Digital design techniques for dependable High-Performance Computing

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Innovative Techniques for Testing and Diagnosing SoCs

We rely upon the continued functioning of many electronic devices for our everyday welfare, usually embedding integrated circuits that are becoming even cheaper and smaller with improved features. Nowadays, microelectronics can integrate a working computer with CPU, memories, and even GPUs on a single die, namely System-On-Chip (SoC). SoCs are also employed on automotive safety-critical applications, but need to be tested thoroughly to comply with reliability standards, in particular the ISO26262 functional safety for road vehicles. The goal of this PhD. thesis is to improve SoC reliability by proposing innovative techniques for testing and diagnosing its internal modules: CPUs, memories, peripherals, and GPUs. The proposed approaches in the sequence appearing in this thesis are described as follows: 1. Embedded Memory Diagnosis: Memories are dense and complex circuits which are susceptible to design and manufacturing errors. Hence, it is important to understand the fault occurrence in the memory array. In practice, the logical and physical array representation differs due to an optimized design which adds enhancements to the device, namely scrambling. This part proposes an accurate memory diagnosis by showing the efforts of a software tool able to analyze test results, unscramble the memory array, map failing syndromes to cell locations, elaborate cumulative analysis, and elaborate a final fault model hypothesis. Several SRAM memory failing syndromes were analyzed as case studies gathered on an industrial automotive 32-bit SoC developed by STMicroelectronics. The tool displayed defects virtually, and results were confirmed by real photos taken from a microscope. 2. Functional Test Pattern Generation: The key for a successful test is the pattern applied to the device. They can be structural or functional; the former usually benefits from embedded test modules targeting manufacturing errors and is only effective before shipping the component to the client. The latter, on the other hand, can be applied during mission minimally impacting on performance but is penalized due to high generation time. However, functional test patterns may benefit for having different goals in functional mission mode. Part III of this PhD thesis proposes three different functional test pattern generation methods for CPU cores embedded in SoCs, targeting different test purposes, described as follows: a. Functional Stress Patterns: Are suitable for optimizing functional stress during I Operational-life Tests and Burn-in Screening for an optimal device reliability characterization b. Functional Power Hungry Patterns: Are suitable for determining functional peak power for strictly limiting the power of structural patterns during manufacturing tests, thus reducing premature device over-kill while delivering high test coverage c. Software-Based Self-Test Patterns: Combines the potentiality of structural patterns with functional ones, allowing its execution periodically during mission. In addition, an external hardware communicating with a devised SBST was proposed. It helps increasing in 3% the fault coverage by testing critical Hardly Functionally Testable Faults not covered by conventional SBST patterns. An automatic functional test pattern generation exploiting an evolutionary algorithm maximizing metrics related to stress, power, and fault coverage was employed in the above-mentioned approaches to quickly generate the desired patterns. The approaches were evaluated on two industrial cases developed by STMicroelectronics; 8051-based and a 32-bit Power Architecture SoCs. Results show that generation time was reduced upto 75% in comparison to older methodologies while increasing significantly the desired metrics. 3. Fault Injection in GPGPU: Fault injection mechanisms in semiconductor devices are suitable for generating structural patterns, testing and activating mitigation techniques, and validating robust hardware and software applications. GPGPUs are known for fast parallel computation used in high performance computing and advanced driver assistance where reliability is the key point. Moreover, GPGPU manufacturers do not provide design description code due to content secrecy. Therefore, commercial fault injectors using the GPGPU model is unfeasible, making radiation tests the only resource available, but are costly. In the last part of this thesis, we propose a software implemented fault injector able to inject bit-flip in memory elements of a real GPGPU. It exploits a software debugger tool and combines the C-CUDA grammar to wisely determine fault spots and apply bit-flip operations in program variables. The goal is to validate robust parallel algorithms by studying fault propagation or activating redundancy mechanisms they possibly embed. The effectiveness of the tool was evaluated on two robust applications: redundant parallel matrix multiplication and floating point Fast Fourier Transform

