Incipient Fault Diagnosis of a Grid-Connected T-Type Multilevel Inverter Using Multilayer Perceptron and Walsh Transform

Publisher Copyright: © 2023 by the authors.This article deals with fault detection and the classification of incipient and intermittent open-transistor faults in grid-connected three-level T-type inverters. Normally, open-transistor detection algorithms are developed for permanent faults. Nevertheless, the difficulty to detect incipient and intermittent faults is much greater, and appropriate methods are required. This requirement is due to the fact that over time, its repetition may lead to permanent failures that may lead to irreversible degradation. Therefore, the early detection of these failures is very important to ensure the reliability of the system and avoid unscheduled stops. For diagnosing these incipient and intermittent faults, a novel method based on a Walsh transform combined with a multilayer perceptron (MLP)-based classifier is proposed in this paper. This non-classical approach of using the Walsh transform not only allows accurate detections but is also very fast. This last characteristic is very important in these applications due to their practical implementation. The proposed method includes two main steps. First, the acquired AC currents are used by the control system and processed using the Walsh transform. This results in detailed information used to potentially identify open-transistor faults. Then, such information is processed using the MLP to finally determine whether a fault is present or not. Several experiments are conducted with different types of incipient transistor faults to create a relevant dataset.publishersversionpublishe

A Fast Diagnosis Method for Both IGBT Faults and Current Sensor Faults in Grid-Tied Three-Phase Inverters With Two Current Sensors

© 1986-2012 IEEE. This article considers fault detection in the case of a three-phase three-wire (3P3W) inverter, when only two current sensors are used to save cost or due to a faulty current sensor. With two current sensors, there is no current method addressing the diagnosis of both IGBT open-circuit (OC) faults and current sensor faults. In order to solve this problem, this article proposes a method which innovatively combines two kinds of diagnosis variables, line voltage deviations and phase voltage deviations. The unique faulty characteristics of diagnosis variables for each fault are extracted and utilized to distinguish the fault. Using an average model, the method only needs the signals already available in the controller. Both IGBT OC faults and current sensor faults can be detected quickly in inverter mode and rectifier mode, so that the converter can be protected in a timely way to avoid further damages. In addition, error-adaptive thresholds are adopted to make the method robust. Effects such as system unbalance are analyzed to ensure that the method is robust and feasible. Simulation and experimental results are used to verify and validate the effectiveness of the method

Open circuit fault diagnosis technique for inverter switches and gate drive malfunction

Open circuit faults (OCFs) in voltage source inverters (VSIs) can significantly affect their performance and reliability. In this paper, a novel fault diagnosis technique (FDT)is presented for the detection and classification of two types of OCFs in VSIs: gate drive malfunction (GDM) and open switch fault (OSF). the effect of these OCFs on the output current of the VSI is analysed, this shows that they can be identified and distinguished using the average and root mean square (RMS) ratio of the current parameters. The proposed FDT is simple to implement and can identify switch faults with quick response, without the need for additional equipment. In this work the authors adopted the ensemble bagged tree classification method to detect and classify the GDM and OSF, the results show the credibility of the proposed technique in identifying different open circuit faults

Fault Diagnosis and Condition Monitoring of Power Electronic Components Using Spread Spectrum Time Domain Reflectometry (SSTDR) and the Concept of Dynamic Safe Operating Area (SOA)

