Dependable Computing on Inexact Hardware through Anomaly Detection.

Reliability of transistors is on the decline as transistors continue to shrink in size. Aggressive voltage scaling is making the problem even worse. Scaled-down transistors are more susceptible to transient faults as well as permanent in-field hardware failures. In order to continue to reap the benefits of technology scaling, it has become imperative to tackle the challenges risen due to the decreasing reliability of devices for the mainstream commodity market. Along with the worsening reliability, achieving energy efficiency and performance improvement by scaling is increasingly providing diminishing marginal returns. More than any other time in history, the semiconductor industry faces the crossroad of unreliability and the need to improve energy efficiency. These challenges of technology scaling can be tackled by categorizing the target applications in the following two categories: traditional applications that have relatively strict correctness requirement on outputs and emerging class of soft applications, from various domains such as multimedia, machine learning, and computer vision, that are inherently inaccuracy tolerant to a certain degree. Traditional applications can be protected against hardware failures by low-cost detection and protection methods while soft applications can trade off quality of outputs to achieve better performance or energy efficiency. For traditional applications, I propose an efficient, software-only application analysis and transformation solution to detect data and control flow transient faults. The intelligence of the data flow solution lies in the use of dynamic application information such as control flow, memory and value profiling. The control flow protection technique achieves its efficiency by simplifying signature calculations in each basic block and by performing checking at a coarse-grain level. For soft applications, I develop a quality control technique. The quality control technique employs continuous, light-weight checkers to ensure that the approximation is controlled and application output is acceptable. Overall, I show that the use of low-cost checkers to produce dependable results on commodity systems---constructed from inexact hardware components---is efficient and practical.PhDComputer Science and EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/113341/1/dskhudia_1.pd

Doctor of Philosophy

dissertationCurrent scaling trends in transistor technology, in pursuit of larger component counts and improving power efficiency, are making the hardware increasingly less reliable. Due to extreme transistor miniaturization, it is becoming easier to flip a bit stored in memory elements built using these transistors. Given that soft errors can cause transient bit-flips in memory elements, caused due to alpha particles and cosmic rays striking those elements, soft errors have become one of the major impediments in system resilience as we move towards exascale computing. Soft errors escaping the hardware-layer may silently corrupt the runtime application data of a program, causing silent data corruption in the output. Also, given that soft errors are transient in nature, it is notoriously hard to trace back their origins. Therefore, techniques to enhance system resilience hinge on the availability of efficient error detectors that have high detection rates, low false positive rates, and lower computational overhead. It is equally important to have a flexible infrastructure capable of simulating realistic soft error models to promote an effective evaluation of newly developed error detectors. In this work, we present a set of techniques for efficiently detecting soft errors affecting control-flow, data, and structured address computations in an application. We evaluate the efficacy of the proposed techniques by evaluating them on a collection of benchmarks through fault-injection driven studies. As an important requirement, we also introduce two new LLVM-based fault injectors, KULFI and VULFI, which are geared towards scalar and vector architectures, respectively. Through this work, we aim to make contributions to the system resilience community by making our research tools (in the form of error detectors and fault injectors) publicly available

Hardware-Assisted Dependable Systems

Unpredictable hardware faults and software bugs lead to application crashes, incorrect computations, unavailability of internet services, data losses, malfunctioning components, and consequently financial losses or even death of people. In particular, faults in microprocessors (CPUs) and memory corruption bugs are among the major unresolved issues of today. CPU faults may result in benign crashes and, more problematically, in silent data corruptions that can lead to catastrophic consequences, silently propagating from component to component and finally shutting down the whole system. Similarly, memory corruption bugs (memory-safety vulnerabilities) may result in a benign application crash but may also be exploited by a malicious hacker to gain control over the system or leak confidential data. Both these classes of errors are notoriously hard to detect and tolerate. Usual mitigation strategy is to apply ad-hoc local patches: checksums to protect specific computations against hardware faults and bug fixes to protect programs against known vulnerabilities. This strategy is unsatisfactory since it is prone to errors, requires significant manual effort, and protects only against anticipated faults. On the other extreme, Byzantine Fault Tolerance solutions defend against all kinds of hardware and software errors, but are inadequately expensive in terms of resources and performance overhead. In this thesis, we examine and propose five techniques to protect against hardware CPU faults and software memory-corruption bugs. All these techniques are hardware-assisted: they use recent advancements in CPU designs and modern CPU extensions. Three of these techniques target hardware CPU faults and rely on specific CPU features: ∆-encoding efficiently utilizes instruction-level parallelism of modern CPUs, Elzar re-purposes Intel AVX extensions, and HAFT builds on Intel TSX instructions. The rest two target software bugs: SGXBounds detects vulnerabilities inside Intel SGX enclaves, and “MPX Explained” analyzes the recent Intel MPX extension to protect against buffer overflow bugs. Our techniques achieve three goals: transparency, practicality, and efficiency. All our systems are implemented as compiler passes which transparently harden unmodified applications against hardware faults and software bugs. They are practical since they rely on commodity CPUs and require no specialized hardware or operating system support. Finally, they are efficient because they use hardware assistance in the form of CPU extensions to lower performance overhead

