Design of High Speed Comparator

A new CMOS dynamic comparator using dual input single output differential amplifier as latch stage suitable for high speed analog - to - digital converters with High Spee d, low power dissipation and immune to. Back - to - back inverter in the latch stage is replaced with dual - input single output differential amplifier. This topology completely removes the noise that is present in the input. The stru cture shows lower power dissipation and higher speed than the conventional comparators. The circuit is simulated with 1V DC supply voltage and 250 MHz clock frequency. The proposed topology is based on two cross coupled differential pairs positive feedback and switchable current source ces, has a lower power dissipation, higher speed, less area, and it is shown to be very robust against transistor mismatch, n oise immunity

Design Techniques for High Speed Low Voltage and Low Power Non-Calibrated Pipeline Analog to Digital Converters

The profound digitization of modern microelectronic modules made Analog-to- Digital converters (ADC) key components in many systems. With resolutions up to 14bits and sampling rates in the 100s of MHz, the pipeline ADC is a prime candidate for a wide range of applications such as instrumentation, communications and consumer electronics. However, while past work focused on enhancing the performance of the pipeline ADC from an architectural standpoint, little has been done to individually address its fundamental building blocks. This work aims to achieve the latter by proposing design techniques to improve the performance of these blocks with minimal power consumption in low voltage environments, such that collectively high performance is achieved in the pipeline ADC. Towards this goal, a Recycling Folded Cascode (RFC) amplifier is proposed as an enhancement to the general performance of the conventional folded cascode. Tested in Taiwan Semiconductor Manufacturing Company (TSMC) 0.18?m Complementary Metal Oxide Semiconductor (CMOS) technology, the RFC provides twice the bandwidth, 8-10dB additional gain, more than twice the slew rate and improved noise performance over the conventional folded cascode-all at no additional power or silicon area. The direct auto-zeroing offset cancellation scheme is optimized for low voltage environments using a dual level common mode feedback (CMFB) circuit, and amplifier differential offsets up to 50mV are effectively cancelled. Together with the RFC, the dual level CMFB was used to implement a sample and hold amplifier driving a singleended load of 1.4pF and using only 2.6mA; at 200MS/s better than 9bit linearity is achieved. Finally a power conscious technique is proposed to reduce the kickback noise of dynamic comparators without resorting to the use of pre-amplifiers. When all techniques are collectively used to implement a 1Vpp 10bit 160MS/s pipeline ADC in Semiconductor Manufacturing International Corporation (SMIC) 0.18[mu]m CMOS, 9.2 effective number of bits (ENOB) is achieved with a near Nyquist-rate full scale signal. The ADC uses an area of 1.1mm2 and consumes 42mW in its analog core. Compared to recent state-of-the-art implementations in the 100-200MS/s range, the presented pipeline ADC uses the least power per conversion rated at 0.45pJ/conversion-step

8-bit 1 Gs/s Adc Architecture And 4-bit Flash Adc For +10 Gs/s Time Interleaved Adc In 65nm Cmos Technology

