Metodologia Per la Caratterizzazione di amplificatori a basso rumore per UMTS

In questo lavoro si presenta una metodologia di progettazione elettronica a livello di sistema, affrontando il problema della caratterizzazione dello spazio di progetto dell' amplificatore a basso rumore costituente il primo stadio di un front end a conversione diretta per UMTS realizzato in tecnologia CMOS con lunghezza di canale .18u. La metodologia è sviluppata al fine di valutare in modo quantititativo le specifiche ottime di sistema per il front-end stesso e si basa sul concetto di Piattaforma Analogica, che prevede la costruzione di un modello di prestazioni per il blocco analogico basato su campionamento statistico di indici di prestazioni del blocco stesso, misurati tramite simulazione di dimensionamenti dei componenti attivi e passivi soddisfacenti un set di equazioni specifico della topologia circuitale. Gli indici di prestazioni vengono successivamente ulizzati per parametrizzare modelli comportamentali utilizzati nelle fasi di ottimizzazione a livello di sistema. Modelli comportamentali atti a rappresentare i sistemi RF sono stati pertanto studiati per ottimizzare la scelta delle metriche di prestazioni. L'ottimizzazione dei set di equazioni atti a selezionare le configurazione di interesse per il campionamento ha al tempo stesso richiesto l'approfondimento dei modelli di dispositivi attivi validi in tutte le regioni di funzionamento, e lo studio dettagliato della progettazione degli amplificatori a basso rumore basati su degenerazione induttiva. Inoltre, il problema della modellizzazione a livello di sistema degli effetti della comunicazione tra LNA e Mixer è stato affrontato proponendo e analizzando diverse soluzioni. Il lavoro ha permesso di condurre un'ottimizzazione del front-end UMTS, giungendo a specifiche ottime a livello di sistema per l'amplificatore stesso

Application of Nonlinear Transistor Characteristics

This research presents three works all related by the subject of third-order distortion reduction in nonlinear circuits. Each one is a novel extension to previous work in that branch of electronics literature. All three follow the procedure of presenting a novel algebraic proof and following up with simulations and/or measurements to confirm the theoretical result. The works are generally themed around nonlinear low-frequency bipolar transistor circuits. Firstly, an investigation is conducted into a well documented effect in bipolar-junction transistors (BJTs) called inherent third-order distortion nulling. This effect is shown to be a fundamental result of the transistor’s transfer junction acting upon an input signal. The proof of a single BJT emitter-follower amplifier’s inherent null is examined which is well documented in the literature. This forms the basis for a novel extension in Darlington transistors where theory suggests the third-order null occurs at double the collector current of a single BJT. Discrete measurements of a CA3083 transistor array are undertaken and compared with theory and simulation data. These measurements confirm theory with reasonable accuracy. A temperature and process variation independent bias circuit is developed to solve one issue with using third-order distortion nulling. This work is interesting in that it branches into series resistance compensation for translinear circuits and stands as a useful circuit in its own right. Using stacks of matched forward-biased semiconductor junctions which conform to translinear conditions, a bias current can be generated which theoretically removes temperature and series resistance dependence on the particular BJT used. This proves useful for the previous work in distortion nulling, but also allows direct and accurate measurement of series resistance. Again, simulation and measurement data is obtained from discrete measurements of the proposed circuit, and the results conform with theory to a reasonable degree. Lastly, this work presents the analysis of a cascoded-compensation (Cascomp) amplifier. It presents the first fully nonlinear derivation of the Cascomp’s transfer function and its associated harmonic and intermodulation distortion components. The derivation reveals an interesting characteristic in which the third-order intermodulation distortion has multiple local minima. This characteristic has not yet been presented in the literature, and allows better optimisation of Cascomp amplifiers in any application. Again, this characteristic and its potential benefits are confirmed with simulation and discrete measurements. Observations of the presented works are discussed and built upon in the last chapter. This leads to suggestions on future research topics branching on from these works

