Using a SAT solver to generate checking sequences

Methods for software testing based on Finite State Machines (FSMs) have been researched since the early 60’s. Many of these methods are about generating a checking sequence from a given FSM which is an input sequence that determines whether an implementation of the FSM is faulty or correct. In this paper, we consider one of these methods, which constructs a checking sequence by reducing the problem of generating a checking sequence to finding a Chinese rural postman tour on a graph induced by the FSM; we re-formulate the constraints used in this method as a set of Boolean formulas; and use a SAT solver to generate a checking sequence of minimal length

Minimizing the cost of fault location when testing from a finite state machine

If a test does not produce the expected output, the incorrect output may have been caused by an earlier state transfer failure. Ghedamsi and coworkers generate a set of candidates and then produce further tests to locate the failures within this set. We consider a special case where there is a state identification process that is known to be correct. A number of preset and adaptive approaches to fault location are described and the problem of minimizing the cost is explored. Some of the approaches lead to NP-hard optimization problems for which possible heuristics are suggested

Using distinguishing and UIO sequences together in a checking sequence

If a finite state machine M does not have a distinguishing sequence, but has UIO sequences for its states, there are methods to produce a checking sequence for M. However, if M has a distinguishing sequence D, then there are methods that make use of D to construct checking sequences that are much shorter than the ones that would be constructed by using only the UIO sequences for M. The methods to applied when a distinguishing sequence exists, only make use of the distinguishing sequences. In this paper we show that, even if M has a distinguishing sequence D, the UIO sequences can still be used together with D to construct shorter checking sequences

Constructing multiple unique input/output sequences using metaheuristic optimisation techniques

Multiple unique input/output sequences (UIOs) are often used to generate robust and compact test sequences in finite state machine (FSM) based testing. However, computing UIOs is NP-hard. Metaheuristic optimisation techniques (MOTs) such as genetic algorithms (GAs) and simulated annealing (SA) are effective in providing good solutions for some NP-hard problems. In the paper, the authors investigate the construction of UIOs by using MOTs. They define a fitness function to guide the search for potential UIOs and use sharing techniques to encourage MOTs to locate UIOs that are calculated as local optima in a search domain. They also compare the performance of GA and SA for UIO construction. Experimental results suggest that, after using a sharing technique, both GA and SA can find a majority of UIOs from the models under test

A two-level approach to automated conformance testing of VHDL designs

For manufacturers of consumer electronics, conformance testing of embedded software is a vital issue. To improve performance, parts of this software are implemented in hardware, often designed in the Hardware Description Language VHDL. Conformance testing is a time consuming and error-prone process. Thus automating (parts of) this process is essential. There are many tools for test generation and for VHDL simulation. However, most test generation tools operate on a high level of abstraction and applying the generated tests to a VHDL design is a complicated task. For each specific case one can build a layer of dedicated circuitry and/or software that performs this task. It appears that the ad-hoc nature of this layer forms the bottleneck of the testing process. We propose a {em generic solution for bridging this gap: a generic layer of software dedicated to interface with VHDL implementations. It consists of a number of Von Neumann-like components that can be instantiated for each specific VHDL design. This paper reports on the construction of and some initial experiences with a concrete tool environment based on these principles

Improved test quality using robust unique input/output circuit sequences (UIOCs)

In finite state machine (FSM) based testing, the problem of fault masking in the unique input/ output (UIO) sequence may degrade the test performance of the UIO based methods. This paper investigates this problem and proposes the use of a new type of unique input/output circuit (UIOC) sequence for state verification, which may help to overcome the drawbacks that exist in the UIO based techniques. When constructing a UIOC, overlap and internal state observation schema are used to increase the robustness of a test sequence. Test quality is compared by using the forward UIO method (F-method), the backward UIO method (B-method) and the UIOC method (C-method) separately. Robustness of the UIOCs constructed by the algorithm given in this paper is also compared with those constructed by the algorithm given previously. Experimental results suggest that the C-method outperforms the F- and the B-methods and the UIOCs constructed by the Algorithm given in this paper, are more robust than those constructed by other proposed algorithms

Testing a system specified using Statecharts and Z

A hybrid specification language SZ, in which the dynamic behaviour of a system is described using Statecharts and the data and the data transformations are described using Z, has been developed for the specification of embedded systems. This paper describes an approach to testing from a deterministic sequential specification written in SZ. By considering the Z specifications of the operations, the extended finite state machine (EFSM) defined by the Statechart can be rewritten to produce an EFSM that has a number of properties that simplify test generation. Test generation algorithms are introduced and applied to an example. While this paper considers SZ specifications, the approaches described might be applied whenever the specification is an EFSM whose states and transitions are specified using a language similar to Z

UIO sequence based checking sequences for distributed test architectures

This study addresses the construction of a preset checking sequence that will not pose controllability (synchronization) and observability (undetectable output shift) problems when applied in distributed test architectures that utilize remote testers. The controllability problem manifests itself when a tester is required to send the current input and because it did not send the previous input nor did it receive the previous output it cannot determine when to send the input. The observability problem manifests itself when a tester is expecting an output in response to either the previous input or the current input and because it is not the one to send the current input, it cannot determine when to start and stop waiting for the output. Based on UIO sequences, a checking sequence construction method is proposed to yield a sequence that is free from controllability and observability problems

Optimizing the length of checking sequences

A checking sequence, generated from a finite state machine, is a test sequence that is guaranteed to lead to a failure if the system under test is faulty and has no more states than the specification. The problem of generating a checking sequence for a finite state machine M is simplified if M has a distinguishing sequence: an input sequence D~ with the property that the output sequence produced by M in response to D is different for the different states of M. Previous work has shown that, where a distinguishing sequence is known, an efficient checking sequence can be produced from the elements of a set A of sequences that verify the distinguishing sequence used and the elements of a set /spl gamma/ of subsequences that test the individual transitions by following each transition t by the distinguishing sequence that verifies the final state of t. In this previous work, A is a predefined set and /spl gamma/ is defined in terms of A. The checking sequence is produced by connecting the elements of /spl gamma/ and A to form a single sequence, using a predefined acyclic set E/sub c/ of transitions. An optimization algorithm is used in order to produce the shortest such checking sequence that can be generated on the basis of the given A and E/sub c/. However, this previous work did not state how the sets A and E/sub c/ should be chosen. This paper investigates the problem of finding appropriate A and E/sub c/ to be used in checking sequence generation. We show how a set A may be chosen so that it minimizes the sum of the lengths of the sequences to be combined. Further, we show that the optimization step, in the checking sequence generation algorithm, may be adapted so that it generates the optimal E/sub c/. Experiments are used to evaluate the proposed method