3,366 research outputs found

    Versatile Data Acquisition and Controls for Epics Using Vme-Based Fpgas

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    Field-Programmable Gate Arrays (FPGAs) have provided Thomas Jefferson National Accelerator Facility (Jefferson Lab) with versatile VME-based data acquisition and control interfaces with minimal development times. FPGA designs have been used to interface to VME and provide control logic for numerous systems. The building blocks of these logic designs can be tailored to the individual needs of each system and provide system operators with read-backs and controls via a VME interface to an EPICS based computer. This versatility allows the system developer to choose components and define operating parameters and options that are not readily available commercially. Jefferson Lab has begun developing standard FPGA libraries that result in quick turn around times and inexpensive designs.Comment: 3 pages, ICALEPCS 2001, T. Allison and R. Foold, Jefferson La

    Ring oscillator clocks and margins

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    How much margin do we have to add to the delay lines of a bundled-data circuit? This paper is an attempt to give a methodical answer to this question, taking into account all sources of variability and the existing EDA machinery for timing analysis and sign-off. The paper is based on the study of the margins of a ring oscillator that substitutes a PLL as clock generator. A timing model is proposed that shows that a 12% margin for delay lines can be sufficient to cover variability in a 65nm technology. In a typical scenario, performance and energy improvements between 15% and 35% can be obtained by using a ring oscillator instead of a PLL. The paper concludes that a synchronous circuit with a ring oscillator clock shows similar benefits in performance and energy as those of bundled-data asynchronous circuits.Peer ReviewedPostprint (author's final draft

    Computing centroids in current-mode technique

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    A novel current-mode circuit for calculating the centre of mass of a discrete distribution of currents is described. It is simple and compact, an ideal building block for VLSI analogue IC design. The design principles are presented as well as the simulated behaviour of a one-dimensional implementation

    Low-Jitter Clock Multiplication: a Comparioson between PLLs and DLLs

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    This paper shows that, for a given power budget, a practical phase-locked loop (PLL)-based clock multiplier generates less jitter than a delay-locked loop (DLL) equivalent. This is due to the fact that the delay cells in a PLL ring-oscillator can consume more power per cell than their counterparts in the DLL. We can show that this effect is stronger than the notorious jitter accumulation effect that occurs in the voltage-controlled oscillator (VCO) of a PLL. First, an analysis of the stochastic-output jitter of the architectures, due to the most important noise sources, is presented. Then, another important source of jitter in a DLL-based clock multiplier is treated, namely the stochastic mismatch in the delay cells which compose the DLL voltage-controlled delay line (VCDL). An analysis is presented that relates the stochastic spread of the delay of the cells to the output jitter of the clock multiplier. A circuit design technique, called impedance level scaling, is then presented which allows the designer to optimize the noise and mismatch behavior of a circuit, independently from other specifications such as speed and linearity. Applying this technique on a delay cell design yields a direct tradeoff between noise induced jitter and power usage, and between stochastic mismatch induced jitter and power usage

    Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report

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    The goal of this study was to perform an independent investigation of single event destructive and transient susceptibility of the Microsemi RTG4 device. The devices under test were the Microsemi RTG4 field programmable gate array (FPGA) Rev C. The devices under test will be referenced as the DUT or RTG4 Rev C throughout this document. The DUT was configured to have various test structures that are geared to measure specific potential susceptibilities of the device. DesignDevice susceptibility was determined by monitoring the DUT for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) was checked throughout heavy-ion testing by monitoring device current
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