkel Effect, the Schottky Effect, and Space-Charge-Limited Current were observed in In-Situ polymerized devices, while the Poole-Frenkel Effect, the Schottky Effect, and Fowler-Nordheim Tunneling were observed in Pre-Poly devices. Overall, both devices showed voltage dependent capacitance. The Pre-Poly devices generally had lower levels of leakage current. However, due to differing properties of the polymer in each case In-Situ devices exhibited less capacitance loss at low temperatures

SCINTILLATION CONDITIONING OF TANTALUM CAPACITORS WITH MANGANESE DIOXIDE CATHODES

Scintillation testing is a method that activates the self-healing mechanism in tantalum capacitors. In preliminary experiments, the deliberate activation of self-healing yielded up to 27% higher breakdown voltages in weak parts that had an increased risk of ignition failure. This improvement results in a better performance under surge current conditions. This paper demonstrates that scintillation conditioning reduces surge current failures in tantalum capacitors with manganese dioxide cathodes. Tantalum capacitors with MnO2 cathodes from two manufacturers are subjected to scintillation conditioning and compared to non-conditioned populations in a surge current test. To ensure that the activation of the self-healing mechanism has no detrimental effect on the reliability of the parts, a life test is conducted. The results show that the conditioning method increases the breakdown voltage of self-healed tantalum capacitors by up to 25% under surge current conditions, which mitigates the risk of ignition failures. No detrimental effect on the life of the conditioned samples was observed. Additional tests to assess the reliability of tantalum capacitors with manganese dioxide cathodes under simultaneous thermo-mechanical and voltage stresses were performed. Even though these tests are not directly related to scintillation conditioning the study was included as an additional chapter, since it pertains to the general subject of tantalum capacitor reliability

Capacitance Stability of Polymer Tantalum Capacitors Under Different Environmental Conditions

Polymer Hermetic Sealed (PHS) Tantalum capacitors with pre-polymerized PEDOT cathodes and different dielectric thicknesses were used to study the stability of Polymer Tantalum capacitors under different environmental conditions. In particular, capacitance dependence on temperature, frequency, and dc bias voltage were studied in humid and dry capacitors with varying dielectric thicknesses. Capacitance and ESR measurements were performed to characterize the capacitors.Humid capacitors were observed to have higher capacitance than dry capacitors for all dielectric thicknesses. The capacitance for all dielectric thicknesses was observed to increase with temperature in both humid and dry capacitors. Humid capacitors showed a stronger temperature dependence at lower temperatures while dry capacitors showed a stronger temperature dependence at higher temperatures. These temperature effects were more pronounced in thinner dielectric capacitors, and the results were explained by the integrity of the dielectric-polymer interface. The capacitance for all dielectric thicknesses was also observed to decrease with an increase in frequency, both in humid and dry capacitors. The frequency effect was more pronounced in humid capacitors with thinner dielectrics. These results were explained by the RC ladder effect, secondary transitions of the polar segments of the polymer cathode, and lower reactance and lower self-resonance frequency of the thinner dielectric capacitors

Degradation of Leakage Currents and Reliability Prediction for Tantalum Capacitors

Two types of failures in solid tantalum capacitors, catastrophic and parametric, and their mechanisms are described. Analysis of voltage and temperature reliability acceleration factors reported in literature shows a wide spread of results and requires more investigation. In this work, leakage currents in two types of chip tantalum capacitors were monitored during highly accelerated life testing (HALT) at different temperatures and voltages. Distributions of degradation rates were approximated using a general log-linear Weibull model and yielded voltage acceleration constants B = 9.8 +/- 0.5 and 5.5. The activation energies were Ea = 1.65 eV and 1.42 eV. The model allows for conservative estimations of times to failure and was validated by long-term life test data. Parametric degradation and failures are reversible and can be annealed at high temperatures. The process is attributed to migration of charged oxygen vacancies that reduce the barrier height at the MnO2/Ta2O5 interface and increase injection of electrons from the MnO2 cathode. Analysis showed that the activation energy of the vacancies' migration is ~ 1.1 eV

Guatemala\u27s Remote Sensing CubeSat - Tools and Approaches to Increase the Probability of Mission Success

Universidad del Valle de Guatemala (UVG) is undertaking an undergraduate academic project with a mission to design, develop, and operate a CubeSat-class satellite to test a multispectral sensor prototype, opening the field of space science & technology in Guatemala, developing the country’s human capital, and enabling the independent acquisition of remote sensing data for natural resource management. Throughout the four-year span of this project’s design phase, more than 200 requirements, 70 risks, 220 controlled documents, 150 parts, 330 tasks, and 60 engineering drawings were monitored. Increasing the project complexity, it has to date included over 100 students and volunteers working at different points in time. To increase the odds of mission success, multiple tools and approaches were taken to manage the project’s multiple physical and document components, and are here described. These tools include a Requirement Compliance Matrix, Requirement Verification and Validation Matrix, Risk Matrix, Failure Mode and Effects Analyses, Document Control, Capacitor Control, Parts Control, Material Off-Gassing, Engineering Drawings Architecture and Control, N-Squared Diagram, Structural and Thermal Finite Element Analyses, and Assembly Procedure, to name a few. This manuscript describes what each of these tools entail, how they are used, and their results with respect to Quetzal 1, UVG’s student project

Electrical characterization of plasma-enhanced Cvd silicon nitride dielectric on copper

In this work, a novel metal-insulator-metal (MIM) capacitor process is introduced and integrated in a Copper Interconnect technology, whose smallest feature size is 0.18mum process, which has good yield, reliability and repeatability. The MIM uses a one-photomask process and hence is termed as the Low-cost-integration (LCI) MIM. The LCI MIM uses copper as the bottom electrode, plasma enhanced silicon nitride as the dielectric, and Tantalum nitride as the top electrode. The target capacitance density is 1.5fF/mum2. The target leakage current is 1e-7A/cm2 at 3.3V at 125°C. The maximum operating voltages that the MIM is designed for is 5V. The voltage linearity is desired to be less than 100ppm/v; The purpose of the study is to determine the feasibility of integrating the low-cost-integration (LCI) MIM capacitor and to characterize the device to ensure that it meets the above mentioned target values for the various parameters. This is done by electrically characterizing the capacitor for the capacitance change with voltage, the leakage current at accelerated voltages and the time-dependent-dielectric breakdown (TDDB) under various electric fields. (Abstract shortened by UMI.)

Capacitor Technologies, Applications and Reliability

Various aspects of capacitor technologies and applications are discussed. Major emphasis is placed on: the causes of failures; accelerated testing; screening tests; destructive physical analysis; applications techniques; and improvements in capacitor capabilities

Space Electrochemical Research and Technology

Individual papers presented at the conference address the following topics: development of a micro-fiber nickel electrode for nickel-hydrogen cell, high performance nickel electrodes for space power application, bending properties of nickel electrodes for nickel-hydrogen batteries, effect of KOH concentration and anions on the performance of a Ni-H2 battery positive plate, advanced dependent pressure vessel nickel hydrogen spacecraft cell and battery design, electrolyte management considerations in modern nickel hydrogen and nickel cadmium cell and battery design, a novel unitized regenerative proton exchange membrane fuel cell, fuel cell systems for first lunar outpost - reactant storage options, the TMI regenerable solid oxide fuel cell, engineering development program of a closed aluminum-oxygen semi-cell system for an unmanned underwater vehicle, SPE OBOGS on-board oxygen generating system, hermetically sealed aluminum electrolytic capacitor, sol-gel technology and advanced electrochemical energy storage materials, development of electrochemical supercapacitors for EMA applications, and high energy density electrolytic capacitor