Title from PDF of title page viewed April 1, 2021Dissertation advisors: Faisal Khan and Yong ZengVitaIncludes bibliographical references ( page 117-132)Thesis (Ph.D.)--School of Computing and Engineering and Department of Mathematics and Statistics. University of Missouri--Kansas City, 2021Fault diagnosis and condition monitoring (CM) of power electronic components with a goal of improving system reliability and availability have been one of the major focus areas in the power electronics field in the last decades. Power semiconductor devices such as metal oxide semiconductor field-effect transistor (MOSFET) and insulated-gate bipolar transistor (IGBT) are considered to be the most fragile element of the power electronic systems and their reliability degrades with time due to mechanical and thermo-electrical stresses, which ultimately leads to a complete failure of the overall power conversion systems. Therefore, it is important to know the present state of health (SOH) of the power devices and the remaining useful life (RUL) of a power converter in order to perform preventive scheduled maintenance, which will eventually lead to increased system availability and reduced cost. In conventional practice, device aging and lifetime prediction techniques rely on the estimation of the meantime to failure (MTTF), a value that represents the expected lifespan of a device. MTTF predicts expected lifespan, but cannot adequately predict failures attributed to unusual circumstances or continuous overstress and premature degradation. This inability is due in large part to the fact that it considers the device safe operating area (SOA) or voltage and current ride-through capability to be independent of SOH. However, we experimentally proved that SOA of any semiconductor device goes down with the increased level of aging, and therefore, the probability of occurrence of over-voltage/current situation increases. As a result, the MTTF of the device as well as the overall converter reliability reduces with aging. That said, device degradation can be estimated by accomplishing an accurate online degradation monitoring tool that will determine the dynamic SOA. The correlation between aging and dynamic SOA gives us the useful remaining life of the device or the availability of a circuit. For this monitoring tool, spread spectrum time domain reflectometry (SSTDR) has been proposed and was successfully implemented in live power converters. In SSTDR, a high-frequency sine-modulated pseudo-noise sequence (SMPNS) is sent through the system, and reflections from age-related impedance discontinuities return to the test end where they are analyzed. In the past, SSTDR has been successfully used for device degradation detection in power converters while running at static conditions. However, the rapid variation in impedance throughout the entire live converter circuit caused by the fast-switching operation makes CM more challenging while using SSTDR. The algorithms and techniques developed in this project have overcome this challenge and demonstrated that the SSTDR test data are consistent with the aging of the power devices and do not affect the switching performance of the modulation process even the test signal is applied across the gate-source interface of the power MOSFET. This implies that the SSTDR technique can be integrated with the gate driver module, thereby creating a new platform for an intelligent gate-driver architecture (IGDA) that enables real-time health monitoring of power devices while performing features offered by a commercially available driver. Another application of SSTDR in power electronic systems is the ground fault prediction and detection technique for PV arrays. Protecting PV arrays from ground faults that lead to fire hazards and power loss is imperative to maintaining safe and effective solar power operations. Unlike many standard detection methods, SSTDR does not depend on fault current, therefore, can be implemented for testing ground faults at night or low illumination. However, wide variation in impedance throughout different materials and interconnections makes fault location more challenging than fault detection. This barrier was surmounted by the SSTDR-based fault detection algorithm developed in this project. The proposed algorithm was accounted for any variation in the number of strings, fault resistance, and the number of faults. In addition to its general utility for fault detection, the proposed algorithm can identify the location of multiple faults using only a single measurement point, thereby working as a preventative measure to protect the entire system at a reduced cost. Within the scope of the research work on SSTDR-based fault diagnosis and CM of power electronic components, a cell-level SOH measurement tool has been proposed that utilizes SSTDR to detect the location and aging of individual degraded cells in a large series-parallel connected Li-ion battery pack. This information of cell level SOH along with the respective cell location is critical to calculating the SOH of a battery pack and its remaining useful lifetime since the initial SOH of Li-ion cells varies under different manufacturing processes and operating conditions, causing them to perform inconsistently and thereby affect the performance of the entire battery pack in real-life applications. Unfortunately, today’s BMS considers the SOH of the entire battery pack/cell string as a single SOH and therefore, cannot monitor the SOH at the cell level. A healthy battery string has a specific impedance between the two terminals, and any aged cell in that string will change the impedance value. Since SSTDR can characterize the impedance change in its propagation path along with its location, it can successfully locate the degraded cell in a large battery pack and thereby, can prevent premature failure and catastrophic danger by performing scheduled maintenance.Introduction -- Background study and literature review -- Fundamentals of Spread Spectrum Time Domain Reflectometry (SSTDR): A new method for testing electronics live -- Accelerated aging test bench: design and implementation -- Condition monitoring of power switching in live power switching devices in live power electronic converters using SSTDR -- An irradiance-independent, robust ground-fault detection scheme for PV arrays based on SSTDR -- Detection of degraded/aged cell in a LI-Ion battery pack using SSTDR -- Dynamiv safe operating area (SOA) of power semiconductor devices -- Conclusion and future researc

