6 research outputs found
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Very-Large-Scale-Integration Circuit Techniques in Internet-of-Things Applications
Heading towards the era of Internet-of-things (IoT) means both opportunity and challenge for the circuit-design community. In a system where billions of devices are equipped with the ability to sense, compute, communicate with each other and perform tasks in a coordinated manner, security and power management are among the most critical challenges.
Physically unclonable function (PUF) emerges as an important security primitive in hardware-security applications; it provides an object-specific physical identifier hidden within the intrinsic device variations, which is hard to expose and reproduce by adversaries. Yet, designing a compact PUF robust to noise, temperature and voltage remains a challenge.
This thesis presents a novel PUF design approach based on a pair of ultra-compact analog circuits whose output is proportional to absolute temperature. The proposed approach is demonstrated through two works: (1) an ultra-compact and robust PUF based on voltage-compensated proportional-to-absolute-temperature voltage generators that occupies 8.3× less area than the previous work with the similar robustness and twice the robustness of the previously most compact PUF design and (2) a technique to transform a 6T-SRAM array into a robust analog PUF with minimal overhead. In this work, similar circuit topology is used to transform a preexisting on-chip SRAM into a PUF, which further reduces the area in (1) with no robustness penalty.
In this thesis, we also explore techniques for power management circuit design.
Energy harvesting is an essential functionality in an IoT sensor node, where battery replacement is cost-prohibitive or impractical. Yet, existing energy-harvesting power management units (EH PMU) suffer from efficiency loss in the two-step voltage conversion: harvester-to-battery and battery-to-load. We propose an EH PMU architecture with hybrid energy storage, where a capacitor is introduced in addition to the battery to serve as an intermediate energy buffer to minimize the battery involvement in the system energy flow. Test-case measurements show as much as a 2.2× improvement in the end-to-end energy efficiency.
In contrast, with the drastically reduced power consumption of IoT nodes that operates in the sub-threshold regime, adaptive dynamic voltage scaling (DVS) for supply-voltage margin removal, fully on-chip integration and high power conversion efficiency (PCE) are required in PMU designs. We present a PMU–load co-design based on a fully integrated switched-capacitor DC-DC converter (SC-DC) and hybrid error/replica-based regulation for a fully digital PMU control. The PMU is integrated with a neural spike processor (NSP) that achieves a record-low power consumption of 0.61 µW for 96 channels. A tunable replica circuit is added to assist the error regulation and prevent loss of regulation. With automatic energy-robustness co-optimization, the PMU can set the SC-DC’s optimal conversion ratio and switching frequency. The PMU achieves a PCE of 77.7% (72.2%) at VIN = 0.6 V (1 V) and at the NSP’s margin-free operating point
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Modeling attack resistant strong physical unclonable functions : design and applications
Physical unclonable functions (PUFs) have great promise as hardware authentication primitives due to their physical unclonability, high resistance to reverse engineering, and difficulty of mathematical cloning. Strong PUFs are distinguished by an exponentially large number of challenge-response pairs (CRPs), in contrast with weak PUFs that have a smaller CRP set. Because the adversary cannot create an enumeration clone by recording all CRPs even when in physical possession of a PUF, strong PUFs enable secure direct authentication, that does not require cryptography and are thus attractive to low-energy and IoT applications. The first contribution of this dissertation is the design of a strong silicon PUF resistant to machine learning (ML) attacks. For a strong PUF to be an effective security primitive, the CRPs need to be unpredictable: given a set of known CRPs, it should be difficult to predict the unobserved CRPs. Otherwise, an adversary can succeed in an attack based on building a model of the PUF. Early strong PUFs have shown vulnerability to ML based attacks. We take advantage of the strongly nonlinear I -- V property of MOSFETs operating in subthreshold region to introduce a highly unpredictable PUF. The PUF, termed the subthreshold current array PUF (SCA-PUF), consists of a pair of two-dimensional transistor arrays, a circuit stabilizing the PUF output, and a low-offset comparator. The proposed 65-bit SCA-PUF is fabricated in a 130nm process and allows 2⁶⁵ CRPs. It consumes 68nW and 11pJ/bit while exhibiting high