Behavioural simulation of mixed analogue/digital circuits.

Continuing improvements in integrated circuit technology have made possible the implementation of complex electronic systems on a single chip. This often requires both analogue and digital signal processing. It is essential to simulate such IC's during the design process to detect errors at an early stage. Unfortunately, the simulators that are currently available are not well-suited to large mixed-signal circuits. This thesis describes the design and development of a new methodology for simulating analogue and digital components in a single, integrated environment. The methodology represents components as behavioural models that are more efficient than the circuit models used in conventional simulators. The signals that flow between models are all represented as piecewise-linear (PWL) waveforms. Since models representing digital and analogue components use the same format to represent their signals, they can be directly connected together. An object-oriented approach was used to create a class hierarchy to implement the component models. This supports rapid development of new models since all models are derived from a common base class and inherit the methods and attributes defined in their parentc lassesT. he signal objectsa re implementedw ith a similar class hierarchy. The development and validation of models representing various digital, analogue and mixed-signal components are described. Comparisons are made between the accuracy and performance of the proposed methodology and several commercial simulators. The development of a Windows-based demonstrations imulation tool called POISE is also described. This permitted models to be tested independently and multiple models to be connected together to form structural models of complex circuits

Circuit simulation using distributed waveform relaxation techniques

Simulation plays an important role in the design of integrated circuits. Due to high costs and large delays involved in their fabrication, simulation is commonly used to verify functionality and to predict performance before fabrication. This thesis describes analysis, implementation and performance evaluation of a distributed memory parallel waveform relaxation technique for the electrical circuit simulation of MOS VLSI circuits. The waveform relaxation technique exhibits inherent parallelism due to the partitioning of a circuit into a number of sub-circuits. These subcircuits can be concurrently simulated on parallel processors. Different forms of parallelism in the direct method and the waveform relaxation technique are studied. An analysis of single queue and distributed queue approaches to implement parallel waveform relaxation on distributed memory machines is performed and their performance implications are studied. The distributed queue approach selected for exploiting the coarse grain parallelism across sub-circuits is described. Parallel waveform relaxation programs based on Gauss-Seidel and Gauss-Jacobi techniques are implemented using a network of eight Transputers. Static and dynamic load balancing strategies are studied. A dynamic load balancing algorithm is developed and implemented. Results of parallel implementation are analyzed to identify sources of bottlenecks. This thesis has demonstrated the applicability of a low cost distributed memory multi-computer system for simulation of MOS VLSI circuits. Speed-up measurements prove that a five times improvement in the speed of calculations can be achieved using a full window parallel Gauss-Jacobi waveform relaxation algorithm. Analysis of overheads shows that load imbalance is the major source of overhead and that the fraction of the computation which must be performed sequentially is very low. Communication overhead depends on the nature of the parallel architecture and the design of communication mechanisms. The run-time environment (parallel processing framework) developed in this research exploits features of the Transputer architecture to reduce the effect of the communication overhead by effectively overlapping computation with communications, and running communications processes at a higher priority. This research will contribute to the development of low cost, high performance workstations for computer-aided design and analysis of VLSI circuits

Signal Delay in General RC Networks with Application to Timing Simulation of Digital Integrated Circuits

Modeling digital MOS circuits by RC networks has become a well accepted practice for estimating delays. In 1981, Penfield and Rubinstein proposed a method to bound the waveforms of nodes in an RC tree network. In this paper, a single value of delay is derived for any node in a general RC network. The effects of parallel connections and stored charges are properly taken into consideration. The algorithms can be used either as a stand-alone simulator, or as a front end for producing initial waveforms for waveform-relaxation based circuit simulators. An experimental simulator called SDS (Signal Delay Simulator) has been developed. For all the examples tested so far, this simulator runs two to three orders of magnitude faster than SPICE, and detects all transitions and glitches at approximately the correct time

Transient fault behavior in a microprocessor: A case study

An experimental analysis is described which studies the susceptibility of a microprocessor based jet engine controller to upsets caused by current and voltage transients. A design automation environment which allows the run time injection of transients and the tracing from their impact device to the pin level is described. The resulting error data are categorized by the charge levels of the injected transients by location and by their potential to cause logic upsets, latched errors, and pin errors. The results show a 3 picoCouloumb threshold, below which the transients have little impact. An Arithmetic and Logic Unit transient is most likely to result in logic upsets and pin errors (i.e., impact the external environment). The transients in the countdown unit are potentially serious since they can result in latched errors, thus causing latent faults. Suggestions to protect the processor against these errors, by incorporating internal error detection and transient suppression techniques, are also made

Integration of continuous-time dynamics in a spiking neural network simulator

Contemporary modeling approaches to the dynamics of neural networks consider two main classes of models: biologically grounded spiking neurons and functionally inspired rate-based units. The unified simulation framework presented here supports the combination of the two for multi-scale modeling approaches, the quantitative validation of mean-field approaches by spiking network simulations, and an increase in reliability by usage of the same simulation code and the same network model specifications for both model classes. While most efficient spiking simulations rely on the communication of discrete events, rate models require time-continuous interactions between neurons. Exploiting the conceptual similarity to the inclusion of gap junctions in spiking network simulations, we arrive at a reference implementation of instantaneous and delayed interactions between rate-based models in a spiking network simulator. The separation of rate dynamics from the general connection and communication infrastructure ensures flexibility of the framework. We further demonstrate the broad applicability of the framework by considering various examples from the literature ranging from random networks to neural field models. The study provides the prerequisite for interactions between rate-based and spiking models in a joint simulation

A parallel algorithm for switch-level timing simulation on a hypercube multiprocessor

The parallel approach to speeding up simulation is studied, specifically the simulation of digital LSI MOS circuitry on the Intel iPSC/2 hypercube. The simulation algorithm is based on RSIM, an event driven switch-level simulator that incorporates a linear transistor model for simulating digital MOS circuits. Parallel processing techniques based on the concepts of Virtual Time and rollback are utilized so that portions of the circuit may be simulated on separate processors, in parallel for as large an increase in speed as possible. A partitioning algorithm is also developed in order to subdivide the circuit for parallel processing

Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system

A simulation study is described which predicts the susceptibility of an advanced control system to electrical transients resulting in logic errors, latched errors, error propagation, and digital upset. The system is based on a custom-designed microprocessor and it incorporates fault-tolerant techniques. The system under test and the method to perform the transient injection experiment are described. Results for 2100 transient injections are analyzed and classified according to charge level, type of error, and location of injection