Concurrent optimization strategies for high-performance VLSI circuits

In the next generation of VLSI circuits, concurrent optimizations will be essential to achieve the performance challenges. In this dissertation, we present techniques for combining traditional timing optimization techniques to achieve a superior performance;The method of buffer insertion is used in timing optimization to either increase the driving power of a path in a circuit, or to isolate large capacitive loads that lie on noncritical or less critical paths. The procedure of transistor sizing selects the sizes of transistors within a circuit to achieve a given timing specification. Traditional design techniques perform these two optimizations as independent steps during synthesis, even though they are intimately linked and performing them in alternating steps is liable to lead to suboptimal solutions. The first part of this thesis presents a new approach for unifying transistor sizing with buffer insertion. Our algorithm achieve from 5% to 49% area reduction compared with the results of a standard transistor sizing algorithm;The next part of the thesis deals with the problem of collapsing gates for technology mapping. Two new techniques are proposed. The first method, the odd-level transistor replacement (OTR) method, performs technology mapping without the restriction of a fixed library size, and maps a circuit to a virtual library of complex static CMOS gates. The second technique, the Static CMOS/PTL method, uses a mix of static CMOS and pass transistor logic (PTL) to realize the circuit, using the relation between PTL and binary decision diagrams. The methods are very efficient and can handle all ISCAS\u2785 benchmark circuits in minutes. On average, it was found that the OTR method gave 40%, and the Static/PTL gave 50% delay reductions over SIS, with substantial area savings;Finally, we extend the technology mapping work to interleave it with placement in a single optimization. Conventional methods that perform these steps separately will not be adequate for next-generation circuits. Our approach presents an integrated solution to this problem, and shows an average of 28.19%, and a maximum of 78.42% improvement in the delay over a method that performs the two optimizations in separate steps

Diseño de circuitos analógicos y de señal mixta con consideraciones de diseño físico y variabilidad

Advances in microelectronic technology has been based on an increasing capacity to integrate transistors, moving this industry to the nanoelectronics realm in recent years. Moore’s Law [1] has predicted (and somehow governed) the growth of the capacity to integrate transistors in a single IC. Nevertheless, while this capacity has grown steadily, the increasing number of design tasks that are involved in the creation of the integrated circuit and their complexity has led to a phenomenon known as the ``design gap´´. This is the difference between what can theoretically be integrated and what can practically be designed. Since the early 2000s, the International Technology Roadmap of Semiconductors (ITRS) reports, published by the Semiconductor Industry Association (SIA), alert about the necessity to limit the growth of the design cost by increasing the productivity of the designer to continue the semiconductor industry’s growth. Design automation arises as a key element to close this ”design gap”. In this sense, electronic design automation (EDA) tools have reached a level of maturity for digital circuits that is far behind the EDA tools that are made for analog circuit design automation. While digital circuits rely, in general, on two stable operation states (which brings inherent robustness against numerous imperfections and interferences, leading to few design constraints like area, speed or power consumption), analog signal processing, on the other hand, demands compliance with lots of constraints (e.g., matching, noise, robustness, ...). The triumph of digital CMOS circuits, thanks to their mentioned robustness, has, ultimately, facilitated the way that circuits can be processed by algorithms, abstraction levels and description languages, as well as how the design information traverse the hierarchical levels of a digital system. The field of analog design automation faces many more difficulties due to the many sources of perturbation, such as the well-know process variability, and the difficulty in treating these systematically, like digital tools can do. In this Thesis, different design flows are proposed, focusing on new design methodologies for analog circuits, thus, trying to close the ”gap” between digital and analog EDA tools. In this chapter, the most important sources for perturbations and their impact on the analog design process are discussed in Section 1.2. The traditional analog design flow is discussed in 1.3. Emerging design methodologies that try to reduce the ”design gap” are presented in Section 1.4 where the key concept of Pareto-Optimal Front (POF) is explained. This concept, brought from the field of economics, models the analog circuit performances into a set of solutions that show the optimal trade-offs among conflicting circuit performances (e.g. DC-gain and unity-gain frequency). Finally, the goals of this thesis are presented in Section 1.5

