Electronics and control technology

Until recently, there was no requirement to learn electronics and control technology in the New Zealand school curriculum. Apart from isolated pockets of teaching based on the enthusiasm of individual teachers, there is very little direct learning of electronics in New Zealand primary or secondary schools. The learning of electronics is located in tertiary vocational training programmes. Thus, few school students learn about electronics and few school teachers have experience in teaching it. Lack of experience with electronics (other than using its products) has contributed to a commonly held view of electronics as out of the control and intellectual grasp of the average person; the domain of the engineer, programmer and enthusiast with his or her special aptitude. This need not be true, but teachers' and parents' lack of experience with electronics is in danger of denying young learners access to the mainstream of modern technology

Integrating security solutions to support nanoCMOS electronics research

The UK Engineering and Physical Sciences Research Council (EPSRC) funded Meeting the Design Challenges of nanoCMOS Electronics (nanoCMOS) is developing a research infrastructure for collaborative electronics research across multiple institutions in the UK with especially strong industrial and commercial involvement. Unlike other domains, the electronics industry is driven by the necessity of protecting the intellectual property of the data, designs and software associated with next generation electronics devices and therefore requires fine-grained security. Similarly, the project also demands seamless access to large scale high performance compute resources for atomic scale device simulations and the capability to manage the hundreds of thousands of files and the metadata associated with these simulations. Within this context, the project has explored a wide range of authentication and authorization infrastructures facilitating compute resource access and providing fine-grained security over numerous distributed file stores and files. We conclude that no single security solution meets the needs of the project. This paper describes the experiences of applying X.509-based certificates and public key infrastructures, VOMS, PERMIS, Kerberos and the Internet2 Shibboleth technologies for nanoCMOS security. We outline how we are integrating these solutions to provide a complete end-end security framework meeting the demands of the nanoCMOS electronics domain

Load flow studies on stand alone microgrid system in Ranau, Sabah

This paper presents the power flow or load flow analysis of Ranau microgrid, a standalone microgrid in the district of Ranau,West Coast Division of Sabah. Power flow for IEEE 9 bus also performed and analyzed. Power flow is define as an important tool involving numerical analysis applied to power system. Power flow uses simplified notation such as one line diagram and per-unit system focusing on voltages, voltage angles, real power and reactive power. To achieved that purpose, this research is done by analyzing the power flow analysis and calculation of all the elements in the microgrid such as generators, buses, loads, transformers, transmission lines using the Power Factory DIGSilent 14 software to calculate the power flow. After the analysis and calculations, the results were analysed and compared

Internationalisation of Innovation: Why Chip Design Moving to Asia

This paper will appear in International Journal of Innovation Management, special issue in honor of Keith Pavitt, (Peter Augsdoerfer, Jonathan Sapsed, and James Utterback, guest editors), forthcoming. Among Keith Pavitt's many contributions to the study of innovation is the proposition that physical proximity is advantageous for innovative activities that involve highly complex technological knowledge But chip design, a process that creates the greatest value in the electronics industry and that requires highly complex knowledge, is experiencing a massive dispersion to leading Asian electronics exporting countries. To explain why chip design is moving to Asia, the paper draws on interviews with 60 companies and 15 research institutions that are doing leading-edge chip design in Asia. I demonstrate that "pull" and "policy" factors explain what attracts design to particular locations. But to get to the root causes that shift the balance in favor of geographical decentralization, I examine "push" factors, i.e. changes in design methodology ("system-on-chip design") and organization ("vertical specialization" within global design networks). The resultant increase in knowledge mobility explains why chip design - that, in Pavitt's framework is not supposed to move - is moving from the traditional centers to a few new specialized design clusters in Asia. A completely revised and updated version has been published as: " Complexity and Internationalisation of Innovation: Why is Chip Design Moving to Asia?," in International Journal of Innovation Management, special issue in honour of Keith Pavitt, Vol. 9,1: 47-73.

Characterizing an image intensifier in an full-field range image system

We are developing a high precision full-field range imaging system. An integral component in this system is an image intensifier, which is modulated at frequencies up to 100 MHz. The range measurement precision is dictated by the image intensifier performance, in particular, the achievable modulation frequency, modulation depth, and waveform shape. By characterizing the image intensifier response, undesirable effects can be observed and quantified with regards to the consequence on the resulting range measurements, and the optimal operating conditions can be selected to minimize these disturbances. The characterization process utilizes a pulsed laser source to temporally probe the gain of the image intensifier. The laser is pulsed at a repetition rate slightly different to the image intensifier modulation frequency, producing a continuous phase shift between the two signals. A charge coupled device samples the image intensifier output, capturing the response over a complete modulation period. Deficiencies in our measured response are clearly identifiable and simple modifications to the configuration of our electrical driver circuit improve the modulation performance

Characterizing an image intensifier in an full-field range image system

We are developing a high precision full-field range imaging system. An integral component in this system is an image intensifier, which is modulated at frequencies up to 100 MHz. The range measurement precision is dictated by the image intensifier performance, in particular, the achievable modulation frequency, modulation depth, and waveform shape. By characterizing the image intensifier response, undesirable effects can be observed and quantified with regards to the consequence on the resulting range measurements, and the optimal operating conditions can be selected to minimize these disturbances. The characterization process utilizes a pulsed laser source to temporally probe the gain of the image intensifier. The laser is pulsed at a repetition rate slightly different to the image intensifier modulation frequency, producing a continuous phase shift between the two signals. A charge coupled device samples the image intensifier output, capturing the response over a complete modulation period. Deficiencies in our measured response are clearly identifiable and simple modifications to the configuration of our electrical driver circuit improve the modulation performance