Data reliability and error correction for NAND Flash Memory System

NAND flash memory has been widely used for data storage due to its high density, high throughput, and low power. However, as the flash memory scales to smaller process technologies and stores more bits per cell, its reliability is decreasing. The error correction coding can be used to significantly improve the data reliability; nevertheless, the advanced ECCs such as low-density parity-check (LDPC) codes generally demand soft decisions while NAND flash memory channel provides hard-decisions only. Extracting the soft information requires the accurate characterization of flash memory channel and the effective design of coding schemes. To this end, we have presented a novel LDPC-TCM coding scheme for the Multilevel Cell (MLC) flash memories. The a posteriori TCM decoding algorithm is used in the scheme to generate soft information, which is fed to the LDPC decoder for further correction of data bits. It has been demonstrated that the proposed scheme can achieve higher error correction performance than the traditional hard-decisions based flash coding algorithms, and is feasible in the design practice. Further with the LDPC-TCM, we believe it is important to characterize the flash memory channel and investigate a method to calculate the soft decision for each bit, with the available channel outputs. We studied the various noises and interferences occurring in the memory channel and mathematically formulated the probability density function of the overall noise distribution. Based on the results we derived the final distribution for the cell threshold voltages, which can be used to instruct the calculation of soft decisions. The discoveries on the theoretical level have been demonstrated to be consistent with the real channel behaviours. The channel characterization and model provided in this dissertation can enable more design of soft-decisions based ECCs for future NAND flash memories. The data pattern processing algorithm deals with the write patterns and targets to lower the proportion of patterns that would introduce data errors. On the other hand, the voltages applied to the memory cells charges the MOSFET capacitances frequently on programming these data patterns, leading to the power problem. The high energy consumption and current spikes also cause reliability issue to the data stored in the flash memory. This dissertation proposes a write pattern formatting algorithm (WPFA) attempting to solve the two problems together. We have designed and implemented the algorithm and evaluated its performance through both the software simulations and hardware synthesis

