A 10b 320 MS/s 40 mW Open-Loop Interpolated Pipeline ADC

Abstract An open-loop interpolated pipeline ADC is proposed. Weight controlled capacitor arrays are introduced to realize an interpolation and a pipelined operation with open-loop amplifiers. The 10-bit ADC fabricated in 90 nm CMOS demonstrates ENOB of 8.5b over 80 MHz bandwidth (BW) and a conversion rate of 320 MS/s without linearity compensation and consumes 40 mW. The FoMs are 780 fJ/c. Circuit description The input offset voltages, which reduce the linearity, are canceled and the accurate interpolated voltages can be generated if the gains of amplifiers are sufficiently similar. The first amplifiers use the differential CMOS amplifier with source degeneration resistors, as shown in Measurement results and conclusion The chip is fabricated in 90 nm CMOS technology and occupied area is 0.46 mm 2 , as shown i

Design and debugging of multi-step analog to digital converters

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. The trend of increasing integration level for integrated circuits has forced the A/D converter interface to reside on the same silicon in complex mixed-signal ICs containing mostly digital blocks for DSP and control. However, specifications of the converters in various applications emphasize high dynamic range and low spurious spectral performance. It is nontrivial to achieve this level of linearity in a monolithic environment where post-fabrication component trimming or calibration is cumbersome to implement for certain applications or/and for cost and manufacturability reasons. Additionally, as CMOS integrated circuits are accomplishing unprecedented integration levels, potential problems associated with device scaling – the short-channel effects – are also looming large as technology strides into the deep-submicron regime. The A/D conversion process involves sampling the applied analog input signal and quantizing it to its digital representation by comparing it to reference voltages before further signal processing in subsequent digital systems. Depending on how these functions are combined, different A/D converter architectures can be implemented with different requirements on each function. Practical realizations show the trend that to a first order, converter power is directly proportional to sampling rate. However, power dissipation required becomes nonlinear as the speed capabilities of a process technology are pushed to the limit. Pipeline and two-step/multi-step converters tend to be the most efficient at achieving a given resolution and sampling rate specification. This thesis is in a sense unique work as it covers the whole spectrum of design, test, debugging and calibration of multi-step A/D converters; it incorporates development of circuit techniques and algorithms to enhance the resolution and attainable sample rate of an A/D converter and to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover and compensate for the errors continuously. The power proficiency for high resolution of multi-step converter by combining parallelism and calibration and exploiting low-voltage circuit techniques is demonstrated with a 1.8 V, 12-bit, 80 MS/s, 100 mW analog to-digital converter fabricated in five-metal layers 0.18-µm CMOS process. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. Microscopic particles present in the manufacturing environment and slight variations in the parameters of manufacturing steps can all lead to the geometrical and electrical properties of an IC to deviate from those generated at the end of the design process. Those defects can cause various types of malfunctioning, depending on the IC topology and the nature of the defect. To relive the burden placed on IC design and manufacturing originated with ever-increasing costs associated with testing and debugging of complex mixed-signal electronic systems, several circuit techniques and algorithms are developed and incorporated in proposed ATPG, DfT and BIST methodologies. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. With the use of dedicated sensors, which exploit knowledge of the circuit structure and the specific defect mechanisms, the method described in this thesis facilitates early and fast identification of excessive process parameter variation effects. The expectation-maximization algorithm makes the estimation problem more tractable and also yields good estimates of the parameters for small sample sizes. To allow the test guidance with the information obtained through monitoring process variations implemented adjusted support vector machine classifier simultaneously minimize the empirical classification error and maximize the geometric margin. On a positive note, the use of digital enhancing calibration techniques reduces the need for expensive technologies with special fabrication steps. Indeed, the extra cost of digital processing is normally affordable as the use of submicron mixed signal technologies allows for efficient usage of silicon area even for relatively complex algorithms. Employed adaptive filtering algorithm for error estimation offers the small number of operations per iteration and does not require correlation function calculation nor matrix inversions. The presented foreground calibration algorithm does not need any dedicated test signal and does not require a part of the conversion time. It works continuously and with every signal applied to the A/D converter. The feasibility of the method for on-line and off-line debugging and calibration has been verified by experimental measurements from the silicon prototype fabricated in standard single poly, six metal 0.09-µm CMOS process

Pipelined multi-step interpolating A/D converter

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.Includes bibliographical references (p. 97-98).by Edmond Patrick Coady.M.S

Calibration techniques in nyquist A/D converters

In modern systems signal processing is performed in the digital domain. Contrary to analog circuits, digital signal processing offers more robustness, programmability, error correction and storage possibility. The trend to shift the A/D converter towards the input of the system requires A/D converters with more dynamic range and higher sampling speeds. This puts extreme demands on the A/D converter and potentially increases the power consumption. Calibration Techniques in Nyquist A/D Converters analyses different A/D-converter architectures with an emphasis on the maximum achievable power efficiency. It is shown that in order to achieve high speed and high accuracy at high power efficiency, calibration is required. Calibration reduces the overall power consumption by using the available digital processing capability to relax the demands on critical power hungry analog components. Several calibration techniques are analyzed. The calibration techniques presented in this book are applicable to other analog-to-digital systems, such as those applied in integrated receivers. Further refinements will allow using analog components with less accuracy, which will then be compensated by digital signal processing. The presented methods allow implementing this without introducing a speed or power penalty

