Modeling of preloaded threaded pipe connections

In this paper a modeling method to perform parametric studies on preloaded threaded connections is presented. The method uses a non-linear 2D axisymmetric finite element model, and is illustrated by a parametric study of an API Line Pipe connection. The method was used to quantify the influence of the coefficient of friction, the wall thickness of pin and box and the box recess length of the connection

Variable length strut with longitudinal compliance and locking capability

A variable length strut device is illustrated for connecting two associated structures which includes an outer load bearing shell, a drive assembly, a length varying compliance assembly positioned by drive assembly, and a strut rod locking assembly. The load bearing shell includes a connecting part adapted for connection to a first associated structure. A strut connection rod has a connecting part adapted for connection to a second associated structure and a distal end having a piston driver slidably carried in a housing of compliance assembly. Two compliance pistons act in opposing directions on the piston driver to provide longitudinal compliance in a compliance mode of operation. Locking assembly includes locking balls which are urged in a locking ring as locking bolt is urged to the left by fluid pressure. Microswitches sense the displacement of pistons away from the internal ring to bring the pistons to a neutral position wherein the pistons are in contact with the internal ring when it is desired to do so as affected by a control source

Asymptotic distribution of fixed points of pattern-avoiding involutions

For a variety of pattern-avoiding classes, we describe the limiting distribution for the number of fixed points for involutions chosen uniformly at random from that class. In particular we consider monotone patterns of arbitrary length as well as all patterns of length 3. For monotone patterns we utilize the connection with standard Young tableaux with at most $k$ rows and involutions avoiding a monotone pattern of length $k$. For every pattern of length 3 we give the bivariate generating function with respect to fixed points for the involutions that avoid that pattern, and where applicable apply tools from analytic combinatorics to extract information about the limiting distribution from the generating function. Many well-known distributions appear.Comment: 16 page

Electron diffusion length and lifetime in p-type GaN

We report on electron beam induced current and current–voltage (I–V) measurements on Schottky diodes on p-type doped GaN layers grown by metal organic chemical vapor deposition. A Schottky barrier height of 0.9 eV was measured for the Ti/Au Schottky contact from the I–V data. A minority carrier diffusion length for electrons of (0.2 ± 0.05) µm was measured for the first time in GaN. This diffusion length corresponds to an electron lifetime of approximately 0.1 ns. We attempted to correlate the measured electron diffusion length and lifetime with several possible recombination mechanisms in GaN and establish connection with electronic and structural properties of GaN