Advanced reliability modeling of fault-tolerant computer-based systems

Two methodologies for the reliability assessment of fault tolerant digital computer based systems are discussed. The computer-aided reliability estimation 3 (CARE 3) and gate logic software simulation (GLOSS) are assessment technologies that were developed to mitigate a serious weakness in the design and evaluation process of ultrareliable digital systems. The weak link is based on the unavailability of a sufficiently powerful modeling technique for comparing the stochastic attributes of one system against others. Some of the more interesting attributes are reliability, system survival, safety, and mission success

Trends in reliability modeling technology for fault tolerant systems

Reliability modeling for fault tolerant avionic computing systems was developed. The modeling of large systems involving issues of state size and complexity, fault coverage, and practical computation was discussed. A novel technique which provides the tool for studying the reliability of systems with nonconstant failure rates is presented. The fault latency which may provide a method of obtaining vital latent fault data is measured

FIMSIM: A fault injection infrastructure for microarchitectural simulators

Fault injection is a widely used approach for experiment-based dependability evaluation in which faults can be injected to the hardware, to the simulator or to the software. Simulation based fault injection is more appealing for researchers, since it can be utilized at the early design stage of the processor. As such, it enables a preliminary analysis of the correlation between the criticality of circuit level faults and their impact on applications. However, the lack of publicly available fault injectors for microarchitecture level simulators brings extra burden of designing and implementing fault injectors to the researchers who evaluate microarchitecture dependability. In this study, we present FIMSIM, to the best of our knowledge, the first publicly available fault injection simulator at the microarchitecture level. FIMSIM is a compact tool which is capable of injecting transient, permanent, intermittent and multi-bit faults. Therefore, FIMSIM provides the opportunity to comprehensively evaluate the vulnerability of different microarchitectural structures against different fault models.Postprint (published version

Experimental analysis of computer system dependability

This paper reviews an area which has evolved over the past 15 years: experimental analysis of computer system dependability. Methodologies and advances are discussed for three basic approaches used in the area: simulated fault injection, physical fault injection, and measurement-based analysis. The three approaches are suited, respectively, to dependability evaluation in the three phases of a system's life: design phase, prototype phase, and operational phase. Before the discussion of these phases, several statistical techniques used in the area are introduced. For each phase, a classification of research methods or study topics is outlined, followed by discussion of these methods or topics as well as representative studies. The statistical techniques introduced include the estimation of parameters and confidence intervals, probability distribution characterization, and several multivariate analysis methods. Importance sampling, a statistical technique used to accelerate Monte Carlo simulation, is also introduced. The discussion of simulated fault injection covers electrical-level, logic-level, and function-level fault injection methods as well as representative simulation environments such as FOCUS and DEPEND. The discussion of physical fault injection covers hardware, software, and radiation fault injection methods as well as several software and hybrid tools including FIAT, FERARI, HYBRID, and FINE. The discussion of measurement-based analysis covers measurement and data processing techniques, basic error characterization, dependency analysis, Markov reward modeling, software-dependability, and fault diagnosis. The discussion involves several important issues studies in the area, including fault models, fast simulation techniques, workload/failure dependency, correlated failures, and software fault tolerance

Effects of intermittent faults on the reliability of a Reduced Instruction Set Computing (RISC) microprocessor

© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.With the scaling of complementary metal-oxide-semiconductor (CMOS) technology to the submicron range, designers have to deal with a growing number and variety of fault types. In this way, intermittent faults are gaining importance in modern very large scale integration (VLSI) circuits. The presence of these faults is increasing due to the complexity of manufacturing processes (which produce residues and parameter variations), together with special aging mechanisms. This work presents a case study of the impact of intermittent faults on the behavior of a reduced instruction set computing (RISC) microprocessor. We have carried out an exhaustive reliability assessment by using very-high-speed-integrated-circuit hardware description language (VHDL)-based fault injection. In this way, we have been able to modify different intermittent fault parameters, to select various targets, and even, to compare the impact of intermittent faults with those induced by transient and permanent faults.This work was supported by the Spanish Government under the Research Project TIN2009-13825 and by the Universitat Politecnica de Valencia under the Project SP20120806. Associate Editor: L. Cui.Gracia-Morán, J.; Baraza Calvo, JC.; Gil Tomás, DA.; Saiz-Adalid, L.; Gil, P. (2014). Effects of intermittent faults on the reliability of a Reduced Instruction Set Computing (RISC) microprocessor. IEEE Transactions on Reliability. 63(1):144-153. https://doi.org/10.1109/TR.2014.2299711S14415363

