Jitter measurement built-in self-test circuit for phase locked loops

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2005.Includes bibliographical references (p. 77-79).This paper discusses the development of a new type of BIST circuit, the (VDL)2, with the purpose of measuring jitter in IBM's phase locked loops. The (VDL)2, which stands for Variable Vernier Digital Delay Locked Line, implements both cycle-to-cycle and phase jitter measurements, by using a digital delay locked loop and a 60 stage Vernier delay line. This achieves a nominal jitter resolution of 10 ps with a capture range of +/- 150 ps and does so in real time. The proposed application for this circuit is during manufacturing test of the PLL. The circuit is implemented in IBM's 90 nm process and was completed in the PLL and Clocking Development ASIC group at IBM Microelectronics in Essex Junction, Vermont as part of the VI-A program.by Brandon Ray Kam.M.Eng

TIME-DIFFERENCE CIRCUITS: METHODOLOGY, DESIGN, AND DIGITAL REALIZATION

This thesis presents innovations for a special class of circuits called Time Difference (TD) circuits. We introduce a signal processing methodology with TD signals that alters the target signal from a magnitude perspective to time interval between two time events and systematically organizes the primary TD functions abstracted from existing TD circuits and systems. The TD circuits draw attention from a broad range of application fields. In addition, highly evolved complementary metal-oxide-semiconductor (CMOS) technology suffers from various problems related to voltage and current amplitude signal processing methods. Compared to traditional analog and digital circuits, TD circuits bring several compelling features: high-resolution, high-throughput, and low-design complexity with digital integration capability. Further, the fabrication technology is advancing into the nanometer regime; the reduction in voltage headroom limits the performance of traditional analog/mixed-signal designs. All-digital design of time-difference circuit needs to be stressed to adapt to the low-cost, low-power, and high-portability applications. We focus on Time-to-Digital Converters (TDC), one of the crucial building blocks in TD circuits. A novel algorithmic architecture is proposed based on a binary search algorithm and validated with both simulation and fabricated silicon. An all-digital structure Time-difference Amplifier (TDA) is designed and implemented to make FPGA and other all-digital implementations for TDC and related TD circuits feasible. Besides, we propose an all-digital timing measurement circuit based on the process variation from CMOS fabrication: PVTMC, which achieves a high measurement resolution:

Low Noise Time to Digital Converters as Phase Detectors for All Digital PLLs

Nowadays PLLs are used in in almost every electronic circuit, because phase correction and detection are very important in a circuit. For this phase detection TDCs are used. This work proposes and demonstrates a Low noise Time to Digital Converter (TDC). This Time to Digital converter will be used as a phase detector in an all Digital PLL, with a 100 MHz frequency. The proposed topology employs CMOS inverters, and Set and Reset Flip Flops, due to their simplicity, to achieve a 4 bit circuit. The performance of the circuit was studied by evaluation fundamental parameters like RMS jitter, linearity, resolution and range. To further test the circuit a mismatch and noise analysis was performed, by testing the circuit with the PVT corners and Monte Carlo variations. The proposed TDC is simulated, using UMC 130 nm CMOS technology, achieves a RMS jitter of 22.9 f s, a INL and DNL error of 0.13 and 0.11 LSB respectively and a resolution of 15.3 ps. The TDC also has a power consumption of 1.11 mW and a area of 0.143 mm2.Atualmente as PLLs são utilizadas em quase todos os circuitos eletrónicos, porque a correção e a deteção de fase são muito importantes num circuito. Para esta deteção de fase são utilizados CTDs. Este trabalho propõe e demonstra um conversor de tempo para digital (CTD) de baixo ruído. Este conversor de tempo para digital será utilizado como detetor de fase num PLL completamente Digital, com frequência de 100 MHz. A topologia proposta emprega inversores CMOS e Flip Flops Set e Reset, devido à sua simplicidade, para obter um circuito de 4 bits. O desempenho do circuito foi estudado pela avaliação de parâmetros fundamentais como jitter RMS, linearidade, resolução e alcance. Para testar ainda mais o circuito foi realizada uma análise de incompatibilidade e ruído, testando o circuito com os cantos PVT e variações de Monte Carlo. O CTD proposto é simulado, usando tecnologia UMC 130 nm CMOS, atinge um jitter RMS de 22,9 f s, um erro INL e DNL de 0,13 e 0,11 LSB respetivamente e uma resolução de 15,3 ps. O CTD tem também um consumo de energia de 1,11 mW e uma área de 0.143 mm2

