392 research outputs found

    Critical dimension control influencing factors and measurement

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    ๋ฐ˜๋„์ฒด ์ œ์กฐ ๊ณต์ •์„ ์œ„ํ•œ GAN ๊ธฐ๋ฐ˜ ์ด์ข… ์ด๋ฏธ์ง€ ์ •๋ ฌ ์ฒด๊ณ„

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    ํ•™์œ„๋…ผ๋ฌธ(์„์‚ฌ)--์„œ์šธ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› :๊ณต๊ณผ๋Œ€ํ•™ ๊ธฐ๊ณ„ํ•ญ๊ณต๊ณตํ•™๋ถ€,2019. 8. ๊น€๋„๋…„.In semiconductor manufacturing process, visual inspection on wafer using template-based detection is widely researched topic. As a prerequisite of detection process, new demand for aligning multimodal image has emerged. To address this issue, this paper proposes a framework with GAN based image translation followed by NCC based template matching algorithm. Different from previous function based approaches, our deep learning based framework effectively transforms an image to another domain where template matching is much easier. Also, for practical usage, we propose a new training data generation strategy which allows our model to train from only 20 pre-aligned images. Experimental results on 4 types of manually aligned data, consisted of 400 pairs of images, demonstrate that our method successfully transforms image regardless of the presence of defect or noise. Also, using transformed image, alignment process with NCC based template matching achieved almost 100% accuracy on every types of image. Moreover, our framework shows great efficiency as it takes only 15 minutes for training and 0.25 seconds per image in test time.๋ฐ˜๋„์ฒด ๊ณต์ •์—์„œ ํ…œํ”Œ๋ฆฟ์„ ์ด์šฉํ•œ ๋น„์ „ ๊ธฐ๋ฐ˜์˜ ์›จ์ดํผ ๊ฒ€์‚ฌ๋Š” ๋„๋ฆฌ ์—ฐ๊ตฌ๋˜๋Š” ๋ถ„์•ผ์ด๋‹ค. ์ด๋Ÿฌํ•œ ๊ฒ€์‚ฌ ๊ณผ์ •์˜ ์ „์ œ ์กฐ๊ฑด์œผ๋กœ ๋ฉ€ํ‹ฐ๋ชจ๋‹ฌ ์ด๋ฏธ์ง€ ์ •๋ ฌ์— ๋Œ€ํ•œ ์ƒˆ๋กœ์šด ์š”๊ตฌ๊ฐ€ ๋Œ€๋‘๋˜์—ˆ๋‹ค. ์ด ๋ฌธ์ œ๋ฅผ ํ•ด๊ฒฐํ•˜๊ธฐ ์œ„ํ•ด ๋ณธ ๋…ผ๋ฌธ์€ GAN์„ ํ™œ์šฉํ•œ ์ด๋ฏธ์ง€ ๋ณ€ํ™˜๊ณผ NCC ๊ธฐ๋ฐ˜์˜ ํ…œํ”Œ๋ฆฟ ์ •๋ ฌ ์•Œ๊ณ ๋ฆฌ์ฆ˜์„ ์ด์šฉํ•œ ํ”„๋ ˆ์ž„์›Œํฌ๋ฅผ ์ œ์•ˆํ•œ๋‹ค. ์ด์ „์˜ ํ•จ์ˆ˜ ๊ธฐ๋ฐ˜ ์ ‘๊ทผ๋ฒ•๊ณผ ๋‹ฌ๋ฆฌ ๋”ฅ๋Ÿฌ๋‹ ๊ธฐ๋ฐ˜ ํ”„๋ ˆ์ž„์›Œํฌ๋Š” ์ด๋ฏธ์ง€๋ฅผ ํ…œํ”Œ๋ฆฟ ์ •๋ ฌ์ด ํ›จ์”ฌ ์šฉ์ดํ•œ ๋„๋ฉ”์ธ์œผ๋กœ ํšจ๊ณผ์ ์œผ๋กœ ๋ณ€ํ™˜ํ•œ๋‹ค. ๋˜ํ•œ ์‹ค์šฉ์ ์ธ ๊ด€์ ์—์„œ ๊ณ ์•ˆํ•œ ์ƒˆ๋กœ์šด ํ•™์Šต ๋ฐ์ดํ„ฐ ์ƒ์„ฑ ๋ฐฉ๋ฒ•์„ ํ†ตํ•ด ์˜ค์ง 20๊ฐœ์˜ ์ •๋ ฌ๋œ ์ดˆ๊ธฐ ๋ฐ์ดํ„ฐ๋ฅผ ํ†ตํ•ด์„œ ๋”ฅ๋Ÿฌ๋‹ ๋ชจ๋ธ์„ ์„ฑ๊ณต์ ์œผ๋กœ ํ•™์Šตํ•  ์ˆ˜ ์žˆ๋‹ค. ๊ฐ๊ฐ 100์Œ์˜ ์ด๋ฏธ์ง€๋กœ ์ด๋ฃจ์–ด์ง„ 4๊ฐ€์ง€ ์ข…๋ฅ˜์˜ ์ˆ˜์ž‘์—…์œผ๋กœ ์ •๋ ฌํ•œ ๋ฐ์ดํ„ฐ๋ฅผ ์‚ฌ์šฉํ•œ ์‹คํ—˜ ๊ฒฐ๊ณผ๋ฅผ ํ†ตํ•ด ๊ณ ์•ˆํ•œ ๋ฐฉ๋ฒ•์ด ๊ฒฐํ•จ์ด๋‚˜ ๋…ธ์ด์ฆˆ์˜ ์กด์žฌ์—ฌ๋ถ€์™€ ์ƒ๊ด€์—†์ด ํšจ๊ณผ์ ์œผ๋กœ ์ด๋ฏธ์ง€๋ฅผ ๋ณ€ํ™˜ํ•œ๋‹ค๋Š” ๊ฒƒ์„ ํ™•์ธํ•  ์ˆ˜ ์žˆ๋‹ค. ๋˜ํ•œ ๋ณ€ํ™˜๋œ ์ด๋ฏธ์ง€๋ฅผ ์‚ฌ์šฉํ•œ NCC ๊ธฐ๋ฐ˜์˜ ํ…œํ”Œ๋ฆฟ ์ •๋ ฌ ์•Œ๊ณ ๋ฆฌ์ฆ˜์€ ์ด๋ฏธ์ง€ ์ •๋ ฌ์—์„œ 100%์— ๊ฐ€๊นŒ์šด ์ •ํ™•๋„๋ฅผ ๋ณด์ธ๋‹ค. ๋งˆ์ง€๋ง‰์œผ๋กœ ์†Œ์š” ์‹œ๊ฐ„์—์„œ ํ”„๋ ˆ์ž„์›Œํฌ๋Š” ํ•™์Šต์— 15๋ถ„, ํ…Œ์ŠคํŠธ ์‹œ ์ด๋ฏธ์ง€๋‹น 0.25 ์ดˆ ๋งŒ์„ ์†Œ๋ชจํ•˜๋ฉฐ ๋†’์€ ํšจ์œจ์„ ๋ณด์ธ๋‹ค.1. Introduction 1 2. Proposed Framework 5 2.1 Training image generation and image preprocessing 6 2.2 GAN based image translation and template matching 9 3. Experimental Results 13 3.1 Performance of image generation 14 3.2 Accuracy of template matching 22 3.3 Running time of framework 24 4. Conclusion 26 References 28 Abstract in Korean 31Maste

