Noise shaping Asynchronous SAR ADC based time to digital converter

Time-to-digital converters (TDCs) are key elements for the digitization of timing information in modern mixed-signal circuits such as digital PLLs, DLLs, ADCs, and on-chip jitter-monitoring circuits. Especially, high-resolution TDCs are increasingly employed in on-chip timing tests, such as jitter and clock skew measurements, as advanced fabrication technologies allow fine on-chip time resolutions. Its main purpose is to quantize the time interval of a pulse signal or the time interval between the rising edges of two clock signals. Similarly to ADCs, the performance of TDCs are also primarily characterized by Resolution, Sampling Rate, FOM, SNDR, Dynamic Range and DNL/INL. This work proposes and demonstrates 2nd order noise shaping Asynchronous SAR ADC based TDC architecture with highest resolution of 0.25 ps among current state of art designs with respect to post-layout simulation results. This circuit is a combination of low power/High Resolution 2nd Order Noise Shaped Asynchronous SAR ADC backend with simple Time to Amplitude converter (TAC) front-end and is implemented in 40nm CMOS technology. Additionally, special emphasis is given on the discussion on various current state of art TDC architectures.Electrical and Computer Engineerin

Design and layout strategies for integrated frequency synthesizers with high spectral purity

Dieser Beitrag ist mit Zustimmung des Rechteinhabers aufgrund einer (DFG geförderten) Allianz- bzw. Nationallizenz frei zugänglich.This publication is with permission of the rights owner freely accessible due to an Alliance licence and a national licence (funded by the DFG, German Research Foundation) respectively.Design guidelines for fractional-N phase-locked loops with a high spectral purity of the output signal are presented. Various causes for phase noise and spurious tones (spurs) in integer-N and fractional-N phase-locked loops (PLLs) are briefly described. These mechanisms include device noise, quantization noise folding, and noise coupling from charge pump (CP) and reference input buffer to the voltage-controlled oscillator (VCO) and vice versa through substrate and bondwires. Remedies are derived to mitigate the problems by using proper PLL parameters and a careful chip layout. They include a large CP current, sufficiently large transistors in the reference input buffer, linearization of the phase detector, a high speed of the programmable frequency divider, and minimization of the cross-coupling between the VCO and the other building blocks. Examples are given based on experimental PLLs in SiGe BiCMOS technologies for space communication and wireless base stations.BMBF, 03ZZ0512A, Zwanzig20 - Verbundvorhaben: fast-spot; TP1: Modularer Basisband- Prozessor mit extrem hohen Datenraten, sehr kurzen Latenzzeiten und SiGe-Analog-Frontend-IC-Fertigung bei >200 GHz Trägerfrequen

Analysis and equalization of data-dependent jitter

Data-dependent jitter limits the bit-error rate (BER) performance of broadband communication systems and aggravates synchronization in phase- and delay-locked loops used for data recovery. A method for calculating the data-dependent jitter in broadband systems from the pulse response is discussed. The impact of jitter on conventional clock and data recovery circuits is studied in the time and frequency domain. The deterministic nature of data-dependent jitter suggests equalization techniques suitable for high-speed circuits. Two equalizer circuit implementations are presented. The first is a SiGe clock and data recovery circuit modified to incorporate a deterministic jitter equalizer. This circuit demonstrates the reduction of jitter in the recovered clock. The second circuit is a MOS implementation of a jitter equalizer with independent control of the rising and falling edge timing. This equalizer demonstrates improvement of the timing margins that achieve 10/sup -12/ BER from 30 to 52 ps at 10 Gb/s

An Offset Cancelation Technique for Latch Type Sense Amplifiers

An offset compensation technique for a latch type sense amplifier is proposed in this paper. The proposed scheme is based on the recalibration of the charging/discharging current of the critical nodes which are affected by the device mismatches. The circuit has been designed in a 65 nm CMOS technology with 1.2 V core transistors. The auto-calibration procedure is fully digital. Simulation results are given verifying the operation for sampling a 5 Gb/s signal dissipating only 360 uW

