Design and test for timing uncertainty in VLSI circuits.

由於特徵尺寸不斷縮小，集成電路在生產過程中的工藝偏差在運行環境中溫度和電壓等參數的波動以及在使用過程中的老化等效應越來越嚴重，導致芯片的時序行為出現很大的不確定性。多數情況下，芯片的關鍵路徑會不時出現時序錯誤。加入更多的時序餘量不是一種很好的解決方案，因為這種保守的設計方法會抵消工藝進步帶來的性能上的好處。這就為設計一個時序可靠的系統提出了極大的挑戰，其中的一些關鍵問題包括：(一)如何有效地分配有限的功率預算去優化那些正爆炸式增加的關鍵路徑的時序性能；(二)如何產生能夠捕捉準確的最壞情況時延的高品質測試向量；(三)為了能夠取得更好的功耗和性能上的平衡，我們將不得不允許芯片在使用過程中出現一些頻率很低的時序錯誤。隨之而來的問題是如何做到在線的檢錯和糾錯。為了解決上述問題，我們首先發明了一種新的技術用於識別所謂的虛假路徑，該方法使我們能夠發現比傳統方法更多的虛假路徑。當將所提取的虛假路徑集成到靜態時序分析工具里以後，我們可以得到更為準確的時序分析結果，同時也能節省本來用於優化這些路徑的成本。接著，考慮到現有的延時自動向量生成(ATPG) 方法會產生功能模式下無法出現的測試向量，這種向量可能會造成測試過程中在被激活的路徑周圍出現過多(或過少)的電源噪聲(PSN) ，從而導致測試過度或者測試不足情況。為此，我們提出了一種新的偽功能ATPG工具。通過同時考慮功能約束以及電路的物理佈局信息，我們使用類似ATPG 的算法產生狀態跳變使其能最大化已激活的路徑周圍的PSN影響。最後，基於近似電路的原理，我們提出了一種新的在線原位校正技術，即InTimeFix，用於糾正時序錯誤。由於實現近似電路的綜合僅需要簡單的電路結構分析，因此該技術能夠很容易的擴展到大型電路設計上去。With technology scaling, integrated circuits (ICs) suffer from increasing process, voltage, and temperature (PVT) variations and aging effects. In most cases, these reliability threats manifest themselves as timing errors on speed-paths (i.e., critical or near-critical paths) of the circuit. Embedding a large design guard band to prevent timing errors to occur is not an attractive solution, since this conservative design methodology diminishes the benefit of technology scaling. This creates several challenges on build a reliable systems, and the key problems include (i) how to optimize circuit’s timing performance with limited power budget for explosively increased potential speed-paths; (ii) how to generate high quality delay test pattern to capture ICs’ accurate worst-case delay; (iii) to have better power and performance tradeoff, we have to accept some infrequent timing errors in circuit’s the usage phase. Therefore, the question is how to achieve online timing error resilience.To address the above issues, we first develop a novel technique to identify so-called false paths, which facilitate us to find much more false paths than conventional methods. By integrating our identified false paths into static timing analysis tool, we are able to achieve more accurate timing information and also save the cost used to optimize false paths. Then, due to the fact that existing delay automated test pattern generation (ATPG) methods may generate test patterns that are functionally-unreachable, and such patterns may incur excessive (or limited) power supply noise (PSN) on sensitized paths in test mode, thus leading to over-testing or under-testing of the circuits, we propose a novel pseudo-functional ATPG tool. By taking both circuit layout information and functional constrains into account, we use ATPG like algorithm to justify transitions that pose the maximized functional PSN effects on sensitized critical paths. Finally, we propose a novel in-situ correction technique to mask timing errors, namely InTimeFix, by introducing redundant approximation circuit with more timing slack for speed-paths into the design. The synthesis of the approximation circuit relies on simple structural analysis of the original circuit, which is easily scalable to large IC designs.Detailed summary in vernacular field only.Detailed summary in vernacular field only.Yuan, Feng.Thesis (Ph.D.)