Tez (Yüksek Lisans) -- İstanbul Teknik Üniversitesi, Fen Bilimleri Enstitüsü, 2015Thesis (M.Sc.) -- İstanbul Technical University, Instıtute of Science and Technology, 2015Haberleşme sistemlerinin veri aktarım sıklıkları ve bant genişlikleri sürekli olarak artmaktadır. Sayısal yarıiletken teknolojilerindeki gelişmeler, haberleşme sistemlerindeki işaret işleme kısımlarını sayısal domenine almıştır. Sayısal işaret işlemenin avantajları, ideal olmayan durumlara yüksek tolerans, gerçekleme kolaylığı, bir fonksiyonu gerçeklemek için gereken alanın dolayısıyla maliyetin düşük olması ve yeni teknolojilere taşınabilme olarak sayılabilir. Bu avantajlardan faydalanmak için analog işaretleri sayısal domene almada köprü görevi görecek yüksek hızlı analog-sayısal dönüştürücülere(ADC) ihtiyaç vardır. Kablolu ve kablosuz haberleşme teknolojilerinde 10 GHz'yi de aşan bant genişlikleri tek kanallı ADCleri bu iş için elverişsiz kılmaktadır. Zaman aralıklı ADCler gerek ulaşabilecekleri dönüştürme hızı gerek güç verimliliği açısından iyi bir aday olarak karşımıza çıkar. Zaman aralıklama, tek kanallı eş ADClerin sıra ile kullanılması esasına dayanmaktadır. Sıradaki örneği alan ADC, sıra tekrar kendisine gelene kadar bu örneği dönüştürür. Dolayısıyla toplam dönüştürme hızı, tek bir dönüştürücünün hızı ile kanal sayısının çarpımı kadar olmaktadır. Bu şekilde yüksek dönüştürme hızları elde edilebilir. Ayrıca bu şekilde tek kanal ADCler daha fazla hız elde etmek için güç bakımından verimsiz oldukları noktalara itilmez ve daha verimli yapılar ortaya çıkar. Zaman aralıklı ADClerdeki kanal uyumsuzlukları performansı düşürmektedir. Bu hatalar temel olarak dengesizlik, kazanç ve zamanlama uyumsuzluklarından ileri gelmektedir. Zamanlama hataları kestirilmeleri ve düzeltilmeleri noktasında diğerlerinden daha zorludur ve bu durum yüksek frekanslarda daha da zorlaşmaktadır. Zaman aralıklı ADClerdeki zamanlama hatalarının kestirilmeleri ve düzeltilmeleri güncel bir araştırma konusu teşkil etmektedir. Hataların kalibrasyonu ön planda veya arka planda yapılabilir. Arka planda yapılan kalibrasyon sistemin işlerliği ile ilgili herhangi bir sıkıntı yaratmaması ve değişen çevre şartlarına uyum sağlayabilme esnekliği açısından daha avantajlıdır. Zaman aralıklama hataları frekans spektrumunda çıkıntılar(spur) oluşturmaktadır. Bu çıkıntılar, güçlü olmaları durumunda alıcı kısmındaki devreleri sıkıştırma noktasına iterek modülasyonlu işaretlerin sezilmesini zorlaştırabilir veya giriş işaretini tamamen engelleyebilirler. Dolayısıyla kanal uyumsuzluk hataları özellikle kablosuz haberleşme sistemleri için sorun teşkil etmektedir. Bu sorunlardan kurtulmak için kanalları rastgele kullanmaya dayanan bir teknik önerilmiştir. Bu teknik ile kanallardan kaynaklanan hatalar çıkışa rastgele bir sırayla etki yaptıklarından gürültü gibi bir karaktere geçerler. Dolayısıyla frekans spektrumundaki çıkıntılar söndürülmüş olur. Tekniğin bir diğer avantajı arka planda çalışmasıdır. Ancak dikkat edilmelidir ki bu teknik bir hata düzeltme tekniği değildir, dolayısıyla sistemin işaretgürültü oranını iyileştirmemektedir. Kanal uyumsuzluk hatalarının kestirilmesi gibi, saat işaretlerinin dağıtılması da artan kanal sayısı ile zorlaşmaktadır. Ayrıca yüksek kanal sayısına sahip olan zaman aralıklı ADClerde saat işareti dağıtımının tükettiği güç yüksek seviyelere ulaşabilir. Belli bir dönüştürme hızı için kanal sayısını düşük tutmak ise kanal ADClerinin dönüştürme hızlarını arttırmak ile mümkündür. ADClerin hızları yüksek tutulurken aynı zamanda güç verimliliği de yüksek tutulmalıdır. Bu hedefler