    A Review of Modern Characterization Methods for Semiconductor Materials

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    The manufacture of solid state devices in the microelectronics industry involves crystal growth, slice preparation, diffusion and implantation, oxide and metal deposition, patterning and etching, probe testing and packaging of completed devices. This simplified process flow is adopted in an overview to briefly outline some established as well as newly developed techniques of materials characterization. The complexity of semiconductor processing has imposed greater stringency criteria which have resulted in the revitalization of old methods as well as the development of new techniques capable of extreme sensitivity and spatial resolution. Examples given for trace impurity and dopant detection include neutron activation analysis, infrared and photoluminescence spectroscopies, atomic resonance ionization, and accelerator based mass spectroscopy. Some methods highlighted for measuring thin film composition and quality are scanning Lang and double crystal x-ray topographies and Rutherford backscattering and Auger spectroscopies. The strengths and frequency of use of these are compared relative to one another and the process steps used in semiconductor manufacture

    Integrated 3D Hydrogel Waveguide Out-Coupler by Step-and-Repeat Thermal Nanoimprint Lithography: A Promising Sensor Device for Water and pH

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    Hydrogel materials offer many advantages for chemical and biological sensoring due to their response to a small change in their environment with a related change in volume. Several designs have been outlined in the literature in the specific field of hydrogel-based optical sensors, reporting a large number of steps for their fabrication. In this work we present a three-dimensional, hydrogel-based sensor the structure of which is fabricated in a single step using thermal nanoimprint lithography. The sensor is based on a waveguide with a grating readout section. A specific hydrogel formulation, based on a combination of PEGDMA (Poly(Ethylene Glycol DiMethAcrylate)), NIPAAm (N-IsoPropylAcrylAmide), and AA (Acrylic Acid), was developed. This stimulus-responsive hydrogel is sensitive to pH and to water. Moreover, the hydrogel has been modified to be suitable for fabrication by thermal nanoimprint lithography. Once stimulated, the hydrogel-based sensor changes its topography, which is characterised physically by AFM and SEM, and optically using a specific optical set-up

    Carbon nanotube forests: synthesis, patterning, milling, mechanics, and applications

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    Carbon nanotube (CNT) forests are a nano-structured material consisting of vertically oriented carbon nanotubes. The material has many exceptional and unique physical properties that have motivated considerable research in the past 10 years. CNT forests hold promise for diverse applications in the fields of thermal interfaces, mechanical interfaces, electrical interconnects, molecular sensors, battery cathodes, energy storage devices, and low reflectance coatings. This thesis seeks to introduce the reader to nanotechnology and nano-carbon materials, and explain several processes for creating, patterning, shaping, modifying physical properties, testing, and using carbon nanotube forests in novel applications. The thesis is organized so that each chapter describes an individual project or publication and is independent of other chapters.Includes bibliographical reference