낸드플래시 메모리 오류정정을 위한 고성능 LDPC 복호방법 연구

학위논문 (박사)-- 서울대학교 대학원 : 전기·컴퓨터공학부, 2013. 8. 성원용.반도체 공정의 미세화에 따라 비트 에러율이 증가하는 낸드 플래시 메모리에서 고성능 에러 정정 방법은 필수적이다. Low-density parity-check (LDPC) 부호와 같은 연판정 에러 정정 부호는 뛰어난 에러 정정 성능을 보이지만, 높은 구현 복잡도로 인해 플래시 메모리 시스템에 적용되기 힘든 단점이 있다. 본 논문에서는 LDPC 부호의 효율적인 복호를 위해 고성능 메시지 전파 스케줄링 방법과 저 복잡도 복호 알고리즘을 제안한다. 특히 finite geometry (FG) LDPC 부호에 대한 효율적인 디코더 아키텍쳐를 제안하며, 구현된 디코더를 이용하여 낸드 플래시 메모리에 대해 연판정 복호시의 에너지 소모량에 대해 연구한다. 본 논문의 첫 번째 부분에서는 동적 스케줄링 (informed dynamic scheduling, IDS) 알고리즘의 성능향상 방법에 대해 연구한다. 이를 위해 우선 기존의 가장 빠른 수렴 속도를 보이는 IDS 알고리즘인 레지듀얼 신뢰 전파 (residual belief propagation, RBP) 알고리즘의 동작 특성을 분석하고, 이를 바탕으로 특정 노드에 메시지 갱신이 집중되는 것을 방지하여 RBP 알고리즘의 수렴속도를 증가시킨 improved RBP (iRBP) 알고리즘을 제안한다. 또한 iRBP의 뛰어난 수렴속도와 기존의 NS 알고리즘의 우수한 에러 정정 능력을 모두 갖춘 신드롬 기반의 혼합 스케줄링 (mixed scheduling) 방법을 제안한다. 끝으로 다양한 부호율의 LDPC 부호에 대한 모의실험을 통해 제안된 신드롬 기반의 혼합 스케줄링 방법이 본 논문에서 시험된 다른 모든 스케줄링 알고리즘의 성능을 능가함을 확인하였다. 논문의 두 번째 부분에서는 복호 실패시 많은 비트 에러를 발생시키는 a posteriori probability (APP) 알고리즘의 개선 방안에 방안을 제안한다. 또한 빠른 수렴속도와 우수한 에러 마루 (error-floor) 성능으로 데이터 저장장치에 적합한 FG-LDPC 부호에 대해 제안된 알고리즘이 적용된 하드웨어 아키텍처를 제안하였다. 제안된 아키텍처는 높은 노드 가중치를 가지는 FG-LDPC 부호에 적합하도록 쉬프트 레지스터 (shift registers)와 SRAM 기반의 혼합 구조를 채용하며, 높은 처리량을 얻기 위해 파이프라인된 병렬 아키텍처를 사용한다. 또한 메모리 사용량을 줄이기 위해 세 가지의 메모리 용량 감소 기법을 적용하며, 전력 소비를 줄이기 위해 두 가지의 저전력 기법을 제안한다. 본 제안된 아키텍처는 부호율 0.96의 (68254, 65536) Euclidean geometry LDPC 부호에 대해 0.13-um CMOS 공정에서 구현하였다. 마지막으로 본 논문에서는 연판정 복호가 적용된 낸드 플래시 메모리 시스템의 에너지 소모를 낮추는 방법에 대해 제안한다. 연판정 기반의 에러 정정 알고리즘은 높은 성능을 보이지만, 이는 플래시 메모리의 센싱 수와 에너지 소모를 증가 시키는 단점이 있다. 본 연구에서는 앞서 구현된 LDPC 디코더가 채용된 낸드 플래시 메모리 시스템의 에너지 소모를 분석하고, LDPC 디코더와 BCH 디코더 간의 칩 사이즈와 에너지 소모량을 비교하였다. 이와 더불어 본 논문에서는 LDPC 디코더를 이용한 센싱 정밀도 결정 방법을 제안한다. 본 연구를 통해 제안된 복호 및 스케줄링 알고리즘, VLSI 아키텍쳐, 그리고 읽기 정밀도 결정 방법을 통해 낸드 플래시 메모리 시스템의 에러 정정 성능을 극대화 하고 에너지 소모를 최소화 할 수 있다.High-performance error correction for NAND flash memory is greatly needed because the raw bit error rate increases as the semiconductor geometry shrinks for high density. Soft-decision error correction, such as low-density parity-check (LDPC) codes, offers high performance but their implementation complexity hinders wide adoption to consumer products. This dissertation proposes two high-performance message-passing schedules and a low-complexity decoding algorithm for LDPC codes. In particular, an efficient decoder architecture for finite geometry (FG) LDPC codes is proposed, and the energy consumption of soft-decision decoding for NAND flash memory is analyzed. The first part of this dissertation is devoted to improving the informed dynamic scheduling (IDS) algorithms. We analyze the behavior of the residual belief propagation (RBP), which is the fastest IDS algorithm, and develop an improved RBP (iRBP) by avoiding the concentration of message updates at a particular node. We also study the syndrome-based mixed scheduling of the iRBP and the node-wise scheduling (NS). The proposed mixed scheduling outperforms all other scheduling methods tested in this work. The next part of this dissertation is to develop a conditional variable node update scheme for the a posteriori probability (APP) algorithm. The developed algorithm is robust to decoding failures and can reduce the dynamic power consumption by lowering switching activities in the LDPC decoder. To implement the developed algorithm, we propose a memory-efficient pipelined parallel architecture for LDPC decoding. The architecture employs FG-LDPC codes that not only show fast convergence speed and good error-floor performance but also perform well with iterative decoding algorithms, which is especially suitable for data storage devices. We also developed a rate-0.96 (68254, 65536) Euclidean geometry LDPC code and implemented the proposed architecture in 0.13-um CMOS technology. This dissertation also covers low-energy error correction of NAND flash memory through soft-decision decoding. The soft-decision-based error correction algorithms show high performance, but they demand an increased number of flash memory sensing operations and consume more energy for memory access. We examine the energy consumption of a NAND flash memory system equipping an LDPC code-based soft-decision error correction circuit. The sum of energy consumed at NAND flash memory and the LDPC decoder is minimized. In addition, the chip size and energy consumption of the decoder were compared with those of two Bose-Chaudhuri-Hocquenghem (BCH) decoding circuits showing the comparable error performance and the throughput. We also propose an LDPC decoder-assisted precision selection method that needs virtually no overhead. This dissertation is intended to develop high-performance and low-power error correction circuits for NAND flash memory by studying improved decoding and scheduling algorithms, VLSI architecture, and a read precision selection method.1 Introduction 1 1.1 NAND Flash Memory 1 1.2 LDPC Codes 4 1.3 Outline of the Dissertation 6 2 LDPC Decoding and Scheduling Algorithms 8 2.1 Introduction 8 2.2 Decoding Algorithms for LDPC Codes 10 2.2.1 Belief Propagation Algorithm 10 2.2.2 Simplified Belief Propagation Algorithms 12 2.3 Message-Passing Schedules for Decoding of LDPC Codes 15 2.3.1 Static Schedules 15 2.3.2 Dynamic Schedules 17 3 Improved Dynamic Scheduling Algorithms for Decoding of LDPC Codes 22 3.1 Introduction 22 3.2 Improved Residual Belief Propagation Algorithm 23 3.3 Syndrome-Based Mixed Scheduling of iRBP and NS 26 3.4 Complexity Analysis and Simulation Results 28 3.4.1 Complexity Analysis 28 3.4.2 Simulation Results 29 3.5 Concluding Remarks 33 4 A Pipelined Parallel Architecture for Decoding of Finite-Geometry LDPC Codes 36 4.1 Introduction 36 4.2 Finite-Geometry LDPC Codes and Conditional Variable Node Update Algorithm 38 4.2.1 Finite-Geometry LDPC codes 38 4.2.2 Conditional Variable Node Update Algorithm for Fixed-Point Normalized APP-Based Algorithm 40 4.3 Decoder Architecture 46 4.3.1 Baseline Sequential Architecture 46 4.3.2 Pipelined-Parallel Architecture 54 4.3.3 Memory Capacity Reduction 57 4.4 Implementation Results 60 4.5 Concluding Remarks 64 5 Low-Energy Error Correction of NAND Flash Memory through Soft-Decision Decoding 66 5.1 Introduction 66 5.2 Energy Consumption of Read Operations in NAND Flash Memory 67 5.2.1 Voltage Sensing Scheme for Soft-Decision Data Output 67 5.2.2 LSB and MSB Concurrent Access Scheme for Low-Energy Soft-Decision Data Output 72 5.2.3 Energy Consumption of Read Operations in NAND Flash Memory 73 5.3 The Performance of Soft-Decision Error Correction over a NAND Flash Memory Channel 76 5.4 Hardware Performance of the (68254, 65536) LDPC Decoder 81 5.4.1 Energy Consumption of the LDPC Decoder 81 5.4.2 Performance Comparison of the LDPC Decoder and Two BCH Decoders 83 5.5 Low-Energy Error Correction Scheme for NAND Flash Memory 87 5.5.1 Optimum Precision for Low-Energy Decoding 87 5.5.2 Iteration Count-Based Precision Selection 90 5.6 Concluding Remarks 91 6 Conclusion 94 Bibliography 96 Abstract in Korean 110 감사의 글 112Docto