DC-Patch: A Microarchitectural Fault Patching Technique for GPU Register Files

The ever-increasing parallelism demand of General-Purpose Graphics Processing Unit (GPGPU) applications pushes toward larger and more energy-hungry register files in successive GPU generations. Reducing the supply voltage beyond its safe limit is an effective way to improve the energy efficiency of register files. However, at these operating voltages, the reliability of the circuit is compromised. This work aims to tolerate permanent faults from process variations in large GPU register files operating below the safe supply voltage limit. To do so, this paper proposes a microarchitectural patching technique, DC-Patch, exploiting the inherent data redundancy of applications to compress registers at run-time with neither compiler assistance nor instruction set modifications. Instead of disabling an entire faulty register file entry, DC-Patch leverages the reliable cells within a faulty entry to store compressed register values. Experimental results show that, with more than a third of faulty register entries, DC-Patch ensures a reliable operation of the register file and reduces the energy consumption by 47% with respect to a conventional register file working at nominal supply voltage. The energy savings are 21% compared to a voltage noise smoothing scheme operating at the safe supply voltage limit. These benefits are obtained with less than 2 and 6% impact on the system performance and area, respectively

Analyzing the Sensitivity of GPU Pipeline Registers to Single Events Upsets

Graphics processing units are available solutions for high-performance safety-critical applications, such as self-driving cars. In this application domain, functional-safety and reliability are major concerns. Thus, the adoption of fault tolerance techniques is mandatory to detect or correct faults, since these devices must work properly, even when faults are present. GPUs are designed and implemented with cutting-edge technologies, which makes them sensitive to faults caused by radiation interference, such as single event upsets. These effects can lead the system to a failure, which is unacceptable in safety-critical applications. Therefore, effective detection and mitigation strategies must be adopted to harden the GPU operation. In this paper, we analyze transient effects in the pipeline registers of a GPU architecture. We run four applications at three GPU configurations, considering the source of the fault, its effect on the GPU, and the use of software-based hardening techniques. The evaluation was performed using a general-purpose soft-core GPU based on the NVIDIA G80 architecture. Results can guide designers in building more resilient GPU architectures

Protecting GPU's Microarchitectural Vulnerabilities via Effective Selective Hardening

Graphics Processing Units (GPUs) are today adopted in several domains for which reliability is fundamental, such as self-driving cars and autonomous machines. Unfortunately, on one side GPUs have been shown to have a high error rate and, on the other side, the constraints imposed by real-time safety-critical applications make traditional, costly, replication-based hardening solutions inadequate. This paper proposes an effective microarchitectural selective hardening of GPU modules to mitigate those faults that affect instructions correct execution. We first characterize, through Register-Transfer Level (RTL) fault injections, the architectural vulnerabilities of a GPU model (FlexGripPlus). We specifically target transient faults in the functional units and pipeline registers of a GPU core. Then, we apply selective hardening by triplicating the locations in each module that we found to be more critical. The results show that selective hardening using Triple Modular Redundancy (TMR) can correct 85% to 99% of faults in the pipeline registers and from 50% to 100% of faults in the functional units. The proposed selective TMR strategy reduces the hardware overhead by up to 65% when compared with traditional TMR

Cross layer reliability estimation for digital systems

Forthcoming manufacturing technologies hold the promise to increase multifuctional computing systems performance and functionality thanks to a remarkable growth of the device integration density. Despite the benefits introduced by this technology improvements, reliability is becoming a key challenge for the semiconductor industry. With transistor size reaching the atomic dimensions, vulnerability to unavoidable fluctuations in the manufacturing process and environmental stress rise dramatically. Failing to meet a reliability requirement may add excessive re-design cost to recover and may have severe consequences on the success of a product. %Worst-case design with large margins to guarantee reliable operation has been employed for long time. However, it is reaching a limit that makes it economically unsustainable due to its performance, area, and power cost. One of the open challenges for future technologies is building ``dependable'' systems on top of unreliable components, which will degrade and even fail during normal lifetime of the chip. Conventional design techniques are highly inefficient. They expend significant amount of energy to tolerate the device unpredictability by adding safety margins to a circuit's operating voltage, clock frequency or charge stored per bit. Unfortunately, the additional cost introduced to compensate unreliability are rapidly becoming unacceptable in today's environment where power consumption is often the limiting factor for integrated circuit performance, and energy efficiency is a top concern. Attention should be payed to tailor techniques to improve the reliability of a system on the basis of its requirements, ending up with cost-effective solutions favoring the success of the product on the market. Cross-layer reliability is one of the most promising approaches to achieve this goal. Cross-layer reliability techniques take into account the interactions between the layers composing a complex system (i.e., technology, hardware and software layers) to implement efficient cross-layer fault mitigation mechanisms. Fault tolerance mechanism are carefully implemented at different layers starting from the technology up to the software layer to carefully optimize the system by exploiting the inner capability of each layer to mask lower level faults. For this purpose, cross-layer reliability design techniques need to be complemented with cross-layer reliability evaluation tools, able to precisely assess the reliability level of a selected design early in the design cycle. Accurate and early reliability estimates would enable the exploration of the system design space and the optimization of multiple constraints such as performance, power consumption, cost and reliability. This Ph.D. thesis is devoted to the development of new methodologies and tools to evaluate and optimize the reliability of complex digital systems during the early design stages. More specifically, techniques addressing hardware accelerators (i.e., FPGAs and GPUs), microprocessors and full systems are discussed. All developed methodologies are presented in conjunction with their application to real-world use cases belonging to different computational domains