One way Doppler extractor. Volume 1: Vernier technique

A feasibility analysis, trade-offs, and implementation for a One Way Doppler Extraction system are discussed. A Doppler error analysis shows that quantization error is a primary source of Doppler measurement error. Several competing extraction techniques are compared and a Vernier technique is developed which obtains high Doppler resolution with low speed logic. Parameter trade-offs and sensitivities for the Vernier technique are analyzed, leading to a hardware design configuration. A detailed design, operation, and performance evaluation of the resulting breadboard model is presented which verifies the theoretical performance predictions. Performance tests have verified that the breadboard is capable of extracting Doppler, on an S-band signal, to an accuracy of less than 0.02 Hertz for a one second averaging period. This corresponds to a range rate error of no more than 3 millimeters per second

A high speed serializer/deserializer design

A Serializer/Deserializer (SerDes) is a circuit that converts parallel data into a serial stream and vice versa. It helps solve clock/data skew problems, simplifies data transmission, lowers the power consumption and reduces the chip cost. The goal of this project was to solve the challenges in high speed SerDes design, which included the low jitter design, wide bandwidth design and low power design. A quarter-rate multiplexer/demultiplexer (MUX/DEMUX) was implemented. This quarter-rate structure decreases the required clock frequency from one half to one quarter of the data rate. It is shown that this significantly relaxes the design of the VCO at high speed and achieves lower power consumption. A novel multi-phase LC-ring oscillator was developed to supply a low noise clock to the SerDes. This proposed VCO combined an LC-tank with a ring structure to achieve both wide tuning range (11%) and low phase noise (-110dBc/Hz at 1MHz offset). With this structure, a data rate of 36 Gb/s was realized with a measured peak-to-peak jitter of 10ps using 0.18microm SiGe BiCMOS technology. The power consumption is 3.6W with 3.4V power supply voltage. At a 60 Gb/s data rate the simulated peak-to-peak jitter was 4.8ps using 65nm CMOS technology. The power consumption is 92mW with 2V power supply voltage. A time-to-digital (TDC) calibration circuit was designed to compensate for the phase mismatches among the multiple phases of the PLL clock using a three dimensional fully depleted silicon on insulator (3D FDSOI) CMOS process. The 3D process separated the analog PLL portion from the digital calibration portion into different tiers. This eliminated the noise coupling through the common substrate in the 2D process. Mismatches caused by the vertical tier-to-tier interconnections and the temperature influence in the 3D process were attenuated by the proposed calibration circuit. The design strategy and circuits developed from this dissertation provide significant benefit to both wired and wireless applications

Delay Measurements and Self Characterisation on FPGAs

This thesis examines new timing measurement methods for self delay characterisation of Field-Programmable Gate Arrays (FPGAs) components and delay measurement of complex circuits on FPGAs. Two novel measurement techniques based on analysis of a circuit's output failure rate and transition probability is proposed for accurate, precise and efficient measurement of propagation delays. The transition probability based method is especially attractive, since it requires no modifications in the circuit-under-test and requires little hardware resources, making it an ideal method for physical delay analysis of FPGA circuits. The relentless advancements in process technology has led to smaller and denser transistors in integrated circuits. While FPGA users benefit from this in terms of increased hardware resources for more complex designs, the actual productivity with FPGA in terms of timing performance (operating frequency, latency and throughput) has lagged behind the potential improvements from the improved technology due to delay variability in FPGA components and the inaccuracy of timing models used in FPGA timing analysis. The ability to measure delay of any arbitrary circuit on FPGA offers many opportunities for on-chip characterisation and physical timing analysis, allowing delay variability to be accurately tracked and variation-aware optimisations to be developed, reducing the productivity gap observed in today's FPGA designs. The measurement techniques are developed into complete self measurement and characterisation platforms in this thesis, demonstrating their practical uses in actual FPGA hardware for cross-chip delay characterisation and accurate delay measurement of both complex combinatorial and sequential circuits, further reinforcing their positions in solving the delay variability problem in FPGAs

