Very Large Scale Integration Cell Based Path Extractor For Physical To Layout Mapping In Fault Isolation Work

Debug and diagnosis in post-silicon challenges the technological advancement in Physical-to-Layout Mapping capabilities. Areas that require such innovation are fault isolation work in failure analysis of semiconductor devices, at post-silicon stage. Since fault isolation work begins at Register Transfer Level (RTL) level to form a suspected boundary consisting of multiple logics from one end to the other, layout to schematic mapping automation tool helps to identify fault in design within given boundary. Therefore the development of a path extractor program which is capable of extracting all possible paths from these start to end signals can save engineers time in tracing components involved between a fault line. This feature is extremely significant in Electronic Design Automation (EDA) as it can provide results of net name sequences stored in a database of mapper files. These mapper files can be used in layout design debug as the net sequence represents schematic signals. To be able to retrieve all possible signals involved within a suspected boundary is a popular search computational problem. Therefore the path extractor program proposed incorporates the characteristics of a depth-first search algorithm by considering the specifications of a cell-based design. The objectives achieved in this research are proven reliable with path extraction results consistent even with search depth manipulation. Performance differs an average of 12.6 % (iteration count) with keeping maximum allowable depth of search constant. Paths of net sequences were consistent throughout the verification of the path extractor program. This development and study of the path extract method carries significance in areas of EDA and debug diagnosis work

An efficient logic fault diagnosis framework based on effect-cause approach

Fault diagnosis plays an important role in improving the circuit design process and the manufacturing yield. With the increasing number of gates in modern circuits, determining the source of failure in a defective circuit is becoming more and more challenging. In this research, we present an efficient effect-cause diagnosis framework for combinational VLSI circuits. The framework consists of three stages to obtain an accurate and reasonably precise diagnosis. First, an improved critical path tracing algorithm is proposed to identify an initial suspect list by backtracing from faulty primary outputs toward primary inputs. Compared to the traditional critical path tracing approach, our algorithm is faster and exact. Second, a novel probabilistic ranking model is applied to rank the suspects so that the most suspicious one will be ranked at or near the top. Several fast filtering methods are used to prune unrelated suspects. Finally, to refine the diagnosis, fault simulation is performed on the top suspect nets using several common fault models. The difference between the observed faulty behavior and the simulated behavior is used to rank each suspect. Experimental results on ISCAS85 benchmark circuits show that this diagnosis approach is efficient both in terms of memory space and CPU time and the diagnosis results are accurate and reasonably precise

Advanced Operation and Maintenance in Solar Plants, Wind Farms and Microgrids

This reprint presents advances in operation and maintenance in solar plants, wind farms and microgrids. This compendium of scientific articles will help clarify the current advances in this subject, so it is expected that it will please the reader

Fault Isolation with ‘X’ Filter for Bogus Signals and Intensive Scan Cell Sequence Validation

There are some concerns in silicon data collection by using the Design-For-Test (DFT). Bogus signal which carries ‘x’ value in simulation, results from the complex logic synthesis and power-up floating state can often mislead the fault isolation process with invalid failing condition. Besides, scan cells within the scan chain architecture is also having mismatch value in between the simulation data and silicon data due to the non-ideal mapping file passed down from the designer team. Hence, it is important to develop an integrated tool that can filter all the bogus signal online and to validate the correlation between silicon data and simulation data with minimum coverage of 90%. Data from actual Intel 6th generation microprocessor with 14 nm process technology, Skylake is imported to ensure that the application of this thesis in the current industry market. Necessary tools such as the “Differentiate and Display” feature to ease the analysis of data, the AND-logic operation to filter the bogus signal and X-OR logic operation to handle the inverted characteristic of signals are developed throughout the thesis. Results show that the developed integrated filter of bogus signals is successful and the minimum coverage of validation tool is 96.5%. Actual failure analysis case from industry is imported and the difference with and without the developed tools are compared. Inconclusive optical test result from the sample is obtained without the implementation of tools. On the other hand, defect of short circuit between the via and the metal line is found after the implementation of the developed tools. It is concluded that this thesis has achieved all the objectives set