--Chinese University of Hong Kong, 2012.Includes bibliographical references (leaves 88-100).Abstract also in Chinese.Abstract --- p.iAcknowledgement --- p.ivChapter 1 --- Introduction --- p.1Chapter 1.1 --- Challenges to Solve Timing Uncertainty Problem --- p.2Chapter 1.2 --- Contributions and Thesis Outline --- p.5Chapter 2 --- Background --- p.7Chapter 2.1 --- Sources of Timing Uncertainty --- p.7Chapter 2.1.1 --- Process Variation --- p.7Chapter 2.1.2 --- Runtime Environment Fluctuation --- p.9Chapter 2.1.3 --- Aging Effect --- p.10Chapter 2.2 --- Technical Flow to Solve Timing Uncertainty Problem --- p.10Chapter 2.3 --- False Path --- p.12Chapter 2.3.1 --- Path Sensitization Criteria --- p.12Chapter 2.3.2 --- False Path Aware Timing Analysis --- p.13Chapter 2.4 --- Manufacturing Testing --- p.14Chapter 2.4.1 --- Functional Testing vs. Structural Testing --- p.14Chapter 2.4.2 --- Scan-Based DfT --- p.15Chapter 2.4.3 --- Pseudo-Functional Testing --- p.17Chapter 2.5 --- Timing Error Tolerance --- p.19Chapter 2.5.1 --- Timing Error Detection --- p.19Chapter 2.5.2 --- Timing Error Recover --- p.20Chapter 3 --- Timing-Independent False Path Identification --- p.23Chapter 3.1 --- Introduction --- p.23Chapter 3.2 --- Preliminaries and Motivation --- p.26Chapter 3.2.1 --- Motivation --- p.27Chapter 3.3 --- False Path Examination Considering Illegal States --- p.28Chapter 3.3.1 --- Path Sensitization Criterion --- p.28Chapter 3.3.2 --- Path-Aware Illegal State Identification --- p.30Chapter 3.3.3 --- Proposed Examination Procedure --- p.31Chapter 3.4 --- False Path Identification --- p.32Chapter 3.4.1 --- Overall Flow --- p.34Chapter 3.4.2 --- Static Implication Learning --- p.35Chapter 3.4.3 --- Suspicious Node Extraction --- p.36Chapter 3.4.4 --- S-Frontier Propagation --- p.37Chapter 3.5 --- Experimental Results --- p.38Chapter 3.6 --- Conclusion and Future Work --- p.42Chapter 4 --- PSN Aware Pseudo-Functional Delay Testing --- p.43Chapter 4.1 --- Introduction --- p.43Chapter 4.2 --- Preliminaries and Motivation --- p.45Chapter 4.2.1 --- Motivation --- p.46Chapter 4.3 --- Proposed Methodology --- p.48Chapter 4.4 --- Maximizing PSN Effects under Functional Constraints --- p.50Chapter 4.4.1 --- Pseudo-Functional Relevant Transitions Generation --- p.51Chapter 4.5 --- Experimental Results --- p.59Chapter 4.5.1 --- Experimental Setup --- p.59Chapter 4.5.2 --- Results and Discussion --- p.60Chapter 4.6 --- Conclusion --- p.64Chapter 5 --- In-Situ Timing Error Masking in Logic Circuits --- p.65Chapter 5.1 --- Introduction --- p.65Chapter 5.2 --- Prior Work and Motivation --- p.67Chapter 5.3 --- In-Situ Timing Error Masking with Approximate Logic --- p.69Chapter 5.3.1 --- Equivalent Circuit Construction with Approximate Logic --- p.70Chapter 5.3.2 --- Timing Error Masking with Approximate Logic --- p.72Chapter 5.4 --- Cost-Efficient Synthesis for InTimeFix --- p.75Chapter 5.4.1 --- Overall Flow --- p.76Chapter 5.4.2 --- Prime Critical Segment Extraction --- p.77Chapter 5.4.3 --- Prime Critical Segment Merging --- p.79Chapter 5.5 --- Experimental Results --- p.81Chapter 5.5.1 --- Experimental Setup --- p.81Chapter 5.5.2 --- Results and Discussion --- p.82Chapter 5.6 --- Conclusion --- p.85Chapter 6 --- Conclusion and Future Work --- p.86Bibliography --- p.10

Advances in Logic Locking: Past, Present, and Prospects

Logic locking is a design concealment mechanism for protecting the IPs integrated into modern System-on-Chip (SoC) architectures from a wide range of hardware security threats at the IC manufacturing supply chain. Logic locking primarily helps the designer to protect the IPs against reverse engineering, IP piracy, overproduction, and unauthorized activation. For more than a decade, the research studies that carried out on this paradigm has been immense, in which the applicability, feasibility, and efficacy of the logic locking have been investigated, including metrics to assess the efficacy, impact of locking in different levels of abstraction, threat model definition, resiliency against physical attacks, tampering, and the application of machine learning. However, the security and strength of existing logic locking techniques have been constantly questioned by sophisticated logical and physical attacks that evolve in sophistication at the same rate as logic locking countermeasure approaches. By providing a comprehensive definition regarding the metrics, assumptions, and principles of logic locking, in this survey paper, we categorize the existing defenses and attacks to capture the most benefit from the logic locking techniques for IP protection, and illuminating the need for and giving direction to future research studies in this topic. This survey paper serves as a guide to quickly navigate and identify the state-of-the-art that should be considered and investigated for further studies on logic locking techniques, helping IP vendors, SoC designers, and researchers to be informed of the principles, fundamentals, and properties of logic locking

High Quality Delay Testing Scheme for a Self-Timed Microprocessor

RÉSUMÉ La popularité d’internet et la quantité toujours croissante de données qui transitent à travers ses terminaux nécessite d’importantes infrastructures de serveurs qui consomment énormément d’énergie. Par conséquent, et puisqu’une augmentation de la consommation d’énergie se traduit par une augmentation des coûts, la demande pour des processeurs efficaces en énergie est en forte hausse. Une manière d’augmenter l’efficacité énergétique des processeurs consiste à moduler la fréquence d’opération du système en fonction de la charge de travail. Les processeurs endochrones et asynchrones sont une des solutions mettant en œuvre ce principe de modulation de l’activité à la demande. Cependant, les méthodes de conception non conventionnelles qui leur sont associées, en particulier en termes de testabilité et d’automation, sont un frein au développement de ce type de systèmes. Ce travail s’intéresse au développement d’une méthode de test de haute qualité adressée aux pannes de retards dans une architecture de processeur endochrone spécifique, appelée AnARM. La méthode proposée consiste à détecter les pannes à faibles retards (PFR) dans l’AnARM en tirant profit des lignes à délais configurables intégrées. Ces pannes sont connues pour passer au travers des modèles de pannes de retards utilisés habituellement (les pannes de retards de portes). Ce travail s’intéresse principalement aux PFR qui échappent à la détection des pannes de retards de portes mais qui sont suffisamment longues pour provoquer des erreurs dans des conditions normales d’opération. D’autre part, la détection de pannes à très faibles retards est évitée, autant que possible, afin de limiter le nombre de faux positifs. Pour réaliser un test de haute qualité, ce travail propose, dans un premier temps, une métrique de test dédiée aux PFR, qui est mieux adaptée aux circuits endochrones, puis, dans un second temps, une méthode de test des pannes de retards basée sur la modulation de la vitesse des lignes à délais intégrés, qui s’adapte à un jeu de vecteurs de test préexistant.Ce travail présente une métrique de test ciblant les PFR, appelée pourcentage de marges pondérées (PoMP), ainsi qu’un nouveau modèle de test pour les PFR (appelé test de PFR idéal).----------ABSTRACT The popularity of the Internet and the huge amount of data that is transfered between devices nowadays requires very powerful servers that demand lots of power. Since higher power consumptions mean more expenses to companies, there is an increase in demand for power eÿcient processors. One of the ways to increase the power eÿciency of processors is to adapt the processing speeds and chip activity according the needed computation load. Self-timed or asynchronous processors are one of the solutions that apply this principle of activity on demand. However, their unconventional design methodology introduces several challenges in terms of testability and design automation. This work focuses on developing a high quality delay test for a specific architecture of self-timed processors called the AnARM. The proposed delay test focuses on catching e˙ective small-delay defects (SDDs) in the AnARM by taking advantage of built-in configurable delay lines. Those defects are known to escape one of the most commonly used delay fault models (the transition delay fault model). This work mainly focuses on e˙ective SDDs which can escape transition delay fault testing and are large enough to fail the circuit under normal operating conditions. At the same time, catching very small delay defects is avoided, when possible, to avoid falsely failing functional chips. To build the high quality delay test, this work develops an SDD test quality metric that is better suited for circuits with adaptable speeds. Then, it builds a delay test optimizer that adapts the built-in delay lines speeds to a preexisting at-speed pattern set to create a high quality SDD test. This work presents a novel SDD test quality metric called the weighted slack percentage (WeSPer), along with a new SDD testing model (named the ideal SDD test model). WeSPer is built to be a flexible metric capable of adapting to the availability of information about the circuit under test and the test environment. Since the AnARM can use multiple test speeds, WeSPer computation takes special care of assessing the effects of test frequency changes on the test quality. Specifically, special care is taken into avoiding overtesting the circuit. Overtesting will cause circuits under test to fail due to defects that are too small to affect the functionality of these circuits in their present state. A computation framework is built to compute WeSPer and compare it with other existing metrics in the literature over a large sets of process-voltage-temperature computation points. Simulations are done on a selected set of known benchmark circuits synthesized in the 28nm FD-SOI technology from STMicroelectronics