doğrultusunda 8-bit 1 GS/s bir çevrimde birden fazla bit dönüştüren bir SAR ADC yapısı önerilmiştir. Bir çevrimde birden fazla bit dönüştüren SAR ADCler, tek kanalda yüksek hızlara çıkmak konusunda sıkça kullanılan bir yöntem olarak karşımıza çıkmaktadır. Bunun yanında ilk üç en anlamlı bit bir flash ADC ile dönüştürüldüğünden önemli hız kazanımları elde edilir. Flash ADC çıkışında bir kod çözücü yapısı kullanılmaması da zaman kazanımında etkilidir. Önerilen ADC yapısında özgün bir dönüştürme algoritması kullanılmaktadır. Algoritma temel olarak, dönüştürme fazlarına fazladan seviyeler eklemek ve fazların aralıklarını kesiştirmek sureti ile devre bloklarının hata toleranslarını arttırmasına dayanmaktadır. Bu nedenle herhangi bir kalibrasyon sistemine ihtiyaç duyulmaz dolayısıyla güç tüketimi azaltılabilir. Bu yapının gerçeklenebilmesi için çoklu seviye üreten bir ön kuvvetlendirici önerilmiştir. Önerilen ön kuvvetlendirici yapısı nedeniyle, algoritmadaki farklı fazlar için tek bir ön kuvvetlendirici kullanılabilmektedir. Bu sayede farklı ön kuvvetlendiricilerden kaynaklanacak dengesizlik uyumsuzluklarının da önüne geçilmiş olur. Yüksek hızlı veri dönüştürücülerin gerçeklenmesindeki en etkili devre bloğu, kendisi de 1 bitlik bir ADC olarak sayılabilecek karşılaştırıcı devreleridir. Karşılaştırıcı devresinin hızı, doğruluğu ve güç tüketimi bir ADCnin ilgili performans parametrelerini doğrudan etkilemektedir. Yüksek karşılaştırma hızlı özgün bir gömülü ön kuvvetlendiricili karşılaştırıcı devre önerilmiştir. Yapı geleneksel dinamik sezme kuvvetlendiricisi devresi temel alınarak tasarlanmıştır. Ek olarak giriş farksal kuvvetlendirici bölümüne bir statik akım kaynağı bağlanmıştır. Bu şekilde dinamik karşılaştırıcı yapısına ön kuvvetlendirici gömülmüş olur. Yapı geleneksel yapılara nazaran, hız, dengesizlik, güç tüketimi ve geri tepme gürültüsü açısından iyileştirmeler içermektedir. 8-bit 1 GS/s bir çevrimde birden fazla bit dönüştüren SAR ADC yapısı, ilk 3 biti olabildiğince hızlı dönüştürmek için bir flash ADC yapısı kullanmaktadır. Flash ADC yapılarının önemli hız avantajlarına rağmen, karşılaştırıcı devrelerin dengesizlik ve geri tepme gürültüsü performansı düşürmektedir. Önerilen gömülü ön kuvvetlendiricili karşılaştırıcı devresi dengesizlik performansını ve geri tepme gürültüsünü iyileştirmektedir. Ancak geri tepme gürültüsünden kaynaklanan hataları tam olarak çözmek adına, referans gerilimleri de giriş işaretleri gibi örneklenebilir. Bu teknik ile karşılaştırıcı geri tepme gürültüsünün giriş ve referans gerilimi üzerindeki etkisi eşitlenmekte ve geri tepme gürültüsünün etkisi bertaraf edilmektedir. ADC girişleri örneklenerek geldiğinden ve örnekleme devrelerindeki bir hata doğrudan ADCye iletileceğinden bu devrelerin performansı çok önemlidir. Çapraz bağlamalı anahtar tekniği kullanılarak anahtarların doğrusallığı iyileştirilmiştir. Aynı zamanda çapraz bağlama tekniği anahtar yük enjeksiyonu hatasını giriş işaretinden bağımsız hale getirmektedir. Bu durum, yukarıda bahsedilen referans örnekleme tekniği ile birleştirildiğinde flash ADC için önemli bir doğruluk iyileştirmesi sağlamaktadır. ADC blokları ST Microelectronics 65 nm CMOS teknolojisinde tasarlanmış ve serimleri yapılmıştır. Serim sonrası benzetim sonuçları tasarımların ve kullanılan tekniklerin doğruluğunu göstermektedir. Tasarlanan ADC Haziran 2015'de üretime yollanmıştır. Kasım 2015'de ölçümlere başlanması planlanmaktadır.Data rate of communication systems constantly increasing . Rapid scaling of digital semiconductor technologies has moved the signal processing of these systems