Experimental evaluation of two software countermeasures against fault attacks

Injection of transient faults can be used as a way to attack embedded systems. On embedded processors such as microcontrollers, several studies showed that such a transient fault injection with glitches or electromagnetic pulses could corrupt either the data loads from the memory or the assembly instructions executed by the circuit. Some countermeasure schemes which rely on temporal redundancy have been proposed to handle this issue. Among them, several schemes add this redundancy at assembly instruction level. In this paper, we perform a practical evaluation for two of those countermeasure schemes by using a pulsed electromagnetic fault injection process on a 32-bit microcontroller. We provide some necessary conditions for an efficient implementation of those countermeasure schemes in practice. We also evaluate their efficiency and highlight their limitations. To the best of our knowledge, no experimental evaluation of the security of such instruction-level countermeasure schemes has been published yet.Comment: 6 pages, 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), Arlington : United States (2014

Toward the assessment of the susceptibility of a digital system to lightning upset

Accomplishments and directions for further research aimed at developing methods for assessing a candidate design of an avionic computer with respect to susceptability to lightning upset are reported. Emphasis is on fault tolerant computers. Both lightning stress and shielding are covered in a review of the electromagnetic environment. Stress characterization, system characterization, upset detection, and positive and negative design features are considered. A first cut theory of comparing candidate designs is presented including tests of comparative susceptability as well as its analysis and simulation. An approach to lightning induced transient fault effects is included

Static analysis of SEU effects on software applications

Control flow errors have been widely addressed in literature as a possible threat to the dependability of computer systems, and many clever techniques have been proposed to detect and tolerate them. Nevertheless, it has never been discussed if the overheads introduced by many of these techniques are justified by a reasonable probability of incurring control flow errors. This paper presents a static executable code analysis methodology able to compute, depending on the target microprocessor platform, the upper-bound probability that a given application incurs in a control flow error

DFT and BIST of a multichip module for high-energy physics experiments

Engineers at Politecnico di Torino designed a multichip module for high-energy physics experiments conducted on the Large Hadron Collider. An array of these MCMs handles multichannel data acquisition and signal processing. Testing the MCM from board to die level required a combination of DFT strategie

Runtime asynchronous fault tolerance via speculation

Transient faults are emerging as a critical reliability concern in modern microprocessors. Redundant hardware solutions are commonly deployed to detect transient faults, but they are less flexible and cost-effective than software solutions. However, software solutions are rendered impractical because of high performance overheads. To address this problem, this paper presents Runtime Asynchronous Fault Tolerance via Speculation (RAFT), the fastest transient fault detection technique known to date. Serving as a layer between the application and the underlying platform, RAFT automatically generates two symmetric program instances from a program binary. It detects transient faults in a non-invasive way and exploits high-confidence value speculation to achieve low runtime overhead. Evaluation on a commodity multicore system demonstrates that RAFT delivers a geomean performance overhead of 2.83% on a set of 30 SPEC CPU benchmarks and STAMP benchmarks. Compared with existing transient fault detection techniques, RAFT exhibits the best performance and fault coverage, without requiring any change to the hardware or the software applications

Fault Injection for Embedded Microprocessor-based Systems

Microprocessor-based embedded systems are increasingly used to control safety-critical systems (e.g., air and railway traffic control, nuclear plant control, aircraft and car control). In this case, fault tolerance mechanisms are introduced at the hardware and software level. Debugging and verifying the correct design and implementation of these mechanisms ask for effective environments, and Fault Injection represents a viable solution for their implementation. In this paper we present a Fault Injection environment, named FlexFI, suitable to assess the correctness of the design and implementation of the hardware and software mechanisms existing in embedded microprocessor-based systems, and to compute the fault coverage they provide. The paper describes and analyzes different solutions for implementing the most critical modules, which differ in terms of cost, speed, and intrusiveness in the original system behavio