Circuit design of a novel adaptable and reliable L1 data cache

This paper proposes a novel adaptable and reliable L1 data cache design (Adapcache) with the unique capability of automatically adapting itself for different supply voltage levels and providing the highest reliability. Depending on the supply voltage level, Adapcache defines three operating modes: In high supply voltages, Adapcache provides reliability through single-bit parity. In middle range of supply voltages, Adapcache writes data to two separate cache-lines simultaneously in order to use one line for error recovery when the other line is faulty. In near threshold supply voltages, Adapcache writes data to three separate cache-lines simultaneously in order to provide the correct data based on bitwise majority voter. We design and simulate one embodiment of the Adapcache as a 64-KB L1 data cache with 45-nm CMOS technology at 2GHz processor frequency for almost nominal supply voltages (1V-0.6V), at 900MHz for middle supply voltages (0.6V-0.4V), and at 400MHz for near threshold supply voltages (0.4V-0.32V). According to our experimental results, the energy reduction and latency as well as cache capacity usage are improved compared to typical previous proposals, Triple Modular Redundancy (TMR) and Double Modular Redundancy (DMR) techniques and also to the state of the art proposal, Parichute Error Correction Code (ECC).Postprint (published version

Exploiting Adaptive Techniques to Improve Processor Energy Efficiency

Rapid device-miniaturization keeps on inducing challenges in building energy efficient microprocessors. As the size of the transistors continuously decreasing, more uncertainties emerge in their operations. On the other hand, integrating more and more transistors on a single chip accentuates the need to lower its supply-voltage. This dissertation investigates one of the primary device uncertainties - timing error, in microprocessor performance bottleneck in NTC era. Then it proposes various innovative techniques to exploit these opportunities to maintain processor energy efficiency, in the context of emerging challenges. Evaluated with the cross-layer methodology, the proposed approaches achieve substantial improvements in processor energy efficiency, compared to other start-of-art techniques

A Survey of Phase Classification Techniques for Characterizing Variable Application Behavior

Adaptable computing is an increasingly important paradigm that specializes system resources to variable application requirements, environmental conditions, or user requirements. Adapting computing resources to variable application requirements (or application phases) is otherwise known as phase-based optimization. Phase-based optimization takes advantage of application phases, or execution intervals of an application, that behave similarly, to enable effective and beneficial adaptability. In order for phase-based optimization to be effective, the phases must first be classified to determine when application phases begin and end, and ensure that system resources are accurately specialized. In this paper, we present a survey of phase classification techniques that have been proposed to exploit the advantages of adaptable computing through phase-based optimization. We focus on recent techniques and classify these techniques with respect to several factors in order to highlight their similarities and differences. We divide the techniques by their major defining characteristics---online/offline and serial/parallel. In addition, we discuss other characteristics such as prediction and detection techniques, the characteristics used for prediction, interval type, etc. We also identify gaps in the state-of-the-art and discuss future research directions to enable and fully exploit the benefits of adaptable computing.Comment: To appear in IEEE Transactions on Parallel and Distributed Systems (TPDS

A survey of emerging architectural techniques for improving cache energy consumption

The search goes on for another ground breaking phenomenon to reduce the ever-increasing disparity between the CPU performance and storage. There are encouraging breakthroughs in enhancing CPU performance through fabrication technologies and changes in chip designs but not as much luck has been struck with regards to the computer storage resulting in material negative system performance. A lot of research effort has been put on finding techniques that can improve the energy efficiency of cache architectures. This work is a survey of energy saving techniques which are grouped on whether they save the dynamic energy, leakage energy or both. Needless to mention, the aim of this work is to compile a quick reference guide of energy saving techniques from 2013 to 2016 for engineers, researchers and students

High-Performance Energy-Efficient and Reliable Design of Spin-Transfer Torque Magnetic Memory

In this dissertation new computing paradigms, architectures and design philosophy are proposed and evaluated for adopting the STT-MRAM technology as highly reliable, energy efficient and fast memory. For this purpose, a novel cross-layer framework from the cell-level all the way up to the system- and application-level has been developed. In these framework, the reliability issues are modeled accurately with appropriate fault models at different abstraction levels in order to analyze the overall failure rates of the entire memory and its Mean Time To Failure (MTTF) along with considering the temperature and process variation effects. Design-time, compile-time and run-time solutions have been provided to address the challenges associated with STT-MRAM. The effectiveness of the proposed solutions is demonstrated in extensive experiments that show significant improvements in comparison to state-of-the-art solutions, i.e. lower-power, higher-performance and more reliable STT-MRAM design

Adaptive Distributed Architectures for Future Semiconductor Technologies.

Year after year semiconductor manufacturing has been able to integrate more components in a single computer chip. These improvements have been possible through systematic shrinking in the size of its basic computational element, the transistor. This trend has allowed computers to progressively become faster, more efficient and less expensive. As this trend continues, experts foresee that current computer designs will face new challenges, in utilizing the minuscule devices made available by future semiconductor technologies. Today's microprocessor designs are not fit to overcome these challenges, since they are constrained by their inability to handle component failures by their lack of adaptability to a wide range of custom modules optimized for specific applications and by their limited design modularity. The focus of this thesis is to develop original computer architectures, that can not only survive these new challenges, but also leverage the vast number of transistors available to unlock better performance and efficiency. The work explores and evaluates new software and hardware techniques to enable the development of novel adaptive and modular computer designs. The thesis first explores an infrastructure to quantitatively assess the fallacies of current systems and their inadequacy to operate on unreliable silicon. In light of these findings, specific solutions are then proposed to strengthen digital system architectures, both through hardware and software techniques. The thesis culminates with the proposal of a radically new architecture design that can fully adapt dynamically to operate on the hardware resources available on chip, however limited or abundant those may be.PHDComputer Science and EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/102405/1/apellegr_1.pd

Exploiting task-based programming models for resilience

Hardware errors become more common as silicon technologies shrink and become more vulnerable, especially in memory cells, which are the most exposed to errors. Permanent and intermittent faults are caused by manufacturing variability and circuits ageing. While these can be mitigated once they are identified, their continuous rate of appearance throughout the lifetime of memory devices will always cause unexpected errors. In addition, transient faults are caused by effects such as radiation or small voltage/frequency margins, and there is no efficient way to shield against these events. Other constraints related to the diminishing sizes of transistors, such as power consumption and memory latency have caused the microprocessor industry to turn to increasingly complex processor architectures. To solve the difficulties arising from programming such architectures, programming models have emerged that rely on runtime systems. These systems form a new intermediate layer on the hardware-software abstraction stack, that performs tasks such as distributing work across computing resources: processor cores, accelerators, etc. These runtime systems dispose of a lot of information, both from the hardware and the applications, and offer thus many possibilities for optimisations. This thesis proposes solutions to the increasing fault rates in memory, across multiple resilience disciplines, from algorithm-based fault tolerance to hardware error correcting codes, through OS reliability strategies. These solutions rely for their efficiency on the opportunities presented by runtime systems. The first contribution of this thesis is an algorithmic-based resilience technique, allowing to tolerate detected errors in memory. This technique allows to recover data that is lost by performing computations that rely on simple redundancy relations identified in the program. The recovery is demonstrated for a family of iterative solvers, the Krylov subspace methods, and evaluated for the conjugate gradient solver. The runtime can transparently overlap the recovery with the computations of the algorithm, which allows to mask the already low overheads of this technique. The second part of this thesis proposes a metric to characterise the impact of faults in memory, which outperforms state-of-the-art metrics in precision and assurances on the error rate. This metric reveals a key insight into data that is not relevant to the program, and we propose an OS-level strategy to ignore errors in such data, by delaying the reporting of detected errors. This allows to reduce failure rates of running programs, by ignoring errors that have no impact. The architectural-level contribution of this thesis is a dynamically adaptable Error Correcting Code (ECC) scheme, that can increase protection of memory regions where the impact of errors is highest. A runtime methodology is presented to estimate the fault rate at runtime using our metric, through performance monitoring tools of current commodity processors. Guiding the dynamic ECC scheme online using the methodology's vulnerability estimates allows to decrease error rates of programs at a fraction of the redundancy cost required for a uniformly stronger ECC. This provides a useful and wide range of trade-offs between redundancy and error rates. The work presented in this thesis demonstrates that runtime systems allow to make the most of redundancy stored in memory, to help tackle increasing error rates in DRAM. This exploited redundancy can be an inherent part of algorithms that allows to tolerate higher fault rates, or in the form of dead data stored in memory. Redundancy can also be added to a program, in the form of ECC. In all cases, the runtime allows to decrease failure rates efficiently, by diminishing recovery costs, identifying redundant data, or targeting critical data. It is thus a very valuable tool for the future computing systems, as it can perform optimisations across different layers of abstractions.Los errores en memoria se vuelven más comunes a medida que las tecnologías de silicio reducen su tamaño. La variabilidad de fabricación y el envejecimiento de los circuitos causan fallos permanentes e intermitentes. Aunque se pueden mitigar una vez identificados, su continua tasa de aparición siempre causa errores inesperados. Además, la memoria también sufre de fallos transitorios contra los cuales no se puede proteger eficientemente. Estos fallos están causados por efectos como la radiación o los reducidos márgenes de voltaje y frecuencia. Otras restricciones coetáneas, como el consumo de energía y la latencia de la memoria, obligaron a las arquitecturas de computadores a volverse cada vez más complejas. Para programar tales procesadores, se desarrollaron modelos de programación basados en entornos de ejecución. Estos sistemas forman una nueva abstracción entre hardware y software, realizando tareas como la distribución del trabajo entre recursos informáticos: núcleos de procesadores, aceleradores, etc. Estos entornos de ejecución disponen de mucha información tanto sobre el hardware como sobre las aplicaciones, y ofrecen así muchas posibilidades de optimización. Esta tesis propone soluciones a los fallos en memoria entre múltiples disciplinas de resiliencia, desde la tolerancia a fallos basada en algoritmos, hasta los códigos de corrección de errores en hardware, incluyendo estrategias de resiliencia del sistema operativo. La eficiencia de estas soluciones depende de las oportunidades que presentan los entornos de ejecución. La primera contribución de esta tesis es una técnica a nivel algorítmico que permite corregir fallos encontrados mientras el programa su ejecuta. Para corregir fallos se han identificado redundancias simples en los datos del programa para toda una clase de algoritmos, los métodos del subespacio de Krylov (gradiente conjugado, GMRES, etc). La estrategia de recuperación de datos desarrollada permite corregir errores sin tener que reinicializar el algoritmo, y aprovecha el modelo de programación para superponer las computaciones del algoritmo y de la recuperación de datos. La segunda parte de esta tesis propone una métrica para caracterizar el impacto de los fallos en la memoria. Esta métrica supera en precisión a las métricas de vanguardia y permite identificar datos que son menos relevantes para el programa. Se propone una estrategia a nivel del sistema operativo retrasando la notificación de los errores detectados, que permite ignorar fallos en estos datos y reducir la tasa de fracaso del programa. Por último, la contribución a nivel arquitectónico de esta tesis es un esquema de Código de Corrección de Errores (ECC por sus siglas en inglés) adaptable dinámicamente. Este esquema puede aumentar la protección de las regiones de memoria donde el impacto de los errores es mayor. Se presenta una metodología para estimar el riesgo de fallo en tiempo de ejecución utilizando nuestra métrica, a través de las herramientas de monitorización del rendimiento disponibles en los procesadores actuales. El esquema de ECC guiado dinámicamente con estas estimaciones de vulnerabilidad permite disminuir la tasa de fracaso de los programas a una fracción del coste de redundancia requerido para un ECC uniformemente más fuerte. El trabajo presentado en esta tesis demuestra que los entornos de ejecución permiten aprovechar al máximo la redundancia contenida en la memoria, para contener el aumento de los errores en ella. Esta redundancia explotada puede ser una parte inherente de los algoritmos que permite tolerar más fallos, en forma de datos inutilizados almacenados en la memoria, o agregada a la memoria de un programa en forma de ECC. En todos los casos, el entorno de ejecución permite disminuir los efectos de los fallos de manera eficiente, disminuyendo los costes de recuperación, identificando datos redundantes, o focalizando esfuerzos de protección en los datos críticos.Postprint (published version

Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview

Advanced computing systems realized in forthcoming technologies hold the promise of a significant increase of computational capabilities. However, the same path that is leading technologies toward these remarkable achievements is also making electronic devices increasingly unreliable. Developing new methods to evaluate the reliability of these systems in an early design stage has the potential to save costs, produce optimized designs and have a positive impact on the product time-to-market. CLERECO European FP7 research project addresses early reliability evaluation with a cross-layer approach across different computing disciplines, across computing system layers and across computing market segments. The fundamental objective of the project is to investigate in depth a methodology to assess system reliability early in the design cycle of the future systems of the emerging computing continuum. This paper presents a general overview of the CLERECO project focusing on the main tools and models that are being developed that could be of interest for the research community and engineering practice