4,455 research outputs found
Regularized Newton Methods for X-ray Phase Contrast and General Imaging Problems
Like many other advanced imaging methods, x-ray phase contrast imaging and
tomography require mathematical inversion of the observed data to obtain
real-space information. While an accurate forward model describing the
generally nonlinear image formation from a given object to the observations is
often available, explicit inversion formulas are typically not known. Moreover,
the measured data might be insufficient for stable image reconstruction, in
which case it has to be complemented by suitable a priori information. In this
work, regularized Newton methods are presented as a general framework for the
solution of such ill-posed nonlinear imaging problems. For a proof of
principle, the approach is applied to x-ray phase contrast imaging in the
near-field propagation regime. Simultaneous recovery of the phase- and
amplitude from a single near-field diffraction pattern without homogeneity
constraints is demonstrated for the first time. The presented methods further
permit all-at-once phase contrast tomography, i.e. simultaneous phase retrieval
and tomographic inversion. We demonstrate the potential of this approach by
three-dimensional imaging of a colloidal crystal at 95 nm isotropic resolution.Comment: (C)2016 Optical Society of America. One print or electronic copy may
be made for personal use only. Systematic reproduction and distribution,
duplication of any material in this paper for a fee or for commercial
purposes, or modifications of the content of this paper are prohibite
High-resolution ab initio three-dimensional X-ray diffraction microscopy
Coherent X-ray diffraction microscopy is a method of imaging non-periodic
isolated objects at resolutions only limited, in principle, by the largest
scattering angles recorded. We demonstrate X-ray diffraction imaging with high
resolution in all three dimensions, as determined by a quantitative analysis of
the reconstructed volume images. These images are retrieved from the 3D
diffraction data using no a priori knowledge about the shape or composition of
the object, which has never before been demonstrated on a non-periodic object.
We also construct 2D images of thick objects with infinite depth of focus
(without loss of transverse spatial resolution). These methods can be used to
image biological and materials science samples at high resolution using X-ray
undulator radiation, and establishes the techniques to be used in
atomic-resolution ultrafast imaging at X-ray free-electron laser sources.Comment: 22 pages, 11 figures, submitte
Phase Retrieval with Application to Optical Imaging
This review article provides a contemporary overview of phase retrieval in
optical imaging, linking the relevant optical physics to the information
processing methods and algorithms. Its purpose is to describe the current state
of the art in this area, identify challenges, and suggest vision and areas
where signal processing methods can have a large impact on optical imaging and
on the world of imaging at large, with applications in a variety of fields
ranging from biology and chemistry to physics and engineering
Holographic particle localization under multiple scattering
We introduce a novel framework that incorporates multiple scattering for
large-scale 3D particle-localization using single-shot in-line holography.
Traditional holographic techniques rely on single-scattering models which
become inaccurate under high particle-density. We demonstrate that by
exploiting multiple-scattering, localization is significantly improved. Both
forward and back-scattering are computed by our method under a tractable
recursive framework, in which each recursion estimates the next higher-order
field within the volume. The inverse scattering is presented as a nonlinear
optimization that promotes sparsity, and can be implemented efficiently. We
experimentally reconstruct 100 million object voxels from a single 1-megapixel
hologram. Our work promises utilization of multiple scattering for versatile
large-scale applications
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