Low Voltage Low Power Analogue Circuits Design

Disertační práce je zaměřena na výzkum nejběžnějších metod, které se využívají při návrhu analogových obvodů s využití nízkonapěťových (LV) a nízkopříkonových (LP) struktur. Tyto LV LP obvody mohou být vytvořeny díky vyspělým technologiím nebo také využitím pokročilých technik návrhu. Disertační práce se zabývá právě pokročilými technikami návrhu, především pak nekonvenčními. Mezi tyto techniky patří využití prvků s řízeným substrátem (bulk-driven - BD), s plovoucím hradlem (floating-gate - FG), s kvazi plovoucím hradlem (quasi-floating-gate - QFG), s řízeným substrátem s plovoucím hradlem (bulk-driven floating-gate - BD-FG) a s řízeným substrátem s kvazi plovoucím hradlem (quasi-floating-gate - BD-QFG). Práce je také orientována na možné způsoby implementace známých a moderních aktivních prvků pracujících v napěťovém, proudovém nebo mix-módu. Mezi tyto prvky lze začlenit zesilovače typu OTA (operational transconductance amplifier), CCII (second generation current conveyor), FB-CCII (fully-differential second generation current conveyor), FB-DDA (fully-balanced differential difference amplifier), VDTA (voltage differencing transconductance amplifier), CC-CDBA (current-controlled current differencing buffered amplifier) a CFOA (current feedback operational amplifier). Za účelem potvrzení funkčnosti a chování výše zmíněných struktur a prvků byly vytvořeny příklady aplikací, které simulují usměrňovací a induktanční vlastnosti diody, dále pak filtry dolní propusti, pásmové propusti a také univerzální filtry. Všechny aktivní prvky a příklady aplikací byly ověřeny pomocí PSpice simulací s využitím parametrů technologie 0,18 m TSMC CMOS. Pro ilustraci přesného a účinného chování struktur je v disertační práci zahrnuto velké množství simulačních výsledků.The dissertation thesis is aiming at examining the most common methods adopted by analog circuits' designers in order to achieve low voltage (LV) low power (LP) configurations. The capability of LV LP operation could be achieved either by developed technologies or by design techniques. The thesis is concentrating upon design techniques, especially the non–conventional ones which are bulk–driven (BD), floating–gate (FG), quasi–floating–gate (QFG), bulk–driven floating–gate (BD–FG) and bulk–driven quasi–floating–gate (BD–QFG) techniques. The thesis also looks at ways of implementing structures of well–known and modern active elements operating in voltage–, current–, and mixed–mode such as operational transconductance amplifier (OTA), second generation current conveyor (CCII), fully–differential second generation current conveyor (FB–CCII), fully–balanced differential difference amplifier (FB–DDA), voltage differencing transconductance amplifier (VDTA), current–controlled current differencing buffered amplifier (CC–CDBA) and current feedback operational amplifier (CFOA). In order to confirm the functionality and behavior of these configurations and elements, they have been utilized in application examples such as diode–less rectifier and inductance simulations, as well as low–pass, band–pass and universal filters. All active elements and application examples have been verified by PSpice simulator using the 0.18 m TSMC CMOS parameters. Sufficient numbers of simulated plots are included in this thesis to illustrate the precise and strong behavior of structures.

Modeling and characterization of HBT transistor and its application to EBG multiband antenna

Ph.DDOCTOR OF PHILOSOPH

RF Induced Nonlinear Effects in High-Speed Electronics

Previous experiments and research have indicated rectification of modulated electromagnetic interference can cause upset effects in digital electronics. Although RF rectification has been observed in discrete components, only speculation of the most sensitive mechanisms causing RF rectification has been proposed. Through theoretical analysis, experiments, and simulations, the p-n junctions in ESD protection circuits were determined to be susceptible to rectifying pulse modulated RF signals. Threshold experiments on several logic families of CMOS inverters provided indications to susceptibilities of electronics based on their input ESD protection topology. Parasitic elements have also been determined to cause additional effects including bias shifts, state changes, RF gain, and circuit resonances. DC and high frequency parameter extraction techniques were used to build diode and generic inverter models including package parasitics in PSPICE. Models were designed which gave good agreement to measured rectification drive curves, input impedance resonances, output voltage bias shifts, and induced spurious oscillations

Design of high frequency circuits for a gigabit per second data transmission system with isolation transformers and improved electrostatic protection

