9 research outputs found
Evaluating the reliability of NAND multiplexing with PRISM
Probabilistic-model checking is a formal verification technique for analyzing the reliability and performance of systems exhibiting stochastic behavior. In this paper, we demonstrate the applicability of this approach and, in particular, the probabilistic-model-checking tool PRISM to the evaluation of reliability and redundancy of defect-tolerant systems in the field of computer-aided design. We illustrate the technique with an example due to von Neumann, namely NAND multiplexing. We show how, having constructed a model of a defect-tolerant system incorporating probabilistic assumptions about its defects, it is straightforward to compute a range of reliability measures and investigate how they are affected by slight variations in the behavior of the system. This allows a designer to evaluate, for example, the tradeoff between redundancy and reliability in the design. We also highlight errors in analytically computed reliability bounds, recently published for the same case study
Evaluating the reliability of NAND multiplexing with PRISM
Probabilistic-model checking is a formal verification technique for analyzing the reliability and performance of systems exhibiting stochastic behavior. In this paper, we demonstrate the applicability of this approach and, in particular, the probabilistic-model-checking tool PRISM to the evaluation of reliability and redundancy of defect-tolerant systems in the field of computer-aided design. We illustrate the technique with an example due to von Neumann, namely NAND multiplexing. We show how, having constructed a model of a defect-tolerant system incorporating probabilistic assumptions about its defects, it is straightforward to compute a range of reliability measures and investigate how they are affected by slight variations in the behavior of the system. This allows a designer to evaluate, for example, the tradeoff between redundancy and reliability in the design. We also highlight errors in analytically computed reliability bounds, recently published for the same case study
Should We Learn Probabilistic Models for Model Checking? A New Approach and An Empirical Study
Many automated system analysis techniques (e.g., model checking, model-based
testing) rely on first obtaining a model of the system under analysis. System
modeling is often done manually, which is often considered as a hindrance to
adopt model-based system analysis and development techniques. To overcome this
problem, researchers have proposed to automatically "learn" models based on
sample system executions and shown that the learned models can be useful
sometimes. There are however many questions to be answered. For instance, how
much shall we generalize from the observed samples and how fast would learning
converge? Or, would the analysis result based on the learned model be more
accurate than the estimation we could have obtained by sampling many system
executions within the same amount of time? In this work, we investigate
existing algorithms for learning probabilistic models for model checking,
propose an evolution-based approach for better controlling the degree of
generalization and conduct an empirical study in order to answer the questions.
One of our findings is that the effectiveness of learning may sometimes be
limited.Comment: 15 pages, plus 2 reference pages, accepted by FASE 2017 in ETAP
Reachability in Parametric Interval Markov Chains using Constraints
Parametric Interval Markov Chains (pIMCs) are a specification formalism that
extend Markov Chains (MCs) and Interval Markov Chains (IMCs) by taking into
account imprecision in the transition probability values: transitions in pIMCs
are labeled with parametric intervals of probabilities. In this work, we study
the difference between pIMCs and other Markov Chain abstractions models and
investigate the two usual semantics for IMCs: once-and-for-all and
at-every-step. In particular, we prove that both semantics agree on the
maximal/minimal reachability probabilities of a given IMC. We then investigate
solutions to several parameter synthesis problems in the context of pIMCs --
consistency, qualitative reachability and quantitative reachability -- that
rely on constraint encodings. Finally, we propose a prototype implementation of
our constraint encodings with promising results
Parameter Synthesis for Markov Models
Markov chain analysis is a key technique in reliability engineering. A
practical obstacle is that all probabilities in Markov models need to be known.
However, system quantities such as failure rates or packet loss ratios, etc.
are often not---or only partially---known. This motivates considering
parametric models with transitions labeled with functions over parameters.
Whereas traditional Markov chain analysis evaluates a reliability metric for a
single, fixed set of probabilities, analysing parametric Markov models focuses
on synthesising parameter values that establish a given reliability or
performance specification . Examples are: what component failure rates
ensure the probability of a system breakdown to be below 0.00000001?, or which
failure rates maximise reliability? This paper presents various analysis
algorithms for parametric Markov chains and Markov decision processes. We focus
on three problems: (a) do all parameter values within a given region satisfy
?, (b) which regions satisfy and which ones do not?, and (c)
an approximate version of (b) focusing on covering a large fraction of all
possible parameter values. We give a detailed account of the various
algorithms, present a software tool realising these techniques, and report on
an extensive experimental evaluation on benchmarks that span a wide range of
applications.Comment: 38 page
Cross-layer Soft Error Analysis and Mitigation at Nanoscale Technologies
This thesis addresses the challenge of soft error modeling and mitigation in nansoscale technology nodes and pushes the state-of-the-art forward by proposing novel modeling, analyze and mitigation techniques. The proposed soft error sensitivity analysis platform accurately models both error generation and propagation starting from a technology dependent device level simulations all the way to workload dependent application level analysis