Flash Memory Devices

Flash memory devices have represented a breakthrough in storage since their inception in the mid-1980s, and innovation is still ongoing. The peculiarity of such technology is an inherent flexibility in terms of performance and integration density according to the architecture devised for integration. The NOR Flash technology is still the workhorse of many code storage applications in the embedded world, ranging from microcontrollers for automotive environment to IoT smart devices. Their usage is also forecasted to be fundamental in emerging AI edge scenario. On the contrary, when massive data storage is required, NAND Flash memories are necessary to have in a system. You can find NAND Flash in USB sticks, cards, but most of all in Solid-State Drives (SSDs). Since SSDs are extremely demanding in terms of storage capacity, they fueled a new wave of innovation, namely the 3D architecture. Today “3D” means that multiple layers of memory cells are manufactured within the same piece of silicon, easily reaching a terabit capacity. So far, Flash architectures have always been based on "floating gate," where the information is stored by injecting electrons in a piece of polysilicon surrounded by oxide. On the contrary, emerging concepts are based on "charge trap" cells. In summary, flash memory devices represent the largest landscape of storage devices, and we expect more advancements in the coming years. This will require a lot of innovation in process technology, materials, circuit design, flash management algorithms, Error Correction Code and, finally, system co-design for new applications such as AI and security enforcement

Algorithms and Data Representations for Emerging Non-Volatile Memories

The evolution of data storage technologies has been extraordinary. Hard disk drives that fit in current personal computers have the capacity that requires tons of transistors to achieve in 1970s. Today, we are at the beginning of the era of non-volatile memory (NVM). NVMs provide excellent performance such as random access, high I/O speed, low power consumption, and so on. The storage density of NVMs keeps increasing following Moore’s law. However, higher storage density also brings significant data reliability issues. When chip geometries scale down, memory cells (e.g. transistors) are aligned much closer to each other, and noise in the devices will become no longer negligible. Consequently, data will be more prone to errors and devices will have much shorter longevity. This dissertation focuses on mitigating the reliability and the endurance issues for two major NVMs, namely, NAND flash memory and phase-change memory (PCM). Our main research tools include a set of coding techniques for the communication channels implied by flash memory and PCM. To approach the problems, at bit level we design error correcting codes tailored for the asymmetric errors in flash and PCM, we propose joint coding scheme for endurance and reliability, error scrubbing methods for controlling storage channel quality, and study codes that are inherently resisting to typical errors in flash and PCM; at higher levels, we are interested in analyzing the structures and the meanings of the stored data, and propose methods that pass such metadata to help further improve the coding performance at bit level. The highlights of this dissertation include the first set of write-once memory code constructions which correct a significant number of errors, a practical framework which corrects errors utilizing the redundancies in texts, the first report of the performance of polar codes for flash memories, and the emulation of rank modulation codes in NAND flash chips

Energy-Efficient Decoders of Near-Capacity Channel Codes.