Fault Location in Grid Connected Ungrounded PV Systems Using Wavelets

Solar photovoltaic (PV) power has become one of the major sources of renewable energy worldwide. This thesis develops a wavelet-based fault location method for ungrounded PV farms based on pattern recognition of the high frequency transients due to switching frequencies in the system and which does not need any separate devices for fault location. The solar PV farm used for the simulation studies consists of a large number of PV modules connected to grid-connected inverters through ungrounded DC cables. Manufacturers report that about 1% of installed PV panels fail annually. Detecting phase to ground faults in ungrounded underground DC cables is also difficult and time consuming. Therefore, identifying ground faults is a significant problem in ungrounded PV systems because such earth faults do not provide sufficient fault currents for their detection and location during system operation. If such ground faults are not cleared quickly, a subsequent ground fault on the healthy phase will create a complete short-circuit in the system, which will cause a fire hazard and arc-flashing. Locating such faults with commonly used fault locators requires costly external high frequency signal generators, transducers, relays, and communication devices as well as generally longer lead times to find the fault. This thesis work proposes a novel fault location scheme that overcomes the shortcomings of the currently available methods. In this research, high frequency noise patterns are used to identify the fault location in an ungrounded PV farm. This high frequency noise is generated due to the switching transients of converters combined with parasitic capacitance of PV panels and cables. The pattern recognition approach, using discrete wavelet transform (DWT) multi-resolution analysis (MRA) and artificial neural networks (ANN), is utilized to investigate the proposed method for ungrounded grid integrated PV systems. Detailed time domain electromagnetic simulations of PV systems are done in a real-time environment and the results are analyzed to verify the performance of the fault locator. The fault locator uses a wavelet transform-based digital signal processing technique, which uses the high frequency patterns of the mid-point voltage signal of the converters to analyze the ground fault location. The Daubechies 10 (db10) wavelet and scale 11 are chosen as the appropriate mother wavelet function and decomposition level according to the characteristics of the noise waveform to give the proposed method better performance. In this study, norm values of the measured waveform at different frequency bands give unique features at different fault locations and are used as the feature vectors for pattern recognition. Then, the three-layer feed-forward ANN classifier, which can automatically classify the fault locations according to the extracted features, is investigated. The neural network is trained with the Levenberg-Marquardt back-propagation learning algorithm. The proposed fault locating scheme is tested and verified for different types of faults, such as ground and line-line faults at PV modules and cables of the ungrounded PV system. These faults are simulated in a real-time environment with a digital simulator and the data is then analyzed with wavelets in MATLAB. The test results show that the proposed method achieves 99.177% and 97.851% of fault location accuracy for different faults in DC cables and PV modules, respectively. Finally, the effectiveness and feasibility of the designed fault locator in real field applications is tested under varying fault impedance, power outputs, temperature, PV parasitic elements, and switching frequencies of the converters. The results demonstrate the proposed approach has very accurate and robust performance even with noisy measurements and changes in operating conditions

Algorithms for Fault Detection and Diagnosis

Due to the increasing demand for security and reliability in manufacturing and mechatronic systems, early detection and diagnosis of faults are key points to reduce economic losses caused by unscheduled maintenance and downtimes, to increase safety, to prevent the endangerment of human beings involved in the process operations and to improve reliability and availability of autonomous systems. The development of algorithms for health monitoring and fault and anomaly detection, capable of the early detection, isolation, or even prediction of technical component malfunctioning, is becoming more and more crucial in this context. This Special Issue is devoted to new research efforts and results concerning recent advances and challenges in the application of “Algorithms for Fault Detection and Diagnosis”, articulated over a wide range of sectors. The aim is to provide a collection of some of the current state-of-the-art algorithms within this context, together with new advanced theoretical solutions

Experimental analysis of computer system dependability

This paper reviews an area which has evolved over the past 15 years: experimental analysis of computer system dependability. Methodologies and advances are discussed for three basic approaches used in the area: simulated fault injection, physical fault injection, and measurement-based analysis. The three approaches are suited, respectively, to dependability evaluation in the three phases of a system's life: design phase, prototype phase, and operational phase. Before the discussion of these phases, several statistical techniques used in the area are introduced. For each phase, a classification of research methods or study topics is outlined, followed by discussion of these methods or topics as well as representative studies. The statistical techniques introduced include the estimation of parameters and confidence intervals, probability distribution characterization, and several multivariate analysis methods. Importance sampling, a statistical technique used to accelerate Monte Carlo simulation, is also introduced. The discussion of simulated fault injection covers electrical-level, logic-level, and function-level fault injection methods as well as representative simulation environments such as FOCUS and DEPEND. The discussion of physical fault injection covers hardware, software, and radiation fault injection methods as well as several software and hybrid tools including FIAT, FERARI, HYBRID, and FINE. The discussion of measurement-based analysis covers measurement and data processing techniques, basic error characterization, dependency analysis, Markov reward modeling, software-dependability, and fault diagnosis. The discussion involves several important issues studies in the area, including fault models, fast simulation techniques, workload/failure dependency, correlated failures, and software fault tolerance

