6,877 research outputs found

    Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level

    Get PDF
    In recent technology nodes, reliability is considered a part of the standard design ¿ow at all levels of embedded system design. While techniques that use only low-level models at gate- and register transfer-level offer high accuracy, they are too inefficient to consider the overall application of the embedded system. Multi-level models with high abstraction are essential to efficiently evaluate the impact of physical defects on the system. This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction-level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software system. A case study of a system consisting of hardware and software for image compression and data encryption is presented and the method is compared to a standard gate/RT mixed-level approac

    System Reliability Evaluation Using Concurrent Multi-Level Simulation of Structural Faults

    Get PDF
    This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software syste

    Simulator verification techniques study. Integrated simulator self test system concepts

    Get PDF
    Software and hardware requirements for implementing hardware self tests are presented in support of the development of training and procedures development simulators for the space shuttle program. Self test techniques for simulation hardware and the validation of simulation performance are stipulated. The requirements of an integrated simulator self system are analyzed. Readiness tests, fault isolation tests, and incipient fault detection tests are covered

    Chip level simulation of fault tolerant computers

    Get PDF
    Chip level modeling techniques, functional fault simulation, simulation software development, a more efficient, high level version of GSP, and a parallel architecture for functional simulation are discussed

    Graph-based real-time fault diagnostics

    Get PDF
    A real-time fault detection and diagnosis capability is absolutely crucial in the design of large-scale space systems. Some of the existing AI-based fault diagnostic techniques like expert systems and qualitative modelling are frequently ill-suited for this purpose. Expert systems are often inadequately structured, difficult to validate and suffer from knowledge acquisition bottlenecks. Qualitative modelling techniques sometimes generate a large number of failure source alternatives, thus hampering speedy diagnosis. In this paper we present a graph-based technique which is well suited for real-time fault diagnosis, structured knowledge representation and acquisition and testing and validation. A Hierarchical Fault Model of the system to be diagnosed is developed. At each level of hierarchy, there exist fault propagation digraphs denoting causal relations between failure modes of subsystems. The edges of such a digraph are weighted with fault propagation time intervals. Efficient and restartable graph algorithms are used for on-line speedy identification of failure source components

    Performance Evaluation of FMOSSIM, a Concurrent Switch-Level Fault Simulator

    Get PDF
    This paper presents measurements obtained while performing fault simulations of MOS circuits modeled at the switch level. In this model the transistor structure of the circuit is represented explicitly as a network of charge storage nodes connected by bidirectional transistor switches. Since the logic model of the simulator closely matches the actual structure of MOS circuits, such faults as stuck-open and closed transistors as well as short and open-circuited wires can be simulated. By using concurrent simulation techniques, we obtain a performance level comparable to fault simulators using logic gate models. Our measurements indicate that fault simulation times grow as the product of the circuit size and number of patterns, assuming the number of faults to be simulated is proportional to the circuit size. However, fault simulation times depend strongly on the rate at which the test patterns detect the faults

    Experimental analysis of computer system dependability

    Get PDF
    This paper reviews an area which has evolved over the past 15 years: experimental analysis of computer system dependability. Methodologies and advances are discussed for three basic approaches used in the area: simulated fault injection, physical fault injection, and measurement-based analysis. The three approaches are suited, respectively, to dependability evaluation in the three phases of a system's life: design phase, prototype phase, and operational phase. Before the discussion of these phases, several statistical techniques used in the area are introduced. For each phase, a classification of research methods or study topics is outlined, followed by discussion of these methods or topics as well as representative studies. The statistical techniques introduced include the estimation of parameters and confidence intervals, probability distribution characterization, and several multivariate analysis methods. Importance sampling, a statistical technique used to accelerate Monte Carlo simulation, is also introduced. The discussion of simulated fault injection covers electrical-level, logic-level, and function-level fault injection methods as well as representative simulation environments such as FOCUS and DEPEND. The discussion of physical fault injection covers hardware, software, and radiation fault injection methods as well as several software and hybrid tools including FIAT, FERARI, HYBRID, and FINE. The discussion of measurement-based analysis covers measurement and data processing techniques, basic error characterization, dependency analysis, Markov reward modeling, software-dependability, and fault diagnosis. The discussion involves several important issues studies in the area, including fault models, fast simulation techniques, workload/failure dependency, correlated failures, and software fault tolerance

    Fault Tolerant Adaptive Parallel and Distributed Simulation through Functional Replication

    Full text link
    This paper presents FT-GAIA, a software-based fault-tolerant parallel and distributed simulation middleware. FT-GAIA has being designed to reliably handle Parallel And Distributed Simulation (PADS) models, which are needed to properly simulate and analyze complex systems arising in any kind of scientific or engineering field. PADS takes advantage of multiple execution units run in multicore processors, cluster of workstations or HPC systems. However, large computing systems, such as HPC systems that include hundreds of thousands of computing nodes, have to handle frequent failures of some components. To cope with this issue, FT-GAIA transparently replicates simulation entities and distributes them on multiple execution nodes. This allows the simulation to tolerate crash-failures of computing nodes. Moreover, FT-GAIA offers some protection against Byzantine failures, since interaction messages among the simulated entities are replicated as well, so that the receiving entity can identify and discard corrupted messages. Results from an analytical model and from an experimental evaluation show that FT-GAIA provides a high degree of fault tolerance, at the cost of a moderate increase in the computational load of the execution units.Comment: arXiv admin note: substantial text overlap with arXiv:1606.0731
    corecore