A Model-Data-Hybrid-Driven Diagnosis Method for Open-Switch Faults in Power Converters

To combine the advantages of both model-driven and data-driven methods, this paper proposes a model-data-hybrid-driven (MDHD) method to diagnose open-switch faults in power converters. This idea is based on the explicit analytical model of converters and the learning capability of artificial neural network (ANN). The process of the method is divided into two parts: offline model analysis and learning, and online fault diagnosis. For both parts, model-driven and data-driven are combined. With the model information and data-based learning capability, a fast diagnosis for various operating conditions can be achieved without high computation burden, tricky threshold selection and complex rulemaking. This can greatly contribute to the practical application. The open-switch fault diagnosis in a two-level three-phase converter is studied for method validation. For this converter, an ANN is trained with two input elements, seven output elements, and two neurons in the hidden layer. Experimental results are given to demonstrate good performance

Industrial and Technological Applications of Power Electronics Systems

The Special Issue "Industrial and Technological Applications of Power Electronics Systems" focuses on: - new strategies of control for electric machines, including sensorless control and fault diagnosis; - existing and emerging industrial applications of GaN and SiC-based converters; - modern methods for electromagnetic compatibility. The book covers topics such as control systems, fault diagnosis, converters, inverters, and electromagnetic interference in power electronics systems. The Special Issue includes 19 scientific papers by industry experts and worldwide professors in the area of electrical engineering

Modular Battery Systems for Electric Vehicles based on Multilevel Inverter Topologies - Opportunities and Challenges

Modular battery systems based on multilevel inverter (MLI) topologies can possibly overcome some shortcomings of two-level inverters when used for vehicle propulsion. The results presented in this thesis aim to point out the advantages and disadvantages, as well as the technical challenges, of modular vehicle battery systems based on MLIs in comparison to a conventional, two-level IGBT inverter drivetrain. The considered key aspects for this comparative investigation are the drive cycle efficiency, the inverter cost, the fault tolerance capability of the drivetrain and the conducted electromagnetic emissions. Extensive experiments have been performed to support the results and conclusions.In this work, it is shown that the simulated drive cycle efficiency of different low-voltage-MOSFET-based, cascaded seven-level inverter types is improved in comparison to a similarly rated, two-level IGBT inverter drivetrain. For example, the simulated WLTP drive cycle efficiency of a cascaded double-H-bridge (CDHB) inverter drivetrain in comparison to a two-level IGBT inverter, when used in a small passenger car, is increased from 94.24% to 95.04%, considering the inverter and the ohmic battery losses. In contrast, the obtained efficiency of a similar rated seven-level cascaded H-bridge (CHB) drivetrain is almost equal to that of the two-level inverter drivetrain, but with the help of a hybrid modulation technique, utilizing fundamental selective harmonic elimination at lower speeds, it could be improved to 94.85%. In addition, the CDHB and CHB inverters’ cost, in comparison to the two-level inverter, is reduced from 342€ to 202€ and 121€, respectively. Furthermore, based on a simple three-level inverter with a dual battery pack, it is shown that MLIs inherently allow for a fault tolerant operation. It is explained how the drivetrain of a neutral point clamped (NPC) inverter can be operated under a fault condition, so that the vehicle can drive with a limited maximum power to the next service station, referred to as limp home mode. Especially, the detection and localization of open circuit faults has been investigated and verified through simulations and experiments.Moreover, it is explained how to measure the conducted emissions of an NPC inverter with a dual battery pack according to the governing standard, CISPR 25, because the additional neutral point connection forms a peculiar three-wire DC source. To separate the measured noise spectra into CM, line-DM and phase-DMquantities, two hardware separators based on HF transformers are developed and utilized. It is shown that the CM noise is dominant. Furthermore, the CM noise is reduced by 3dB to 6dB when operating the inverter with three-level instead of two-level modulation