A FPGA-Based Reconfigurable Software Architecture for Highly Dependable Systems

Nowadays, systems-on-chip are commonly equipped with reconfigurable hardware. The use of hybrid architectures based on a mixture of general purpose processors and reconfigurable components has gained importance across the scientific community allowing a significant improvement of computational performance. Along with the demand for performance, the great sensitivity of reconfigurable hardware devices to physical defects lead to the request of highly dependable and fault tolerant systems. This paper proposes an FPGA-based reconfigurable software architecture able to abstract the underlying hardware platform giving an homogeneous view of it. The abstraction mechanism is used to implement fault tolerance mechanisms with a minimum impact on the system performanc

Interconnect yield analysis and fault tolerance for field programmable gate arrays

Imperial Users onl

DeSyRe: on-Demand System Reliability

The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect and fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints

Defect-tolerance and testing for configurable nano-crossbars

Moore\u27s Law speculated a trend in computation technology in terms of number of transistors per unit area that would double roughly every two years. Even after 40 years of this prediction, current technologies have been following it successfully. There are however, certain physical limitations of current CMOS that would result in fundamental obstructions to continuation of Moore\u27s Law. Although there is a debate amongst experts on how much time it would take for this to happen, it is certain that some entirely new paradigms for semiconductor electronics would be needed to replace CMOS and to delay the end of Moore\u27s Law. Silicon nanowires (SiNW) and Carbon nanotubes (CNT) possess significant promise to replace current CMOS --Abstract, page iv

Efficient reconfigurable techniques for VLSI arrays with 6-port switches

This paper proposes an efficient techniques to reconfigure a two-dimensional degradable very large scale integration/wafer scale integration (VLSI/WSI) array under the row and column routing constraints, which has been shown to be NP-complete. The proposed VLSI/WSI array consists of identical processing elements such as processors or memory cells embedded in a 6-port switch lattice in the form of a rectangular grid. It has been shown that the proposed VLSI structure with 6-port switches eliminates the need to incorporate internal bypass within processing elements and leads to notable increase in the harvest when compared with the one using 4-port switches. A new greedy rerouting algorithm and compensation approaches are also proposed to maximize harvest through reconfiguration. Experimental results show that the proposed VLSI array with 6-port switches consistently outperforms the most efficient alternative, proposed in literature, toward maximizing the harvest in the presence of fault processing elements

Efficient algorithms for reconfiguration in VLSI/WSI arrays

The issue of developing efficient algorithms for reconfiguring processor arrays in the presence of faulty processors and fixed hardware resources is discussed. The models discussed consist of a set of identical processors embedded in a flexible interconnection structure that is configured in the form of a rectangular grid. An array grid model based on single-track switches is considered. An efficient polynomial time algorithm is proposed for determining feasible reconfigurations for an array with a given distribution of faulty processors. In the process, it is shown that the set of conditions in the reconfigurability theorem is not necessary. A polynomial time algorithm is developed for finding feasible reconfigurations in an augmented single-track model and in array grid models with multiple-track switche

March CRF: an Efficient Test for Complex Read Faults in SRAM Memories

In this paper we study Complex Read Faults in SRAMs, a combination of various malfunctions that affect the read operation in nanoscale memories. All the memory elements involved in the read operation are studied, underlining the causes of the realistic faults concerning this operation. The requirements to cover these fault models are given. We show that the different causes of read failure are independent and may coexist in nanoscale SRAMs, summing their effects and provoking Complex Read Faults, CRFs. We show that the test methodology to cover this new read faults consists in test patterns that match the requirements to cover all the different simple read fault models. We propose a low complexity (?2N) test, March CRF, that covers effectively all the realistic Complex Read Fault

Product assurance technology for custom LSI/VLSI electronics

The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification