Temperature and Voltage Estimation Using Ring-Oscillator-Based Monitor for Field Test

Field test is performed in diverse environments, in which temperature varies across a wide range. As temperature affects a circuit delay greatly, accurate temperature monitors are required. They should be placed at various locations on a chip including hot spots. This paper proposes a flexible ring-oscillator-based monitor that accurately measures voltage as well as temperature at the same time. The measurement accuracy was confirmed by circuit simulation for 180 nm, 90 nm and 45 nm technologies. An experiment using test chips with 180 nm technology shows its feasibility.2014 IEEE 23rd Asian Test Symposium (ATS), 16-19 Nov. 2014, Hangzhou, Chin

Towards on-chip time-resolved thermal mapping with micro-/nanosensor arrays

In recent years, thin-film thermocouple (TFTC) array emerged as a versatile candidate in micro-/nanoscale local temperature sensing for its high resolution, passive working mode, and easy fabrication. However, some key issues need to be taken into consideration before real instrumentation and industrial applications of TFTC array. In this work, we will demonstrate that TFTC array can be highly scalable from micrometers to nanometers and that there are potential applications of TFTC array in integrated circuits, including time-resolvable two-dimensional thermal mapping and tracing the heat source of a device. Some potential problems and relevant solutions from a view of industrial applications will be discussed in terms of material selection, multiplexer reading, pattern designing, and cold-junction compensation. We show that the TFTC array is a powerful tool for research fields such as chip thermal management, lab-on-a-chip, and other novel electrical, optical, or thermal devices

Using temperature as observable of the frequency response of RF CMOS amplifiers

The power dissipated by the devices of an integrated circuit can be considered a signature of the circuit's performance. Without disturbing the circuit operation, this power consumption can be monitored by temperature measurements on the silicon surface. In this paper, the frequency response of a RF LNA is observed by measuring spectral components of the sensed temperature. Results prove that temperature can be used to debug and observe figures of merit of analog blocks in a RFIC. Experimental measurements have been done in a 0.25 mum CMOS process. Laser probing techniques have been used as temperature sensors; specifically, a thermoreflectometer and a Michaelson interferometer.Peer ReviewedPostprint (author's final draft

Differential temperature sensors: Review of applications in the test and characterization of circuits, usage and design methodology

Differential temperature sensors can be placed in integrated circuits to extract a signature ofthe power dissipated by the adjacent circuit blocks built in the same silicon die. This review paper firstdiscusses the singularity that differential temperature sensors provide with respect to other sensortopologies, with circuit monitoring being their main application. The paper focuses on the monitoringof radio-frequency analog circuits. The strategies to extract the power signature of the monitoredcircuit are reviewed, and a list of application examples in the domain of test and characterizationis provided. As a practical example, we elaborate the design methodology to conceive, step bystep, a differential temperature sensor to monitor the aging degradation in a class-A linear poweramplifier working in the 2.4 GHz Industrial Scientific Medical—ISM—band. It is discussed how,for this particular application, a sensor with a temperature resolution of 0.02 K and a high dynamicrange is required. A circuit solution for this objective is proposed, as well as recommendations for thedimensions and location of the devices that form the temperature sensor. The paper concludes with adescription of a simple procedure to monitor time variability.Postprint (published version