Formal Verification and In-Situ Test of Analog and Mixed-Signal Circuits

As CMOS technologies continuously scale down, designing robust analog and mixed-signal (AMS) circuits becomes increasingly difficult. Consequently, there are pressing needs for AMS design checking techniques, more specifically design verification and design for testability (DfT). The purpose of verification is to ensure that the performance of an AMS design meets its specification under process, voltage and temperature (PVT) variations and different working conditions, while DfT techniques aim at embedding testability into the design, by adding auxiliary circuitries for testing purpose. This dissertation focuses on improving the robustness of AMS designs in highly scaled technologies, by developing novel formal verification and in-situ test techniques. Compared with conventional AMS verification that relies more on heuristically chosen simulations, formal verification provides a mathematically rigorous way of checking the target design property. A formal verification framework is proposed that incorporates nonlinear SMT solving techniques and simulation exploration to efficiently verify the dynamic properties of AMS designs. A powerful Bayesian inference based technique is applied to dynamically tradeoff between the costs of simulation and nonlinear SMT. The feasibility and efficacy of the proposed methodology are demonstrated on the verification of lock time specification of a charge-pump PLL. The powerful and low-cost digital processing capabilities of today?s CMOS technologies are enabling many new in-situ test schemes in a mixed-signal environment. First, a novel two-level structure of GRO-PVDL is proposed for on-chip jitter testing of high-speed high-resolution applications with a gated ring oscillator (GRO) at the first level to provide a coarse measurement and a Vernier-style structure at the second level to further measure the residue from the first level with a fine resolution. With the feature of quantization noise shaping, an effective resolution of 0.8ps can be achieved using a 90nm CMOS technology. Second, the reconfigurability of recent all-digital PLL designs is exploited to provide in-situ output jitter test and diagnosis abilities under multiple parametric variations of key analog building blocks. As an extension, an in-situ test scheme is proposed to provide online testing for all-digital PLL based polar transmitters

Time-Mode Analog Circuit Design for Nanometric Technologies

Rapid scaling in technology has introduced new challenges in the realm of traditional analog design. Scaling of supply voltage directly impacts the available voltage-dynamic-range. On the other hand, nanometric technologies with fT in the hundreds of GHz range open opportunities for time-resolution-based signal processing. With reduced available voltage-dynamic-range and improved timing resolution, it is more convenient to devise analog circuits whose performance depends on edge-timing precision rather than voltage levels. Thus, instead of representing the data/information in the voltage-mode, as a difference between two node voltages, it should be represented in time-mode as a time-difference between two rising and/or falling edges. This dissertation addresses the feasibility of employing time-mode analog circuit design in different applications. Specifically: 1) Time-mode-based quanitzer and feedback DAC of SigmaDelta ADC. 2) Time-mode-based low-THD 10MHz oscillator, 3) A Spur-Frequency Boosting PLL with -74dBc Reference-Spur Rejection in 90nm Digital CMOS. In the first project, a new architectural solution is proposed to replace the DAC and the quantizer by a Time-to-Digital converter. The architecture has been fabricated in 65nm and shows that this technology node is capable of achieving a time-matching of 800fs which has never been reported. In addition, a competitive figure-of-merit is achieved. In the low-THD oscillator, I proposed a new architectural solution for synthesizing a highly-linear sinusoidal signal using a novel harmonic rejection approach. The chip is fabricated in 130nm technology and shows an outstanding performance compared to the state of the art. The designed consumes 80% less power; consumes less area; provides much higher amplitude while being composed of purely digital circuits and passive elements. Last but not least, the spur-frequency boosting PLL employs a novel technique that eliminates the reference spurs. Instead of adding additional filtering at the reference frequency, the spur frequency is boosted to higher frequency which is, naturally, has higher filtering effects. The prototype is fabricated in 90nm digital CMOS and proved to provide the lowest normalized reference spurs ever reported

Reconfigurable time interval measurement circuit incorporating a programmable gain time difference amplifier