Advanced information processing system: Local system services

The Advanced Information Processing System (AIPS) is a multi-computer architecture composed of hardware and software building blocks that can be configured to meet a broad range of application requirements. The hardware building blocks are fault-tolerant, general-purpose computers, fault-and damage-tolerant networks (both computer and input/output), and interfaces between the networks and the computers. The software building blocks are the major software functions: local system services, input/output, system services, inter-computer system services, and the system manager. The foundation of the local system services is an operating system with the functions required for a traditional real-time multi-tasking computer, such as task scheduling, inter-task communication, memory management, interrupt handling, and time maintenance. Resting on this foundation are the redundancy management functions necessary in a redundant computer and the status reporting functions required for an operator interface. The functional requirements, functional design and detailed specifications for all the local system services are documented

Injecting Intermittent Faults for the Dependability Assessment of a Fault-Tolerant Microcomputer System

© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.As scaling is more and more aggressive, intermittent faults are increasing their importance in current deep submicron complementary metal-oxide-semiconductor (CMOS) technologies. This work shows the dependability assessment of a fault-tol- erant computer system against intermittent faults. The applied methodology lies in VHDL-based fault injection, which allows the assessment in early design phases, together with a high level of observability and controllability. The evaluated system is a duplex microcontroller system with cold stand-by sparing. A wide set of intermittent fault models have been injected, and from the simulation traces, coverages and latencies have been measured. Markov models for this system have been generated and some dependability functions, such as reliability and safety, have been calculated. From these results, some enhancements of detection and recovery mechanisms have been suggested. The methodology presented is general to any fault-tolerant computer system.This work was supported in part by the Universitat Politecnica de Valencia under the Research Project SP20120806, and in part by the Spanish Government under the Research Project TIN2012-38308-C02-01. Associate Editor: J. Shortle.Gil Tomás, DA.; Gracia Morán, J.; Baraza Calvo, JC.; Saiz Adalid, LJ.; Gil Vicente, PJ. (2016). Injecting Intermittent Faults for the Dependability Assessment of a Fault-Tolerant Microcomputer System. IEEE Transactions on Reliability. 65(2):648-661. https://doi.org/10.1109/TR.2015.2484058S64866165

Characterizing the Effects of Intermittent Faults on a Processor for Dependability Enhancement Strategy

As semiconductor technology scales into the nanometer regime, intermittent faults have become an increasing threat. This paper focuses on the effects of intermittent faults on NET versus REG on one hand and the implications for dependability strategy on the other. First, the vulnerability characteristics of representative units in OpenSPARC T2 are revealed, and in particular, the highly sensitive modules are identified. Second, an arch-level dependability enhancement strategy is proposed, showing that events such as core/strand running status and core-memory interface events can be candidates of detectable symptoms. A simple watchdog can be deployed to detect application running status (IEXE event). Then SDC (silent data corruption) rate is evaluated demonstrating its potential. Third and last, the effects of traditional protection schemes in the target CMT to intermittent faults are quantitatively studied on behalf of the contribution of each trap type, demonstrating the necessity of taking this factor into account for the strategy

Study of a unified hardware and software fault-tolerant architecture

A unified architectural concept, called the Fault Tolerant Processor Attached Processor (FTP-AP), that can tolerate hardware as well as software faults is proposed for applications requiring ultrareliable computation capability. An emulation of the FTP-AP architecture, consisting of a breadboard Motorola 68010-based quadruply redundant Fault Tolerant Processor, four VAX 750s as attached processors, and four versions of a transport aircraft yaw damper control law, is used as a testbed in the AIRLAB to examine a number of critical issues. Solutions of several basic problems associated with N-Version software are proposed and implemented on the testbed. This includes a confidence voter to resolve coincident errors in N-Version software. A reliability model of N-Version software that is based upon the recent understanding of software failure mechanisms is also developed. The basic FTP-AP architectural concept appears suitable for hosting N-Version application software while at the same time tolerating hardware failures. Architectural enhancements for greater efficiency, software reliability modeling, and N-Version issues that merit further research are identified

Cross-layer system reliability assessment framework for hardware faults

System reliability estimation during early design phases facilitates informed decisions for the integration of effective protection mechanisms against different classes of hardware faults. When not all system abstraction layers (technology, circuit, microarchitecture, software) are factored in such an estimation model, the delivered reliability reports must be excessively pessimistic and thus lead to unacceptably expensive, over-designed systems. We propose a scalable, cross-layer methodology and supporting suite of tools for accurate but fast estimations of computing systems reliability. The backbone of the methodology is a component-based Bayesian model, which effectively calculates system reliability based on the masking probabilities of individual hardware and software components considering their complex interactions. Our detailed experimental evaluation for different technologies, microarchitectures, and benchmarks demonstrates that the proposed model delivers very accurate reliability estimations (FIT rates) compared to statistically significant but slow fault injection campaigns at the microarchitecture level.Peer ReviewedPostprint (author's final draft