to digital domain. Therefore high-speed ADCs are required to form the bridge to take the analog signals in digital domain. Data rates exceeding 10 Gbps makes the use of single channel ADCs unfeasible on this purpose. A power efficient solution is time-interleaving. Time-interleaving relaxes the speed requirements on single channel ADCs and lets designers to focus on power efficiency of the ADC. Channel mismatches in time-interleaved ADCs causes performance degradation. Errors arise mainly due to offset, gain and timing mismatch of channels. Among them, timing error is the most problematic since estimation of timing errors becomes more cumbersome in high-frequencies. Estimation and correction of timing errors in time-interleaved ADCs are hot topics of research. Calibration of errors can be on background or on foreground. Background calibration is more desirable since it allows system to adapt to changing conditions while not hindering the operation of the ADC. Time interleaving errors generate spurs on the spectrum. Spurs are problematic for the wireless communication systems, since they may block the input signal. In order to extinguish the spurs a channel randomization technique is proposed. Technique is based on randomly taking one of the ADC channels to make the errors of the channels noise-like term. It is advantageous since it works on background. Technique maintains a spur-free spectrum however does not improve the SNR of the system. Estimation of channel mismatch errors and clock distribution in a time-interleaved ADC becomes tedious as the number of channels increase. In order to keep the channel number low, channels should be fast while being power efficient. To satisfy this task, an 8-bit 1 GS/s multi-bit per cycle ADC is proposed. ADC employs a novel search algorithm based on redundancy. No calibration scheme required thanks to the algorithm therefore the power efficiency of the system can be increased. In order to realize the multi-bit per cycle structure, a multiple-threshold generation preamp is proposed. Comparators are the most important part of an ADC. Comparator specifications such as speed, accuracy and power consumption directly affect the relative specifications of the whole ADC. A novel latch with embedded preamp is proposed. Novel structure has latch regeneration time, offset, power consumption and kickback noise improvements over the conventional structures. 8-bit 1 GS/s multi-bit per cycle SAR ADC employs a flash ADC to perform the coarse conversion benefit from its speed. Although flash ADCs are fast, offset and kickback noise of comparators can penalize their accuracy. Proposed latch with embedded preamp improves the offset performance. To solve the kickback issue, reference voltages of the flash ADC are sampled. This technique is based on equalizing the kickback for both input and reference voltages therefore eliminating the effect. Sampling network of the ADC is critically important since any error made in the sampling phase directly passes to the ADC. Bootstrapped switches are used to improve the linearity of the switches. By using bootstrap switches, charge injection can be made signal independent. If it is combined with the reference sampling technique used in flash ADC, effects of charge injection can be diminished significantly. ADC blocks are designed and laid out in ST Microlectronics 65 nm process. Postlayout simulations have proven the efectiveness of the proposed techniques and blocks. Tape-out was done in July 2015. Measurements is expected to take place in November 2015.Yüksek LisansM.Sc