On the nature and effect of power distribution noise in CMOS digital integrated circuits

The thesis reports on the development of a novel simulation method aimed at modelling power distribution noise generated in digital CMOS integrated circuits. The simulation method has resulted in new information concerning: 1. The magnitude and nature of the power distribution noise and its dependence on the performance and electrical characteristics of the packaged integrated circuit. Emphasis is laid on the effects of resistive, capacitative and inductive elements associated with the packaged circuit. 2. Power distribution noise associated with a generic systolic array circuit comprising 1,020,000 transistors, of which 510,000 are synchronously active. The circuit is configured as a linear array which, if fabricated using two-micron bulk CMOS technology, would be over eight centimetres long and three millimetres wide. In principle, the array will perform 1.5 x 10 to the power of 11 operations per second. 3. Power distribution noise associated with a non-array-based signal processor which, if fabricated in 2-micron bulk CMOS technology, would occupy 6.7 sq. cm. The circuit contains about 900,000 transistors, of which 600,000 are functional and about 300,000 are used for yield enhancement. The processor uses the RADIX-2 algorithm and is designed to achieve 2 x 10 to the power of 8 floating point operations per second. 4. The extent to which power distribution noise limits the level of integration and/ or performance of such circuits using standard and non-standard fabrication and packaging technology. 5. The extent to which the predicted power distribution noise levels affect circuit susceptibility to transient latch-up and electromigration. It concludes the nature of CMOS digital integrated circuit power distribution noise and recommends ways in which it may be minimised. It outlines an approach aimed at mechanising the developed simulation methodology so that the performance of power distribution networks may more routinely be assessed. Finally. it questions the long term suitability of mainly digital techniques for signal processing

Methodology to accelerate diagnostic coverage assessment: MADC

Tese (doutorado) - Universidade Federal de Santa Catarina, Centro Tecnológico, Programa de Pós-Graduação em Engenharia Elétrica, Florianópolis, 2016.Os veículos da atualidade vêm integrando um número crescente de eletrônica embarcada, com o objetivo de permitir uma experiência mais segura aos motoristas. Logo, a garantia da segurança física é um requisito que precisa ser observada por completo durante o processo de desenvolvimento. O padrão ISO 26262 provê medidas para garantir que esses requisitos não sejam negligenciados. Injeção de falhas é fortemente recomendada quando da verificação do funcionamento dos mecanismos de segurança implementados, assim como sua capacidade de cobertura associada ao diagnóstico de falhas existentes. A análise exaustiva não é obrigatória, mas evidências de que o máximo esforço foi feito para acurar a cobertura de diagnóstico precisam ser apresentadas, principalmente durante a avalição dos níveis de segurança associados a arquitetura implementada em hardware. Estes níveis dão suporte às alegações de que o projeto obedece às métricas de segurança da integridade física exigida em aplicações automotivas. Os níveis de integridade variam de A à D, sendo este último o mais rigoroso. Essa Tese explora o estado-da-arte em soluções de verificação, e tem por objetivo construir uma metodologia que permita acelerar a verificação da cobertura de diagnóstico alcançado. Diferentemente de outras técnicas voltadas à aceleração de injeção de falhas, a metodologia proposta utiliza uma plataforma de hardware dedicada à verificação, com o intuito de maximizar o desempenho relativo a simulação de falhas. Muitos aspectos relativos a ISO 26262 são observados de forma que a presente contribuição possa ser apreciada no segmento automotivo. Por fim, uma arquitetura OpenRISC é utilizada para confirmar os resultados alcançados com essa solução proposta pertencente ao estado-da-arte.Abstract : Modern vehicles are integrating a growing number of electronics to provide a safer experience for the driver. Therefore, safety is a non-negotiable requirement that must be considered through the vehicle development process. The ISO 26262 standard provides guidance to ensure that such requirements are implemented. Fault injection is highly recommended for the functional verification of safety mechanisms or to evaluate their diagnostic coverage capability. An exhaustive analysis is not required, but evidence of best effort through the diagnostic coverage assessment needs to be provided when performing quantitative evaluation of hardware architectural metrics. These metrics support that the automotive safety integrity level ? ranging from A (lowest) to D (strictest) levels ? was obeyed. This thesis explores the most advanced verification solutions in order to build a methodology to accelerate the diagnostic coverage assessment. Different from similar techniques for fault injection acceleration, the proposed methodology does not require any modification of the design model to enable acceleration. Many functional safety requisites in the ISO 26262 are considered thus allowing the contribution presented to be a suitable solution for the automotive segment. An OpenRISC architecture is used to confirm the results achieved by this state-of-the-art solution

