5,539 research outputs found

    A Web-Based Distributed Virtual Educational Laboratory

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    Evolution and cost of measurement equipment, continuous training, and distance learning make it difficult to provide a complete set of updated workbenches to every student. For a preliminary familiarization and experimentation with instrumentation and measurement procedures, the use of virtual equipment is often considered more than sufficient from the didactic point of view, while the hands-on approach with real instrumentation and measurement systems still remains necessary to complete and refine the student's practical expertise. Creation and distribution of workbenches in networked computer laboratories therefore becomes attractive and convenient. This paper describes specification and design of a geographically distributed system based on commercially standard components

    A Lens-Calibrated Active Marker Metrology System

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    This paper presents a prototypical marker tracking system, MT, which is capable of recording multiple mobile robot trajectories in parallel for offline analysis. The system is also capable of providing trajectory data in realtime to agents (such as robots in an arena) and implements several multi-agent operators to simplify agent-based perception. The latter characteristic provides an ability to minimise the normally expensive process of implementing agent-centric perceptual mechanisms and provides a means for multiagent "global knowledge" (Parker 1993)

    Computer aided inspection procedures to support smart manufacturing of injection moulded components

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    This work presents Reverse Engineering and Computer Aided technologies to improve the inspection of injection moulded electro-mechanical parts. Through a strong integration and automation of these methods, tolerance analysis, acquisition tool-path optimization and data management are performed. The core of the procedure concerns the automation of the data measure originally developed through voxel-based segmentation. This paper discusses the overall framework and its integration made according to Smart Manufacturing requirements. The experimental set-up, now in operative conditions at ABB SACE, is composed of a laser scanner installed on a CMM machine able to measure components with lengths in the range of 5Ă·250 mm, (b) a tool path optimization procedure and (c) a data management both developed as CAD-based applications

    A flexible modular master programme in technology developped whithin a Tempus Project

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    In today’s competitive industry and in view of recent economic turbulences new frontiers of challenges emerge that require new educational paradigms accompanied by new tools and methodologies applicable to all aspects of engineering areas including the functional and organizational aspects. In accordance with the objectives stipulated by the Council of European Union work programme on the future of education and training, a Tempus project (2010-2013) has been mounted to develop a novel model for modular programmes to be used in education of technology specialities at master level. The model is implemented in manufacturing technology and management area and has general applicability for technology education in several fields. The main feature of this project consists in flexibility, adaptability, dynamic interactivity while consolidating theoretical and practical skills. MasTech is the name of a flexible modular master two-year programme in technology being developed according to the Bologna process that is to be adapted to the particular conditions of the universities in Algeria, Morocco and Tunisia. Three European Universities (Sweden, Germany, France) are involved in the project. This paper introduces MasTech and describes the different steps that have been followed to develop the master programme taking into account both academic and industrial needs and priorities. Results are expressed in terms of a professional master programme that has been submitted for accreditation.TEMPUS - MASTECH -2010 - 3369 / 001 - 00

    Development of a Coordinate Measuring Machine-Based Inspection Planning System for Industry 4.0

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    Industry 4.0 represents a new paradigm which creates new requirements in the area of manufacturing and manufacturing metrology such as to reduce the cost of product, flexibility, mass customization, quality of product, high level of digitalization, optimization, etc., all of which contribute to smart manufacturing and smart metrology systems. This paper presents a developed inspection planning system based on CMM as support of the smart metrology within Industry 4.0 or manufacturing metrology 4.0 (MM4.0). The system is based on the application of three AI techniques such as engineering ontology (EO), GA and ants colony optimization (ACO). The developed system consists of: the ontological knowledge base; the mathematical model for generating strategy of initial MP; the model of analysis and optimization of workpiece setups and probe configuration; the path simulation model in MatLab, PTC Creo and STEP-NC Machine software, and the model of optimization MP by applying ACO. The advantage of the model is its suitability for monitoring of the measurement process and digitalization of the measurement process planning, simulation carried out and measurement verification based on CMM, reduction of the preparatory measurement time as early as in the inspection planning phase and minimizing human involvement or human errors through intelligent planning, which directly influences increased production efficiency, competitiveness, and productivity of enterprises. The measuring experiment was performed using a machined prismatic workpiece (PW)

    Development of a Coordinate Measuring Machine-Based Inspection Planning System for Industry 4.0

    Get PDF
    Industry 4.0 represents a new paradigm which creates new requirements in the area of manufacturing and manufacturing metrology such as to reduce the cost of product, flexibility, mass customization, quality of product, high level of digitalization, optimization, etc., all of which contribute to smart manufacturing and smart metrology systems. This paper presents a developed inspection planning system based on CMM as support of the smart metrology within Industry 4.0 or manufacturing metrology 4.0 (MM4.0). The system is based on the application of three AI techniques such as engineering ontology (EO), GA and ants colony optimization (ACO). The developed system consists of: the ontological knowledge base; the mathematical model for generating strategy of initial MP; the model of analysis and optimization of workpiece setups and probe configuration; the path simulation model in MatLab, PTC Creo and STEP-NC Machine software, and the model of optimization MP by applying ACO. The advantage of the model is its suitability for monitoring of the measurement process and digitalization of the measurement process planning, simulation carried out and measurement verification based on CMM, reduction of the preparatory measurement time as early as in the inspection planning phase and minimizing human involvement or human errors through intelligent planning, which directly influences increased production efficiency, competitiveness, and productivity of enterprises. The measuring experiment was performed using a machined prismatic workpiece (PW)

    A review of data mining applications in semiconductor manufacturing

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    The authors acknowledge Fundacao para a Ciencia e a Tecnologia (FCT-MCTES) for its financial support via the project UIDB/00667/2020 (UNIDEMI).For decades, industrial companies have been collecting and storing high amounts of data with the aim of better controlling and managing their processes. However, this vast amount of information and hidden knowledge implicit in all of this data could be utilized more efficiently. With the help of data mining techniques unknown relationships can be systematically discovered. The production of semiconductors is a highly complex process, which entails several subprocesses that employ a diverse array of equipment. The size of the semiconductors signifies a high number of units can be produced, which require huge amounts of data in order to be able to control and improve the semiconductor manufacturing process. Therefore, in this paper a structured review is made through a sample of 137 papers of the published articles in the scientific community regarding data mining applications in semiconductor manufacturing. A detailed bibliometric analysis is also made. All data mining applications are classified in function of the application area. The results are then analyzed and conclusions are drawn.publishersversionpublishe

    An industry 4.0 framework for the quality inspection in gearboxes production

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    Nowadays, the development of Internet of Things (IoT) technologies have been enhancing the factory digitalization with several advantages in terms of production efficiency, product quality, and cost reduction. This opportunity encourages the implementation of digital twins related to physical systems for controlling the production workflow in real time. Firstly, the paper studies the enabling technologies for supporting the defect analysis in the context of Industry 4.0 for mechanical workpieces. Secondly, the approach aims to study the integration between the CAD geometry and the quality check process for the inspection planning. A Knowledge-Based tool has been proposed to support the configurations of the quality control chain for each CAD geometry. The test case is focused on the fragmented production of customized gearbox parts
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