Design of a novel high speed dynamic comparator with low power dissipation for high speed ADCs

A new CMOS dynamic comparator using dual input single output differential amplifier as latch stage suitable for high speed analog-to-digital converters with High Speed, low power dissipation and immune to noise than the previous reported work is proposed. Backto- back inverter in the latch stage is replaced with dual-input single output differential amplifier. This topology completely removes the noise that is present in the input. The structure shows lower power dissipation and higher speed than the conventional comparators. The circuit is simulated with 1V DC supply voltage and 250 MHz clock frequency. The proposed topology is based on two cross coupled differential pairs positive feedback and switchable current sources, has a lower power dissipation, higher speed, less area, and it is shown to be very robust against transistor mismatch, noise immunity. Previous reported comparators are designed and simulated their DC response and Transient response in Cadence® Virtuoso Analog Design Environment using GPDK 90nm technology. Layouts of the proposed comparator have been done in Cadence® Virtuoso Layout XL Design Environment. DRC and LVS has been checked and compared with the corresponding circuits and RC extracted diagram has been generated. After that post layout simulation with 1V supply voltage has been done and compared the speed, power dissipation, Area, delay with the results before layout and the superior features of the proposed comparator are established

Study and Analysis of different types of comparator

Different types of comparators are studied and the circuits are simulated in Cadence® Virtuoso Analog Design Environment using GPDK 90nm technology. The circuits are simulated with 1.8 Volt DC supply voltage. The clock has a frequency of 250 MHz. All the respective DC responses and transient responses are plotted and analyzed. Layouts of all the comparators have been done in Cadence® Virtuoso Layout XL Design Environment. Different static and dynamic characteristics of all the comparators are studied and compared. Their advantages and disadvantages were also discussed

Digital Background Self-Calibration Technique for Compensating Transition Offsets in Reference-less Flash ADCs

This Dissertation focusses on proving that background calibration using adaptive algorithms are low-cost, stable and effective methods for obtaining high accuracy in flash A/D converters. An integrated reference-less 3-bit flash ADC circuit has been successfully designed and taped out in UMC 180 nm CMOS technology in order to prove the efficiency of our proposed background calibration. References for ADC transitions have been virtually implemented built-in in the comparators dynamic-latch topology by a controlled mismatch added to each comparator input front-end. An external very simple DAC block (calibration bank) allows control the quantity of mismatch added in each comparator front-end and, therefore, compensate the offset of its effective transition with respect to the nominal value. In order to assist to the estimation of the offset of the prototype comparators, an auxiliary A/D converter with higher resolution and lower conversion speed than the flash ADC is used: a 6-bit capacitive-DAC SAR type. Special care in synchronization of analogue sampling instant in both ADCs has been taken into account. In this thesis, a criterion to identify the optimum parameters of the flash ADC design with adaptive background calibration has been set. With this criterion, the best choice for dynamic latch architecture, calibration bank resolution and flash ADC resolution are selected. The performance of the calibration algorithm have been tested, providing great programmability to the digital processor that implements the algorithm, allowing to choose the algorithm limits, accuracy and quantization errors in the arithmetic. Further, systematic controlled offset can be forced in the comparators of the flash ADC in order to have a more exhaustive test of calibration

An 8-Bit Analog-to-Digital Converter for Battery Operated Wireless Sensor Nodes

Wireless sensing networks (WSNs) collect analog information transduced into the form of a voltage or current. This data is typically converted into a digital representation of the value and transmitted wirelessly using various modulation techniques. As the available power and size is limited for wireless sensor nodes in many applications, a medium resolution Analog-to-Digital Converter (ADC) is proposed to convert a sensed voltage with moderate speeds to lower power consumption. Specifications also include a rail-to-rail input range and minimized errors associated with offset, gain, differential nonlinearity, and integral nonlinearity. To achieve these specifications, an 8-bit successive approximation register ADC is developed which has a conversion time of nine clock cycles. This ADC features a charge scaling array included to achieve minimized power consumption and area by reducing unit capacitance in the digital-to-analog converter. Furthermore, a latched comparator provides fast decisions utilizing positive feedback. The ADC was designed and simulated using Cadence Virtuoso with parasitic extraction over expected operating temperature range of 0 – 85°C. The design was fabricated using TSMC’s 65 nanometer RF GP process and tested on a printed circuit board to verify design specifications. The measured results for the device show an offset and gain error of +7 LSB and 31.1 LSB, respectively, and a DNL range of -0.9 LSB to +0.8 LSB and an INL range of approximately -4.6 LSB to +12 LSB. The INL is much improved in regard to the application of the temperature sensor. The INL for this region of interest is from -3.5 LSB to +2.8 LSB

Design Techniques for High Speed Low Voltage and Low Power Non-Calibrated Pipeline Analog to Digital Converters