Effect of Jitter on the Settling Time of Mesochronous Clock Retiming Circuits

It is well known that timing jitter can degrade the bit error rate (BER) of receivers that recover the clock from input data. However, timing jitter can also result in an indefinite increase in the settling time of clock recovery circuits, particularly in low swing mesochronous systems. Mesochronous clock retiming circuits are required in repeaterless low swing on-chip interconnects. We first discuss how timing jitter can result in a large increase in the settling time of the clock recovery circuit. Next, the circuit is modelled as a Markov chain with absorbing states. The mean time to absorption of the Markov chain, which represents the mean settling time of the circuit, is determined. The model is validated through behavioural simulations of the circuit, the results of which match well with the model predictions. We consider circuits with (i) data dependent jitter, (ii) random jitter, and (iii) combination of both of them. We show that a mismatch between the strengths of up and down corrections of the retiming can reduce the settling time. In particular, a 10% mismatch can reduce the mean settling time by up to 40%. We leverage this fact toward improving the settling time performance, and propose useful techniques based on biased training sequences and mismatched charge pumps. We also present a coarse+fine clock retiming circuit, which can operate in coarse first mode, to reduce the settling time substantially. These fast settling retiming circuits are verified with circuit simulations.Comment: 23 pages, 40 figure

Experimental study of visual corona under aeronautic pressure conditions using low-cost imaging sensors

Visual corona tests have been broadly applied for identifying the critical corona points of diverse high-voltage devices, although other approaches based on partial discharge or radio interference voltage measurements are also widely applied to detect corona activity. Nevertheless, these two techniques must be applied in screened laboratories, which are scarce and expensive, require sophisticated instrumentation, and typically do not allow location of the discharge points. This paper describes the detection of the visual corona and location of the critical corona points of a sphere-plane gap configurations under different pressure conditions ranging from 100 to 20 kPa, covering the pressures typically found in aeronautic environments. The corona detection is made with a low-cost CMOS imaging sensor from both the visible and ultraviolet (UV) spectrum, which allows detection of the discharge points and their locations, thus significantly reducing the complexity and costs of the instrumentation required while preserving the sensitivity and accuracy of the measurements. The approach proposed in this paper can be applied in aerospace applications to prevent the arc tracking phenomenon, which can lead to catastrophic consequences since there is not a clear protection solution, due to the low levels of leakage current involved in the pre-arc phenomenon.Peer ReviewedPostprint (published version

Architectures for RF Frequency synthesizers

Frequency synthesizers are an essential building block of RF communication products. They can be found in traditional consumer products, in personal communication systems, and in optical communication equipment. Since frequency synthesizers are used in many different applications, different performance aspects may need to be considered in each case. The main body of the text describes a conceptual framework for analyzing the performance of PLL frequency synthesizers, and presents optimization procedures for the different performance aspects. The analysis of the PLL properties is performed with the use of the open-loop bandwidth and phase margin concepts, to enable the influence of higher-order poles to be taken into account from the beginning of the design process. The theoretical system analysis is complemented by descriptions of innovative system and building block architectures, by circuit implementations in bipolar and CMOS technologies, and by measurement results. Architectures for RF Frequency Synthesizers contains basic information for the beginner as well as in-depth knowledge for the experienced designer. It is widely illustrated with practical design examples used in industrial products.\ud Written for:\ud Electrical and electronic engineer

Phase Locked Loop Test Methodology

Phase locked loops are incorporated into almost every large-scale mixed signal and digital system on chip (SOC). Various types of PLL architectures exist including fully analogue, fully digital, semi-digital, and software based. Currently the most commonly used PLL architecture for SOC environments and chipset applications is the Charge-Pump (CP) semi-digital type. This architecture is commonly used for clock synthesis applications, such as the supply of a high frequency on-chip clock, which is derived from a low frequency board level clock. In addition, CP-PLL architectures are now frequently used for demanding RF (Radio Frequency) synthesis, and data synchronization applications. On chip system blocks that rely on correct PLL operation may include third party IP cores, ADCs, DACs and user defined logic (UDL). Basically, any on-chip function that requires a stable clock will be reliant on correct PLL operation. As a direct consequence it is essential that the PLL function is reliably verified during both the design and debug phase and through production testing. This chapter focuses on test approaches related to embedded CP-PLLs used for the purpose of clock generation for SOC. However, methods discussed will generally apply to CP-PLLs used for other applications

Field Effect Transistor Nanosensor for Breast Cancer Diagnostics

Silicon nanochannel field effect transistor (FET) biosensors are one of the most promising technologies in the development of highly sensitive and label-free analyte detection for cancer diagnostics. With their exceptional electrical properties and small dimensions, silicon nanochannels are ideally suited for extraordinarily high sensitivity. In fact, the high surface-to-volume ratios of these systems make single molecule detection possible. Further, FET biosensors offer the benefits of high speed, low cost, and high yield manufacturing, without sacrificing the sensitivity typical for traditional optical methods in diagnostics. Top down manufacturing methods leverage advantages in Complementary Metal Oxide Semiconductor (CMOS) technologies, making richly multiplexed sensor arrays a reality. Here, we discuss the fabrication and use of silicon nanochannel FET devices as biosensors for breast cancer diagnosis and monitoring