Data Resource Management in Throughput Processors

Graphics Processing Units (GPUs) are becoming common in data centers for tasks like neural network training and image processing due to their high performance and efficiency. GPUs maintain high throughput by running thousands of threads simultaneously, issuing instructions from ready threads to hide latency in others that are stalled. While this is effective for keeping the arithmetic units busy, the challenge in GPU design is moving the data for computation at the same high rate. Any inefficiency in data movement and storage will compromise the throughput and energy efficiency of the system. Since energy consumption and cooling make up a large part of the cost of provisioning and running and a data center, making GPUs more suitable for this environment requires removing the bottlenecks and overheads that limit their efficiency. The performance of GPU workloads is often limited by the throughput of the memory resources inside each GPU core, and though many of the power-hungry structures in CPUs are not found in GPU designs, there is overhead for storing each thread's state. When sharing a GPU between workloads, contention for resources also causes interference and slowdown. This thesis develops techniques to manage and streamline the data movement and storage resources in GPUs in each of these places. The first part of this thesis resolves data movement restrictions inside each GPU core. The GPU memory system is optimized for sequential accesses, but many workloads load data in irregular or transposed patterns that cause a throughput bottleneck even when all loads are cache hits. This work identifies and leverages opportunities to merge requests across threads before sending them to the cache. While requests are waiting for merges, they can be reordered to achieve a higher cache hit rate. These methods yielded a 38% speedup for memory throughput limited workloads. Another opportunity for optimization is found in the register file. Since it must store the registers for thousands of active threads, it is the largest on-chip data storage structure on a GPU. The second work in this thesis replaces the register file with a smaller, more energy-efficient register buffer. Compiler directives allow the GPU to know ahead of time which registers will be accessed, allowing the hardware to store only the registers that will be imminently accessed in the buffer, with the rest moved to main memory. This technique reduced total GPU energy by 11%. Finally, in a data center, many different applications will be launching GPU jobs, and just as multiple processes can share the same CPU to increase its utilization, running multiple workloads on the same GPU can increase its overall throughput. However, co-runners interfere with each other in unpredictable ways, especially when sharing memory resources. The final part of this thesis controls this interference, allowing a GPU to be shared between two tiers of workloads: one tier with a high performance target and another suitable for batch jobs without deadlines. At a 90% performance target, this technique increased GPU throughput by 9.3%. GPUs' high efficiency and performance makes them a valuable accelerator in the data center. The contributions in this thesis further increase their efficiency by removing data movement and storage overheads and unlock additional performance by enabling resources to be shared between workloads while controlling interference.PHDComputer Science & EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttps://deepblue.lib.umich.edu/bitstream/2027.42/146122/1/jklooste_1.pd

