Calibration and Nonlinearity Compensation for Force Application in AFM based Nanomanipulation

Abstract — Both the extent and accuracy of force application in atomic force microscope (AFM) nanomanipulation are significantly limited by the nonlinearity of the commonly used optical lever with a nonlinear position-sensitive detector (PSD). In order to compensate the nonlinearity of the optical lever, a nonlinear calibration method is presented. This method applies the nonlinear curve fit to a full-range position-voltage response of the photodiode, obtaining a continuous function of its voltagerelated sensitivity. Thus, Interaction forces can be defined as integrals of this sensitivity function between any two responses of photodiode voltage outputs, instead of rough transformation with a single conversion factor. The lateral position-voltage response of the photodiode, a universally acknowledged puzzle, was directly characterized by an accurately calibrated force sensor composed of a tippless piezoresistive force sensor, regardless of any knowledge of the cantilevers and laser measuring system. Experiments using a rectangular cantilever (normal force constant 0.24 N/m) demonstrated that the proposed nonlinear calibration method restrained the sensitivity error of normal position-voltage responses to 3.6 % and extended the force application range. Index Terms — Atomic force microscope, nanomanipulation, force calibration, nonlinearity compensation. I

Improvement in the Imaging Performance of Atomic Force Microscopy: A Survey

Nanotechnology is the branch of science which deals with the manipulation of matters at an extremely high resolution down to the atomic level. In recent years, atomic force microscopy (AFM) has proven to be extremely versatile as an investigative tool in this field. The imaging performance of AFMs is hindered by: 1) the complex behavior of piezo materials, such as vibrations due to the lightly damped low-frequency resonant modes, inherent hysteresis, and creep nonlinearities; 2) the cross-coupling effect caused by the piezoelectric tube scanner (PTS); 3) the limited bandwidth of the probe; 4) the limitations of the conventional raster scanning method using a triangular reference signal; 5) the limited bandwidth of the proportional-integral controllers used in AFMs; 6) the offset, noise, and limited sensitivity of position sensors and photodetectors; and 7) the limited sampling rate of the AFM's measurement unit. Due to these limitations, an AFM has a high spatial but low temporal resolution, i.e., its imaging is slow, e.g., an image frame of a living cell takes up to 120 s, which means that rapid biological processes that occur in seconds cannot be studied using commercially available AFMs. There is a need to perform fast scans using an AFM with nanoscale accuracy. This paper presents a survey of the literature, presents an overview of a few emerging innovative solutions in AFM imaging, and proposes future research directions.This work was supported in part by the Australian Research Council (ARC) under Grant FL11010002 and Grant DP160101121 and the UNSW Canberra under a Rector's Visiting Fellowshi

Bouc-Wen modeling and inverse multiplicative structure to compensate hysteresis nonlinearity in piezoelectric actuators.

International audienceA new approach to compensate the strong hysteresis nonlinearity in piezoelectric materials is proposed. Based on the inverse multiplicative scheme, the approach avoids models inversion as employed in existing works. The compensator is therefore simple to implement and does not require additional computation as soon as the direct model is available. The proposed compensation technique is valuable for hysteresis that are modeled with the Bouc-Wen set of equations

Dynamic Force/Position Modeling of a one-DOF Smart Piezoelectric Micro-Finger with Sensorized End-Effector.

International audienceIn this paper, a generic microscale system is studied where a smart microsystem composed of an active based material actuator, sensorized structure and transformation system is studied. This problem is important at the microscale because it offers a force measurement of the applied force by the actuator to a flexible environment which enables to understand the interaction between the complete smart microsystem and the environment and to design and control the interaction between the system and the environment. A special case where a sensorized end-effector is fixed on the tip of a piezoelectric actuator is detailed. Integrating a sensorized end-effector influences the behavior of the smart microfinger and is not studied in recent works. The complete finger, which is called in this paper smart finger, consists of a piezoelectric actuator, an end-effector and a novel piezoresistive force sensor. A complete model is developed for generating both force and displacement at the finger's tip while interaction with a flexible environment. A nonlinear model of the piezoelectric actuator is considered and a complete model is developed taking into account the frequency dependent hysteresis of the piezoelectric actuator. The model of the hysteresis is based on the Bouc-Wen method which simplifies the parameter estimation. The complete dynamic force/position model of the finger is validated experimentally with small errors (less than 10%)

A Modified Preisach Model for Hysteresis in Piezoelectric Actuators

Piezoelectric actuators (PEAs) exhibit hystérésis nonlinearity in open-loop operation, which may lead to undesirable inaccuracy and limit system performance. Classical Preisach model is widely used for portraying hysteresis but it requires a large number of first-order reversal curves to ensure the model accuracy. All the curves may not be obtained due to limitations of experimental conditions, and the detachment between the major and minor loops is not taken into account. This paper aims to propose a modified Preisach model that demands relatively few measurements and that describes the detachment. The modified model is implemented by adding a damper in parallel with the classical Preisach model. The parameter of the damper is adjusted to an appropriate value so that the measured and predicted hysteresis loops are in good agreement. Experimental results prove that the proposed modified Preisach model can characterize hysteresis more accurately than the classical model

Frequency domain approach for dynamics identification of the actuator with asymmetric hysteresis

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