BPF-based thermal sensor circuit for on-chip testing of RF circuits

A new sensor topology meant to extract figures of merit of radio-frequency analog integrated circuits (RF-ICs) was experimentally validated. Implemented in a standard 0.35 µm complementary metal-oxide-semiconductor (CMOS) technology, it comprised two blocks: a single metaloxide-semiconductor (MOS) transistor acting as temperature transducer, which was placed near the circuit to monitor, and an active band-pass filter amplifier. For validation purposes, the temperature sensor was integrated with a tuned radio-frequency power amplifier (420 MHz) and MOS transistors acting as controllable dissipating devices. First, using the MOS dissipating devices, the performance and limitations of the different blocks that constitute the temperature sensor were characterized. Second, by using the heterodyne technique (applying two nearby tones) to the power amplifier (PA) and connecting the sensor output voltage to a low-cost AC voltmeter, the PA’s output power and its central frequency were monitored. As a result, this topology resulted in a low-cost approach, with high linearity and sensitivity, for RF-IC testing and variability monitoring.This research was funded by Spanish AEI–Agencia Estatal de Investigación–grant number PID2019-103869RB-C33. (X.P.) has also received founds from the Spanish Ministry of Science, Innovation and Universities through Agencia Estatal de Investigación (AEI) (projects: HIPERCELLS, RTI2018-098392B-I00, and “Fiabilidad Inteligente”, PCI2020-112028).Peer ReviewedPostprint (published version

Analytical approach to design of proportional-to-the-absolute-temperature current sources and temperature sensors based on heterojunction bipolar transistors

Embedded temperature sensors based on proportional-to-the-absolute-temperature (PTAT) current sources have the potential to lay the foundation for low-cost temperature-aware integrated circuit architectures if they meet the requirements of miniaturization, fabrication process match, and precise estimation in a wide range of temperatures. This paper addresses an analytical approach to the minimum-element PTAT circuit design capitalizing on the physics-based modeling of the heterojunction bipolar transistor (HBT) structures. It is shown that a PTAT circuit can be implemented on only two core HBT elements with good accuracy. Derived parametric relations allow a straightforward specification of the thermal gain at the design stage, which affects sensor sensitivity. Further derived current-to-temperature mapping expresses a temperature estimate based on the measured PTAT output current. Numerical examples indicate attainable estimation accuracy of 0.43% in case of a measurement instance taken in the absence of measurement noise.The National Research Foundation of South Africa under Grant UID:74041http://ieeexplore.ieee.org/hb2013ai201

Hardware-Software Integrated Silicon Photonic Systems

Fabrication of integrated photonic devices and circuits in a CMOS-compatible process or foundry is the essence of the silicon photonic platform. Optical devices in this platform are enabled by the high index contrast between silicon and silicon on insulator. These devices offer potential benefits when integrated with existing and emerging high performance microelectronics. Integration of silicon photonics with small footprints and power-efficient and high-bandwidth operation has long been cited as a solution to existing issues in high performance interconnects for telecommunications and data communication. Stemming from this historic application in communications, new applications in sensing arrays, biochemistry, and even entertainment continue to grow. However, for many technologies to successfully adopt silicon photonics and reap the perceived benefits, the silicon photonic platform must extend toward development of a full ecosystem. Such extension includes implementation of low cost and robust electronic-photonic packaging techniques for all applications. In an ecosystem implemented with services ranging from device fabrication all the way to packaged products, ease-of-use and ease-of-deployment in systems that require many hardware and software components becomes possible. With the onset of the Internet of Things (IoT), nearly all technologies—sensors, compute, communication devices, etc.—persist in systems with some level of localized or distributed software interaction. These interactions often require a level of networked communications. For silicon photonics to penetrate technologies comprising IoT, it is advantageous to implement such devices in a hardware-software integrated way. Meaning, all functionalities and interactions related to the silicon photonic devices are well defined in terms of the physicality of the hardware. This hardware is then abstracted into various levels of software as needed in the system. The power of hardware-software integration allows many of the piece-wise demonstrated functionalities of silicon photonics to easily translate to commercial implementation. This work begins by briefly highlighting the challenges and solutions for transforming existing silicon photonic platforms to a full-fledged silicon photonic ecosystem. The highlighted solutions in development consist of tools for fabrication, testing, subsystem packaging, and system validation. Building off the knowledge of a silicon photonic ecosystem in development, this work continues by demonstrating various levels of hardware-software integration. These are primarily focused on silicon photonic interconnects. The first hardware-software integration-focused portion of this work explores silicon microring-based devices as a key building block for greater silicon photonic subsystems. The microring’s sensitivity to thermal fluctuations is identified not as a flaw, but as a tool for functionalization. A logical control system is implemented to mitigate thermal effects that would normally render a microring resonator inoperable. The mechanism to control the microring is extended and abstracted with software programmability to offer wavelength routing as a network primitive. This functionality, available through hardware-software integration, offers the possibility for ubiquitous deployment of such microring devices in future photonic interconnection networks. The second hardware-software integration-focused portion of this work explores dynamic silicon photonic switching devices and circuits. Specifically, interactions with and implications of high-speed data propagation and link layer control are demonstrated. The characteristics of photonic link setup include transients due to physical layer optical effects, latencies involved with initializing burst mode links, and optical link quality. The impacts on the functionalities and performance offered by photonic devices are explored. An optical network interface platform is devised using FPGAs to encapsulate hardware and software for controlling these characteristics using custom hardware description language, firmware, and software. A basic version of a silicon photonic network controller using FPGAs is used as a tool to demonstrate a highly scalable switch architecture using microring resonators. This architecture would not be possible without some semblance of this controller, combined with advanced electronic-photonic packaging. A more advanced deployment of the network interface platform is used to demonstrate a method for accelerating photonic links using out-of-band arbitration. A first demonstration of this platform is performed on a silicon photonic microring router network. A second demonstration is used to further explore the feasibility of full hardware-software integrated photonic device actuation, link layer control, and out-of-band arbitration. The demonstration is performed on a complete silicon photonic network with both spatial switching and wavelength routing functionalities. The aforementioned hardware-software integration mechanisms are rigorously tested for data communications applications. Capabilities are shown for very reliable, low latency, and dynamic high-speed data delivery using silicon photonic devices. Applying these mechanisms to complete electronic-photonic packaged subsystems provides a strong path to commercial manifestations of functional silicon photonic devices