Provably Trustworthy and Secure Hardware Design with Low Overhead

Due to the globalization of IC design in the semiconductor industry and outsourcing of chip manufacturing, 3PIPs become vulnerable to IP piracy, reverse engineering, counterfeit IC, and hardware Trojans. To thwart such attacks, ICs can be protected using logic encryption techniques. However, strong resilient techniques incur significant overheads. SCAs further complicate matters by introducing potential attacks post-fabrication. One of the most severe SCAs is PA attacks, in which an attacker can observe the power variations of the device and analyze them to extract the secret key. PA attacks can be mitigated via adding large extra hardware; however, the overheads of such solutions can render them impractical, especially when there are power and area constraints. In our first approach, we present two techniques to prevent normal attacks. The first one is based on inserting MUX equal to half/full of the output bit number. In the second technique, we first design PLGs using SiNW FETs and then replace some logic gates in the original design with their SiNW FETs-based PLGs counterparts. In our second approach, we use SiNW FETs to produce obfuscated ICs that are resistant to advanced reverse engineering attacks. Our method is based on designing a small block, whose output is untraceable, namely URSAT. Since URSAT may not offer very strong resilience against the combined AppSAT-removal attack, S-URSAT is achieved using only CMOS-logic gates, and this increases the security level of the design to robustly thwart all existing attacks. In our third topic, we present the usage of ASLD to produce secure and resilient circuits that withstand IC attacks (during the fabrication) and PA attacks (after fabrication). First, we show that ASLD has unique features that can be used to prevent PA and IC attacks. In our three topics, we evaluate each design based on performance overheads and security guarantees

Multi-level simulation of nano-electronic digital circuits on GPUs

Simulation of circuits and faults is an essential part in design and test validation tasks of contemporary nano-electronic digital integrated CMOS circuits. Shrinking technology processes with smaller feature sizes and strict performance and reliability requirements demand not only detailed validation of the functional properties of a design, but also accurate validation of non-functional aspects including the timing behavior. However, due to the rising complexity of the circuit behavior and the steady growth of the designs with respect to the transistor count, timing-accurate simulation of current designs requires a lot of computational effort which can only be handled by proper abstraction and a high degree of parallelization. This work presents a simulation model for scalable and accurate timing simulation of digital circuits on data-parallel graphics processing unit (GPU) accelerators. By providing compact modeling and data-structures as well as through exploiting multiple dimensions of parallelism, the simulation model enables not only fast and timing-accurate simulation at logic level, but also massively-parallel simulation with switch level accuracy. The model facilitates extensions for fast and efficient fault simulation of small delay faults at logic level, as well as first-order parametric and parasitic faults at switch level. With the parallelization on GPUs, detailed and scalable simulation is enabled that is applicable even to multi-million gate designs. This way, comprehensive analyses of realistic timing-related faults in presence of process- and parameter variations are enabled for the first time. Additional simulation efficiency is achieved by merging the presented methods in a unified simulation model, that allows to combine the unique advantages of the different levels of abstraction in a mixed-abstraction multi-level simulation flow to reach even higher speedups. Experimental results show that the implemented parallel approach achieves unprecedented simulation throughput as well as high speedup compared to conventional timing simulators. The underlying model scales for multi-million gate designs and gives detailed insights into the timing behavior of digital CMOS circuits, thereby enabling large-scale applications to aid even highly complex design and test validation tasks