    Multi-element superconducting nanowire single photon detectors

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    Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2009.This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.Includes bibliographical references (p. 140-148).Single-photon-detector arrays can provide unparalleled performance and detailed information in applications that require precise timing and single photon sensitivity. Such arrays have been demonstrated using a number of single-photon-detector technologies, but the high performance of superconducting nanowire single photon detectors (SNSPDs) and the unavoidable overhead of cryogenic cooling make SNSPDs particularly likely to be used in applications that require detectors with the highest performance available. These applications are also the most likely to benefit from and fully utilize the large amount of information and performance advantages provided by a single-photon-detector array.Although the performance advantages of individual superconducting nanowire single photon detectors (SNSPDs) have been investigated since their first demonstration in 2001, the advantages gained by building arrays of multiple SNSPDs may be even more unique among single photon detector technologies. First, the simplicity and nanoscale dimensions of these detectors make it possible to easily operate multiple elements and to closely space these elements such that the active area of an array is essentially identical to that of a single element. This ability to eliminate seam-loss between elements, as well as the performance advantages gained by using multiple smaller elements, makes the multi-element approach an attractive way to increase the general detector performance (detection efficiency and maximum counting rate) as well as to provide new capabilities (photon-number, spatial, and spectral resolution). Additionally, in contrast to semiconductor-based single-photon detectors, SNSPDs have a negligible probability of spontaneously emitting photons during the detection process, eliminating a potential source of crosstalk between array elements.(cont.) However, the SNSPD can be susceptible to other forms of crosstalk, such as thermal or electromagnetic interactions between elements, so it was important to investigate the operation and limitations of multi-element SNSPDs. This thesis will introduce the concept of a multi-element SNSPD with a continuous active area and will investigate its performance advantages, its potential drawbacks and finally its application to intensity correlation measurements.This work is sponsored by the United States Air Force under Contract #FA8721-05-C-0002. Opinions, interpretations, recommendations and conclusions are those of the authors and are not necessarily endorsed by the United States Government.by Eric Dauler.Ph.D

    Doctor of Philosophy

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    dissertationIn Part 1, we demonstrate the fabrication of organic light-emitting devices (OLEDs) with precisely patterned pixels by the spin-casting of Alq3 and rubrene thin films with dimensions as small as 10ใ€€ฮผm. The solution-based patterning technique produces pixels via the segregation of organic molecules into microfabricated channels or wells. Segregation is controlled by a combination of weak adsorbing characteristics of aliphatic terminated self-assembled monolayers (SAMs) and by centrifugal force, which directs the organic solution into the channel or well. This novel patterning technique may resolve the limitations of pixel resolution in the method of thermal evaporation using shadow masks, and is applicable to the fabrication of large area displays. Furthermore, the patterning technique has the potential to produce pixel sizes down to the limitation of photolithography and micromachining techniques, thereby enabling the fabrication of high-resolution microdisplays. The patterned OLEDs, based upon a confined structure with low refractive index of SiO2, exhibited higher current density than an unpatterned OLED, which results in higher electroluminescence intensity and eventually more efficient device operation at low applied voltages. We discuss the patterning method and device fabrication, and characterize the morphological, optical, and electrical properties of the organic pixels. In part 2, we demonstrate a new growth technique for organic single crystals based on solvent vapor assisted recrystallization. We show that, by controlling the polarity of the solvent vapor and the exposure time in a closed system, we obtain rubrene in orthorhombic to monoclinic crystal structures. This novel technique for growing single crystals can induce phase shifting and alteration of crystal structure and lattice parameters. The organic molecules showed structural change from orthorhombic to monoclinic, which also provided additional optical transition of hypsochromic shift from that of the orthorhombic form. An intermediate form of the crystal exhibits an optical transition to the lowest vibrational energy level that is otherwise disallowed in the single-crystal orthorhombic form. The monoclinic form exhibits entirely new optical transitions and showed a possible structural rearrangement for increasing charge carrier mobility, making it promising for organic devices. These phenomena can be explained and proved by the chemical structure and molecular packing of the monoclinic form, transformed from orthorhombic crystalline structure

    Confocal Raman Spectroscopy and AFM for Evaluation of Sidewalls in Type II Superlattice FPAs

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    We propose to utilize confocal Raman spectroscopy combined with high resolution atomic force microscopy (AFM) for nondestructive characterisation of the sidewalls of etched and passivated small pixel (24 ฮผmร—24 ฮผm) focal plane arrays (FPA) fabricated using LW/LWIR InAs/GaSb type-II strained layer superlattice (T2SL) detector material. Special high aspect ratio Si and GaAs AFM probes, with tip length of 13 ฮผm and tip aperture less than 7ยฐ, allow characterisation of the sidewall morphology. Confocal microscopy enables imaging of the sidewall profile through optical sectioning. Raman spectra measured on etched T2SL FPA single pixels enable us to quantify the non-uniformity of the mesa delineation process
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