Design of CMOS PSCD circuits and checkers for stuck-at and stuck-on faults

[[abstract]]We present in this paper an approach to designing partially strongly code-disjoint (PSCD) CMOS circuits and checkers, considering transistor stuck-on faults in addition to gate-level stuck-at faults. Our design-for-testability (DFT) technique requires only a small number of extra transistors for monitoring abnormal static currents, coupled with a simple clocking scheme, to detect the stuck-on faults concurrently. The DFT circuitry not only can detect the faults in the functional circuit but also can detect or tolerate faults in itself, making it a good candidate for checker design. Switch and circuit level simulations were performed on a sample circuit, and a sample 4-out-of-8 code checker chip using the proposed technique has been designed, fabricated, and tested, showing the correctness of the method. Performance penalty is reduced by a novel BiCMOS checker circuit.[[fileno]]2030108010057[[department]]電機工程學

DeSyRe: on-Demand System Reliability

The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect and fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints

A Generic Dual Core Architecture with Error Containment

The dual core strategy allows to construct a fail-silent processor from two instances (master/checker) of any arbitrary standard processor. Its main drawbacks are its vulnerability with respect to common mode failures and the existence of residual single points of failure. In this paper we propose a generic frame that systematically eliminates these drawbacks. First, we employ temporal redundancy to cope with common mode failures. Unlike similar approaches we can ensure error containment even if -- as a result of the temporal redundancy -- the comparison by the checker core is delayed. We attain this by introducing a specific delay element for outgoing data. Second, we perform a systematic analysis of potential single points of failure and eliminate these by careful layout, self-checking circuits and similar methods. We finally validate our approach by means of exhaustive fault injection experiments. The results indicate a 100% self-checking coverage for stuck-at faults and complete error containment. Since the proposed framework has been kept generic in the sense that the individual standard processor cores are treated as black boxes, these results are valid independent of the core actually used

Desynchronization: Synthesis of asynchronous circuits from synchronous specifications

Asynchronous implementation techniques, which measure logic delays at run time and activate registers accordingly, are inherently more robust than their synchronous counterparts, which estimate worst-case delays at design time, and constrain the clock cycle accordingly. De-synchronization is a new paradigm to automate the design of asynchronous circuits from synchronous specifications, thus permitting widespread adoption of asynchronicity, without requiring special design skills or tools. In this paper, we first of all study different protocols for de-synchronization and formally prove their correctness, using techniques originally developed for distributed deployment of synchronous language specifications. We also provide a taxonomy of existing protocols for asynchronous latch controllers, covering in particular the four-phase handshake protocols devised in the literature for micro-pipelines. We then propose a new controller which exhibits provably maximal concurrency, and analyze the performance of desynchronized circuits with respect to the original synchronous optimized implementation. We finally prove the feasibility and effectiveness of our approach, by showing its application to a set of real designs, including a complete implementation of the DLX microprocessor architectur

An Integrated Test Plan for an Advanced Very Large Scale Integrated Circuit Design Group

VLSI testing poses a number of problems which includes the selection of test techniques, the determination of acceptable fault coverage levels, and test vector generation. Available device test techniques are examined and compared. Design rules should be employed to assure the design is testable. Logic simulation systems and available test utilities are compared. The various methods of test vector generation are also examined. The selection criteria for test techniques are identified. A table of proposed design rules is included. Testability measurement utilities can be used to statistically predict the test generation effort. Field reject rates and fault coverage are statistically related. Acceptable field reject rates can be achieved with less than full test vector fault coverage. The methods and techniques which are examined form the basis of the recommended integrated test plan. The methods of automatic test vector generation are relatively primitive but are improving

Development of a KSC test and flight engineering oriented computer language, Phase 1

Ten, primarily test oriented, computer languages reviewed during the phase 1 study effort are described. Fifty characteristics of ATOLL, ATLAS, and CLASP are compared. Unique characteristics of the other languages, including deficiencies, problems, safeguards, and checking provisions are identified. Programming aids related to these languages are reported, and the conclusions resulting from this phase of the study are discussed. A glossary and bibliography are included. For the reports on phase 2 of the study, see N71-35027 and N71-35029

Fault-Tolerant FPGA-Based Systems

This paper presents a new approach to on-line fault tolerance via reconfiguration for the systems mapped onto field programmable gate arrays (FPGAs). The fault detection, based on self-checking technique, is introduced at application level; therefore our approach can detect the faults of configurable logic blocks (CLBs) and routing interconnections in the FPGAs concurrently with the normal system work. A grid of tiles is projected on the FPGA structure and a certain number of spare CLBs is reserved inside every tile. The number of spare CLBs per tile, which will be used as a backup upon detecting any faulty CLB, is estimated in accordance with the probability of failure. After locating the faulty CLBs, the faulty tile will be reconfigured with avoiding the faulty CLBs. Our proposed approach uses a combination of hardware and software redundancy. We assume that a module external to the FPGA controls automatically the reconfiguration process in addition to the diagnosis process (DIRC); typically this is an embedded microprocessor having some storage for the various tile configurations. We have implemented our approach using Xilinx Virtex FPGA. The DIRC code is written in JBits software tools. In response to a component failure this approach capitalizes on the unique reconfiguration capabilities of FPGAs and replaces the affected tile with a functionally equivalent one that does not rely on the faulty component. Unlike fixed structure fault-tolerance techniques for ASICs and microprocessors, this approach allows a single physical component to provide redundant backup for several types of components

Reliable Hardware Architectures of CORDIC Algorithm with Fixed Angle of Rotations

Fixed-angle rotation operation of vectors is widely used in signal processing, graphics, and robotics. Various optimized coordinate rotation digital computer (CORDIC) designs have been proposed for uniform rotation of vectors through known and specified angles. Nevertheless, in the presence of faults, such hardware architectures are potentially vulnerable. In this thesis, we propose efficient error detection schemes for two fixed-angle rotation designs, i.e., the Interleaved Scaling and Cascaded Single-rotation CORDIC. To the best of our knowledge, this work is the first in providing reliable architectures for these variants of CORDIC. The former is suitable for low-area applications and, hence, we propose recomputing with encoded operands schemes which add negligible area overhead to the designs. Moreover, the proposed error detection schemes for the latter variant are optimized for efficient applications which hamper the performance of the architectures negligibly. We present three variants of recomputing with encoded operands to detect both transient and permanent faults, coupled with signature-based schemes. The overheads of the proposed designs are assessed through Xilinx FPGA implementations and their effectiveness is benchmarked through error simulations. The results give confidence for the proposed efficient architectures which can be tailored based on the reliability requirements and the overhead to be tolerated