11,286 research outputs found

    Nanowire Zinc Oxide MOSFET Pressure Sensor

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    Fabrication and characterization of a new kind of pressure sensor using self-assembly Zinc Oxide (ZnO) nanowires on top of the gate of a Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) is presented. Self-assembly ZnO nanowires were fabricated with a diameter of 80 nm and 800 nm height (80:8 aspect ratio) on top of the gate of the MOSFET. The sensor showed a 110% response in the drain current due to pressure, even with the expected piezoresistive response of the silicon device removed from the measurement. The pressure sensor was fabricated through low temperature bottom up ultrahigh aspect ratio ZnO nanowire growth using anodic alumina oxide (AAO) templates. The pressure sensor has two main components: MOSFET and ZnO nanowires. Silicon Dioxide growth, photolithography, dopant diffusion, and aluminum metallization were used to fabricate a basic MOSFET. In the other hand, a combination of aluminum anodization, alumina barrier layer removal, ZnO atomic layer deposition (ALD), and wet etching for nanowire release were optimized to fabricate the sensor on a silicon wafer. The ZnO nanowire fabrication sequence presented is at low temperature making it compatible with CMOS technology

    Effect of anodization on the surface characteristics and electrochemical behaviour of zirconium in artificial saliva

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    The paper is focused on elaboration of ZrO2 films on pure zirconium via anodizing inphosphoric acid with and without fluoride at constant potentials of 30 V and 60 V. Thestructure and composition of the films were investigated using scanning electronicmicroscopy, Raman spectroscopy and X-ray photoelectron spectroscopy. The composition ofthe oxides formed at both potentials can be identified as monoclinic ZrO2. In addition to Zrand O, the layers formed in phosphoric acid contain phosphorus originating from thephosphoric acid. When the phosphoric acid solution contains NaF, fluorine is alsoincorporated into the oxide layer. The oxides formed at a higher voltage have greaterroughness than those formed at 30 V. Anodized samples exhibit smaller current densitiesduring anodic polarization compared to the as-received zirconium covered with native oxide.Fil: Romonti, Daniela E.. Faculty of Applied Chemistry and Materials Science; RumaniaFil: Gomez Sanchez, Andrea Valeria. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Mar del Plata. Instituto de Investigaciones en Ciencia y Tecnología de Materiales. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Instituto de Investigaciones en Ciencia y Tecnología de Materiales; ArgentinaFil: Milošev, Ingrid. Jožef Stefan Institute; EsloveniaFil: Demetrescu, Ioana. Faculty of Applied Chemistry and Materials Science; RumaniaFil: Ceré, Silvia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Mar del Plata. Instituto de Investigaciones en Ciencia y Tecnología de Materiales. Universidad Nacional de Mar del Plata. Facultad de Ingeniería. Instituto de Investigaciones en Ciencia y Tecnología de Materiales; Argentin

    Fabrication and structural characterization of highly ordered sub-100-nm planar magnetic nanodot arrays over 1 cm2 coverage area

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    Porous alumina masks are fabricated by anodization of aluminum films grown on both semiconducting and insulating substrates. For these self-assembled alumina masks, pore diameters and periodicities within the ranges of 10–130 and 20–200nm, respectively, can be controlled by varying anodization conditions. 20nm periodicities correspond to pore densities in excess of 1012 per square inch, close to the holy grail of media with 1Tbit∕in.2 density. With these alumina masks, ordered sub-100-nm planar ferromagnetic nanodot arrays covering over 1cm2 were fabricated by electron beam evaporation and subsequent mask lift-off. Moreover, exchange-biased bilayer nanodots were fabricated using argon-ion milling. The average dot diameter and periodicity are tuned between 25 and 130nm and between 45 and 200nm, respectively. Quantitative analyses of scanning electron microscopy (SEM) images of pore and dot arrays show a high degree of hexagonal ordering and narrow size distributions. The dot periodicity obtained from grazi..

    Effect of the anodization voltage on the porewidening rate of nanoporous anodic alumina

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    A detailed study of the pore-widening rate of nanoporous anodic alumina layers as a function of the anodization voltage was carried out. The study focuses on samples produced under the same electrolyte and concentration but different anodization voltages within the self-ordering regime. By means of ellipsometry-based optical characterization, it is shown that in the porewidening process, the porosity increases at a faster rate for lower anodization voltages. This opens the possibility of obtaining three-dimensional nanostructured nanoporous anodic alumina with controlled thickness and refractive index of each layer, and with a refractive index difference of up to 0.24 between layers, for samples produced with oxalic acid electrolytes
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