From FPGA to ASIC: A RISC-V processor experience

This work document a correct design flow using these tools in the Lagarto RISC- V Processor and the RTL design considerations that must be taken into account, to move from a design for FPGA to design for ASIC

Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study

We present an industrial case study that demonstrates the practicality and effectiveness of Symbolic Quick Error Detection (Symbolic QED) in detecting logic design flaws (logic bugs) during pre-silicon verification. Our study focuses on several microcontroller core designs (~1,800 flip-flops, ~70,000 logic gates) that have been extensively verified using an industrial verification flow and used for various commercial automotive products. The results of our study are as follows: 1. Symbolic QED detected all logic bugs in the designs that were detected by the industrial verification flow (which includes various flavors of simulation-based verification and formal verification). 2. Symbolic QED detected additional logic bugs that were not recorded as detected by the industrial verification flow. (These additional bugs were also perhaps detected by the industrial verification flow.) 3. Symbolic QED enables significant design productivity improvements: (a) 8X improved (i.e., reduced) verification effort for a new design (8 person-weeks for Symbolic QED vs. 17 person-months using the industrial verification flow). (b) 60X improved verification effort for subsequent designs (2 person-days for Symbolic QED vs. 4-7 person-months using the industrial verification flow). (c) Quick bug detection (runtime of 20 seconds or less), together with short counterexamples (10 or fewer instructions) for quick debug, using Symbolic QED

E-QED: Electrical Bug Localization During Post-Silicon Validation Enabled by Quick Error Detection and Formal Methods

During post-silicon validation, manufactured integrated circuits are extensively tested in actual system environments to detect design bugs. Bug localization involves identification of a bug trace (a sequence of inputs that activates and detects the bug) and a hardware design block where the bug is located. Existing bug localization practices during post-silicon validation are mostly manual and ad hoc, and, hence, extremely expensive and time consuming. This is particularly true for subtle electrical bugs caused by unexpected interactions between a design and its electrical state. We present E-QED, a new approach that automatically localizes electrical bugs during post-silicon validation. Our results on the OpenSPARC T2, an open-source 500-million-transistor multicore chip design, demonstrate the effectiveness and practicality of E-QED: starting with a failed post-silicon test, in a few hours (9 hours on average) we can automatically narrow the location of the bug to (the fan-in logic cone of) a handful of candidate flip-flops (18 flip-flops on average for a design with ~ 1 Million flip-flops) and also obtain the corresponding bug trace. The area impact of E-QED is ~2.5%. In contrast, deter-mining this same information might take weeks (or even months) of mostly manual work using traditional approaches

Automated Debugging Methodology for FPGA-based Systems

Electronic devices make up a vital part of our lives. These are seen from mobiles, laptops, computers, home automation, etc. to name a few. The modern designs constitute billions of transistors. However, with this evolution, ensuring that the devices fulfill the designer’s expectation under variable conditions has also become a great challenge. This requires a lot of design time and effort. Whenever an error is encountered, the process is re-started. Hence, it is desired to minimize the number of spins required to achieve an error-free product, as each spin results in loss of time and effort. Software-based simulation systems present the main technique to ensure the verification of the design before fabrication. However, few design errors (bugs) are likely to escape the simulation process. Such bugs subsequently appear during the post-silicon phase. Finding such bugs is time-consuming due to inherent invisibility of the hardware. Instead of software simulation of the design in the pre-silicon phase, post-silicon techniques permit the designers to verify the functionality through the physical implementations of the design. The main benefit of the methodology is that the implemented design in the post-silicon phase runs many order-of-magnitude faster than its counterpart in pre-silicon. This allows the designers to validate their design more exhaustively. This thesis presents five main contributions to enable a fast and automated debugging solution for reconfigurable hardware. During the research work, we used an obstacle avoidance system for robotic vehicles as a use case to illustrate how to apply the proposed debugging solution in practical environments. The first contribution presents a debugging system capable of providing a lossless trace of debugging data which permits a cycle-accurate replay. This methodology ensures capturing permanent as well as intermittent errors in the implemented design. The contribution also describes a solution to enhance hardware observability. It is proposed to utilize processor-configurable concentration networks, employ debug data compression to transmit the data more efficiently, and partially reconfiguring the debugging system at run-time to save the time required for design re-compilation as well as preserve the timing closure. The second contribution presents a solution for communication-centric designs. Furthermore, solutions for designs with multi-clock domains are also discussed. The third contribution presents a priority-based signal selection methodology to identify the signals which can be more helpful during the debugging process. A connectivity generation tool is also presented which can map the identified signals to the debugging system. The fourth contribution presents an automated error detection solution which can help in capturing the permanent as well as intermittent errors without continuous monitoring of debugging data. The proposed solution works for designs even in the absence of golden reference. The fifth contribution proposes to use artificial intelligence for post-silicon debugging. We presented a novel idea of using a recurrent neural network for debugging when a golden reference is present for training the network. Furthermore, the idea was also extended to designs where golden reference is not present

A Survey of Techniques For Improving Energy Efficiency in Embedded Computing Systems

Recent technological advances have greatly improved the performance and features of embedded systems. With the number of just mobile devices now reaching nearly equal to the population of earth, embedded systems have truly become ubiquitous. These trends, however, have also made the task of managing their power consumption extremely challenging. In recent years, several techniques have been proposed to address this issue. In this paper, we survey the techniques for managing power consumption of embedded systems. We discuss the need of power management and provide a classification of the techniques on several important parameters to highlight their similarities and differences. This paper is intended to help the researchers and application-developers in gaining insights into the working of power management techniques and designing even more efficient high-performance embedded systems of tomorrow

The Design of a Debugger Unit for a RISC Processor Core

Recently, there has been a significant increase in design complexity for Embedded Systems often referred to as Hardware Software Co-Design. Complexity in design is due to both hardware and firmware closely coupled together in-order to achieve features for low power, high performance and low area. Due to these demands, embedded systems consist of multiple interconnected hardware IPs with complex firmware algorithms running on the device. Often such designs are available in bare-metal form, i.e without an Operating System, which results in difficulty while debugging due to lack of insight into the system. As a result, development cycle and time to market are increased. One of the major challenges for bare-metal design is to capture internal data required during debugging or testing in the post silicon validation stage effectively and efficiently. Post-silicon validation can be performed by leveraging on different technologies such as hardware software co-verification using hardware accelerators, FPGA emulation, logic analyzers, and so on which reduces the complete development cycle time. This requires the hardware to be instrumented with certain features which support debugging capabilities. As there is no standard for debugging capabilities and debugging infrastructure, it completely depends on the manufacturer to manufacturer or designer to designer. This work aims to implement minimum required features for debugging a bare-metal core by instrumenting the hardware compatible for debugging. It takes into consideration the fact that for a single core bare-metal embedded systems silicon area is also a constraint and there must be a trade-off between debugging capabilities which can be implemented in hardware and portions handled in software. The paper discusses various debugging approaches developed and implemented on various processor platforms and implements a new debugging infrastructure by instrumenting the Open-source AMBER 25 core with a set of debug features such as breakpoints, current state read, trace and memory access. Interface between hardware system and host system is designed using a JTAG standard TAP controller. The resulting design can be used in debugging and testing during post silicon verification and validation stages. The design is synthesized using Synopsys Design Compiler targeting a 65 nm technology node and results are compared for the instrumented and non-instrumented system