Efficient soft error protection for commodity embedded microprocessors using profile information

Successive generations of processors use smaller transistors in the quest to make more powerful computing systems. It has been previ-ously studied that smaller transistors make processors more suscep-tible to soft errors (transient faults caused by high energy particle strikes). Such errors can result in unexpected behavior and incorrect results. With smaller and cheaper transistors becoming pervasive in mainstream computing, it is necessary to protect these devices against soft errors; an increasing rate of faults necessitates the protection of applications running on commodity processors against soft errors. The existing methods of protecting against such faults generally have high area or performance overheads and thus are not directly applicable in the embedded design space. In order to protect against soft errors, the detection of these errors is a necessary first step so that a recovery can be triggered. To solve the problem of detecting soft errors cheaply, we propose a profiling-based software-only application analysis and transformation solution. The goal is to develop a low cost solution which can be de-ployed for off-the-shelf embedded processors. The solution works by intelligently duplicating instructions that are likely to affect the pro-gram output, and comparing results between original and duplicated instructions. The intelligence of our solution is garnered through the use of control flow, memory dependence, and value profiling to un-derstand and exploit the common-case behavior of applications. Our solution is able to achieve 92 % fault coverage with a 20 % instruction overhead. This represents a 41 % lower performance overhead than the best prior approaches with approximately the same fault coverage

Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview

Advanced computing systems realized in forthcoming technologies hold the promise of a significant increase of computational capabilities. However, the same path that is leading technologies toward these remarkable achievements is also making electronic devices increasingly unreliable. Developing new methods to evaluate the reliability of these systems in an early design stage has the potential to save costs, produce optimized designs and have a positive impact on the product time-to-market. CLERECO European FP7 research project addresses early reliability evaluation with a cross-layer approach across different computing disciplines, across computing system layers and across computing market segments. The fundamental objective of the project is to investigate in depth a methodology to assess system reliability early in the design cycle of the future systems of the emerging computing continuum. This paper presents a general overview of the CLERECO project focusing on the main tools and models that are being developed that could be of interest for the research community and engineering practice

High-Performance Energy-Efficient and Reliable Design of Spin-Transfer Torque Magnetic Memory

In this dissertation new computing paradigms, architectures and design philosophy are proposed and evaluated for adopting the STT-MRAM technology as highly reliable, energy efficient and fast memory. For this purpose, a novel cross-layer framework from the cell-level all the way up to the system- and application-level has been developed. In these framework, the reliability issues are modeled accurately with appropriate fault models at different abstraction levels in order to analyze the overall failure rates of the entire memory and its Mean Time To Failure (MTTF) along with considering the temperature and process variation effects. Design-time, compile-time and run-time solutions have been provided to address the challenges associated with STT-MRAM. The effectiveness of the proposed solutions is demonstrated in extensive experiments that show significant improvements in comparison to state-of-the-art solutions, i.e. lower-power, higher-performance and more reliable STT-MRAM design

SyRA: early system reliability analysis for cross-layer soft errors resilience in memory arrays of microprocessor systems

© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.Cross-layer reliability is becoming the preferred solution when reliability is a concern in the design of a microprocessor-based system. Nevertheless, deciding how to distribute the error management across the different layers of the system is a very complex task that requires the support of dedicated frameworks for cross-layer reliability analysis. This paper proposes SyRA, a system-level cross-layer early reliability analysis framework for radiation induced soft errors in memory arrays of microprocessor-based systems. The framework exploits a multi-level hybrid Bayesian model to describe the target system and takes advantage of Bayesian inference to estimate different reliability metrics. SyRA implements several mechanisms and features to deal with the complexity of realistic models and implements a complete tool-chain that scales efficiently with the complexity of the system. The simulation time is significantly lower than micro-architecture level or RTL fault-injection experiments with an accuracy high enough to take effective design decisions. To demonstrate the capability of SyRA, we analyzed the reliability of a set of microprocessor-based systems characterized by different microprocessor architectures (i.e., Intel x86, ARM Cortex-A15, ARM Cortex-A9) running both the Linux operating system or bare metal. Each system under analysis executes different software workloads both from benchmark suites and from real applications.Peer ReviewedPostprint (author's final draft

Early Component-Based System Reliability Analysis for Approximate Computing Systems

A key enabler of real applications on approximate computing systems is the availability of instruments to analyze system reliability, early in the design cycle. Accurately measuring the impact on system reliability of any change in the technology, circuits, microarchitecture and software is most of the time a multi-team multi-objective problem and reliability must be traded off against other crucial design attributes (or objectives) such as power, performance and cost. Unfortunately, tools and models for cross-layer reliability analysis are still at their early stages compared to other very mature design tools and this represents a major issue for mainstream applications. This paper presents preliminary information on a cross-layer framework built on top of a Bayesian model designed to perform component-based reliability analysis of complex systems