Channel coding has become essential in state-of-the-art communication and storage systems for ensuring reliable transmission and storage of information. Their goal is to achieve high transmission reliability while keeping the transmit energy consumption low by taking advantage of the coding gain provided by these codes. The lowest total system energy is achieved with a decoder that provides both good coding gain and high energy-efficiency. This thesis demonstrates the VLSI implementation of near-capacity channel decoders using the LDPC, nonbinary LDPC (NB-LDPC) and polar codes with an emphasis of reducing the decode energy. LDPC code is a widely used channel code due to its excellent error-correcting performance. However, memory dominates the power of high-throughput LDPC decoders. Therefore, these memories are replaced with a novel non-refresh embedded DRAM (eDRAM) taking advantage of the deterministic memory access pattern and short access window of the decoding algorithm to trade off retention time for faster access speed. The resulting LDPC decoder with integrated eDRAMs achieves state-of-the-art area- and energy-efficiency. NB-LDPC code achieves better error-correcting performance than LDPC code at the cost of higher decoding complexity. However, the factor graph is simplified, permitting a fully parallel architecture with low wiring overhead. To reduce the dynamic power of the decoder, a fine-grained dynamic clock gating technique is applied based on node-level convergence. This technique greatly reduces dynamic power allowing the decoder to achieve high energy-efficiency while achieving high throughput. The recently invented polar code has a similar error-correcting performance to LDPC code of comparable block length. However, the easy reconfigurability of code rate as well as block length makes it desirable in numerous applications where LDPC is not competitive. In addition, the regular structure and simple processing enables a highly efficient decoder in terms of area and power. Using the belief propagation algorithm with architectural and memory improvements, a polar decoder is demonstrated achieving high throughput and high energy- and area-efficiency. The demonstrated energy-efficient decoders have advanced the state-of-the-art. The decoders will allow the continued reduction of decode energy for the latest communication and storage applications. The developed techniques are widely applicable to designing low-power DSP processors.PhDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/108731/1/parkyoun_1.pd

Error Characterization and Correction Techniques for Reliable STT-RAM Designs

The concerns on the continuous scaling of mainstream memory technologies have motivated tremendous investment to emerging memories. Being a promising candidate, spin-transfer torque random access memory (STT-RAM) offers nanosecond access time comparable to SRAM, high integration density close to DRAM, non-volatility as Flash memory, and good scalability. It is well positioned as the replacement of SRAM and DRAM for on-chip cache and main memory applications. However, reliability issue continues being one of the major challenges in STT-RAM memory designs due to the process variations and unique thermal fluctuations, i.e., the stochastic resistance switching property of magnetic devices. In this dissertation, I decoupled the reliability issues as following three-folds: First, the characterization of STT-RAM operation errors often require expensive Monte-Carlo runs with hybrid magnetic-CMOS simulation steps, making it impracticable for architects and system designs; Second, the state of the art does not have sufficiently understanding on the unique reliability issue of STT-RAM, and conventional error correction codes (ECCs) cannot efficiently handle such errors; Third, while the information density of STT-RAM can be boosted by multi-level cell (MLC) design, the more prominent reliability concerns and the complicated access mechanism greatly limit its applications in memory subsystems. Thus, I present a novel through solution set to both characterize and tackle the above reliability challenges in STT-RAM designs. In the first part of the dissertation, I introduce a new characterization method that can accurately and efficiently capture the multi-variable design metrics of STT-RAM cells; Second, a novel ECC scheme, namely, content-dependent ECC (CD-ECC), is developed to combat the characterized asymmetric errors of STT-RAM at 0->1 and 1->0 bit flipping's; Third, I present a circuit-architecture design, namely state-restricted multi-level cell (SR-MLC) STT-RAM design, which simultaneously achieves high information density, good storage reliability and fast write speed, making MLC STT-RAM accessible for system designers under current technology node. Finally, I conclude that efficient robust (or ECC) designs for STT-RAM require a deep holistic understanding on three different levels-device, circuit and architecture. Innovative ECC schemes and their architectural applications, still deserve serious research and investigation in the near future