TFI-FTS: An efficient transient fault injection and fault-tolerant system for asynchronous circuits on FPGA platform

Designing VLSI digital circuits is challenging tasks because of testing the circuits concerning design time. The reliability and productivity of digital integrated circuits are primarily affected by the defects in the manufacturing process or systems. If the defects are more in the systems, which leads the fault in the systems. The fault tolerant systems are necessary to overcome the faults in the VLSI digital circuits. In this research article, an asynchronous circuits based an effective transient fault injection (TFI) and fault tolerant system (FTS) are modelled. The TFI system generates the faults based on BMA based LFSR with faulty logic insertion and one hot encoded register. The BMA based LFSR reduces the hardware complexity with less power consumption on-chip than standard LFSR method. The FTS uses triple mode redundancy (TMR) based majority voter logic (MVL) to tolerant the faults for asynchronous circuits. The benchmarked 74X-series circuits are considered as an asynchronous circuit for TMR logic. The TFI-FTS module is modeled using Verilog-HDL on Xilinx-ISE and synthesized on hardware platform. The Performance parameters are tabulated for TFI-FTS based asynchronous circuits. The performance of TFI-FTS Module is analyzed with 100% fault coverage. The fault coverage is validated using functional simulation of each asynchronous circuit with fault injection in TFI-FTS Module

Design of Asynchronous Circuits for High Soft Error Tolerance in Deep Submicron CMOS Circuits

As the devices are scaling down, the combinational logic will become susceptible to soft errors. The conventional soft error tolerant methods for soft errors on combinational logic do not provide enough high soft error tolerant capability with reasonably small performance penalty. This paper investigates the feasibility of designing quasi-delay insensitive (QDI) asynchronous circuits for high soft error tolerance. We analyze the behavior of null convention logic (NCL) circuits in the presence of particle strikes, and propose an asynchronous pipeline for soft-error correction and a novel technique to improve the robustness of threshold gates, which are basic components in NCL, against particle strikes by using Schmitt trigger circuit and resizing the feedback transistor. Experimental results show that the proposed threshold gates do not generate soft errors under the strike of a particle within a certain energy range if a proper transistor size is applied. The penalties, such as delay and power consumption, are also presented

CMOS optical-sensor array with high output current levels and automatic signal-range centring

A CMOS compatible photosensor with high output current levels, and an area-efficient scheme for automatic signal-range centring according to illumination conditions are presented. The high output current levels allow the use of these devices in continuoustime asynchronous imagers, as well as in high-sampling-frequency applications

Hardware Fault Injection

Hardware fault injection is the widely accepted approach to evaluate the behavior of a circuit in the presence of faults. Thus, it plays a key role in the design of robust circuits. This chapter presents a comprehensive review of hardware fault injection techniques, including physical and logical approaches. The implementation of effective fault injection systems is also analyzed. Particular emphasis is made on the recently developed emulation-based techniques, which can provide large flexibility along with unprecedented levels of performance. These capabilities provide a way to tackle reliability evaluation of complex circuits.Publicad

Probabilistic analysis of defect tolerance in asynchronous nano crossbar architecture

Among recent advancements in technology, nanotechnology is particularly promising. Most researchers have begun to focus their efforts on developing nano scale circuits. Nano scale devices such as carbon nano tubes (CNT) and silicon nano wires (SiNW) form the primitive building blocks of many nano scale logic devices and recently developed computing architecture. One of the most promising nanotechnologies is crossbar-based architecture, a two-dimensional nanoarray, formed by the intersection of two orthogonal sets of parallel and uniformly-spaced CNTs or SiNWs. Nanowire crossbars offer the potential for ultra-high density, which has never been achieved by photolithography. In an effort to improve these circuits, our research group proposed a new Null Convention Logic (NCL) based clock-less crossbar architecture. By eliminating the clock, this architecture makes possible a still higher density in reconfigurable systems. Defect density, however, is directly proportional to the density of nanowires in the architecture. Future work, therefore, must improve the defect tolerance of these asynchronous structures. The thesis comprises two papers. The first introduces asynchronous crossbar architecture and concludes with the validation of mapping a 1-bit adder on it. It also discusses various advantages of asynchronous crossbar architecture over clock based nano structures. The second paper concentrates on the probabilistic analysis of asynchronous nano crossbar architecture to address the high defect rates in these structures. It analyzes the probability distribution of mapping functions over the structure for varying number of defects and proposes a method to increase the probability of successful mapping --Abstract, page iv

Airborne Advanced Reconfigurable Computer System (ARCS)

A digital computer subsystem fault-tolerant concept was defined, and the potential benefits and costs of such a subsystem were assessed when used as the central element of a new transport's flight control system. The derived advanced reconfigurable computer system (ARCS) is a triple-redundant computer subsystem that automatically reconfigures, under multiple fault conditions, from triplex to duplex to simplex operation, with redundancy recovery if the fault condition is transient. The study included criteria development covering factors at the aircraft's operation level that would influence the design of a fault-tolerant system for commercial airline use. A new reliability analysis tool was developed for evaluating redundant, fault-tolerant system availability and survivability; and a stringent digital system software design methodology was used to achieve design/implementation visibility

Digital generator protection

Imperial Users onl

SEU sensitivity and modeling using picosecond pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology

International audience—This paper presents the design of a CMOS 40 nm D Flip-Flop cell and reports the laser fault sensitivity mapping both with experiments and simulation results. Theses studies are driven by the need to propose a simulation methodology based on laser/silicon interactions with a complex integrated circuit. In the security field, it is therefore mandatory to understand the behavior of sensitive devices like D Flip-Flops to laser stimulation. In previous works, Roscian et al., Sarafianos et al., Lacruche et al. or Courbon et al. studied the relations between the layout of cells, its different laser-sensitive areas and their associated fault model using laser pulse duration in the nanosecond range. In this paper, we report similar experiments carried out using a shorter laser pulse duration (30 ps instead of 50 ns). We also propose an upgrade of the simulation model they used to take into account laser pulse durations in the picosecond range on a logic gate composed of a large number of transistors for a recent CMOS technology (40 nm)