Algorithm-Based Fault Tolerance for Two-Sided Dense Matrix Factorizations

The mean time between failure (MTBF) of large supercomputers is decreasing, and future exascale computers are expected to have a MTBF of around 30 minutes. Therefore, it is urgent to prepare important algorithms for future machines with such a short MTBF. Eigenvalue problems (EVP) and singular value problems (SVP) are common in engineering and scientific research. Solving EVP and SVP numerically involves two-sided matrix factorizations: the Hessenberg reduction, the tridiagonal reduction, and the bidiagonal reduction. These three factorizations are computation intensive, and have long running times. They are prone to suffer from computer failures. We designed algorithm-based fault tolerant (ABFT) algorithms for the parallel Hessenberg reduction and the parallel tridiagonal reduction. The ABFT algorithms target fail-stop errors. These two fault tolerant algorithms use a combination of ABFT and diskless checkpointing. ABFT is used to protect frequently modified data . We carefully design the ABFT algorithm so the checksums are valid at the end of each iterative cycle. Diskless checkpointing is used for rarely modified data. These checkpoints are in the form of checksums, which are small in size, so the time and storage cost to store them in main memory is small. Also, there are intermediate results which need to be protected for a short time window. We store a copy of this data on the neighboring process in the process grid. We also designed algorithm-based fault tolerant algorithms for the CPU-GPU hybrid Hessenberg reduction algorithm and the CPU-GPU hybrid bidiagonal reduction algorithm. These two fault tolerant algorithms target silent errors. Our design employs both ABFT and diskless checkpointing to provide data redundancy. The low cost error detection uses two dot products and an equality test. The recovery protocol uses reverse computation to roll back the state of the matrix to a point where it is easy to locate and correct errors. We provided theoretical analysis and experimental verification on the correctness and efficiency of our fault tolerant algorithm design. We also provided mathematical proof on the numerical stability of the factorization results after fault recovery. Experimental results corroborate with the mathematical proof that the impact is mild

Exploiting Natural On-chip Redundancy for Energy Efficient Memory and Computing

Power density is currently the primary design constraint across most computing segments and the main performance limiting factor. For years, industry has kept power density constant, while increasing frequency, lowering transistors supply (Vdd) and threshold (Vth) voltages. However, Vth scaling has stopped because leakage current is exponentially related to it. Transistor count and integration density keep doubling every process generation (Moore’s Law), but the power budget caps the amount of hardware that can be active at the same time, leading to dark silicon. With each new generation, there are more resources available, but we cannot fully exploit their performance potential. In the last years, different research trends have explored how to cope with dark silicon and unlock the energy efficiency of the chips, including Near-Threshold voltage Computing (NTC) and approximate computing. NTC aggressively lowers Vdd to values near Vth. This allows a substantial reduction in power, as dynamic power scales quadratically with supply voltage. The resultant power reduction could be used to activate more chip resources and potentially achieve performance improvements. Unfortunately, Vdd scaling is limited by the tight functionality margins of on-chip SRAM transistors. When scaling Vdd down to values near-threshold, manufacture-induced parameter variations affect the functionality of SRAM cells, which eventually become not reliable. A large amount of emerging applications, on the other hand, features an intrinsic error-resilience property, tolerating a certain amount of noise. In this context, approximate computing takes advantage of this observation and exploits the gap between the level of accuracy required by the application and the level of accuracy given by the computation, providing that reducing the accuracy translates into an energy gain. However, deciding which instructions and data and which techniques are best suited for approximation still poses a major challenge. This dissertation contributes in these two directions. First, it proposes a new approach to mitigate the impact of SRAM failures due to parameter variation for effective operation at ultra-low voltages. We identify two levels of natural on-chip redundancy: cache level and content level. The first arises because of the replication of blocks in multi-level cache hierarchies. We exploit this redundancy with a cache management policy that allocates blocks to entries taking into account the nature of the cache entry and the use pattern of the block. This policy obtains performance improvements between 2% and 34%, with respect to block disabling, a technique with similar complexity, incurring no additional storage overhead. The latter (content level redundancy) arises because of the redundancy of data in real world applications. We exploit this redundancy compressing cache blocks to fit them in partially functional cache entries. At the cost of a slight overhead increase, we can obtain performance within 2% of that obtained when the cache is built with fault-free cells, even if more than 90% of the cache entries have at least a faulty cell. Then, we analyze how the intrinsic noise tolerance of emerging applications can be exploited to design an approximate Instruction Set Architecture (ISA). Exploiting the ISA redundancy, we explore a set of techniques to approximate the execution of instructions across a set of emerging applications, pointing out the potential of reducing the complexity of the ISA, and the trade-offs of the approach. In a proof-of-concept implementation, the ISA is shrunk in two dimensions: Breadth (i.e., simplifying instructions) and Depth (i.e., dropping instructions). This proof-of-concept shows that energy can be reduced on average 20.6% at around 14.9% accuracy loss