uniqueness, uniformity, and randomness. It achieves bit error rate (BER) of 5.8% for the temperature range of -20 to +80°C and supply voltage variation of ±10%. A calibration-based CRP selection method is developed to improve BER to 0.4% with a 42% loss of CRPs. When subjected to ML attacks, the prediction error stays over 40% on 10⁴ training points, which shows negligible loss in PUF unpredictability and about 100X higher resilience than the 65-bit arbiter PUF, 3-XOR PUF, and 3-XOR lightweight PUF. The second contribution is the application of a strong PUF in a secure key update scheme. Side-channel attacks on cryptographic implementations threaten system security via the loss of the secret key. The adversary can recover the key by analyzing side-channel analog behavior of a cryptographic device, such as power consumption. Fresh re-keying techniques aim to mitigate these attacks by regularly updating the key, so that the side-channel exposure of each key is minimized. Existing key update schemes generate fresh keys by processing a root key using arithmetic operations. Unfortunately, such techniques have been demonstrated to also be vulnerable to side-channel attacks. We propose a novel approach to fresh re-keying that replaces the arithmetic key update function with a strong PUF. We show that the security of our scheme hinges on the resilience of the PUF to a power side-channel attack and propose a realization based on the SCA-PUF. We show that the SCA-PUF is resistant to simple power analysis and a modeling attack that uses ML on the power side-channel. We target an insecure device and secure server encryption scenario for which we provide an efficient and scalable method of PUF enrollment. Finally, we develop an end-to-end encryption system with PUF-based fresh re-keying, using a reverse fuzzy extractor construction. The third contribution is the implementation of a strong PUF provably secure against ML attacks. The security is derived from cryptographic hardness of learning decryption functions of semantically secure public-key cryptosystems within the probably approximately correct framework. The proposed PUF, termed the lattice PUF, compactly realizes the decryption function of the learning-with-errors (LWE) public-key cryptosystem as the core block. The lattice PUF is lightweight and fully digital. It is constructed using a weak PUF, as a physically obfuscated key (POK), an LWE decryption function block, a pseudo-random number generator in the form of a linear-feedback shift register (LFSR), a self-incrementing counter, and a control block. The POK provides the secret key of the LWE decryption function. A fuzzy extractor is utilized to ensure stability of the POK. The proposed lattice PUF significantly improves upon a direct implementation of LWE decryption function in terms of challenge transfer cost by exploiting distributional relaxations allowed by recent work in space-efficient LWEs. Specifically, only a small challenge-seed is transmitted while the full-length challenge is re-generated by the LFSR resulting in a 100X reduction of communication cost. To prevent an active attack in which arbitrary challenges can be submitted, the value of a self-incrementing counter is embedded into the challenge seed. We construct a lattice PUF that realizes a challenge-response pair space of size 2¹³⁶, requires 1160 POK bits, and guarantees 128-bit ML resistance. Assuming a bit error rate of 5% for SRAM-based POK, 6.5K SRAM cells are needed. The PUF shows excellent uniformity, uniqueness, and reliability. We implement the PUF on a Spartan 6 FPGA. It requires only 45 slices for the lattice PUF proper and 233 slices for the fuzzy extractorElectrical and Computer Engineerin
Novel Transistor Resistance Variation-based Physical Unclonable Functions with On-Chip Voltage-to-Digital Converter Designed for Use in Cryptographic and Authentication Applications
Security mechanisms such as encryption, authentication, and feature activation depend on the integrity of embedded secret keys. Currently, this keying material is stored as digital bitstrings in non-volatile memory on FPGAs and ASICs. However, secrets stored this way are not secure against a determined adversary, who can use specialized probing attacks to uncover the secret. Furthermore, storing these pre-determined bitstrings suffers from the disadvantage of not being able to generate the key only when needed. Physical Unclonable Functions (PUFs) have emerged as a superior alternative to this. A PUF is an embedded Integrated Circuit (IC) structure that is designed to leverage random variations in physical parameters of on-chip components as the source of entropy for generating random and unique bitstrings. PUFs also incorporate an on-chip infrastructure for measuring and digitizing these variations in order to produce bitstrings. Additionally, PUFs are designed to reproduce a bitstring on-demand and therefore