Design of a Class-AB Amplifier for a 1.5 Bit MDAC of a 12 Bit 100MSPS Pipeline ADC

The basic building block of a pipeline analog-to-digital converter (ADC) is the multiplying digital-to-analog converter (MDAC). The performance of the MDAC significantly depends on the performance of the operational amplifier and calibration techniques. To reduce the complexity of calibration, the operational amplifier needs to have high-linearity, high bandwidth and moderate gain. In this work, the Op-amp specifications were derived from the pipeline ADC requirements. A novel class-AB bias scheme with feed-forward compensation, which provides high linearity and bandwidth consuming low power is proposed. The advantages of the new topology over Monticelli bias scheme and Miller’s compensated amplifiers is explained. The amplifier is implemented in IBM 130nm technology and the MDAC design is used as a test bench to characterize the Op-amp performance. The proposed architecture performance is compared with class A and class-AB output stage amplifiers with Miller’s compensation reported in literature. The proposed class-AB amplifier with feed forward compensation provides an open loop gain of 47dB, unit gain bandwidth of 1040 MHz and IM3 of 75dB consuming 3.88mA current. The amplifier provides the required linearity and bandwidth at much lower power consumption than the amplifiers using conventional class-AB bias schemes

Utilizing digital design techniques and circuits to improve energy and design efficiency of analog and mixed-signal circuits

Technology scaling has long driven large growth in the electronics market. With each successive technology generation, digital circuits become more power and area efficient. The large performance increases realized for digital circuits due to digital scaling have not translated to similar performance improvements for analog circuits. First, noise-limited analog circuits are not capable of leveraging the reduced parasitics of advanced processes, since capacitor sizes are generally set by noise requirements. Second, analog circuit performance is closely tied to the achievable device intrinsic gain, which degrades as process sizes shrink. Reduced supply voltages further exacerbate this issue, as the achievable gain per stage is limited by the number of devices that can be stacked while maintaining all devices in saturation. Finally, process variation increases with decreased feature sizes, so analog circuits have deal with increased mismatch and wider variations in threshold voltages, increasing the time required to design a circuit that is robust across process, voltage, and temperature (PVT) variation. This work seeks to address the limitations of analog circuits in advanced technologies by leveraging digital techniques and digital-like circuits that offer improved scalability. The first half of this dissertation investigates replacing the traditional closed-loop residue amplifier in a pipeline analog-to-digital converter (ADC) with an open loop dynamic amplifier. Previous works incorporating dynamic amplifiers have struggled to achieve large gains and have suffered from offset mismatch between the comparator and amplifier, which will only get worse in more advanced technologies. We propose the usage of a residue amplifier that combines an integration stage, to ensure low noise operation, with a positive feedback stage, to ensure high gain and high speed operation. By utilizing this topology, the proposed amplifier was the first dynamic amplifier to achieve a high gain of 32. Additionally, the proposed amplifier can reuse existing comparator hardware in the ADC, removing all offset mismatch between comparator and amplifier. Digital calibration techniques were applied to ensure a constant gain across PVT. The next part of this dissertation tries to overcome the scaling challenges for noise-limited ADCs with band-limited input signals. By leveraging digital filtering techniques to generate a prediction of the band-limited signal, the conversion can be limited to a range that is a fraction of the total ADC input range, allowing for significant decreases in reference and comparator power consumption. This work extends previous works by enabling accurate predictions for any band-limited signal characteristic. Previous works only focused on accurate predictions for low-activity signals. Finally, the large compute power enabled by modern technology scaling is leveraged to improve the design efficiency of analog circuits. A new automated circuit sizing tool is proposed that can achieve better performance than manual designs done by experts in a much shorter amount of time. All of these techniques help to alleviate the power and design efficiency limitations caused by technology scaling.Electrical and Computer Engineerin

