Predictive model and near infrared spectroscopy in predicting the diesel fuel properties

Monitoring the diesel fuel properties play an important role in the performance of vehicle engines. Near-infrared (NIR) technology has been investigated as an alternative to monitor the diesel fuel properties. NIR spectroscopy shows an enormous potential for quantitative analysis of complex samples by coupling with artificial neural networks (ANNs). Although a single layer ANN shows promising in the establishing better relationship between a component of interest and NIR spectrum, a different algorithm for updating weight that has been proved to improve the performance of the multilayer could further reveal the potential of single linear layer ANN in NIR spectroscopic analysis. Therefore, this study investigates the performance of a single layer ANN that trained with LevenbergMarquardt (SLM) and that trained with Scaled Conjugate Gradient (SSCG) and compares the proposed methods with multilayer ANN that trained with same learning algori thms. Results were evaluated and discussed with previous studies that used the same data sets to establish the relationship between the NIR spectral data and diesel fuel properties. Finding depicts that the proposed SLM and SSCG were capable of predicting the diesel fuel properties using NIR spectrum without data reduction, and achieving better accuracy in predicting the diesel fuel properties compared with other recent methods. In addition, using a proposed genetic algorithm for data reduction to improve the predictive model of the proposed method

Design methodology for low-jitter differential clock recovery circuits in high performance ADCs

This paper presents a design methodology for the simultaneous optimization of jitter and power consumption in ultra-low jitter clock recovery circuits (<100fsrms) for high-performance ADCs. The key ideas of the design methodology are: a) a smart parameterization of transistor sizes to have smooth dependence of specifications on the design variables, b) based on this parameterization, carrying out a design space sub-sampling which allows capturing the whole circuit performance for reducing computation resources and time during optimization. The proposed methodology, which can easily incorporate process voltage and temperature (PVT) variations, has been used to perform a systematic design space exploration that provides sub-100fs jitter clock recovery circuits in two CMOS commercial processes at different technological nodes (1.8V 0.18μm and 1.2V 90nm). Post-layout simulation results for a case of study with typical jitter of 68fs for a 1.8V 80dB-SNDR 100Msps Pipeline ADC application are also shown as demonstrator.Gobierno de España TEC2015-68448-REuropean Space Agency 4000108445-13-NL-R

45-nm Radiation Hardened Cache Design

abstract: Circuits on smaller technology nodes become more vulnerable to radiation-induced upset. Since this is a major problem for electronic circuits used in space applications, designers have a variety of solutions in hand. Radiation hardening by design (RHBD) is an approach, where electronic components are designed to work properly in certain radiation environments without the use of special fabrication processes. This work focuses on the cache design for a high performance microprocessor. The design tries to mitigate radiation effects like SEE, on a commercial foundry 45 nm SOI process. The design has been ported from a previously done cache design at the 90 nm process node. The cache design is a 16 KB, 4 way set associative, write-through design that uses a no-write allocate policy. The cache has been tested to write and read at above 2 GHz at VDD = 0.9 V. Interleaved layout, parity protection, dual redundancy, and checking circuits are used in the design to achieve radiation hardness. High speed is accomplished through the use of dynamic circuits and short wiring routes wherever possible. Gated clocks and optimized wire connections are used to reduce power. Structured methodology is used to build up the entire cache.Dissertation/ThesisM.S. Electrical Engineering 201

Timing speculation and adaptive reliable overclocking techniques for aggressive computer systems