Monitor amb control strategies to reduce the impact of process variations in digital circuits

As CMOS technology scales down, Process, Voltage, Temperature and Ageing (PVTA) variations have an increasing impact on the performance and power consumption of electronic devices. These issues may hold back the continuous improvement of these devices in the near future. There are several ways to face the variability problem: to increase the operating margins of maximum clock frequency, the implementation of lithographic friendly layout styles, and the last one and the focus of this thesis, to adapt the circuit to its actual manufacturing and environment conditions by tuning some of the adjustable parameters once the circuit has been manufactured. The main challenge of this thesis is to develop a low-area variability compensation mechanism to automatically mitigate PVTA variations in run-time, i.e. while integrated circuit is running. This implies the development of a sensor to obtain the most accurate picture of variability, and the implementation of a control block to knob some of the electrical parameters of the circuit.A mesura que la tecnologia CMOS escala, les variacions de Procés, Voltatge, Temperatura i Envelliment (PVTA) tenen un impacte creixent en el rendiment i el consum de potència dels dispositius electrònics. Aquesta problemàtica podria arribar a frenar la millora contínua d'aquests dispositius en un futur proper. Hi ha diverses maneres d'afrontar el problema de la variabilitat: relaxar el marge de la freqüència màxima d'operació, implementar dissenys físics de xips més fàcils de litografiar, i per últim i com a tema principal d'aquesta tesi, adaptar el xip a les condicions de fabricació i d'entorn mitjançant la modificació d'algun dels seus paràmetres ajustables una vegada el circuit ja ha estat fabricat. El principal repte d'aquesta tesi és desenvolupar un mecanisme de compensació de variabilitat per tal de mitigar les variacions PVTA de manera automàtica en temps d'execució, és a dir, mentre el xip està funcionant. Això implica el desenvolupament d'un sensor capaç de mesurar la variabilitat de la manera més acurada possible, i la implementació d'un bloc de control que permeti l'ajust d'alguns dels paràmetres elèctrics dels circuits

Dynamic surface temperature measurements in ICs

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