eliminate the need for on-chip storage. In this work, two novel PUFs are presented that leverage the random variations observed in the resistance of transistors. A thorough analysis of the randomness, uniqueness and stability characteristics of the bitstrings generated by these PUFs is presented. All results shown are based on an exhaustive testing of a set of 63 chips designed with numerous copies of the PUFs on each chip and fabricated in a 90nm nine-metal layer technology. An on-chip voltage-to-digital conversion technique is also presented and tested on the set of 63 chips. Statistical results of the bitstrings generated by the on-chip digitization technique are compared with that of the voltage-derived bitstrings to evaluate the efficacy of the digitization technique. One of the most important quality metrics of the PUF and the on-chip voltage-to-digital converter, the stability, is evaluated through a lengthy temperature-voltage testing over the range of -40C to +85C and voltage variations of +/- 10% of the nominal supply voltage. The stability of both the bitstrings and the underlying physical parameters is evaluated for the PUFs using the data collected from the hardware experiments and supported with software simulations conducted on the devices. Several novel techniques are proposed and successfully tested that address known issues related to instability of PUFs to changing temperature and voltage conditions, thus rendering our PUFs more resilient to these changing conditions faced in practical use. Lastly, an analysis of the stability to changing temperature and voltage variations of a third PUF that leverages random variations in the resistance of the metal wires in the power and ground grids of a chip is also presented
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In-situ and In-field temperature and transistor BTI sensing techniques with microprocessor level implementation
In modern deep-scaled CMOS technologies, various silicon-related pitfalls present challenges to the long-term performance of microprocessors. Such challenges include (1) local hot spots, which breach the thermal limitations of a microprocessor, and (2) transistor aging, especially NBTI, which degrades transistor threshold voltage, ultimately threatening the reliability of the entire memory block. In previous systems, the dummy circuit was placed next to the subject, where the dummy was frequently analyzed, and the readout was used to infer the condition of the target. Due to rapidly changing ambient conditions (e.g., temperature and voltage) and the potential scale of the target dimensions, such metrics may not accurately represent the condition of the target. Moreover, such temperature sensors and canary circuits occupy a significant area.
Therefore, it would be highly preferable to monitor the target circuit in-situ, i.e., to sense the precise transistor at operation. It is also important to achieve an accurate sensing metric. When the temperature is analyzed, the readout should account for voltage and process variations. While sensing the aging degradation, the readout should account for voltage and temperature fluctuations. This would allow testing during in-field operation, while the circuits achieve area-efficiency.
This research had two stages. One result of the first stage was a silicon test chip that was a compact temperature sensor. It involved a family of PTAT+CTAT sensor front-ends that unitized only 6 to 8 conventional CMOS logic devices, yielding a smaller sized chip. The sensor demonstrates accuracy within the target and achieves a 14.3x smaller foot print than preceding published designs. The second product of the first stage was a PMOS aging sensor used in 6T SRAM circuits. The test chip has a real SRAM array, integrated with the proposed PMOS NBTI sensor. It can sense real PMOS NBTI effects in any bit cell (in-situ) and provide robust readings of temperature and voltage (in-field). Intensive aging tests validated the proposed sensing technique.
The second stage was focused on implementing the in-situ and in-field sensing techniques in a real processor. The MIPS microprocessor had a modified instruction cache (I$) and instruction set architecture. With the addition of new instruction aging sensing and minor modification of the circuits, the processor can execute aging sensing opportunistically to evaluate the aging level of its instruction cache. A software framework was developed and verified to estimate the retention voltage of the instruction cache over the lifetime of the chip.
An area-efficient SoC was developed that could transform the instruction cache into an ambient temperature sensor. It had a physically unclonable function (PUF), and it was built with an area-saving technique similar to the earlier work.
This thesis has four chapters. They are presented in chronological and they are aligned with the research described above