PhD ThesisAs further advances are made in semiconductor manufacturing technology the performance of circuits is continuously increasing. Unfortunately, as the technology node descends deeper into the nanometre region, achieving the potential performance gain is becoming more of a challenge; due not only to the effects of process variation but also to the reduced timing margins between signals within the circuit creating timing problems. Production Standard Automatic Test Equipment (ATE) is incapable of performing internal timing measurements due, first to the lack of accessibility and second to the overall timing accuracy of the tester which is grossly inadequate. To address these issue ‘on-chip’ time measurement circuits have been developed in a similar way that built in self-test (BIST) evolved for ‘on-chip’ logic testing. This thesis describes the design and analysis of three time amplifier circuits. The analysis undertaken considers the operational aspects related to gain and input dynamic range, together with the robustness of the circuits to the effects of process, voltage and temperature (PVT) variations. The design which had the best overall performance was subsequently compared to a benchmark design, which used the ‘buffer delay offset’ technique for time amplification, and showed a marked 6.5 times improvement on the dynamic range extending this from 40 ps to 300ps. The new design was also more robust to the effects of PVT variations. The new time amplifier design was further developed to include an adjustable gain capability which could be varied in steps of approximately 7.5 from 4 to 117. The time amplifier was then connected to a 32-stage tapped delay line to create a reconfigurable time measurement circuit with an adjustable resolution range from 15 down to 0.5 ps and a dynamic range from 480 down to 16 ps depending upon the gain setting. The overall footprint of the measurement circuit, together with its calibration module occupies an area of 0.026 mm2 The final circuit, overall, satisfied the main design criteria for ‘on-chip’ time measurement circuitry, namely, it has a wide dynamic range, high resolution, robust to the effects of PVT and has a small area overhead.Umm Al-Qura University