The focus of this dissertation is the design of a 10 Gbit/s wireline data communication system. The data is sent from the driver chip to the receiver chip on a printed circuit board (PCB). In the GHz frequency range, the parasitic effect of various circuits along the signal path affect the quality of the signal sent. Electrostatic Discharge (ESD) protection, PCB traces and packaging increase the signal loss and distortion;The parasitic effect of ESD protection circuits limits the maximum bandwidth for data transmission. The current high speed driver architectures have the driver circuit directly connected to the chip pads and PCB traces. This causes the chip to be prone to ESD discharge effects. Placing large ESD devices that shunt the output driver to ground, results in their parasitic capacitances acting as low pass filters that severely limit the data transmission rate. The packaging and PCB material are investigated in this project too. An electrical model of the bonding wire is developed through MATLAB RTM and HSPICERTM;In order to increase the data rate, changes in the architecture are performed. The contribution of this project is the introduction of on chip monolithic 4 port RF transformers at the driver and receiver front-end circuits. The transformers act as ESD isolation devices because they filter the low frequency components of the ESD signals before they damage the driver. The driver is physically isolated from the chip exterior. The signal in the driver is conveyed to the traces outside the chip by transformer induction behavior. Spark gap devices are added as ESD discharge paths too. Through investigating several transformer architectures, planar interleaved transformers are fabricated and characterized to have a bandwidth beyond 5GHz needed for suitable data transmission. A design and characterization method of RF transformers by geometric scaling is presented;The transformers are used in the driver and receiver circuit. Through simulation, the improved design proves to increase the bandwidth of the data link significantly

Variability analysis of FinFET AC/RF performances through efficient physics-based simulations for the optimization of RF CMOS stages

A nearly insatiable appetite for the latest electronic device enables the electronic technology sector to maintain research momentum. The necessity for advancement with miniaturization of electronic devices is the need of the day. Aggressive downscaling of electronic devices face some fundamental limits and thus, buoy up the change in device geometry. MOSFETs have been the leading contender in the electronics industry for years, but the dire need for miniaturization is forcing MOSFET to be scaled to nano-scale and in sub-50 nm scale. Short channel effects (SCE) become dominant and adversely affect the performance of the MOSFET. So, the need for a novel structure was felt to suppress SCE to an acceptable level. Among the proposed devices, FinFETs (Fin Field Effect Transistors) were found to be most effective to counter-act SCE in electronic devices. Today, many industries are working on electronic circuits with FinFETs as their primary element.One of limitation which FinFET faces is device variability. The purpose of this work was to study the effect that different sources of parameter fluctuations have on the behavior and characteristics of FinFETs. With deep literature review, we have gained insight into key sources of variability. Different sources of variations, like random dopant fluctuation, line edge roughness, fin variations, workfunction variations, oxide thickness variation, and source/drain doping variations, were studied and their impact on the performance of the device was studied as well. The adverse effect of these variations fosters the great amount of research towards variability modeling. A proper modeling of these variations is required to address the device performance metric before the fabrication of any new generation of the device on the commercial scale. The conventional methods to address the characteristics of a device under variability are Monte-Carlo-like techniques. In Monte Carlo analysis, all process parameters can be varied individually or simultaneously in a more realistic approach. The Monte Carlo algorithm takes a random value within the range of each process parameter and performs circuit simulations repeatedly. The statistical characteristics are estimated from the responses. This technique is accurate but requires high computational resources and time. Thus, efforts are being put by different research groups to find alternative tools. If the variations are small, Green’s Function (GF) approach can be seen as a breakthrough methodology. One of the most open research fields regards "Variability of FinFET AC performances". One reason for the limited AC variability investigations is the lack of commercially available efficient simulation tools, especially those based on accurate physics-based analysis: in fact, the only way to perform AC variability analysis through commercial TCAD tools like Synopsys Sentaurus is through the so-called Monte Carlo approach, that when variations are deterministic, is more properly referred to as incremental analysis, i.e., repeated solutions of the device model with varying physical parameters. For each selected parameter, the model must be solved first in DC operating condition (working point, WP) and then linearized around the WP, hence increasing severely the simulation time. In this work, instead, we used GF approach, using our in-house Simulator "POLITO", to perform AC variability analysis, provided that variations are small, alleviating the requirement of double linearization and reducing the simulation time significantly with a slight trade-off in accuracy. Using this tool we have, for the first time addressed the dependency of FinFET AC parameters on the most relevant process variations, opening the way to its application to RF circuits. This work is ultimately dedicated to the successful implementation of RF stages in commercial applications by incorporating variability effects and controlling the degradation of AC parameters due to variability. We exploited the POLITO (in-house simulator) limited to 2D structures, but this work can be extended to the variability analysis of 3D FinFET structure. Also variability analysis of III-V Group structures can be addressed. There is also potentiality to carry out the sensitivity analysis for the other source of variations, e.g., thermal variations

Ultra low power circuits for a miniature apnoea detection device

Imperial Users onl