Computers have changed our lives beyond our own imagination in the past several decades. The continued and progressive advancements in VLSI technology and numerous micro-architectural innovations have played a key role in the design of spectacular low-cost high performance computing systems that have become omnipresent in today\u27s technology driven world. Performance and dependability have become key concerns as these ubiquitous computing machines continue to drive our everyday life. Every application has unique demands, as they run in diverse operating environments. Dependable, aggressive and adaptive systems improve efficiency in terms of speed, reliability and energy consumption. Traditional computing systems run at a fixed clock frequency, which is determined by taking into account the worst-case timing paths, operating conditions, and process variations. Timing speculation based reliable overclocking advocates going beyond worst-case limits to achieve best performance while not avoiding, but detecting and correcting a modest number of timing errors. The success of this design methodology relies on the fact that timing critical paths are rarely exercised in a design, and typical execution happens much faster than the timing requirements dictated by worst-case design methodology. Better-than-worst-case design methodology is advocated by several recent research pursuits, which exploit dependability techniques to enhance computer system performance. In this dissertation, we address different aspects of timing speculation based adaptive reliable overclocking schemes, and evaluate their role in the design of low-cost, high performance, energy efficient and dependable systems. We visualize various control knobs in the design that can be favorably controlled to ensure different design targets. As part of this research, we extend the SPRIT3E, or Superscalar PeRformance Improvement Through Tolerating Timing Errors, framework, and characterize the extent of application dependent performance acceleration achievable in superscalar processors by scrutinizing the various parameters that impact the operation beyond worst-case limits. We study the limitations imposed by short-path constraints on our technique, and present ways to exploit them to maximize performance gains. We analyze the sensitivity of our technique\u27s adaptiveness by exploring the necessary hardware requirements for dynamic overclocking schemes. Experimental analysis based on SPEC2000 benchmarks running on a SimpleScalar Alpha processor simulator, augmented with error rate data obtained from hardware simulations of a superscalar processor, are presented. Even though reliable overclocking guarantees functional correctness, it leads to higher power consumption. As a consequence, reliable overclocking without considering on-chip temperatures will bring down the lifetime reliability of the chip. In this thesis, we analyze how reliable overclocking impacts the on-chip temperature of a microprocessor and evaluate the effects of overheating, due to such reliable dynamic frequency tuning mechanisms, on the lifetime reliability of these systems. We then evaluate the effect of performing thermal throttling, a technique that clamps the on-chip temperature below a predefined value, on system performance and reliability. Our study shows that a reliably overclocked system with dynamic thermal management achieves 25% performance improvement, while lasting for 14 years when being operated within 353K. Over the past five decades, technology scaling, as predicted by Moore\u27s law, has been the bedrock of semiconductor technology evolution. The continued downscaling of CMOS technology to deep sub-micron gate lengths has been the primary reason for its dominance in today\u27s omnipresent silicon microchips. Even as the transition to the next technology node is indispensable, the initial cost and time associated in doing so presents a non-level playing field for the competitors in the semiconductor business. As part of this thesis, we evaluate the capability of speculative reliable overclocking mechanisms to maximize performance at a given technology level. We evaluate its competitiveness when compared to technology scaling, in terms of performance, power consumption, energy and energy delay product. We present a comprehensive comparison for integer and floating point SPEC2000 benchmarks running on a simulated Alpha processor at three different technology nodes in normal and enhanced modes. Our results suggest that adopting reliable overclocking strategies will help skip a technology node altogether, or be competitive in the market, while porting to the next technology node. Reliability has become a serious concern as systems embrace nanometer technologies. In this dissertation, we propose a novel fault tolerant aggressive system that combines soft error protection and timing error tolerance. We replicate both the pipeline registers and the pipeline stage combinational logic. The replicated logic receives its inputs from the primary pipeline registers while writing its output to the replicated pipeline registers. The organization of redundancy in the proposed Conjoined Pipeline system supports overclocking, provides concurrent error detection and recovery capability for soft errors, intermittent faults and timing errors, and flags permanent silicon defects. The fast recovery process requires no checkpointing and takes three cycles. Back annotated post-layout gate-level timing simulations, using 45nm technology, of a conjoined two-stage arithmetic pipeline and a conjoined five-stage DLX pipeline processor, with forwarding logic, show that our approach, even under a severe fault injection campaign, achieves near 100% fault coverage and an average performance improvement of about 20%, when dynamically overclocked

Interconnect yield analysis and fault tolerance for field programmable gate arrays

Imperial Users onl

Efficacy of Multi-Threshold NULL Convention Logic in Low-Power Applications

In order for an asynchronous design paradigm such as Multi-Threshold NULL Convention Logic (MTNCL) to be adopted by industry, it is important for circuit designers to be aware of its advantages and drawbacks especially with respect to power usage. The power tradeoff between MTNCL and synchronous designs depends on many different factors including design type, circuit size, process node, and pipeline granularity. Each of these design dimensions influences the active power and the leakage power comparisons. This dissertation analyzes the effects of different design dimensions on power consumption and the associated rational for these effects. Results show that while MTNCL typically uses more active power and less leakage power than an equivalent synchronous design, the magnitude of this difference can vary greatly and trends can be observed across each of these different design dimensions. Using the results and analysis found in this work, circuit designers will be able to choose between MTNCL and synchronous architectures for a given target application based on anticipated power consumption differences