The profound digitization of modern microelectronic modules made Analog-to- Digital converters (ADC) key components in many systems. With resolutions up to 14bits and sampling rates in the 100s of MHz, the pipeline ADC is a prime candidate for a wide range of applications such as instrumentation, communications and consumer electronics. However, while past work focused on enhancing the performance of the pipeline ADC from an architectural standpoint, little has been done to individually address its fundamental building blocks. This work aims to achieve the latter by proposing design techniques to improve the performance of these blocks with minimal power consumption in low voltage environments, such that collectively high performance is achieved in the pipeline ADC. Towards this goal, a Recycling Folded Cascode (RFC) amplifier is proposed as an enhancement to the general performance of the conventional folded cascode. Tested in Taiwan Semiconductor Manufacturing Company (TSMC) 0.18?m Complementary Metal Oxide Semiconductor (CMOS) technology, the RFC provides twice the bandwidth, 8-10dB additional gain, more than twice the slew rate and improved noise performance over the conventional folded cascode-all at no additional power or silicon area. The direct auto-zeroing offset cancellation scheme is optimized for low voltage environments using a dual level common mode feedback (CMFB) circuit, and amplifier differential offsets up to 50mV are effectively cancelled. Together with the RFC, the dual level CMFB was used to implement a sample and hold amplifier driving a singleended load of 1.4pF and using only 2.6mA; at 200MS/s better than 9bit linearity is achieved. Finally a power conscious technique is proposed to reduce the kickback noise of dynamic comparators without resorting to the use of pre-amplifiers. When all techniques are collectively used to implement a 1Vpp 10bit 160MS/s pipeline ADC in Semiconductor Manufacturing International Corporation (SMIC) 0.18[mu]m CMOS, 9.2 effective number of bits (ENOB) is achieved with a near Nyquist-rate full scale signal. The ADC uses an area of 1.1mm2 and consumes 42mW in its analog core. Compared to recent state-of-the-art implementations in the 100-200MS/s range, the presented pipeline ADC uses the least power per conversion rated at 0.45pJ/conversion-step

DIGITALLY ASSISTED TECHNIQUES FOR NYQUIST RATE ANALOG-to-DIGITAL CONVERTERS

With the advance of technology and rapid growth of digital systems, low power high speed analog-to-digital converters with great accuracy are in demand. To achieve high effective number of bits Analog-to-Digital Converter(ADC) calibration as a time consuming process is a potential bottleneck for designs. This dissertation presentsa fully digital background calibration algorithm for a 7-bit redundant flash ADC using split structure and look-up table based correction. Redundant comparators are used in the flash ADC design of this work in order to tolerate large offset voltages while minimizing signal input capacitance. The split ADC structure helps by eliminating the unknown input signal from the calibration path. The flash ADC has been designed in 180nm IBM CMOS technology and fabricated through MOSIS. This work was supported by Analog Devices, Wilmington,MA. While much research on ADC design has concentrated on increasing resolution and sample rate, there are many applications (e.g. biomedical devices and sensor networks) that do not require high performance but do require low power energy efficient ADCs. This dissertation also explores on design of a low quiescent current 100kSps Successive Approximation (SAR) ADC that has been used as an error detection ADC for an automotive application in 350nm CD (CMOS-DMOS) technology. This work was supported by ON Semiconductor Corp, East Greenwich,RI

Designing of a high speed, compact and low power, balanced-input balanced-output preamplifier latch based comparator

Analog and digital converters (ADCs) are the most inevitable part of today’s high-speed human interacted devices. Continuous efforts are being made to improve their performance. Despite working for the improvement of whole ADC, efforts to improve sub-modules are also significant. Comparators are also a vital part of ADC. In this work, we have proposed a novel high-speed Balanced-Input Balanced-Output (BIBO) preamplifier latch based comparator design, to be used for the designing of an Asynchronous Successive Approximation Resister (SAR) ADC. In order to make comparison faster, we have employed Preamplifier-Latch based comparator. Transistor fingering is used to save area and makes large transistor easy to handle without changing their aspect ratio. We have implemented this latch using two back to back connected inverters. These inverters are farming a positive feedback arrangement that also prohibits the comparator from bursting into the oscillation. Latch circuit uses three non-overlapping phases namely phi1, phi2 and phi3 and dissipates less power when operated on a single 1V supply voltage. All these features collectively made this comparator expedient and obtained results confirm that it can be used effectively for the designing of SAR ADC