펄스 기반 피드 포워드 이퀄라이저를 갖춘 고용량 DRAM을 위한 컨트롤러 PHY 설계

학위논문 (박사) -- 서울대학교 대학원 : 공과대학 전기·정보공학부, 2020. 8. 김수환.A controller PHY for managed DRAM solution, which is a new memory structure to maximize capacity while minimizing refresh power, is presented. Inter-symbol interference is critical in such a high-capacity DRAM interface in which many DRAM chips share a command/address (C/A) channel. A pulse-based feed-forward equalizer (PB-FFE) is introduced to reduce ISI on a C/A channel. The controller PHY supports all the training sequences specified in the DDR4 standard. A glitch-free DCDL is also adopted to perform link training efficiently and to reduce training time. The DQ transmitter adopts quarter-rate architecture to reduce output latency. For the quarter-rate transmitters in DQ, we propose a quadrature error corrector (QEC), in which clock signal phase errors are corrected using two replicas of the 4:1 serializer of the output stage. Pulse shrinking is used to compare and equalize the outputs of these two replica serializers. A controller PHY was fabricated in 55nm CMOS. The PB-FFE increases the timing margin from 0.23UI to 0.29UI at 1067Mbps. At 2133Mbps, the read timing and voltage margins are 0.53UI and 211mV after read training, and the write margins are 0.72UI and 230mV after write training. To validate the QEC effectiveness, a prototype quarter-rate transmitter, including the QEC, was fabricated to another chip in 65nm CMOS. Adopting our QEC, the experimental results show that the output phase errors of the transmitter are reduced to a residual error of 0.8ps, and the output eye width and height are improved by 84% and 61%, respectively, at a data-rate of 12.8Gbps.본 연구에서 용량을 최대화하면서도 리프레시 전력을 최소화할 수 있는 새로운 메모리 구조인 관리형 DRAM 솔루션을 위한 컨트롤러 PHY를 제시하였다. 이와 같은 고용량 DRAM 인터페이스에서는 많은 DRAM 칩이 명령 / 주소 (C/A) 채널을 공유하고 있어서 심볼 간 간섭이 발생한다. 본 연구에서는 이러한 C/A 채널에서의 심볼 간 간섭을 줄이기 위해 펄스 기반 피드 포워드 이퀄라이저 (PB-FFE)를 채택하였다. 또한 본 연구의 컨트롤러 PHY는 DDR4 표준에 지정된 모든 트레이닝 시퀀스를 지원한다. 링크 트레이닝을 효율적으로 수행하고 트레이닝 시간을 줄이기 위해 글리치가 발생하지 않는 디지털 제어 지연 라인 (DCDL)을 채택하였다. 컨트롤러 PHY의 DQ 송신기는 출력 대기 시간을 줄이기 위해 쿼터 레이트 구조를 채택하였다. 쿼터 레이트 송신기의 경우에는 직교 클럭 간 위상 오류가 출력 신호의 무결성에 영향을 주게 된다. 이러한 영향을 최소화하기 위해 본 연구에서는 출력 단의 4 : 1 직렬 변환기의 두 복제본을 사용하여 클록 신호 위상 오류를 수정하는 QEC (Quadrature Error Corrector)를 제안하였다. 복제된 2개의 직렬 변환기의 출력을 비교하고 균등화하기 위해 펄스 수축 지연 라인이 사용되었다. 컨트롤러 PHY는 55nm CMOS 공정으로 제조되었다. PB-FFE는 1067Mbps에서 C/A 채널 타이밍 마진을 0.23UI에서 0.29UI로 증가시킨다. 읽기 트레이닝 후 읽기 타이밍 및 전압 마진은 2133Mbps에서 0.53UI 및 211mV이고, 쓰기 트레이닝 후 쓰기 마진은 0.72UI 및 230mV이다. QEC의 효과를 검증하기 위해 QEC를 포함한 프로토 타입 쿼터 레이트 송신기를 65nm CMOS의 다른 칩으로 제작하였다. QEC를 적용한 실험 결과, 송신기의 출력 위상 오류가 0.8ps의 잔류 오류로 감소하고, 출력 데이터 눈의 폭과 높이가 12.8Gbps의 데이터 속도에서 각각 84 %와 61 % 개선되었음을 보여준다.CHAPTER 1 INTRODUCTION 1 1.1 MOTIVATION 1 1.1.1 HEAVY LOAD C/A CHANNEL 5 1.1.2 QUARTER-RATE ARCHITECTURE IN DQ TRANSMITTER 7 1.1.3 SUMMARY 8 1.2 THESIS ORGANIZATION 10 CHAPTER 2 ARCHITECTURE 11 2.1 MDS DIMM STRUCTURE 11 2.2 MDS CONTROLLER 15 2.3 MDS CONTROLLER PHY 17 2.3.1 INITIALIZATION SEQUENCE 20 2.3.2 LINK TRAINING FINITE-STATE MACHINE 23 2.3.3 POWER DOWN MODE 28 CHAPTER 3 PULSE-BASED FEED-FORWARD EQUALIZER 29 3.1 COMMAND/ADDRESS CHANNEL 29 3.2 COMMAND/ADDRESS TRANSMITTER 33 3.3 PULSE-BASED FEED-FORWARD EQUALIZER 35 CHAPTER 4 CIRCUIT IMPLEMENTATION 39 4.1 BUILDING BLOCKS 39 4.1.1 ALL-DIGITAL PHASE-LOCKED LOOP (ADPLL) 39 4.1.2 ALL-DIGITAL DELAY-LOCKED LOOP (ADDLL) 44 4.1.3 GLITCH-FREE DCDL CONTROL 47 4.1.4 DUTY-CYCLE CORRECTOR (DCC) 50 4.1.5 DQ/DQS TRANSMITTER 52 4.1.6 DQ/DQS RECEIVER 54 4.1.7 ZQ CALIBRATION 56 4.2 MODELING AND VERIFICATION OF LINK TRAINING 59 4.3 BUILT-IN SELF-TEST CIRCUITS 66 CHAPTER 5 QUADRATURE ERROR CORRECTOR USING REPLICA SERIALIZERS AND PULSE-SHRINKING DELAY LINES 69 5.1 PHASE CORRECTION USING REPLICA SERIALIZERS AND PULSE-SHRINKING UNITS 69 5.2 OVERALL QEC ARCHITECTURE AND ITS OPERATION 71 5.3 FINE DELAY UNIT IN THE PSDL 76 CHAPTER 6 EXPERIMENTAL RESULTS 78 6.1 CONTROLLER PHY 78 6.2 PROTOTYPE QEC 88 CHAPTER 7 CONCLUSION 94 BIBLIOGRAPHY 96Docto