Techniques for Improving Security and Trustworthiness of Integrated Circuits

The integrated circuit (IC) development process is becoming increasingly vulnerable to malicious activities because untrusted parties could be involved in this IC development flow. There are four typical problems that impact the security and trustworthiness of ICs used in military, financial, transportation, or other critical systems: (i) Malicious inclusions and alterations, known as hardware Trojans, can be inserted into a design by modifying the design during GDSII development and fabrication. Hardware Trojans in ICs may cause malfunctions, lower the reliability of ICs, leak confidential information to adversaries or even destroy the system under specifically designed conditions. (ii) The number of circuit-related counterfeiting incidents reported by component manufacturers has increased significantly over the past few years with recycled ICs contributing the largest percentage of the total reported counterfeiting incidents. Since these recycled ICs have been used in the field before, the performance and reliability of such ICs has been degraded by aging effects and harsh recycling process. (iii) Reverse engineering (RE) is process of extracting a circuit’s gate-level netlist, and/or inferring its functionality. The RE causes threats to the design because attackers can steal and pirate a design (IP piracy), identify the device technology, or facilitate other hardware attacks. (iv) Traditional tools for uniquely identifying devices are vulnerable to non-invasive or invasive physical attacks. Securing the ID/key is of utmost importance since leakage of even a single device ID/key could be exploited by an adversary to hack other devices or produce pirated devices. In this work, we have developed a series of design and test methodologies to deal with these four challenging issues and thus enhance the security, trustworthiness and reliability of ICs. The techniques proposed in this thesis include: a path delay fingerprinting technique for detection of hardware Trojans, recycled ICs, and other types counterfeit ICs including remarked, overproduced, and cloned ICs with their unique identifiers; a Built-In Self-Authentication (BISA) technique to prevent hardware Trojan insertions by untrusted fabrication facilities; an efficient and secure split manufacturing via Obfuscated Built-In Self-Authentication (OBISA) technique to prevent reverse engineering by untrusted fabrication facilities; and a novel bit selection approach for obtaining the most reliable bits for SRAM-based physical unclonable function (PUF) across environmental conditions and silicon aging effects

High-Speed Area-Efficient Hardware Architecture for the Efficient Detection of Faults in a Bit-Parallel Multiplier Utilizing the Polynomial Basis of GF(2m)

The utilization of finite field multipliers is pervasive in contemporary digital systems, with hardware implementation for bit parallel operation often necessitating millions of logic gates. However, various digital design issues, whether natural or stemming from soft errors, can result in gate malfunction, ultimately leading to erroneous multiplier outputs. Thus, to prevent susceptibility to error, it is imperative to employ an effective finite field multiplier implementation that boasts a robust fault detection capability. This study proposes a novel fault detection scheme for a recent bit-parallel polynomial basis multiplier over GF(2m), intended to achieve optimal fault detection performance for finite field multipliers while simultaneously maintaining a low-complexity implementation, a favored attribute in resource-constrained applications like smart cards. The primary concept behind the proposed approach is centered on the implementation of a BCH decoder that utilizes re-encoding technique and FIBM algorithm in its first and second sub-modules, respectively. This approach serves to address hardware complexity concerns while also making use of Berlekamp-Rumsey-Solomon (BRS) algorithm and Chien search method in the third sub-module of the decoder to effectively locate errors with minimal delay. The results of our synthesis indicate that our proposed error detection and correction architecture for a 45-bit multiplier with 5-bit errors achieves a 37% and 49% reduction in critical path delay compared to existing designs. Furthermore, the hardware complexity associated with a 45-bit multiplicand that contains 5 errors is confined to a mere 80%, which is significantly lower than the most exceptional BCH-based fault recognition methodologies, including TMR, Hamming's single error correction, and LDPC-based procedures within the realm of finite field multiplication.Comment: 9 pages, 4 figures. arXiv admin note: substantial text overlap with arXiv:2209.1338