Improvement of a Propagation Delay Model for CMOS Digital Logic Circuits

Propagation delay models, for CMOS Digital Circuits, provide an initial design solution for Integrated Circuits. Resources, both monetary and manpower, constrain the design process, leading to the need for a more accurate entry point further along in the design cycle. By verifying an existing propagation delay method, and its resulting delay model, calibration for any given process technology can be achieved. Literature reviews and detailed analysis of each step in the model development allow for greater understanding of each contributing parameter, and ultimately, adjustments to the model calibration result in a more accurate analytical model. An existing model was verified and improved upon using TSMC 0.18um and IBM 0.13um SPICE decks, and the resulting improvements can be used to further assist individuals needing a method and model for deriving an initial circuit design solution for integrated circuits

Resilience of an embedded architecture using hardware redundancy

In the last decade the dominance of the general computing systems market has being replaced by embedded systems with billions of units manufactured every year. Embedded systems appear in contexts where continuous operation is of utmost importance and failure can be profound. Nowadays, radiation poses a serious threat to the reliable operation of safety-critical systems. Fault avoidance techniques, such as radiation hardening, have been commonly used in space applications. However, these components are expensive, lag behind commercial components with regards to performance and do not provide 100% fault elimination. Without fault tolerant mechanisms, many of these faults can become errors at the application or system level, which in turn, can result in catastrophic failures. In this work we study the concepts of fault tolerance and dependability and extend these concepts providing our own definition of resilience. We analyse the physics of radiation-induced faults, the damage mechanisms of particles and the process that leads to computing failures. We provide extensive taxonomies of 1) existing fault tolerant techniques and of 2) the effects of radiation in state-of-the-art electronics, analysing and comparing their characteristics. We propose a detailed model of faults and provide a classification of the different types of faults at various levels. We introduce an algorithm of fault tolerance and define the system states and actions necessary to implement it. We introduce novel hardware and system software techniques that provide a more efficient combination of reliability, performance and power consumption than existing techniques. We propose a new element of the system called syndrome that is the core of a resilient architecture whose software and hardware can adapt to reliable and unreliable environments. We implement a software simulator and disassembler and introduce a testing framework in combination with ERA’s assembler and commercial hardware simulators

Fault simulation for structural testing of analogue integrated circuits

In this thesis the ANTICS analogue fault simulation software is described which provides a statistical approach to fault simulation for accurate analogue IC test evaluation. The traditional figure of fault coverage is replaced by the average probability of fault detection. This is later refined by considering the probability of fault occurrence to generate a more realistic, weighted test metric. Two techniques to reduce the fault simulation time are described, both of which show large reductions in simulation time with little loss of accuracy. The final section of the thesis presents an accurate comparison of three test techniques and an evaluation of dynamic supply current monitoring. An increase in fault detection for dynamic supply current monitoring is obtained by removing the DC component of the supply current prior to measurement