Pipeline analog-to-digital converters for wide-band wireless communications

During the last decade, the development of the analog electronics has been dictated by the enormous growth of the wireless communications. Typical for the new communication standards has been an evolution towards higher data rates, which allows more services to be provided. Simultaneously, the boundary between analog and digital signal processing is moving closer to the antenna, thus aiming for a software defined radio. For analog-to-digital converters (ADCs) of radio receivers this indicates higher sample rate, wider bandwidth, higher resolution, and lower power dissipation. The radio receiver architectures, showing the greatest potential to meet the commercial trends, include the direct conversion receiver and the super heterodyne receiver with an ADC sampling at the intermediate frequency (IF). The pipelined ADC architecture, based on the switched capacitor (SC) technique, has most successfully covered the widely separated resolution and sample rate requirements of these receiver architectures. In this thesis, the requirements of ADCs in both of these receiver architectures are studied using the system specifications of the 3G WCDMA standard. From the standard and from the limited performance of the circuit building blocks, design constraints for pipeline ADCs, at the architectural and circuit level, are drawn. At the circuit level, novel topologies for all the essential blocks of the pipeline ADC have been developed. These include a dual-mode operational amplifier, low-power voltage reference circuits with buffering, and a floating-bulk bootstrapped switch for highly-linear IF-sampling. The emphasis has been on dynamic comparators: a new mismatch insensitive topology is proposed and measurement results for three different topologies are presented. At the architectural level, the optimization of the ADCs in the single-chip direct conversion receivers is discussed: the need for small area, low power, suppression of substrate noise, input and output interfaces, etc. Adaptation of the resolution and sample rate of a pipeline ADC, to be used in more flexible multi-mode receivers, is also an important topic included. A 6-bit 15.36-MS/s embedded CMOS pipeline ADC and an 8-bit 1/15.36-MS/s dual-mode CMOS pipeline ADC, optimized for low-power single-chip direct conversion receivers with single-channel reception, have been designed. The bandwidth of a pipeline ADC can be extended by employing parallelism to allow multi-channel reception. The errors resulted from mismatch of parallel signal paths are analyzed and their elimination is presented. Particularly, an optimal partitioning of the resolution between the stages, and the number of parallel channels, in time-interleaved ADCs are derived. A low-power 10-bit 200-MS/s CMOS parallel pipeline ADC employing double sampling and a front-end sample-and-hold (S/H) circuit is implemented. Emphasis of the thesis is on high-resolution pipeline ADCs with IF-sampling capability. The resolution is extended beyond the limits set by device matching by using calibration, while time interleaving is applied to widen the signal bandwidth. A review of calibration and error averaging techniques is presented. A simple digital self-calibration technique to compensate capacitor mismatch within a single-channel pipeline ADC, and the gain and offset mismatch between the channels of a time-interleaved ADC, is developed. The new calibration method is validated with two high-resolution BiCMOS prototypes, a 13-bit 50-MS/s single-channel and a 14-bit 160-MS/s parallel pipeline ADC, both utilizing a highly linear front-end allowing sampling from 200-MHz IF-band.reviewe

Energy and area efficient techniques for data converters

Data converters are ubiquitous building blocks of a signal chain. The rapid increase in communication and connectivity devices presents new avenues for pushing the state of the art analog to digital converters. Techniques for improving resolution, bandwidth, linearity and bit-error rate, while reducing the power, energy and area is the motivation for this research. This research focuses on achieving this goal by enabling circuit techniques, architecture techniques and calibration methods. The following techniques are proposed for enabling power, area and energy efficient analog to digital converter techniques. 1. A capacitor switching scheme for successive approximation ADC is introduced to enable 93.4% energy reduction and 75 % reduction in capacitor area as compared to a conventional SAR ADCs. 2. Asynchronous correlated level shifting technique for improving current source linearity and power supply rejection ratio of zero crossing based circuits is proposed. This technique enables asynchronous ADC architectures for energy efficient system. 3. Unified gain enhancement model is proposed to catalogue gain enhancement techniques. Class-A+ and Replicated Parallel Gain Enhancement (RPGe) amplifiers are introduced as parallel gain enhancement techniques for switched capacitor circuits. A prototype pipelined ADC using RPGE amplifier achieves 74.9 dB SNDR, 90.8 dB SFDR, 87 dB THD at 20 MS/s. Built in 1P4M 0.18 μm technology and operating at 1.3 V supply, the ADC consumes 5.9 mW. The ADC occupies 3.06 sq. mm and has a figure of merit of 65 fJ /conversion step. Extracted simulation results of the prototype pipeline ADC using dynamic RPGE amplifier achieve 74 dB SNDR, 90 dB SFDR, and 85 dB THD at 30 MS /s in a 0.18 μm process. The ADC consumes 6.6 mW from a 1.3 V supply and achieves a figure of merit of 40 fJ/C-S. 4. A low-gain amplifier based V-T converter is utilized along with a TDC to replace the function of flash ADC and the DAC references in a pipeline ADC. The simulated/ extracted performance of the chip is 12bit, 100 MHz in 65nm process while consuming approximately 8-9 mA from 1 V supply. 5. A measurement technique for detecting and correcting bit-error rate in ADCs is proposed. This multi-path ADC technique squares the bit-error rate of the ADC without consuming additional analog power. The area increase is negligible compared to the conventional modular redundancy techniques. This technique can be applied to digitally detect and correct single event transients for ADCs. A three-path ADC can restore the ADC performance independent of the input frequency and number of errors in a single path. 6. LMS algorithm is used to estimate the VCO non-linearity by using the VCO as a Nyquist ADC and utilizing a slow but accurate ADC. The simulated ADC performance improves from 5 bits to 7.8 bits by using a second order fit to the VCO non-linearity

Electronics for Sensors

The aim of this Special Issue is to explore new advanced solutions in electronic systems and interfaces to be employed in sensors, describing best practices, implementations, and applications. The selected papers in particular concern photomultiplier tubes (PMTs) and silicon photomultipliers (SiPMs) interfaces and applications, techniques for monitoring radiation levels, electronics for biomedical applications, design and applications of time-to-digital converters, interfaces for image sensors, and general-purpose theory and topologies for electronic interfaces