Mechatronic Systems

Mechatronics, the synergistic blend of mechanics, electronics, and computer science, has evolved over the past twenty five years, leading to a novel stage of engineering design. By integrating the best design practices with the most advanced technologies, mechatronics aims at realizing high-quality products, guaranteeing at the same time a substantial reduction of time and costs of manufacturing. Mechatronic systems are manifold and range from machine components, motion generators, and power producing machines to more complex devices, such as robotic systems and transportation vehicles. With its twenty chapters, which collect contributions from many researchers worldwide, this book provides an excellent survey of recent work in the field of mechatronics with applications in various fields, like robotics, medical and assistive technology, human-machine interaction, unmanned vehicles, manufacturing, and education. We would like to thank all the authors who have invested a great deal of time to write such interesting chapters, which we are sure will be valuable to the readers. Chapters 1 to 6 deal with applications of mechatronics for the development of robotic systems. Medical and assistive technologies and human-machine interaction systems are the topic of chapters 7 to 13.Chapters 14 and 15 concern mechatronic systems for autonomous vehicles. Chapters 16-19 deal with mechatronics in manufacturing contexts. Chapter 20 concludes the book, describing a method for the installation of mechatronics education in schools

Sensors Fault Diagnosis Trends and Applications

Fault diagnosis has always been a concern for industry. In general, diagnosis in complex systems requires the acquisition of information from sensors and the processing and extracting of required features for the classification or identification of faults. Therefore, fault diagnosis of sensors is clearly important as faulty information from a sensor may lead to misleading conclusions about the whole system. As engineering systems grow in size and complexity, it becomes more and more important to diagnose faulty behavior before it can lead to total failure. In the light of above issues, this book is dedicated to trends and applications in modern-sensor fault diagnosis

Degradation modeling and degradation-aware control of power electronic systems

The power electronics market is valued at $23.25 billion in 2019 and is projected to reach$ 36.64 billion by 2027. Power electronic systems (PES) have been extensively used in a wide range of critical applications, including automotive, renewable energy, industrial variable-frequency drive, etc. Thus, the PESs\u27 reliability and robustness are immensely important for the smooth operation of mission-critical applications. Power semiconductor switches are one of the most vulnerable components in the PES. The vulnerability of these switches impacts the reliability and robustness of the PES. Thus, switch-health monitoring and prognosis are critical for avoiding unexpected shutdowns and preventing catastrophic failures. The importance of the prognosis study increases dramatically with the growing popularity of the next-generation power semiconductor switches, wide bandgap switches. These switches show immense promise in the high-power high-frequency operations due to their higher breakdown voltage and lower switch loss. But their wide adaptation is limited by the inadequate reliability study. A thorough prognosis study comprising switch degradation modeling, remaining useful life (RUL) estimation, and degradation-aware controller development, is important to enhance the PESs\u27 robustness, especially with wide bandgap switches. In this dissertation, three studies are conducted to achieve these objectives- 1) Insulated Gate Bipolar Transistor (IGBT) degradation modeling and RUL estimation, 2) cascode Gallium Nitride (GaN) Field-Effect Transistor (FET) degradation modeling and RUL estimation, and 3) Degradation-aware controller design for a PES, solid-state transformer (SST). The first two studies have addressed the significant variation in RUL estimation and proposed degradation identification methods for IGBT and cascode GaN FET. In the third study, a system-level integration of the switch degradation model is implemented in the SST. The insight into the switch\u27s degradation pattern from the first two studies is integrated into developing a degradation-aware controller for the SST. State-of-the-art controllers do not consider the switch degradation that results in premature system failure. The proposed low-complexity degradation-aware and adaptive SST controller ensures optimal degradation-aware power transfer and robust operation over the lifetime